Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 25515 | 279 | 18.1 | 47% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | ALUMINUM ANODIZING FILM | authKW | 109445 | 0% | 100% | 1 |
| 2 | AUGER ELECTRON ON SPECTROSCOPY | authKW | 109445 | 0% | 100% | 1 |
| 3 | AUGER ELECTRONIC SPECTROMETER | authKW | 109445 | 0% | 100% | 1 |
| 4 | BINDING STATE IDENTIFICATION | authKW | 109445 | 0% | 100% | 1 |
| 5 | BODY IMPLANTS | authKW | 109445 | 0% | 100% | 1 |
| 6 | BOMBARDMENT INDUCED PHASE TRANSFORMATION | authKW | 109445 | 0% | 100% | 1 |
| 7 | CONTINUOUS MERCURY ANALYZER | authKW | 109445 | 0% | 100% | 1 |
| 8 | DRY TYPE REDUCTION PROCESS | authKW | 109445 | 0% | 100% | 1 |
| 9 | FACTOR SOFT | authKW | 109445 | 0% | 100% | 1 |
| 10 | FESIX FILM | authKW | 109445 | 0% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Materials Science, Coatings & Films | 2118 | 20% | 0% | 56 |
| 2 | Chemistry, Physical | 696 | 34% | 0% | 96 |
| 3 | Physics, Applied | 494 | 29% | 0% | 80 |
| 4 | Physics, Condensed Matter | 424 | 22% | 0% | 61 |
| 5 | Chemistry, Analytical | 378 | 17% | 0% | 47 |
| 6 | Spectroscopy | 240 | 9% | 0% | 24 |
| 7 | Materials Science, Multidisciplinary | 76 | 15% | 0% | 41 |
| 8 | Instruments & Instrumentation | 50 | 5% | 0% | 14 |
| 9 | Metallurgy & Metallurgical Engineering | 28 | 4% | 0% | 12 |
| 10 | Microscopy | 9 | 1% | 0% | 2 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ISIS SENSORIAL MAT | 109445 | 0% | 100% | 1 |
| 2 | MAT SCI ROTTERDAMSEWEG 37 | 109445 | 0% | 100% | 1 |
| 3 | MATEMATY FIZY | 109445 | 0% | 100% | 1 |
| 4 | PHYS ELECT S | 109445 | 0% | 100% | 1 |
| 5 | CARDIFF ELECT ELE SYST ENGN | 54722 | 0% | 50% | 1 |
| 6 | MAT COMPOSANTS | 54722 | 0% | 50% | 1 |
| 7 | LEIBNIZ FESTKORPER WERKSTOFFOR D DEN | 36480 | 0% | 33% | 1 |
| 8 | STAHL TECHNOL | 36480 | 0% | 33% | 1 |
| 9 | MATEMAT FIZYKI | 27358 | 1% | 13% | 2 |
| 10 | MATEMAT FIZ | 21885 | 1% | 10% | 2 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | SURFACE AND INTERFACE ANALYSIS | 37824 | 17% | 1% | 48 |
| 2 | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 7330 | 7% | 0% | 20 |
| 3 | FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 7196 | 7% | 0% | 19 |
| 4 | ANALYTICAL METHODS AND INSTRUMENTATION | 4208 | 0% | 4% | 1 |
| 5 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2487 | 6% | 0% | 18 |
| 6 | MIKROCHIMICA ACTA | 2386 | 3% | 0% | 8 |
| 7 | APPLIED SURFACE SCIENCE | 2087 | 9% | 0% | 26 |
| 8 | FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1190 | 2% | 0% | 6 |
| 9 | MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK | 661 | 1% | 0% | 4 |
| 10 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 646 | 0% | 1% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | ARRANZ, A , PALACIO, C , (1994) FACTOR-ANALYSIS, A USEFUL TOOL FOR SOLVING ANALYTICAL PROBLEM IN AES AND XPS - A STUDY OF THE PERFORMANCES AND LIMITATIONS OF THE INDICATOR FUNCTION.SURFACE AND INTERFACE ANALYSIS. VOL. 22. ISSUE 1-12. P. 93-97 | 17 | 85% | 15 |
| 2 | BALCEROWSKA, G , SIUDA, R , ENGELHARD, H , (2000) APPLICATION OF PCA AND FA IN ELECTRON SPECTROSCOPY. II. THE MINIMUM ENERGY SHIFT OF FACTORS THAT CAN BE RESOLVED IN A SET OF NOISY SPECTRA.SURFACE AND INTERFACE ANALYSIS. VOL. 29. ISSUE 8. P. 492-499 | 9 | 90% | 5 |
| 3 | BUBERT, H , HILLIG, H , (2000) ARTIFICIAL NEURAL NETWORK AND FUZZY CLUSTERING - NEW TOOLS FOR EVALUATION OF DEPTH PROFILE DATA?.MIKROCHIMICA ACTA. VOL. 133. ISSUE 1-4. P. 95 -103 | 9 | 90% | 0 |
| 4 | RENIERS, F , SILBERBERG, E , ROOSE, N , VEREECKEN, J , (1996) STUDY OF THE CHEMICAL BONDING IN TUNGSTEN CARBIDE AND CHROMIUM FILMS BY APPLICATION OF FACTOR ANALYSIS ON AES DEPTH PROFILES.APPLIED SURFACE SCIENCE. VOL. 99. ISSUE 4. P. 379-392 | 9 | 100% | 3 |
| 5 | KOVAC, J , BOGATAJ, T , ZALAR, A , (2000) OPTIMIZED LINEAR DECOMPOSITION OF DATA OBTAINED DURING AES DEPTH PROFILING.SURFACE AND INTERFACE ANALYSIS. VOL. 30. ISSUE 1. P. 190-194 | 8 | 89% | 1 |
| 6 | WATSON, DG , (1990) IMPROVED DYNAMIC-RANGE AND AUTOMATED LINESHAPE DIFFERENTIATION IN AES/XPS COMPOSITION VERSUS DEPTH PROFILES.SURFACE AND INTERFACE ANALYSIS. VOL. 15. ISSUE 9. P. 516-524 | 9 | 100% | 24 |
| 7 | SPLINTER, SJ , VANDERHEIDE, PAW , LIN, A , MCINTYRE, NS , (1995) USE OF ZR- SECONDARY-ION ENERGY-DISTRIBUTIONS AND FACTOR-ANALYSIS TO CONSTRUCT CHEMICAL-STATE DEPTH PROFILES IN SIMS.SURFACE AND INTERFACE ANALYSIS. VOL. 23. ISSUE 9. P. 573-580 | 13 | 57% | 8 |
| 8 | JOHN, A , ZEIGER, W , SCHARNWEBER, D , WORCH, H , OSWALD, S , (1999) SURFACE ANALYTICAL INVESTIGATION OF THE ELECTROCHEMICAL AND CORROSION BEHAVIOUR OF NANOCRYSTALLINE FEAL8.FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY. VOL. 365. ISSUE 1-3. P. 136-141 | 10 | 63% | 5 |
| 9 | KOOI, BJ , SOMERS, MAJ , (1994) FACTOR-ANALYSIS OF FEM2,3VV SPECTRA OF OXIDIZING IRON - THE ROLE OF THE BACKGROUND IN THE EMERGENCE OF GHOST COMPONENTS.SURFACE AND INTERFACE ANALYSIS. VOL. 21. ISSUE 8. P. 501 -513 | 12 | 60% | 20 |
| 10 | BALCEROWSKA, G , SIUDA, R , (1999) ON THE APPLICATION OF PRINCIPAL COMPONENT ANALYSIS AND FACTOR ANALYSIS IN ELECTRON SPECTROSCOPY: THE LIMIT OF DETECTABILITY OF FACTORS IN A SET OF NOISY SPECTRA.APPLIED SURFACE SCIENCE. VOL. 144-45. ISSUE . P. 83 -87 | 7 | 88% | 2 |
Classes with closest relation at Level 1 |