Class information for:
Level 1: SIMS//DEPTH RESOLUTION//SCI ANAL MAT SAM

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
5232 1653 23.9 52%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
638 3       NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//SWIFT HEAVY IONS//THERMAL SPIKE 12586
1242 2             NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//SWIFT HEAVY IONS//THERMAL SPIKE 9004
5232 1                   SIMS//DEPTH RESOLUTION//SCI ANAL MAT SAM 1653

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SIMS authKW 381751 13% 10% 211
2 DEPTH RESOLUTION authKW 328520 3% 34% 52
3 SCI ANAL MAT SAM address 326080 2% 55% 32
4 MRI MODEL authKW 297987 1% 73% 22
5 SURFACE AND INTERFACE ANALYSIS journal 276757 19% 5% 316
6 STORING MATTER TECHNIQUE authKW 221652 1% 100% 12
7 OXYGEN BOMBARDMENT authKW 186247 1% 92% 11
8 DEPTH PROFILING authKW 163863 5% 10% 89
9 SPUTTER DEPTH PROFILING authKW 152500 1% 49% 17
10 USEFUL YIELD authKW 135710 1% 57% 13

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Materials Science, Coatings & Films 19447 25% 0% 411
2 Physics, Applied 7601 44% 0% 728
3 Chemistry, Physical 4843 37% 0% 611
4 Physics, Condensed Matter 2947 23% 0% 388
5 Instruments & Instrumentation 1925 11% 0% 188
6 Nuclear Science & Technology 1814 10% 0% 171
7 Physics, Nuclear 1139 9% 0% 141
8 Physics, Atomic, Molecular & Chemical 989 11% 0% 178
9 Chemistry, Analytical 660 10% 0% 164
10 Microscopy 535 2% 0% 34

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SCI ANAL MAT SAM 326080 2% 55% 32
2 ADV SIMS PROJECTS 98507 0% 67% 8
3 ADV RUMENTAT ION NANOANALYT AINA 69615 0% 54% 7
4 SPDT 60331 0% 47% 7
5 ADV SIMS PROJECT 49253 0% 67% 4
6 SCI ANAL MAT 47202 1% 17% 15
7 ANAL MAT 38349 1% 23% 9
8 MRT 38122 0% 26% 8
9 INL INSA 7 36942 0% 100% 2
10 TECHNOL NANOSTRUCT DEVICES 36942 0% 100% 2

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SURFACE AND INTERFACE ANALYSIS 276757 19% 5% 316
2 APPLIED SURFACE SCIENCE 32876 15% 1% 250
3 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 12684 6% 1% 99
4 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 10666 8% 0% 136
5 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 9284 6% 1% 92
6 FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE 7234 2% 1% 36
7 VACUUM 4986 3% 1% 51
8 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 3189 2% 1% 34
9 MIKROCHIMICA ACTA 2752 1% 1% 21
10 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY 2228 1% 1% 12

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SIMS 381751 13% 10% 211 Search SIMS Search SIMS
2 DEPTH RESOLUTION 328520 3% 34% 52 Search DEPTH+RESOLUTION Search DEPTH+RESOLUTION
3 MRI MODEL 297987 1% 73% 22 Search MRI+MODEL Search MRI+MODEL
4 STORING MATTER TECHNIQUE 221652 1% 100% 12 Search STORING+MATTER+TECHNIQUE Search STORING+MATTER+TECHNIQUE
5 OXYGEN BOMBARDMENT 186247 1% 92% 11 Search OXYGEN+BOMBARDMENT Search OXYGEN+BOMBARDMENT
6 DEPTH PROFILING 163863 5% 10% 89 Search DEPTH+PROFILING Search DEPTH+PROFILING
7 SPUTTER DEPTH PROFILING 152500 1% 49% 17 Search SPUTTER+DEPTH+PROFILING Search SPUTTER+DEPTH+PROFILING
8 USEFUL YIELD 135710 1% 57% 13 Search USEFUL+YIELD Search USEFUL+YIELD
9 SURFACE TRANSIENT 131347 0% 89% 8 Search SURFACE+TRANSIENT Search SURFACE+TRANSIENT
10 STORING MATTER 129297 0% 100% 7 Search STORING+MATTER Search STORING+MATTER

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 WITTMAACK, K , (2013) UNRAVELLING THE SECRETS OF CS CONTROLLED SECONDARY ION FORMATION: EVIDENCE OF THE DOMINANCE OF SITE SPECIFIC SURFACE CHEMISTRY, ALLOYING AND IONIC BONDING.SURFACE SCIENCE REPORTS. VOL. 68. ISSUE 1. P. 108 -230 109 36% 21
2 HOFMANN, S , (1998) SPUTTER DEPTH PROFILE ANALYSIS OF INTERFACES.REPORTS ON PROGRESS IN PHYSICS. VOL. 61. ISSUE 7. P. 827 -888 79 59% 128
3 HOFMANN, S , LIU, Y , WANG, JY , KOVAC, J , (2014) ANALYTICAL AND NUMERICAL DEPTH RESOLUTION FUNCTIONS IN SPUTTER PROFILING.APPLIED SURFACE SCIENCE. VOL. 314. ISSUE . P. 942 -955 40 89% 1
4 CHANBASHA, AR , WEE, ATS , (2007) SURFACE TRANSIENT EFFECTS IN ULTRALOW-ENERGY CS PLUS SPUTTERING OF SI.SURFACE AND INTERFACE ANALYSIS. VOL. 39. ISSUE 5. P. 397-404 42 100% 3
5 YUNIN, PA , DROZDOV, YN , DROZDOV, MN , (2015) A NEW APPROACH TO EXPRESS TOF SIMS DEPTH PROFILING.SURFACE AND INTERFACE ANALYSIS. VOL. 47. ISSUE 7. P. 771 -776 31 97% 3
6 CHANBASHA, AR , WEE, ATS , (2008) ULTRALOW-ENERGY SIMS FOR SHALLOW SEMICONDUCTOR DEPTH PROFILING.APPLIED SURFACE SCIENCE. VOL. 255. ISSUE 4. P. 1307-1310 33 100% 2
7 YUNIN, PA , DROZDOV, YN , DROZDOV, MN , YURASOVA, DV , (2014) RECOVERY OF SIMS DEPTH PROFILES WITH ACCOUNT FOR NONSTATIONARY EFFECTS.APPLIED SURFACE SCIENCE. VOL. 307. ISSUE . P. 33-41 29 85% 4
8 DROZDOV, MN , DROZDOV, YN , CSIK, A , NOVIKOV, AV , VAD, K , YUNIN, PA , YURASOV, DV , BELYKH, SF , GOLOLOBOV, GP , SUVOROV, DV , ET AL (2016) QUANTITATIVE DEPTH PROFILING OF SI1-XGEX STRUCTURES BY TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY AND SECONDARY NEUTRAL MASS SPECTROMETRY.THIN SOLID FILMS. VOL. 607. ISSUE . P. 25 -31 27 84% 0
9 GIORDANI, A , LEE, HD , XU, C , GUSTAFSSON, T , HUNTER, JL , (2016) TEMPERATURE DEPENDENT CS RETENTION, DISTRIBUTION, AND ION YIELD CHANGES DURING CS+ BOMBARDMENT SIMS.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 34. ISSUE 3. P. - 23 85% 1
10 WITTMAACK, K , (1991) SURFACE AND DEPTH ANALYSIS BASED ON SPUTTERING.TOPICS IN APPLIED PHYSICS. VOL. 64. ISSUE . P. 161 -256 98 45% 2

Classes with closest relation at Level 1


Rank Class id link
1 17997 SIMS MICROSCOPY//ION MICROSCOPY//NEUTRON CAPTURE RADIOGRAPHY
2 18100 CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB
3 27392 SHAVE OFF DEPTH PROFILING//SHAVE OFF//SAMPLE ROTATION SIMS
4 7443 ION SPUTTERING//NANORIPPLES//RIPPLES
5 3870 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//ION PHOTON EMISSION//KINETIC EXCITATION
6 25515 ALUMINUM ANODIZING FILM//AUGER ELECTRON ON SPECTROSCOPY//AUGER ELECTRONIC SPECTROMETER
7 8481 ION BEAM MIXING//NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//BALLISTIC MIXING
8 5304 TOF SIMS//CLUSTER SIMS//MOLECULAR DEPTH PROFILING
9 29214 CERAMIC MELTER//OKANOGANITE Y//REE BOROSILICATE
10 31314 WELD BRAZING//B610CF STEEL//BORON GRAPHENE HYBRIDS

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