Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
8897 | 1206 | 26.7 | 65% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
319 | 3 | SURFACE SCIENCE//LOW INDEX SINGLE CRYSTAL SURFACES//CHEMISTRY, PHYSICAL | 39359 |
27 | 2 | SURFACE SCIENCE//LOW INDEX SINGLE CRYSTAL SURFACES//CHEMISORPTION | 33888 |
8897 | 1 | PHOTOELECTRON DIFFRACTION//PHOTOELECTRON HOLOGRAPHY//X RAY FLUORESCENCE HOLOGRAPHY | 1206 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | PHOTOELECTRON DIFFRACTION | authKW | 777063 | 8% | 32% | 95 |
2 | PHOTOELECTRON HOLOGRAPHY | authKW | 565127 | 2% | 89% | 25 |
3 | X RAY FLUORESCENCE HOLOGRAPHY | authKW | 510574 | 2% | 92% | 22 |
4 | X RAY HOLOGRAPHY | authKW | 258924 | 1% | 68% | 15 |
5 | DIRECTIONAL ELASTIC PEAK ELECTRON SPECTROSCOPY DEPES | authKW | 218814 | 1% | 79% | 11 |
6 | X RAY PHOTOELECTRON DIFFRACTION | authKW | 175025 | 2% | 31% | 22 |
7 | STEREOATOMSCOPE | authKW | 151908 | 0% | 100% | 6 |
8 | DISPLAY TYPE SPHERICAL MIRROR ANALYZER | authKW | 130205 | 0% | 86% | 6 |
9 | FORWARD FOCUSING PEAK | authKW | 126590 | 0% | 100% | 5 |
10 | MODULATED ELECTRON EMISSION | authKW | 126590 | 0% | 100% | 5 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 10709 | 49% | 0% | 595 |
2 | Spectroscopy | 2262 | 12% | 0% | 149 |
3 | Chemistry, Physical | 1760 | 27% | 0% | 328 |
4 | Physics, Multidisciplinary | 755 | 13% | 0% | 156 |
5 | Materials Science, Coatings & Films | 590 | 5% | 0% | 66 |
6 | Physics, Applied | 552 | 16% | 0% | 197 |
7 | Instruments & Instrumentation | 169 | 5% | 0% | 55 |
8 | Nuclear Science & Technology | 33 | 2% | 0% | 28 |
9 | Physics, Nuclear | 30 | 2% | 0% | 28 |
10 | Microscopy | 15 | 0% | 0% | 6 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MAT USING GENERAT SYNCHROTRON RADIAT I | 81008 | 1% | 40% | 8 |
2 | CHAIR OPT SPECT | 52740 | 0% | 42% | 5 |
3 | NEUTRON SPECT | 28763 | 0% | 23% | 5 |
4 | CMC CAT ADV PHOTON SOURCE | 25318 | 0% | 100% | 1 |
5 | CNRSUR1 UMR 6251 | 25318 | 0% | 100% | 1 |
6 | CONSORZIO INTERUNIV CHIM MAT | 25318 | 0% | 100% | 1 |
7 | EELECT MECH ENGN | 25318 | 0% | 100% | 1 |
8 | GENERAT SYNCHROTRON IL 3 | 25318 | 0% | 100% | 1 |
9 | INSITUTE NUCL PHYS CHEM | 25318 | 0% | 100% | 1 |
10 | KERN STALINGSFYS | 25318 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 66354 | 10% | 2% | 125 |
2 | SURFACE REVIEW AND LETTERS | 22179 | 4% | 2% | 48 |
3 | SURFACE SCIENCE | 20771 | 12% | 1% | 149 |
4 | PHYSICAL REVIEW B | 7788 | 19% | 0% | 228 |
5 | PROGRESS IN SURFACE SCIENCE | 6026 | 1% | 2% | 13 |
6 | CASABELLA | 3615 | 0% | 14% | 1 |
7 | SURFACE AND INTERFACE ANALYSIS | 3367 | 2% | 0% | 30 |
8 | CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES | 1383 | 0% | 3% | 2 |
9 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1357 | 2% | 0% | 28 |
10 | SURFACE SCIENCE REPORTS | 1254 | 0% | 1% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | MATSUI, F , MATSUSHITA, T , DAIMON, H , (2012) PHOTOELECTRON DIFFRACTION AND HOLOGRAPHIC RECONSTRUCTION OF GRAPHITE.JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN. VOL. 81. ISSUE 11. P. - | 57 | 93% | 0 |
2 | LIDER, VV , (2015) X-RAY HOLOGRAPHY.PHYSICS-USPEKHI. VOL. 58. ISSUE 4. P. 365 -383 | 85 | 52% | 0 |
3 | MATSUSHITA, T , MATSUI, F , (2014) FEATURES OF ATOMIC IMAGES RECONSTRUCTED FROM PHOTOELECTRON, AUGER ELECTRON, AND INTERNAL DETECTOR ELECTRON HOLOGRAPHY USING SPEA-MEM.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 195. ISSUE . P. 365 -374 | 46 | 96% | 1 |
4 | KUZNETSOV, MV , OGORODNIKOV, II , VOROKH, AS , (2014) X-RAY PHOTOELECTRON DIFFRACTION AND PHOTOELECTRON HOLOGRAPHY AS METHODS FOR INVESTIGATING THE LOCAL ATOMIC STRUCTURE OF THE SURFACE OF SOLIDS.RUSSIAN CHEMICAL REVIEWS. VOL. 83. ISSUE 1. P. 13 -37 | 62 | 68% | 2 |
5 | FONDA, L , (1996) EMISSION ELECTRON DIFFRACTION AND HOLOGRAPHY: A THEORETICAL SURVEY.SURFACE REVIEW AND LETTERS. VOL. 3. ISSUE 4. P. 1603-1626 | 78 | 90% | 1 |
6 | MATSUSHITA, T , MATSUI, F , GOTO, K , MATSUMOTO, T , DAIMON, H , (2013) ELEMENT ASSIGNMENT FOR THREE-DIMENSIONAL ATOMIC IMAGING BY PHOTOELECTRON HOLOGRAPHY.JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN. VOL. 82. ISSUE 11. P. - | 44 | 94% | 1 |
7 | SHALAEVA, EV , KUZNETSOV, MV , (2003) X-RAY PHOTOELECTRON DIFFRACTION. POSSIBILITIES OF SURFACE STRUCTURAL ANALYSIS.JOURNAL OF STRUCTURAL CHEMISTRY. VOL. 44. ISSUE 3. P. 465 -498 | 100 | 52% | 3 |
8 | FAIGEL, G , TEGZE, M , (1999) X-RAY HOLOGRAPHY.REPORTS ON PROGRESS IN PHYSICS. VOL. 62. ISSUE 3. P. 355 -393 | 55 | 95% | 65 |
9 | MATSUSHITA, T , GUO, FZ , SUZUKI, M , MATSUI, F , DAIMON, H , HAYASHI, K , (2008) RECONSTRUCTION ALGORITHM FOR ATOMIC-RESOLUTION HOLOGRAPHY USING TRANSLATIONAL SYMMETRY.PHYSICAL REVIEW B. VOL. 78. ISSUE 14. P. - | 39 | 93% | 9 |
10 | WOODRUFF, DP , (2007) ADSORBATE STRUCTURE DETERMINATION USING PHOTOELECTRON DIFFRACTION: METHODS AND APPLICATIONS.SURFACE SCIENCE REPORTS. VOL. 62. ISSUE 1. P. 1-38 | 92 | 38% | 44 |
Classes with closest relation at Level 1 |