Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
20135 | 474 | 15.7 | 45% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
557 | 3 | FIZIKA NIZKIKH TEMPERATUR//PHYSICS, CONDENSED MATTER//JOURNAL OF PHYSICS F-METAL PHYSICS | 17672 |
3223 | 2 | EMBEDDED RESISTOR//RESISTIVE FILMS//THIN FILM RESISTOR | 2029 |
20135 | 1 | EMBEDDED RESISTOR//RESISTIVE FILMS//THIN FILM RESISTOR | 474 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | EMBEDDED RESISTOR | authKW | 518414 | 3% | 62% | 13 |
2 | RESISTIVE FILMS | authKW | 458093 | 2% | 89% | 8 |
3 | THIN FILM RESISTOR | authKW | 343542 | 4% | 27% | 20 |
4 | NI CR THIN FILM | authKW | 257678 | 1% | 100% | 4 |
5 | RESI175 | authKW | 206141 | 1% | 80% | 4 |
6 | RELATIVE RESISTANCE CHANGE | authKW | 193259 | 1% | 100% | 3 |
7 | LASER TRIMMING | authKW | 166126 | 1% | 37% | 7 |
8 | TEMPERATURE COEFFICIENT OF RESISTANCE TCR | authKW | 164903 | 2% | 32% | 8 |
9 | INTEGRAL PASSIVES | authKW | 147241 | 1% | 57% | 4 |
10 | EMBEDDED THIN FILM RESISTOR | authKW | 128839 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 6288 | 26% | 0% | 125 |
2 | Physics, Applied | 3027 | 51% | 0% | 243 |
3 | Materials Science, Multidisciplinary | 1938 | 45% | 0% | 214 |
4 | Physics, Condensed Matter | 1679 | 32% | 0% | 152 |
5 | Engineering, Electrical & Electronic | 432 | 20% | 0% | 93 |
6 | Metallurgy & Metallurgical Engineering | 230 | 8% | 0% | 39 |
7 | Engineering, Manufacturing | 198 | 4% | 0% | 18 |
8 | Nanoscience & Nanotechnology | 103 | 6% | 0% | 28 |
9 | Computer Science, Hardware & Architecture | 62 | 2% | 0% | 11 |
10 | Materials Science, Characterization, Testing | 38 | 1% | 0% | 6 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MINIST HIGH TEMP MAT TESTS | 128835 | 1% | 50% | 4 |
2 | CHAIR ELECT DEVICES CIRCUITS | 64420 | 0% | 100% | 1 |
3 | CHEMFREDERICK SEITZ MAT | 64420 | 0% | 100% | 1 |
4 | CIE UNIV | 64420 | 0% | 100% | 1 |
5 | COLD MASS PRECIS FORMING | 64420 | 0% | 100% | 1 |
6 | E FISHKILL I | 64420 | 0% | 100% | 1 |
7 | EDUC MINIST HIST TEMP MAT TESTS | 64420 | 0% | 100% | 1 |
8 | INFORMAT ENGN PHYS | 64420 | 0% | 100% | 1 |
9 | LASER PROCESSES | 64420 | 0% | 100% | 1 |
10 | MICROREL | 64420 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | THIN SOLID FILMS | 12550 | 18% | 0% | 84 |
2 | ELECTROCOMPONENT SCIENCE AND TECHNOLOGY | 7152 | 1% | 4% | 3 |
3 | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 4982 | 2% | 1% | 10 |
4 | HEWLETT-PACKARD JOURNAL | 3087 | 1% | 1% | 4 |
5 | JOURNAL OF THE KOREAN INSTITUTE OF METALS AND MATERIALS | 1817 | 1% | 1% | 3 |
6 | IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1597 | 1% | 0% | 7 |
7 | IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING | 1462 | 1% | 1% | 3 |
8 | SOUTH AFRICAN JOURNAL OF PHYSICS - SUID-AFRIKAANSE TYDSKRIF VIR FISIKA | 1313 | 0% | 2% | 1 |
9 | VACUUM | 958 | 3% | 0% | 12 |
10 | SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS | 930 | 0% | 1% | 2 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | EMBEDDED RESISTOR | 518414 | 3% | 62% | 13 | Search EMBEDDED+RESISTOR | Search EMBEDDED+RESISTOR |
2 | RESISTIVE FILMS | 458093 | 2% | 89% | 8 | Search RESISTIVE+FILMS | Search RESISTIVE+FILMS |
3 | THIN FILM RESISTOR | 343542 | 4% | 27% | 20 | Search THIN+FILM+RESISTOR | Search THIN+FILM+RESISTOR |
4 | NI CR THIN FILM | 257678 | 1% | 100% | 4 | Search NI+CR+THIN+FILM | Search NI+CR+THIN+FILM |
5 | RESI175 | 206141 | 1% | 80% | 4 | Search RESI175 | Search RESI175 |
6 | RELATIVE RESISTANCE CHANGE | 193259 | 1% | 100% | 3 | Search RELATIVE+RESISTANCE+CHANGE | Search RELATIVE+RESISTANCE+CHANGE |
7 | LASER TRIMMING | 166126 | 1% | 37% | 7 | Search LASER+TRIMMING | Search LASER+TRIMMING |
8 | TEMPERATURE COEFFICIENT OF RESISTANCE TCR | 164903 | 2% | 32% | 8 | Search TEMPERATURE+COEFFICIENT+OF+RESISTANCE+TCR | Search TEMPERATURE+COEFFICIENT+OF+RESISTANCE+TCR |
9 | INTEGRAL PASSIVES | 147241 | 1% | 57% | 4 | Search INTEGRAL+PASSIVES | Search INTEGRAL+PASSIVES |
10 | EMBEDDED THIN FILM RESISTOR | 128839 | 0% | 100% | 2 | Search EMBEDDED+THIN+FILM+RESISTOR | Search EMBEDDED+THIN+FILM+RESISTOR |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | CHUANG, NC , LIN, JT , CHEN, HR , (2015) ANNEALING EFFECT ON THE ELECTRICAL PROPERTIES AND COMPOSITION OF A NICRAL THIN FILM RESISTOR.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 54. ISSUE 12. P. - | 24 | 100% | 0 |
2 | LAI, LF , ZENG, WJ , FU, XZ , SUN, R , DU, RX , (2012) ANNEALING EFFECT ON THE ELECTRICAL PROPERTIES AND MICROSTRUCTURE OF EMBEDDED NI-CR THIN FILM RESISTOR.JOURNAL OF ALLOYS AND COMPOUNDS. VOL. 538. ISSUE . P. 125 -130 | 15 | 71% | 7 |
3 | VINZELBERG, H , SCHUMANN, J , (2016) CRSI(O,N)-BASED CERMET-LIKE MATERIAL FOR HIGH-OHMIC THIN FILM RESISTOR APPLICATIONS.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 213. ISSUE 4. P. 1016 -1024 | 10 | 100% | 0 |
4 | DOW, HS , OH, MW , SONG, SH , KIM, MC , WEE, DM , (2007) FORMATION OF RESI1.75 THIN FILMS ON SI SUBSTRATES BY USING TA GETTER.JOURNAL OF THE KOREAN INSTITUTE OF METALS AND MATERIALS. VOL. 45. ISSUE 6. P. 383 -388 | 14 | 88% | 1 |
5 | CHUANG, NC , LIN, JT , CHEN, HR , (2015) TCR CONTROL OF NI-CR RESISTIVE FILM DEPOSITED BY DC MAGNETRON SPUTTERING.VACUUM. VOL. 119. ISSUE . P. 200 -203 | 11 | 92% | 0 |
6 | BRUCKNER, W , PITSCHKE, W , THOMAS, J , LEITNER, G , (2000) STRESS, RESISTANCE, AND PHASE TRANSITIONS IN NICR(60 WT%) THIN FILMS.JOURNAL OF APPLIED PHYSICS. VOL. 87. ISSUE 5. P. 2219-2226 | 17 | 85% | 14 |
7 | LAI, LF , WANG, JX , WANG, HT , BAO, MD , (2017) STRUCTURES AND PROPERTIES OF C-DOPED NICR THIN FILM DEPOSITED BY CLOSED-FIELD UNBALANCED MAGNETRON SPUTTERING.JOURNAL OF ELECTRONIC MATERIALS. VOL. 46. ISSUE 1. P. 552 -562 | 15 | 63% | 0 |
8 | CHENG, HY , CHEN, YC , LI, PJ , YANG, CF , HUANG, HH , (2015) EFFECT OF ANNEALING PROCESS ON THE PROPERTIES OF NI(55%) CR(40%) SI(5%) THIN-FILM RESISTORS.MATERIALS. VOL. 8. ISSUE 10. P. 6752 -6760 | 12 | 80% | 0 |
9 | GU, JJ , OH, MW , INUI, H , ZHANG, D , (2005) ANISOTROPY OF MOBILITY RATIO BETWEEN ELECTRON AND HOLE ALONG DIFFERENT ORIENTATIONS IN REGEXSI1.75-X THERMOELECTRIC SINGLE CRYSTALS.PHYSICAL REVIEW B. VOL. 71. ISSUE 11. P. - | 12 | 100% | 13 |
10 | LEE, BJ , LEE, S , SHIN, PK , (2009) PRECISION THIN FILM RESISTORS BASED ON NI-CR QUINTERNARY ALLOY THIN FILMS PREPARED BY MAGNETRON SPUTTERING TECHNIQUE.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 48. ISSUE 5. P. - | 10 | 91% | 7 |
Classes with closest relation at Level 1 |