Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
3223 | 2029 | 19.4 | 45% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | EMBEDDED RESISTOR | authKW | 121088 | 1% | 62% | 13 |
2 | RESISTIVE FILMS | authKW | 107004 | 0% | 89% | 8 |
3 | THIN FILM RESISTOR | authKW | 88450 | 1% | 28% | 21 |
4 | THIN FILM THERMOCOUPLES | authKW | 86729 | 1% | 41% | 14 |
5 | ERBIUM FILM | authKW | 75238 | 0% | 100% | 5 |
6 | NI CR THIN FILM | authKW | 60191 | 0% | 100% | 4 |
7 | LONGITUDINAL MICROSTRUCTURE | authKW | 48151 | 0% | 80% | 4 |
8 | RESI175 | authKW | 48151 | 0% | 80% | 4 |
9 | SENSORS SUR E TECHNOL PARTNERSHIP | address | 48151 | 0% | 80% | 4 |
10 | RELATIVE RESISTANCE CHANGE | authKW | 45143 | 0% | 100% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 12229 | 18% | 0% | 364 |
2 | Physics, Applied | 9799 | 45% | 0% | 914 |
3 | Physics, Condensed Matter | 7730 | 33% | 0% | 673 |
4 | Materials Science, Multidisciplinary | 5706 | 38% | 0% | 774 |
5 | Engineering, Electrical & Electronic | 711 | 13% | 0% | 270 |
6 | Instruments & Instrumentation | 685 | 7% | 0% | 133 |
7 | Nanoscience & Nanotechnology | 496 | 6% | 0% | 126 |
8 | Metallurgy & Metallurgical Engineering | 489 | 6% | 0% | 124 |
9 | Physics, Multidisciplinary | 219 | 7% | 0% | 132 |
10 | Engineering, Manufacturing | 105 | 2% | 0% | 31 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SENSORS SUR E TECHNOL PARTNERSHIP | 48151 | 0% | 80% | 4 |
2 | SMART MAT MEMS | 40955 | 0% | 39% | 7 |
3 | HITACHI KYOWA ENGN LTD | 30095 | 0% | 100% | 2 |
4 | SENSORS TECHNOL BRANCH | 30095 | 0% | 100% | 2 |
5 | MINIST HIGH TEMP MAT TESTS | 30091 | 0% | 50% | 4 |
6 | CIENCIAS CONSTRUCC | 26747 | 0% | 44% | 4 |
7 | ADV TRANSDUCERS | 15048 | 0% | 100% | 1 |
8 | AMSOTROPY TEXTURE MAT | 15048 | 0% | 100% | 1 |
9 | BEREICH SONDERFOR 126 | 15048 | 0% | 100% | 1 |
10 | CEFEX | 15048 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PHILIPS TECHNICAL REVIEW | 27065 | 1% | 15% | 12 |
2 | THIN SOLID FILMS | 25402 | 12% | 1% | 248 |
3 | ELECTROCOMPONENT SCIENCE AND TECHNOLOGY | 22460 | 1% | 14% | 11 |
4 | VAKUUM-TECHNIK | 11381 | 0% | 8% | 10 |
5 | JOURNAL OF MATERIALS SCIENCE LETTERS | 5872 | 3% | 1% | 66 |
6 | METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 3729 | 1% | 1% | 25 |
7 | SENSORS AND ACTUATORS A-PHYSICAL | 2604 | 2% | 0% | 42 |
8 | VACUUM | 2470 | 2% | 0% | 40 |
9 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2255 | 3% | 0% | 56 |
10 | JOURNAL OF MATERIALS SCIENCE | 1456 | 3% | 0% | 55 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | EMBEDDED RESISTOR | 121088 | 1% | 62% | 13 | Search EMBEDDED+RESISTOR | Search EMBEDDED+RESISTOR |
2 | RESISTIVE FILMS | 107004 | 0% | 89% | 8 | Search RESISTIVE+FILMS | Search RESISTIVE+FILMS |
3 | THIN FILM RESISTOR | 88450 | 1% | 28% | 21 | Search THIN+FILM+RESISTOR | Search THIN+FILM+RESISTOR |
4 | THIN FILM THERMOCOUPLES | 86729 | 1% | 41% | 14 | Search THIN+FILM+THERMOCOUPLES | Search THIN+FILM+THERMOCOUPLES |
5 | ERBIUM FILM | 75238 | 0% | 100% | 5 | Search ERBIUM+FILM | Search ERBIUM+FILM |
6 | NI CR THIN FILM | 60191 | 0% | 100% | 4 | Search NI+CR+THIN+FILM | Search NI+CR+THIN+FILM |
7 | LONGITUDINAL MICROSTRUCTURE | 48151 | 0% | 80% | 4 | Search LONGITUDINAL+MICROSTRUCTURE | Search LONGITUDINAL+MICROSTRUCTURE |
8 | RESI175 | 48151 | 0% | 80% | 4 | Search RESI175 | Search RESI175 |
9 | RELATIVE RESISTANCE CHANGE | 45143 | 0% | 100% | 3 | Search RELATIVE+RESISTANCE+CHANGE | Search RELATIVE+RESISTANCE+CHANGE |
10 | VERY NARROW COPPER WIRE | 45143 | 0% | 100% | 3 | Search VERY+NARROW+COPPER+WIRE | Search VERY+NARROW+COPPER+WIRE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | ROBLES, ME , GONZALEZ-FUENTES, CA , HENRIQUEZ, R , KREMER, G , MORAGA, L , OYARZUN, S , SUAREZ, MA , FLORES, M , MUNOZ, RC , (2012) RESISTIVITY OF THIN GOLD FILMS ON MICA INDUCED BY ELECTRON-SURFACE SCATTERING: APPLICATION OF QUANTITATIVE SCANNING TUNNELING MICROSCOPY.APPLIED SURFACE SCIENCE. VOL. 258. ISSUE 8. P. 3393 -3404 | 38 | 95% | 5 |
2 | HENRIQUEZ, R , FLORES, M , MORAGA, L , KREMER, G , GONZALEZ-FUENTES, C , MUNOZ, RC , (2013) ELECTRON SCATTERING AT SURFACES AND GRAIN BOUNDARIES IN THIN AU FILMS.APPLIED SURFACE SCIENCE. VOL. 273. ISSUE . P. 315 -323 | 27 | 96% | 6 |
3 | CHUANG, NC , LIN, JT , CHEN, HR , (2015) ANNEALING EFFECT ON THE ELECTRICAL PROPERTIES AND COMPOSITION OF A NICRAL THIN FILM RESISTOR.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 54. ISSUE 12. P. - | 24 | 100% | 0 |
4 | GALL, D , (2016) ELECTRON MEAN FREE PATH IN ELEMENTAL METALS.JOURNAL OF APPLIED PHYSICS. VOL. 119. ISSUE 8. P. - | 22 | 76% | 5 |
5 | MUNOZ, RC , GONZALEZ-FUENTES, CA , HENRIQUEZ, R , ESPINOSA, A , KREMER, G , MORAGA, L , IBANEZ-LANDETA, A , BAHAMONDES, S , DONOSO, S , FLORES, M , (2011) RESISTIVITY OF THIN GOLD FILMS ON MICA INDUCED BY ELECTRON-SURFACE SCATTERING FROM A SELF-AFFINE FRACTAL SURFACE.JOURNAL OF APPLIED PHYSICS. VOL. 110. ISSUE 2. P. - | 27 | 84% | 3 |
6 | CHAWLA, JS , GSTREIN, F , O'BRIEN, KP , CLARKE, JS , GALL, D , (2011) ELECTRON SCATTERING AT SURFACES AND GRAIN BOUNDARIES IN CU THIN FILMS AND WIRES.PHYSICAL REVIEW B. VOL. 84. ISSUE 23. P. - | 26 | 79% | 26 |
7 | CHATTERJEE, S , MEYEROVICH, AE , (2010) INTERFERENCE BETWEEN BULK AND BOUNDARY SCATTERING IN HIGH QUALITY FILMS.PHYSICAL REVIEW B. VOL. 81. ISSUE 24. P. - | 23 | 88% | 8 |
8 | KETENOGLU, D , UNAL, B , (2013) INFLUENCE OF SURFACE ROUGHNESS ON THE ELECTRICAL CONDUCTIVITY OF SEMICONDUCTING THIN FILMS.PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS. VOL. 392. ISSUE 14. P. 3008 -3017 | 28 | 68% | 2 |
9 | ZHENG, PY , DENG, RP , GALL, D , (2014) NI DOPING ON CU SURFACES: REDUCED COPPER RESISTIVITY.APPLIED PHYSICS LETTERS. VOL. 105. ISSUE 13. P. - | 25 | 69% | 6 |
10 | ZHU, YF , LANG, XY , ZHENG, WT , JIANG, Q , (2010) ELECTRON SCATTERING AND ELECTRICAL CONDUCTANCE IN POLYCRYSTALLINE METALLIC FILMS AND WIRES: IMPACT OF GRAIN BOUNDARY SCATTERING RELATED TO MELTING POINT.ACS NANO. VOL. 4. ISSUE 7. P. 3781-3788 | 33 | 57% | 15 |
Classes with closest relation at Level 2 |