Class information for:
Level 1: LONGITUDINAL MICROSTRUCTURE//VERY NARROW COPPER WIRE//ELECTRON SURFACE SCATTERING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
12522 899 21.9 45%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
557 3       FIZIKA NIZKIKH TEMPERATUR//PHYSICS, CONDENSED MATTER//JOURNAL OF PHYSICS F-METAL PHYSICS 17672
3223 2             EMBEDDED RESISTOR//RESISTIVE FILMS//THIN FILM RESISTOR 2029
12522 1                   LONGITUDINAL MICROSTRUCTURE//VERY NARROW COPPER WIRE//ELECTRON SURFACE SCATTERING 899

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 LONGITUDINAL MICROSTRUCTURE authKW 108685 0% 80% 4
2 VERY NARROW COPPER WIRE authKW 101893 0% 100% 3
3 ELECTRON SURFACE SCATTERING authKW 77630 0% 57% 4
4 8 INCH WAFER authKW 67929 0% 100% 2
5 ADDITIVE FREE PLATING authKW 67929 0% 100% 2
6 CALLENDAR VAN DUSEN authKW 67929 0% 100% 2
7 ELECTRICAL RESISTIVITY OF METALLIC THIN FILMS authKW 67929 0% 100% 2
8 HITACHI KYOWA ENGN LTD address 67929 0% 100% 2
9 ROUGHNESS ACCESSIBILITY authKW 67929 0% 100% 2
10 ULTRA HIGH PURITY PLATING MATERIAL authKW 67929 0% 100% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Condensed Matter 5377 41% 0% 368
2 Physics, Applied 4389 45% 0% 407
3 Materials Science, Coatings & Films 3640 15% 0% 133
4 Materials Science, Multidisciplinary 2977 41% 0% 369
5 Nanoscience & Nanotechnology 304 7% 0% 64
6 Physics, Multidisciplinary 263 9% 0% 85
7 Metallurgy & Metallurgical Engineering 172 6% 0% 50
8 Engineering, Electrical & Electronic 103 9% 0% 80
9 Crystallography 12 2% 0% 15
10 Optics 11 3% 0% 27

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 HITACHI KYOWA ENGN LTD 67929 0% 100% 2
2 CIENCIAS CONSTRUCC 60377 0% 44% 4
3 AMSOTROPY TEXTURE MAT 33964 0% 100% 1
4 BEREICH SONDERFOR 126 33964 0% 100% 1
5 CEFEX 33964 0% 100% 1
6 CHRONOMETRIE PIEZOELECT 33964 0% 100% 1
7 CIENCIAS ELE ON 33964 0% 100% 1
8 COL MIGUEL HUEYOTLIPAN 33964 0% 100% 1
9 ENGN IL 3055 33964 0% 100% 1
10 FCCYOT 33964 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ELECTROCOMPONENT SCIENCE AND TECHNOLOGY 26822 1% 10% 8
2 THIN SOLID FILMS 10667 12% 0% 107
3 JOURNAL OF MATERIALS SCIENCE LETTERS 9299 6% 1% 55
4 METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 4889 2% 1% 19
5 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 2644 4% 0% 40
6 JOURNAL OF MATERIALS SCIENCE 2593 5% 0% 48
7 MICROELECTRONIC ENGINEERING 1735 3% 0% 23
8 INDIAN JOURNAL OF PURE & APPLIED PHYSICS 1341 2% 0% 14
9 JOURNAL OF PHYSICS F-METAL PHYSICS 1066 1% 0% 8
10 JOURNAL OF APPLIED PHYSICS 924 6% 0% 56

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 LONGITUDINAL MICROSTRUCTURE 108685 0% 80% 4 Search LONGITUDINAL+MICROSTRUCTURE Search LONGITUDINAL+MICROSTRUCTURE
2 VERY NARROW COPPER WIRE 101893 0% 100% 3 Search VERY+NARROW+COPPER+WIRE Search VERY+NARROW+COPPER+WIRE
3 ELECTRON SURFACE SCATTERING 77630 0% 57% 4 Search ELECTRON+SURFACE+SCATTERING Search ELECTRON+SURFACE+SCATTERING
4 8 INCH WAFER 67929 0% 100% 2 Search 8+INCH+WAFER Search 8+INCH+WAFER
5 ADDITIVE FREE PLATING 67929 0% 100% 2 Search ADDITIVE+FREE+PLATING Search ADDITIVE+FREE+PLATING
6 CALLENDAR VAN DUSEN 67929 0% 100% 2 Search CALLENDAR+VAN+DUSEN Search CALLENDAR+VAN+DUSEN
7 ELECTRICAL RESISTIVITY OF METALLIC THIN FILMS 67929 0% 100% 2 Search ELECTRICAL+RESISTIVITY+OF+METALLIC+THIN+FILMS Search ELECTRICAL+RESISTIVITY+OF+METALLIC+THIN+FILMS
8 ROUGHNESS ACCESSIBILITY 67929 0% 100% 2 Search ROUGHNESS+ACCESSIBILITY Search ROUGHNESS+ACCESSIBILITY
9 ULTRA HIGH PURITY PLATING MATERIAL 67929 0% 100% 2 Search ULTRA+HIGH+PURITY+PLATING+MATERIAL Search ULTRA+HIGH+PURITY+PLATING+MATERIAL
10 ULTRALARGE SCALE INTEGRATION CIRCUITS 67929 0% 100% 2 Search ULTRALARGE+SCALE+INTEGRATION+CIRCUITS Search ULTRALARGE+SCALE+INTEGRATION+CIRCUITS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 ROBLES, ME , GONZALEZ-FUENTES, CA , HENRIQUEZ, R , KREMER, G , MORAGA, L , OYARZUN, S , SUAREZ, MA , FLORES, M , MUNOZ, RC , (2012) RESISTIVITY OF THIN GOLD FILMS ON MICA INDUCED BY ELECTRON-SURFACE SCATTERING: APPLICATION OF QUANTITATIVE SCANNING TUNNELING MICROSCOPY.APPLIED SURFACE SCIENCE. VOL. 258. ISSUE 8. P. 3393 -3404 38 95% 5
2 HENRIQUEZ, R , FLORES, M , MORAGA, L , KREMER, G , GONZALEZ-FUENTES, C , MUNOZ, RC , (2013) ELECTRON SCATTERING AT SURFACES AND GRAIN BOUNDARIES IN THIN AU FILMS.APPLIED SURFACE SCIENCE. VOL. 273. ISSUE . P. 315 -323 27 96% 6
3 GALL, D , (2016) ELECTRON MEAN FREE PATH IN ELEMENTAL METALS.JOURNAL OF APPLIED PHYSICS. VOL. 119. ISSUE 8. P. - 22 76% 5
4 MUNOZ, RC , GONZALEZ-FUENTES, CA , HENRIQUEZ, R , ESPINOSA, A , KREMER, G , MORAGA, L , IBANEZ-LANDETA, A , BAHAMONDES, S , DONOSO, S , FLORES, M , (2011) RESISTIVITY OF THIN GOLD FILMS ON MICA INDUCED BY ELECTRON-SURFACE SCATTERING FROM A SELF-AFFINE FRACTAL SURFACE.JOURNAL OF APPLIED PHYSICS. VOL. 110. ISSUE 2. P. - 27 84% 3
5 CHAWLA, JS , GSTREIN, F , O'BRIEN, KP , CLARKE, JS , GALL, D , (2011) ELECTRON SCATTERING AT SURFACES AND GRAIN BOUNDARIES IN CU THIN FILMS AND WIRES.PHYSICAL REVIEW B. VOL. 84. ISSUE 23. P. - 26 79% 26
6 CHATTERJEE, S , MEYEROVICH, AE , (2010) INTERFERENCE BETWEEN BULK AND BOUNDARY SCATTERING IN HIGH QUALITY FILMS.PHYSICAL REVIEW B. VOL. 81. ISSUE 24. P. - 23 88% 8
7 KETENOGLU, D , UNAL, B , (2013) INFLUENCE OF SURFACE ROUGHNESS ON THE ELECTRICAL CONDUCTIVITY OF SEMICONDUCTING THIN FILMS.PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS. VOL. 392. ISSUE 14. P. 3008 -3017 28 68% 2
8 ZHENG, PY , DENG, RP , GALL, D , (2014) NI DOPING ON CU SURFACES: REDUCED COPPER RESISTIVITY.APPLIED PHYSICS LETTERS. VOL. 105. ISSUE 13. P. - 25 69% 6
9 ZHU, YF , LANG, XY , ZHENG, WT , JIANG, Q , (2010) ELECTRON SCATTERING AND ELECTRICAL CONDUCTANCE IN POLYCRYSTALLINE METALLIC FILMS AND WIRES: IMPACT OF GRAIN BOUNDARY SCATTERING RELATED TO MELTING POINT.ACS NANO. VOL. 4. ISSUE 7. P. 3781-3788 33 57% 15
10 CHATTERJEE, S , MEYEROVICH, AE , (2011) QUANTUM SIZE EFFECT AND THE TWO TYPES OF INTERFERENCE BETWEEN BULK AND BOUNDARY SCATTERING IN ULTRATHIN FILMS.PHYSICAL REVIEW B. VOL. 84. ISSUE 16. P. - 27 69% 1

Classes with closest relation at Level 1


Rank Class id link
1 30368 DIELECTRIC CONSTANTS FROM DC TO MICROWAVE FREQUENCIES//ANCHORING LIQUID CRYSTAL//AU SI111 SYSTEM
2 25200 THIN FILM THERMOCOUPLES//SENSORS SUR E TECHNOL PARTNERSHIP//SMART MAT MEMS
3 14387 JOURNAL OF PHYSICS F-METAL PHYSICS//ULTRAHIGH PURITY ALUMINUM//ULTRA HIGH VACUUM MELTING
4 30502 AU NI50FE50//ATOMICALLY FLAT GOLD//ATOMICALLY SMOOTH GOLD
5 26984 AGGLOMERATION SUPPRESSION//NSF LOW POWER ELECT//SILVER METALLIZATION
6 21367 DIRECT FORCE//ATOMIC MIGRATIONS//METALS AND DILUTE ALLOYS
7 14655 NB AL2O3 MULTILAYERS//OPT SCI PHYS//SUPERCONDUCTING MULTILAYERS
8 9149 QUANTUM WELL STATES//QUANTUM SIZE EFFECTS//ELECTRONIC GROWTH
9 29508 EFFECTIVE DEMAGNETIZING FACTORS//KITTEL FORMULA//ARBEITSGEBIET MIKROSTRUKTURTECH AG MST
10 20135 EMBEDDED RESISTOR//RESISTIVE FILMS//THIN FILM RESISTOR

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