Class information for:
Level 1: SINGLE ATOM TIP//SUR E MODIFICAT//FACETING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
14691 755 22.9 63%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
2614 2             ATOM PROBE TOMOGRAPHY//ATOM PROBE//FIELD EVAPORATION 3568
14691 1                   SINGLE ATOM TIP//SUR E MODIFICAT//FACETING 755

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SINGLE ATOM TIP authKW 415980 2% 86% 12
2 SUR E MODIFICAT address 260916 6% 15% 44
3 FACETING authKW 247640 6% 15% 42
4 GAS FIELD ION SOURCE authKW 144436 1% 71% 5
5 NANOTIPS authKW 139971 2% 23% 15
6 EMISS ELECT address 136219 1% 42% 8
7 FIELD ION MICROSCOPY authKW 122213 3% 13% 23
8 FRESNEL PROJECTION MICROSCOPE authKW 121328 0% 100% 3
9 ULTRASHARP FIELD EMITTERS authKW 121328 0% 100% 3
10 FIELD EMISSION SPECTROSCOPY authKW 121322 1% 50% 6

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 6253 10% 0% 75
2 Physics, Applied 3259 43% 0% 323
3 Physics, Condensed Matter 1482 25% 0% 185
4 Instruments & Instrumentation 997 12% 0% 91
5 Nanoscience & Nanotechnology 745 11% 0% 86
6 Chemistry, Physical 657 22% 0% 165
7 Materials Science, Coatings & Films 635 7% 0% 53
8 Physics, Multidisciplinary 293 11% 0% 80
9 Engineering, Electrical & Electronic 64 8% 0% 61
10 Materials Science, Multidisciplinary 59 10% 0% 74

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SUR E MODIFICAT 260916 6% 15% 44
2 EMISS ELECT 136219 1% 42% 8
3 ULTIMATE TECHNOL NANOELECT CUTE 80886 0% 100% 2
4 GRP MAT NANOESTRUCT 53922 0% 67% 2
5 ADV TECHNOL DEVELOPEMENT 40443 0% 100% 1
6 CHEM ENGN TISSUE REGENERAT ENGN 40443 0% 100% 1
7 CIENCIAS C3 40443 0% 100% 1
8 CINAM UNITE PROPRE RECH 3118 40443 0% 100% 1
9 CNRS URA 5586 40443 0% 100% 1
10 DPM UMR 40443 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ULTRAMICROSCOPY 19552 7% 1% 52
2 SURFACE SCIENCE 6671 9% 0% 67
3 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 6518 7% 0% 52
4 REVIEW OF SCIENTIFIC INSTRUMENTS 5961 9% 0% 67
5 APPLIED SURFACE SCIENCE 1062 4% 0% 31
6 PROGRESS IN SURFACE SCIENCE 907 1% 1% 4
7 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 897 2% 0% 18
8 MICRON 777 1% 0% 7
9 PHYSICS OF LOW-DIMENSIONAL STRUCTURES 761 1% 0% 4
10 SURFACE REVIEW AND LETTERS 743 1% 0% 7

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SINGLE ATOM TIP 415980 2% 86% 12 Search SINGLE+ATOM+TIP Search SINGLE+ATOM+TIP
2 FACETING 247640 6% 15% 42 Search FACETING Search FACETING
3 GAS FIELD ION SOURCE 144436 1% 71% 5 Search GAS+FIELD+ION+SOURCE Search GAS+FIELD+ION+SOURCE
4 NANOTIPS 139971 2% 23% 15 Search NANOTIPS Search NANOTIPS
5 FIELD ION MICROSCOPY 122213 3% 13% 23 Search FIELD+ION+MICROSCOPY Search FIELD+ION+MICROSCOPY
6 FRESNEL PROJECTION MICROSCOPE 121328 0% 100% 3 Search FRESNEL+PROJECTION+MICROSCOPE Search FRESNEL+PROJECTION+MICROSCOPE
7 ULTRASHARP FIELD EMITTERS 121328 0% 100% 3 Search ULTRASHARP+FIELD+EMITTERS Search ULTRASHARP+FIELD+EMITTERS
8 FIELD EMISSION SPECTROSCOPY 121322 1% 50% 6 Search FIELD+EMISSION+SPECTROSCOPY Search FIELD+EMISSION+SPECTROSCOPY
9 FIELD ION MICROSCOPY FIM 101102 1% 50% 5 Search FIELD+ION+MICROSCOPY+FIM Search FIELD+ION+MICROSCOPY+FIM
10 TUNGSTEN TIPS 90995 0% 75% 3 Search TUNGSTEN+TIPS Search TUNGSTEN+TIPS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 BEYER, A , GOLZHAUSER, A , (2010) LOW ENERGY ELECTRON POINT SOURCE MICROSCOPY: BEYOND IMAGING.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 22. ISSUE 34. P. - 41 72% 14
2 BRYL, R , LECHOWSKI, B , (2013) CHANGES OF MORPHOLOGY OF TUNGSTEN MICROSIZED MONOCRYSTAL INDUCED BY PT SUBMONOLAYER.VACUUM. VOL. 91. ISSUE . P. 41-46 26 90% 0
3 ALI, A , BARADA, H , REZEQ, M , (2016) CHARACTERIZATION AND MODELING OF NANOTIPS FABRICATED IN THE FIELD ION MICROSCOPE.NANOTECHNOLOGY REVIEWS. VOL. 5. ISSUE 3. P. 301 -309 22 96% 0
4 HASSELBACH, F , (2010) PROGRESS IN ELECTRON- AND ION-INTERFEROMETRY.REPORTS ON PROGRESS IN PHYSICS. VOL. 73. ISSUE 1. P. - 57 37% 40
5 SZCZEPKOWICZ, A , CISZEWSKI, A , BRYL, R , OLEKSY, C , NIEN, CH , WU, QF , MADEY, TE , (2005) A COMPARISON OF ADSORBATE-INDUCED FACETING ON FLAT AND CURVED CRYSTAL SURFACES.SURFACE SCIENCE. VOL. 599. ISSUE 1-3. P. 55-68 28 88% 20
6 MUTUS, JY , LIVADARU, L , URBAN, R , PITTERS, J , LEGG, AP , SALOMONS, MH , CLOUTIER, M , WOLKOW, RA , (2013) NANOSCALE STRUCTURING OF TUNGSTEN TIP YIELDS MOST COHERENT ELECTRON POINT-SOURCE.NEW JOURNAL OF PHYSICS. VOL. 15. ISSUE . P. - 22 81% 5
7 LIN, RJ , CHEN, YJ , CHEN, HC , FU, TY , (2014) FABRICATION OF MO PYRAMIDAL-SHAPE SINGLE ATOM TIPS COVERED BY A NOBLE METAL.APPLIED SURFACE SCIENCE. VOL. 309. ISSUE . P. 90 -94 22 81% 0
8 HWANG, IS , CHANG, CC , LU, CH , LIU, SC , CHANG, YC , LEE, TK , JENG, HT , KUO, HS , LIN, CY , CHANG, CS , ET AL (2013) INVESTIGATION OF SINGLE-WALLED CARBON NANOTUBES WITH A LOW-ENERGY ELECTRON POINT PROJECTION MICROSCOPE.NEW JOURNAL OF PHYSICS. VOL. 15. ISSUE . P. - 22 76% 5
9 VESA, C , URBAN, R , PITTERS, JL , WOLKOW, RA , (2014) ROBUSTNESS OF TUNGSTEN SINGLE ATOM TIPS TO THERMAL TREATMENT AND AIR EXPOSURE.APPLIED SURFACE SCIENCE. VOL. 300. ISSUE . P. 16 -21 20 80% 2
10 KUO, HS , HWANG, IS , FU, TY , LIN, YC , CHANG, CC , T TSONG, T , (2006) NOBLE METAL/W(111) SINGLE-ATOM TIPS AND THEIR FIELD ELECTRON AND ION EMISSION CHARACTERISTICS.JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS. VOL. 45. ISSUE 11. P. 8972-8983 27 69% 32

Classes with closest relation at Level 1


Rank Class id link
1 29431 FIELD EMISSION AND FIELD IONIZATION//HIGH TEMPERATURE SUPERCONDUCTING OXIDE//MO W
2 5661 LOCAL TUNNELING BARRIER HEIGHT//LOCAL TUNNELING BARRIER HEIGHT LBH//LOCAL WORK FUNCTION
3 13252 ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//LORENTZ MICROSCOPY
4 11338 ATOM MANIPULATION//SINGLE ATOM MANIPULATION//COMPUTING SIMULATIONS
5 6712 ATOM PROBE TOMOGRAPHY//ATOM PROBE//FIELD EVAPORATION
6 8222 LIQUID METAL ION SOURCE//ION BEAMS MAT//ALLOY LIQUID METAL ION SOURCES
7 12951 PHYS BIOL ULTRAFAST SCI TECHNOL//ULTRAFAST ELECTRON DIFFRACTION//ARTHUR AMOS NOYES CHEM PHYS
8 13851 TIP ENHANCED RAMAN SPECTROSCOPY//TERS//TIP ENHANCED RAMAN SPECTROSCOPY TERS
9 16154 PROD DESIGN TECHNOL//CORE LENS//THIN LENS APPROXIMATION
10 8446 SURFACE SCIENCE//BIMETALLIC SURFACES//METAL METAL INTERFACES

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