Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
6712 | 1453 | 24.8 | 55% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
314 | 3 | ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 39933 |
2614 | 2 | ATOM PROBE TOMOGRAPHY//ATOM PROBE//FIELD EVAPORATION | 3568 |
6712 | 1 | ATOM PROBE TOMOGRAPHY//ATOM PROBE//FIELD EVAPORATION | 1453 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ATOM PROBE TOMOGRAPHY | authKW | 1147774 | 13% | 28% | 195 |
2 | ATOM PROBE | authKW | 858477 | 8% | 36% | 112 |
3 | FIELD EVAPORATION | authKW | 678736 | 4% | 52% | 62 |
4 | UMR 6634 | address | 344918 | 6% | 19% | 85 |
5 | GRP PHYS MAT | address | 239824 | 5% | 16% | 72 |
6 | AUSTRALIAN MICROSCOPY MICROANAL | address | 214813 | 4% | 17% | 60 |
7 | ULTRAMICROSCOPY | journal | 169334 | 15% | 4% | 212 |
8 | SCANNING ATOM PROBE | authKW | 168110 | 1% | 100% | 8 |
9 | FIELD ION MICROSCOPY | authKW | 164329 | 3% | 21% | 37 |
10 | LOCAL ELECTRODE ATOM PROBE | authKW | 147096 | 0% | 100% | 7 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 54051 | 21% | 1% | 304 |
2 | Physics, Condensed Matter | 2624 | 24% | 0% | 343 |
3 | Physics, Applied | 2548 | 29% | 0% | 415 |
4 | Physics, Multidisciplinary | 1645 | 17% | 0% | 243 |
5 | Materials Science, Coatings & Films | 1611 | 8% | 0% | 116 |
6 | Chemistry, Physical | 1211 | 21% | 0% | 312 |
7 | Metallurgy & Metallurgical Engineering | 1041 | 10% | 0% | 142 |
8 | Materials Science, Multidisciplinary | 855 | 20% | 0% | 286 |
9 | Nanoscience & Nanotechnology | 334 | 6% | 0% | 88 |
10 | Instruments & Instrumentation | 82 | 3% | 0% | 47 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | UMR 6634 | 344918 | 6% | 19% | 85 |
2 | GRP PHYS MAT | 239824 | 5% | 16% | 72 |
3 | AUSTRALIAN MICROSCOPY MICROANAL | 214813 | 4% | 17% | 60 |
4 | GPM | 144561 | 2% | 20% | 35 |
5 | UMR CNRS 6634 | 106338 | 2% | 19% | 27 |
6 | UFR SCI SITE MADRILLET | 84055 | 0% | 100% | 4 |
7 | ATOM PROBE TOMOG | 77184 | 1% | 28% | 13 |
8 | GRP PHYS MAT UMR CNRS 6634 | 67242 | 0% | 80% | 4 |
9 | OARAI | 61145 | 1% | 15% | 19 |
10 | GRP MET PHYS | 50049 | 1% | 26% | 9 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 169334 | 15% | 4% | 212 |
2 | JOURNAL DE PHYSIQUE | 67800 | 12% | 2% | 175 |
3 | MICROSCOPY AND MICROANALYSIS | 21942 | 3% | 2% | 43 |
4 | SURFACE SCIENCE | 12650 | 9% | 0% | 128 |
5 | APPLIED SURFACE SCIENCE | 4850 | 6% | 0% | 91 |
6 | MRS BULLETIN | 2477 | 1% | 1% | 16 |
7 | SURFACE AND INTERFACE ANALYSIS | 2250 | 2% | 0% | 27 |
8 | JOURNAL OF MICROSCOPY-OXFORD | 978 | 1% | 0% | 11 |
9 | CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 845 | 0% | 1% | 6 |
10 | REVIEW OF SCIENTIFIC INSTRUMENTS | 749 | 2% | 0% | 34 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ATOM PROBE TOMOGRAPHY | 1147774 | 13% | 28% | 195 | Search ATOM+PROBE+TOMOGRAPHY | Search ATOM+PROBE+TOMOGRAPHY |
2 | ATOM PROBE | 858477 | 8% | 36% | 112 | Search ATOM+PROBE | Search ATOM+PROBE |
3 | FIELD EVAPORATION | 678736 | 4% | 52% | 62 | Search FIELD+EVAPORATION | Search FIELD+EVAPORATION |
4 | SCANNING ATOM PROBE | 168110 | 1% | 100% | 8 | Search SCANNING+ATOM+PROBE | Search SCANNING+ATOM+PROBE |
5 | FIELD ION MICROSCOPY | 164329 | 3% | 21% | 37 | Search FIELD+ION+MICROSCOPY | Search FIELD+ION+MICROSCOPY |
6 | LOCAL ELECTRODE ATOM PROBE | 147096 | 0% | 100% | 7 | Search LOCAL+ELECTRODE+ATOM+PROBE | Search LOCAL+ELECTRODE+ATOM+PROBE |
7 | LASER ASSISTED FIELD EVAPORATION | 126082 | 0% | 100% | 6 | Search LASER+ASSISTED+FIELD+EVAPORATION | Search LASER+ASSISTED+FIELD+EVAPORATION |
8 | LASER ASSISTED ATOM PROBE TOMOGRAPHY | 105069 | 0% | 100% | 5 | Search LASER+ASSISTED+ATOM+PROBE+TOMOGRAPHY | Search LASER+ASSISTED+ATOM+PROBE+TOMOGRAPHY |
9 | 3D ATOM PROBE | 94160 | 1% | 41% | 11 | Search 3D+ATOM+PROBE | Search 3D+ATOM+PROBE |
10 | PREFERENTIAL EVAPORATION | 87555 | 0% | 83% | 5 | Search PREFERENTIAL+EVAPORATION | Search PREFERENTIAL+EVAPORATION |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | VURPILLOT, F , GAULT, B , GEISER, BP , LARSON, DJ , (2013) RECONSTRUCTING ATOM PROBE DATA: A REVIEW.ULTRAMICROSCOPY. VOL. 132. ISSUE . P. 19 -30 | 74 | 95% | 29 |
2 | LARSON, DJ , GAULT, B , GEISER, BP , DE GEUSER, F , VURPILLOT, F , (2013) ATOM PROBE TOMOGRAPHY SPATIAL RECONSTRUCTION: STATUS AND DIRECTIONS.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 17. ISSUE 5. P. 236 -247 | 56 | 97% | 21 |
3 | KELLY, TF , LARSON, DJ , (2012) ATOM PROBE TOMOGRAPHY 2012.ANNUAL REVIEW OF MATERIALS RESEARCH, VOL 42. VOL. 42. ISSUE . P. 1-31 | 66 | 67% | 94 |
4 | CAIRNEY, JM , RAJAN, K , HALEY, D , GAULT, B , BAGOT, PJ , CHOI, PP , FELFER, PJ , RINGER, SP , MARCEAU, RKW , MOODY, MP , (2015) MINING INFORMATION FROM ATOM PROBE DATA.ULTRAMICROSCOPY. VOL. 159. ISSUE . P. 324 -337 | 69 | 70% | 4 |
5 | KHAN, MA , RINGER, SP , ZHENG, RK , (2016) ATOM PROBE TOMOGRAPHY ON SEMICONDUCTOR DEVICES.ADVANCED MATERIALS INTERFACES. VOL. 3. ISSUE 12. P. - | 79 | 61% | 0 |
6 | GAULT, B , SAXEY, DW , ASHTON, MW , SINNOTT, SB , CHIARAMONTI, AN , MOODY, MP , SCHREIBER, DK , (2016) BEHAVIOR OF MOLECULES AND MOLECULAR IONS NEAR A FIELD EMITTER.NEW JOURNAL OF PHYSICS. VOL. 18. ISSUE . P. - | 57 | 72% | 1 |
7 | CEGUERRA, AV , BREEN, AJ , STEPHENSON, LT , FELFER, PJ , ARAULLO-PETERS, VJ , LIDDICOAT, PV , CUI, XY , YAO, L , HALEY, D , MOODY, MP , ET AL (2013) THE RISE OF COMPUTATIONAL TECHNIQUES IN ATOM PROBE MICROSCOPY.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 17. ISSUE 5. P. 224-235 | 54 | 82% | 5 |
8 | KELLY, TF , MILLER, MK , (2007) INVITED REVIEW ARTICLE: ATOM PROBE TOMOGRAPHY.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 78. ISSUE 3. P. - | 51 | 62% | 340 |
9 | BLAVETTE, D , DUGUAY, S , (2014) ATOM PROBE TOMOGRAPHY IN NANOELECTRONICS.EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS. VOL. 68. ISSUE 1. P. - | 42 | 89% | 6 |
10 | GAULT, B , MOODY, MP , CAIRNEY, JM , RINGER, SP , (2012) ATOM PROBE CRYSTALLOGRAPHY.MATERIALS TODAY. VOL. 15. ISSUE 9. P. 378 -386 | 53 | 67% | 29 |
Classes with closest relation at Level 1 |