Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
16154 | 670 | 13.8 | 32% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
314 | 3 | ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 39933 |
3221 | 2 | SCANDATE CATHODE//DISPENSER CATHODE//IMPREGNATED CATHODES | 2032 |
16154 | 1 | PROD DESIGN TECHNOL//CORE LENS//THIN LENS APPROXIMATION | 670 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | PROD DESIGN TECHNOL | address | 186087 | 1% | 58% | 7 |
2 | CORE LENS | authKW | 182295 | 1% | 100% | 4 |
3 | THIN LENS APPROXIMATION | authKW | 182295 | 1% | 100% | 4 |
4 | ACCURACY OF COMPUTATION | authKW | 145835 | 1% | 80% | 4 |
5 | ELECTROSTATIC LENS | authKW | 142610 | 2% | 24% | 13 |
6 | ELECTRON GUN | authKW | 140335 | 4% | 13% | 24 |
7 | HAIRPIN FILAMENT | authKW | 136722 | 0% | 100% | 3 |
8 | POINT CATHODE | authKW | 136722 | 0% | 100% | 3 |
9 | MAGNETIC LENS | authKW | 111141 | 1% | 24% | 10 |
10 | EGUN | authKW | 102540 | 0% | 75% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 8671 | 12% | 0% | 83 |
2 | Instruments & Instrumentation | 4815 | 27% | 0% | 180 |
3 | COMPUTER APPLICATIONS & CYBERNETICS | 2089 | 2% | 0% | 11 |
4 | Nuclear Science & Technology | 2010 | 17% | 0% | 111 |
5 | Spectroscopy | 1913 | 15% | 0% | 101 |
6 | Physics, Applied | 1628 | 33% | 0% | 221 |
7 | Physics, Nuclear | 1330 | 14% | 0% | 93 |
8 | Optics | 1147 | 18% | 0% | 122 |
9 | Physics, Particles & Fields | 885 | 13% | 0% | 85 |
10 | Engineering, Electrical & Electronic | 532 | 19% | 0% | 124 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PROD DESIGN TECHNOL | 186087 | 1% | 58% | 7 |
2 | CNRS UMR 5821 | 45574 | 0% | 100% | 1 |
3 | ELE OM BEAM SOURCE | 45574 | 0% | 100% | 1 |
4 | ELE ON BEAM SOURCE | 45574 | 0% | 100% | 1 |
5 | ELECT BEAM SOURCE | 45574 | 0% | 100% | 1 |
6 | INFORMAT ELECT S | 45574 | 0% | 100% | 1 |
7 | PHILIPS ELECT OPT | 45574 | 0% | 100% | 1 |
8 | SCI CNRS 8579 | 45574 | 0% | 100% | 1 |
9 | SHIBUKAWA PLANT 1135 | 45574 | 0% | 100% | 1 |
10 | STRUCT SOLS MAT LMSS MAT | 45574 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | OPTIK | 53146 | 17% | 1% | 111 |
2 | ADVANCES IN IMAGING AND ELECTRON PHYSICS | 20351 | 2% | 3% | 13 |
3 | PROCEEDINGS OF THE SID | 19673 | 2% | 4% | 11 |
4 | JOURNAL OF ELECTRON MICROSCOPY | 19237 | 4% | 2% | 28 |
5 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 14243 | 2% | 3% | 12 |
6 | JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 10496 | 3% | 1% | 23 |
7 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 7344 | 12% | 0% | 82 |
8 | ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS | 5976 | 1% | 2% | 6 |
9 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 3909 | 6% | 0% | 38 |
10 | SOUTH AFRICAN JOURNAL OF PHYSICS - SUID-AFRIKAANSE TYDSKRIF VIR FISIKA | 3716 | 0% | 4% | 2 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CORE LENS | 182295 | 1% | 100% | 4 | Search CORE+LENS | Search CORE+LENS |
2 | THIN LENS APPROXIMATION | 182295 | 1% | 100% | 4 | Search THIN+LENS+APPROXIMATION | Search THIN+LENS+APPROXIMATION |
3 | ACCURACY OF COMPUTATION | 145835 | 1% | 80% | 4 | Search ACCURACY+OF+COMPUTATION | Search ACCURACY+OF+COMPUTATION |
4 | ELECTROSTATIC LENS | 142610 | 2% | 24% | 13 | Search ELECTROSTATIC+LENS | Search ELECTROSTATIC+LENS |
5 | ELECTRON GUN | 140335 | 4% | 13% | 24 | Search ELECTRON+GUN | Search ELECTRON+GUN |
6 | HAIRPIN FILAMENT | 136722 | 0% | 100% | 3 | Search HAIRPIN+FILAMENT | Search HAIRPIN+FILAMENT |
7 | POINT CATHODE | 136722 | 0% | 100% | 3 | Search POINT+CATHODE | Search POINT+CATHODE |
8 | MAGNETIC LENS | 111141 | 1% | 24% | 10 | Search MAGNETIC+LENS | Search MAGNETIC+LENS |
9 | EGUN | 102540 | 0% | 75% | 3 | Search EGUN | Search EGUN |
10 | BOUNDARY MAGNETIC CHARGE METHOD | 91148 | 0% | 100% | 2 | Search BOUNDARY+MAGNETIC+CHARGE+METHOD | Search BOUNDARY+MAGNETIC+CHARGE+METHOD |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | SISE, O , ULU, M , DOGAN, M , (2005) MULTI-ELEMENT CYLINDRICAL ELECTROSTATIC LENS SYSTEMS FOR FOCUSING AND CONTROLLING CHARGED PARTICLES.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 554. ISSUE 1-3. P. 114-131 | 16 | 89% | 24 |
2 | MURATA, H , ISHIGAMI, M , SHIMOYAMA, H , (2016) DEVELOPMENT OF A BOUNDARY MAGNETIC CHARGE METHOD FOR COMPUTING MAGNETIC FIELDS IN A SYSTEM CONTAINING SATURATED MAGNETIC MATERIALS.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 806. ISSUE . P. 360 -369 | 12 | 92% | 0 |
3 | (2001) THE BOUNDARY ELEMENT METHOD.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 116. VOL. 116. ISSUE . P. 263 -356 | 19 | 86% | 0 |
4 | SWANSON, LW , SCHWIND, GA , KELLOGG, SM , LIU, K , (2012) COMPUTER MODELING OF THE SCHOTTKY ELECTRON SOURCE.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 30. ISSUE 6. P. - | 12 | 100% | 0 |
5 | ALAMIR, ASA , (2011) ON CHROMATIC ABERRATION OF MAGNETIC LENSES WITH A FIELD DISTRIBUTION IN THE FORM OF POWER LOW MODEL [B(Z) ALPHA Z(N)].OPTIK. VOL. 122. ISSUE 3. P. 273-275 | 12 | 100% | 0 |
6 | IQBAL, M , ISLAM, GU , MISBAH, I , IQBAL, O , ZHOU, Z , (2014) NOTE: SIMULATION AND TEST OF A STRIP SOURCE ELECTRON GUN.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 85. ISSUE 6. P. - | 10 | 100% | 0 |
7 | KELLOGG, SM , LIU, K , SCHWIND, GA , SWANSON, LW , (2013) OFF-AXIS MODELING AND MEASUREMENT OF EMISSION PARAMETERS FOR THE SCHOTTKY EMITTER.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 31. ISSUE 6. P. - | 10 | 100% | 0 |
8 | ISIK, N , (2016) DETERMINATION OF ELECTRON OPTICAL PROPERTIES FOR APERTURE ZOOM LENSES USING AN ARTIFICIAL NEURAL NETWORK METHOD.MICROSCOPY AND MICROANALYSIS. VOL. 22. ISSUE 2. P. 458 -462 | 11 | 79% | 0 |
9 | SUZUKI, H , (1999) ELECTRON GUN SYSTEMS FOR COLOR CATHODE RAY TUBES.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 105. VOL. 105. ISSUE . P. 267 -404 | 24 | 56% | 4 |
10 | BAHM, A , SCHWIND, G , SWANSON, L , (2011) THE ZRO/W(100) SCHOTTKY CATHODE: MORPHOLOGICAL MODIFICATION AND ITS EFFECT ON LONG TERM OPERATION.JOURNAL OF APPLIED PHYSICS. VOL. 110. ISSUE 5. P. - | 8 | 100% | 5 |
Classes with closest relation at Level 1 |