Class information for:
Level 1: MICROWAVE MICROPROBE//MICROWAVE MICROSCOPE//NEAR FIELD MICROWAVE MICROSCOPY

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
20425 461 19.2 69%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
42 3       IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS//ENGINEERING, ELECTRICAL & ELECTRONIC 97664
2685 2             PERMITTIVITY MEASUREMENT//PL MICROWAVE NONDESTRUCT TESTING//COMPLEX PERMITTIVITY 3376
20425 1                   MICROWAVE MICROPROBE//MICROWAVE MICROSCOPE//NEAR FIELD MICROWAVE MICROSCOPY 461

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MICROWAVE MICROPROBE authKW 397417 1% 100% 6
2 MICROWAVE MICROSCOPE authKW 385370 2% 73% 8
3 NEAR FIELD MICROWAVE MICROSCOPY authKW 383217 2% 64% 9
4 SCANNING MICROWAVE MICROSCOPY authKW 383217 2% 64% 9
5 EVANESCENT MICROWAVE MICROSCOPY authKW 360616 2% 78% 7
6 NEAR FIELD SCANNING MICROWAVE MICROSCOPE authKW 331181 1% 100% 5
7 NEAR FIELD SCANNING MICROWAVE MICROSCOPY authKW 331181 1% 100% 5
8 MICROWAVE MICROSCOPY authKW 295047 2% 64% 7
9 KUHN TUCKER THEOREM IN NONDIFFERENTIAL FORM authKW 198709 1% 100% 3
10 NON CONTACT PROBE authKW 198709 1% 100% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 3822 58% 0% 267
2 Instruments & Instrumentation 1702 20% 0% 90
3 Engineering, Electrical & Electronic 886 27% 0% 125
4 Microscopy 446 3% 0% 16
5 Nanoscience & Nanotechnology 220 8% 0% 38
6 Materials Science, Ceramics 85 3% 0% 14
7 Telecommunications 71 4% 0% 18
8 Materials Science, Multidisciplinary 68 12% 0% 55
9 Physics, Condensed Matter 57 8% 0% 37
10 Materials Science, Characterization, Testing 55 2% 0% 7

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CHRISTIAN DOPPLER NANOSCOP METHODS BIOPHYS 151386 2% 29% 8
2 PROGRAM INTERDISCIPLINARY INTEGRATED BIOTECHNOL 132472 0% 100% 2
3 KEYSIGHT S 132468 1% 50% 4
4 CELL DAMAGE CONTROL 88310 1% 33% 4
5 INTERDISCIPLINARY PROGRAM INTEGRATED BIOTECHNOL 67209 5% 4% 23
6 CHRISTIAN DOPPLER NANOSCALE METHODS BIOPHYS 66236 0% 100% 1
7 DA IICT 66236 0% 100% 1
8 ELECT MICROELECT NANOTECHNOL DHS 66236 0% 100% 1
9 INTERDISCIPLINARY BIOMINERAL CRYSTALLOG 66236 0% 100% 1
10 INTERDISCIPLINARY MAT SCI TECHNOL 66236 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 REVIEW OF SCIENTIFIC INSTRUMENTS 6861 12% 0% 56
2 APPLIED PHYSICS LETTERS 2987 15% 0% 71
3 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 2504 5% 0% 22
4 ULTRAMICROSCOPY 2305 3% 0% 14
5 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS 1399 2% 0% 9
6 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 1242 3% 0% 13
7 COMPUTATIONAL MATHEMATICS AND MATHEMATICAL PHYSICS 893 1% 0% 5
8 RADIOPHYSICS AND QUANTUM ELECTRONICS 783 1% 0% 3
9 JOURNAL OF APPLIED PHYSICS 718 8% 0% 35
10 MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS 703 1% 0% 6

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 MICROWAVE MICROPROBE 397417 1% 100% 6 Search MICROWAVE+MICROPROBE Search MICROWAVE+MICROPROBE
2 MICROWAVE MICROSCOPE 385370 2% 73% 8 Search MICROWAVE+MICROSCOPE Search MICROWAVE+MICROSCOPE
3 NEAR FIELD MICROWAVE MICROSCOPY 383217 2% 64% 9 Search NEAR+FIELD+MICROWAVE+MICROSCOPY Search NEAR+FIELD+MICROWAVE+MICROSCOPY
4 SCANNING MICROWAVE MICROSCOPY 383217 2% 64% 9 Search SCANNING+MICROWAVE+MICROSCOPY Search SCANNING+MICROWAVE+MICROSCOPY
5 EVANESCENT MICROWAVE MICROSCOPY 360616 2% 78% 7 Search EVANESCENT+MICROWAVE+MICROSCOPY Search EVANESCENT+MICROWAVE+MICROSCOPY
6 NEAR FIELD SCANNING MICROWAVE MICROSCOPE 331181 1% 100% 5 Search NEAR+FIELD+SCANNING+MICROWAVE+MICROSCOPE Search NEAR+FIELD+SCANNING+MICROWAVE+MICROSCOPE
7 NEAR FIELD SCANNING MICROWAVE MICROSCOPY 331181 1% 100% 5 Search NEAR+FIELD+SCANNING+MICROWAVE+MICROSCOPY Search NEAR+FIELD+SCANNING+MICROWAVE+MICROSCOPY
8 MICROWAVE MICROSCOPY 295047 2% 64% 7 Search MICROWAVE+MICROSCOPY Search MICROWAVE+MICROSCOPY
9 KUHN TUCKER THEOREM IN NONDIFFERENTIAL FORM 198709 1% 100% 3 Search KUHN+TUCKER+THEOREM+IN+NONDIFFERENTIAL+FORM Search KUHN+TUCKER+THEOREM+IN+NONDIFFERENTIAL+FORM
10 NON CONTACT PROBE 198709 1% 100% 3 Search NON+CONTACT+PROBE Search NON+CONTACT+PROBE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 REZNIK, AN , KOROLYOV, SA , (2016) MONOPOLE ANTENNA IN QUANTITATIVE NEAR-FIELD MICROWAVE MICROSCOPY OF PLANAR STRUCTURES.JOURNAL OF APPLIED PHYSICS. VOL. 119. ISSUE 9. P. - 32 84% 0
2 REZNIK, AN , (2014) QUASISTATICS AND ELECTRODYNAMICS OF NEAR-FIELD MICROWAVE MICROSCOPE.JOURNAL OF APPLIED PHYSICS. VOL. 115. ISSUE 8. P. - 29 91% 4
3 BARKER, DJ , JACKSON, TJ , SUHERMAN, PM , GASHINOVA, MS , LANCASTER, MJ , (2014) UNCERTAINTIES IN THE PERMITTIVITY OF THIN FILMS EXTRACTED FROM MEASUREMENTS WITH NEAR FIELD MICROWAVE MICROSCOPY CALIBRATED BY AN IMAGE CHARGE MODEL.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 25. ISSUE 10. P. - 37 71% 1
4 MICHALAS, L , WANG, F , BRILLARD, C , CHEVALIER, N , HARTMANN, JM , MARCELLI, R , THERON, D , (2015) MODELING AND DE-EMBEDDING THE INTERFEROMETRIC SCANNING MICROWAVE MICROSCOPY BY MEANS OF DOPANT PROFILE CALIBRATION.APPLIED PHYSICS LETTERS. VOL. 107. ISSUE 22. P. - 26 93% 1
5 NOZOKIDO, T , ISHINO, M , SETO, R , BAE, J , (2015) CONTRAST ANALYSIS OF NEAR-FIELD SCANNING MICROSCOPY USING A METAL SLIT PROBE AT MILLIMETER WAVELENGTHS.JOURNAL OF APPLIED PHYSICS. VOL. 118. ISSUE 11. P. - 37 65% 1
6 REZNIK, AN , DEMIDOV, EV , (2013) QUANTITATIVE DETERMINATION OF SHEET RESISTANCE OF SEMICONDUCTING FILMS BY MICROWAVE NEAR-FIELD PROBING.JOURNAL OF APPLIED PHYSICS. VOL. 113. ISSUE 9. P. - 27 93% 2
7 TSELEV, A , LAVRIK, NV , KOLMAKOV, A , KALININ, SV , (2013) SCANNING NEAR-FIELD MICROWAVE MICROSCOPY OF VO2 AND CHEMICAL VAPOR DEPOSITION GRAPHENE.ADVANCED FUNCTIONAL MATERIALS. VOL. 23. ISSUE 20. P. 2635 -2645 31 70% 12
8 TORIGOE, K , ARITA, M , MOTOOKA, T , (2012) SENSITIVITY ANALYSIS OF SCANNING MICROWAVE MICROSCOPY FOR NANO-SCALE DOPANT MEASUREMENTS IN SI.JOURNAL OF APPLIED PHYSICS. VOL. 112. ISSUE 10. P. - 24 92% 5
9 YANG, YL , LAI, KJ , TANG, QC , KUNDHIKANJANA, W , KELLY, MA , ZHANG, K , SHEN, ZX , LI, XX , (2012) BATCH-FABRICATED CANTILEVER PROBES WITH ELECTRICAL SHIELDING FOR NANOSCALE DIELECTRIC AND CONDUCTIVITY IMAGING.JOURNAL OF MICROMECHANICS AND MICROENGINEERING. VOL. 22. ISSUE 11. P. - 24 83% 9
10 SUN, WQ , YANG, Y , WU, Z , FENG, T , ZHUANG, QW , PENG, LM , XU, SY , ONG, CK , (2014) PENETRATIVE IMAGING OF SUB-SURFACE MICROSTRUCTURES WITH A NEAR-FIELD MICROWAVE MICROSCOPE.JOURNAL OF APPLIED PHYSICS. VOL. 116. ISSUE 4. P. - 18 95% 2

Classes with closest relation at Level 1


Rank Class id link
1 24763 PL MICROWAVE NONDESTRUCT TESTING//MICROWAVE NONDESTRUCTIVE TESTING//MODULATED SCATTERER TECHNIQUE MST
2 14198 SCANNING CAPACITANCE MICROSCOPY//SSRM//INSYS
3 10286 KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY//SCI CRYSTAL PHYS
4 30354 MAXWELL WAGNER MODEL//EFISHG//MAXWELL WAGNER EFFECT ELEMENT
5 1063 NEAR FIELD OPTICS//SNOM//SCANNING NEAR FIELD OPTICAL MICROSCOPY
6 6357 PERMITTIVITY MEASUREMENT//COMPLEX PERMITTIVITY//MICROWAVE MEASUREMENTS
7 10724 COMBINATORIAL CATALYSIS//HIGH THROUGHPUT EXPERIMENTATION//COMBINATORIAL
8 29499 THERMAL ACOUSTIC RADIATION//ELDIS//ACOUSTICAL THERMOGRAPHY
9 31479 PASSIVE INTERMODULATION PIM//PASSIVE INTERMODULATION//PASSIVE INTERMODULATION DISTORTION PIM
10 13001 ANTENNA MEASUREMENTS//NEAR FIELD FAR FIELD TRANSFORMATION//NEAR FIELD SCANNING

Go to start page