Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
32280 | 141 | 14.7 | 35% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
314 | 3 | ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 39933 |
2614 | 2 | ATOM PROBE TOMOGRAPHY//ATOM PROBE//FIELD EVAPORATION | 3568 |
32280 | 1 | AUGER TRANSISTOR//SELF CONSISTENT QUANTUM WELLS//44 THIO BIS BENZENETHIOLATE | 141 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | AUGER TRANSISTOR | authKW | 649692 | 2% | 100% | 3 |
2 | SELF CONSISTENT QUANTUM WELLS | authKW | 649692 | 2% | 100% | 3 |
3 | 44 THIO BIS BENZENETHIOLATE | authKW | 216564 | 1% | 100% | 1 |
4 | AL SIO2 N SI | authKW | 216564 | 1% | 100% | 1 |
5 | COORDINATION INSERTION RING OPENING POLYMERIZATION CROP | authKW | 216564 | 1% | 100% | 1 |
6 | CURRENT INSTABILITIES | authKW | 123748 | 1% | 29% | 2 |
7 | P SI111 | authKW | 108281 | 1% | 50% | 1 |
8 | PHYSICS OF LOW-DIMENSIONAL STRUCTURES | journal | 65891 | 11% | 2% | 16 |
9 | SHALLOW P N JUNCTION | authKW | 54140 | 1% | 25% | 1 |
10 | ANIONIC RING OPENING POLYMERIZATION AROP | authKW | 43311 | 1% | 20% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 982 | 44% | 0% | 62 |
2 | Physics, Applied | 179 | 25% | 0% | 35 |
3 | Engineering, Electrical & Electronic | 156 | 21% | 0% | 30 |
4 | Physics, Multidisciplinary | 109 | 14% | 0% | 20 |
5 | Telecommunications | 52 | 6% | 0% | 8 |
6 | Nanoscience & Nanotechnology | 47 | 7% | 0% | 10 |
7 | Materials Science, Coatings & Films | 26 | 4% | 0% | 5 |
8 | Physics, Atomic, Molecular & Chemical | 8 | 4% | 0% | 6 |
9 | Engineering, General | 6 | 2% | 0% | 3 |
10 | Microscopy | 4 | 1% | 0% | 1 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | VA FOCK PHYS | 21290 | 4% | 2% | 6 |
2 | PL MATH CONTROL PROC | 1932 | 1% | 1% | 1 |
3 | AF IOFFE PHYS TECH | 1718 | 4% | 0% | 5 |
4 | IMAGE SCI ENGN | 1639 | 1% | 1% | 1 |
5 | COMP INFORMAT SYST | 1241 | 2% | 0% | 3 |
6 | COMP INFORMAT TECHNOL | 940 | 2% | 0% | 3 |
7 | PETRODVORETS BRANCH | 923 | 1% | 0% | 1 |
8 | FOCK PHYS | 511 | 1% | 0% | 1 |
9 | IOFFE PHYSICOTECH | 429 | 1% | 0% | 1 |
10 | NN SEMENOV CHEM PHYS | 352 | 1% | 0% | 2 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PHYSICS OF LOW-DIMENSIONAL STRUCTURES | 65891 | 11% | 2% | 16 |
2 | FIZIKA TVERDOGO TELA | 4448 | 11% | 0% | 15 |
3 | PHILIPS TECHNICAL REVIEW | 2705 | 1% | 1% | 1 |
4 | PHILIPS JOURNAL OF RESEARCH | 2590 | 1% | 1% | 2 |
5 | VESTNIK LENINGRADSKOGO UNIVERSITETA SERIYA FIZIKA KHIMIYA | 1339 | 1% | 0% | 2 |
6 | PROGRESS IN SURFACE SCIENCE | 1221 | 1% | 0% | 2 |
7 | JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS | 1094 | 3% | 0% | 4 |
8 | IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA | 1088 | 4% | 0% | 5 |
9 | SOVIET MICROELECTRONICS | 722 | 1% | 0% | 1 |
10 | RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY B | 630 | 1% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | KALGANOV, VD , MILESHKINA, NV , OSTROUMOVA, EV , (2006) TUNNELING EMISSION OF ELECTRONS FROM SEMICONDUCTORS' VALENCE BANDS IN HIGH ELECTRIC FIELDS.SEMICONDUCTORS. VOL. 40. ISSUE 9. P. 1036-1042 | 8 | 73% | 0 |
2 | GONCHAROV, SN , KALGANOV, VD , MILESHKINA, NV , SHLYAHTENKO, PG , (2004) KINETIC PROCESSES IN GAAS CRYSTALS AT HIGH ELECTRIC FIELD UNDER LASER RADIATION.PHYSICS OF LOW-DIMENSIONAL STRUCTURES. VOL. 5-6. ISSUE . P. 57-65 | 6 | 100% | 0 |
3 | DECK, T , KALGANOV, VD , MILESHKINA, NV , MOSCARDINI, A , (2001) PHOTO-FIELD-EMISSION CHARACTERISTICS OF SEMICONDUCTOR DETECTOR STRUCTURES.PHYSICS OF LOW-DIMENSIONAL STRUCTURES. VOL. 5-6. ISSUE . P. 9-18 | 7 | 88% | 0 |
4 | ROGACHEV, AA , KALGANOV, VD , MILESHKINA, NV , OSTROUMOVA, EV , (2000) THE INFLUENCE OF STRONG ELECTRIC FIELD ON THE INTERFACE IN THE AL-SIO2-N-SI AUGER TRANSISTOR.MICROELECTRONICS JOURNAL. VOL. 31. ISSUE 11-12. P. 905 -911 | 6 | 100% | 3 |
5 | ZHU, DZ , ZHU, JH , (2002) SI BASED QUASI-PLANAR SELF-ALIGNED ELECTRON EMISSION ARRAY.APPLIED SURFACE SCIENCE. VOL. 202. ISSUE 1-2. P. 110-113 | 5 | 100% | 0 |
6 | KALGANOV, VD , MILESHKINA, NV , MOSKARDINI, AO , SAPRONOV, SA , (2000) MANIFESTATION OF SURFACE ELECTRON STATES IN THE ENERGY DISTRIBUTION OF ELECTRONS UNDER THE FIELD EMISSION FROM P-TYPE GERMANIUM.JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS. VOL. 45. ISSUE 6. P. 690 -694 | 5 | 100% | 0 |
7 | KALGANOV, VD , MILESHKINA, NV , OSTROUMOVA, EV , (2003) TUNNEL EMISSION OF ELECTRONS IN PHOTO-FIELD DETECTORS AND IN AN AUGER TRANSISTOR IN VERY STRONG ELECTRIC FIELDS.SEMICONDUCTORS. VOL. 37. ISSUE 3. P. 354 -359 | 6 | 75% | 4 |
8 | DECK, T , KALGANOV, VD , MILESHKINA, NV , MOSCARDINI, A , (2006) EFFICIENT SURFACE SENSITIVE FIELD EMISSION STRUCTURES FOR GAS SENSORS.PHYSICS OF LOW-DIMENSIONAL STRUCTURES. VOL. 1. ISSUE . P. 41-44 | 4 | 100% | 0 |
9 | KALGANOV, VD , MILESHKINA, NV , TCHUMAK, SV , (2004) PHOTOSENSITIVITY EXCITATION SPECTRA FOR FIELD EMISSION FROM GAAS CRYSTAL.PHYSICS OF LOW-DIMENSIONAL STRUCTURES. VOL. 5-6. ISSUE . P. 49-55 | 5 | 83% | 1 |
10 | DECK, T , MOSCARDINI, AO , KALGANOV, VD , MILESHKINA, NV , (2008) THE ENERGY DISTRIBUTION OF FIELD-EMITTED ELECTRONS FROM GAAS CRYSTALS.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 20. ISSUE 39. P. - | 5 | 71% | 0 |
Classes with closest relation at Level 1 |