Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
7837 | 1322 | 20.4 | 69% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
277 | 3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//JOURNAL OF SYNCHROTRON RADIATION//NUCLEAR SCIENCE & TECHNOLOGY | 43290 |
1283 | 2 | X RAY OPTICS//X RAY MICROSCOPY//ZONE PLATE | 8701 |
7837 | 1 | X RAY OPTICS//ZONE PLATE//X RAY MICROSCOPY | 1322 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | X RAY OPTICS | authKW | 585474 | 8% | 23% | 108 |
2 | ZONE PLATE | authKW | 584112 | 4% | 44% | 58 |
3 | X RAY MICROSCOPY | authKW | 544393 | 7% | 26% | 92 |
4 | FRESNEL ZONE PLATE | authKW | 385413 | 3% | 38% | 44 |
5 | REFRACTIVE LENSES | authKW | 351210 | 2% | 72% | 21 |
6 | MULTILAYER LAUE LENS | authKW | 323347 | 1% | 100% | 14 |
7 | X RAY FOCUSING | authKW | 282911 | 2% | 58% | 21 |
8 | RONTGENPHYS | address | 269752 | 3% | 28% | 42 |
9 | COMPOUND REFRACTIVE LENSES | authKW | 257061 | 1% | 70% | 16 |
10 | X RAY WAVEGUIDE | authKW | 225326 | 1% | 51% | 19 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Instruments & Instrumentation | 12527 | 31% | 0% | 406 |
2 | Optics | 7549 | 32% | 0% | 422 |
3 | Physics, Applied | 6280 | 45% | 0% | 591 |
4 | Spectroscopy | 1923 | 11% | 0% | 145 |
5 | Nuclear Science & Technology | 1234 | 10% | 0% | 127 |
6 | Physics, Nuclear | 1226 | 10% | 0% | 129 |
7 | Physics, Particles & Fields | 816 | 9% | 0% | 119 |
8 | Microscopy | 643 | 2% | 0% | 33 |
9 | Nanoscience & Nanotechnology | 617 | 8% | 0% | 108 |
10 | Physics, Multidisciplinary | 320 | 9% | 0% | 116 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | RONTGENPHYS | 269752 | 3% | 28% | 42 |
2 | XRAY MICROSCOPY SECT | 123174 | 1% | 67% | 8 |
3 | MISTRAL BEAMLINE EXPT | 103930 | 0% | 75% | 6 |
4 | ENGN SCI SYST | 83142 | 0% | 60% | 6 |
5 | PRECIS SCI TECHNOL | 76074 | 3% | 9% | 38 |
6 | NANOMETEROPT TECHNOL | 64152 | 0% | 56% | 5 |
7 | ULTR RECIS SCI TECHNOL | 63736 | 1% | 20% | 14 |
8 | ULTRA PRECIS SCI TECHNOL | 59522 | 1% | 14% | 19 |
9 | XRAY OPT | 59006 | 3% | 8% | 34 |
10 | NANOFABRICAT USERS NETWORK | 51965 | 0% | 75% | 3 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF SYNCHROTRON RADIATION | 167834 | 11% | 5% | 149 |
2 | REVIEW OF SCIENTIFIC INSTRUMENTS | 8339 | 8% | 0% | 105 |
3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 6875 | 8% | 0% | 112 |
4 | JOURNAL DE PHYSIQUE IV | 3353 | 3% | 0% | 39 |
5 | MICROELECTRONIC ENGINEERING | 2579 | 3% | 0% | 34 |
6 | OPTICS EXPRESS | 2212 | 4% | 0% | 58 |
7 | JOURNAL OF STRUCTURAL BIOLOGY | 2131 | 1% | 1% | 18 |
8 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2050 | 3% | 0% | 39 |
9 | JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES | 1857 | 0% | 1% | 6 |
10 | JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 1844 | 0% | 1% | 6 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | X RAY OPTICS | 585474 | 8% | 23% | 108 | Search X+RAY+OPTICS | Search X+RAY+OPTICS |
2 | ZONE PLATE | 584112 | 4% | 44% | 58 | Search ZONE+PLATE | Search ZONE+PLATE |
3 | X RAY MICROSCOPY | 544393 | 7% | 26% | 92 | Search X+RAY+MICROSCOPY | Search X+RAY+MICROSCOPY |
4 | FRESNEL ZONE PLATE | 385413 | 3% | 38% | 44 | Search FRESNEL+ZONE+PLATE | Search FRESNEL+ZONE+PLATE |
5 | REFRACTIVE LENSES | 351210 | 2% | 72% | 21 | Search REFRACTIVE+LENSES | Search REFRACTIVE+LENSES |
6 | MULTILAYER LAUE LENS | 323347 | 1% | 100% | 14 | Search MULTILAYER+LAUE+LENS | Search MULTILAYER+LAUE+LENS |
7 | X RAY FOCUSING | 282911 | 2% | 58% | 21 | Search X+RAY+FOCUSING | Search X+RAY+FOCUSING |
8 | COMPOUND REFRACTIVE LENSES | 257061 | 1% | 70% | 16 | Search COMPOUND+REFRACTIVE+LENSES | Search COMPOUND+REFRACTIVE+LENSES |
9 | X RAY WAVEGUIDE | 225326 | 1% | 51% | 19 | Search X+RAY+WAVEGUIDE | Search X+RAY+WAVEGUIDE |
10 | ZERNIKE PHASE CONTRAST | 174658 | 1% | 69% | 11 | Search ZERNIKE+PHASE+CONTRAST | Search ZERNIKE+PHASE+CONTRAST |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | CHU, YS , YAN, HF , CONLEY, R , BOUET, N , (2014) HARD X-RAY NANOFOCUSING BY MULTILAYER LAUE LENSES.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 47. ISSUE 26. P. - | 65 | 52% | 23 |
2 | ARISTOV, VV , SHABEL'NIKOV, LG , (2008) RECENT ADVANCES IN X-RAY REFRACTIVE OPTICS.PHYSICS-USPEKHI. VOL. 51. ISSUE 1. P. 57 -77 | 52 | 76% | 8 |
3 | SNIGIREV, A , SNIGIREVA, I , (2008) HIGH ENERGY X-RAY MICRO-OPTICS.COMPTES RENDUS PHYSIQUE. VOL. 9. ISSUE 5-6. P. 507-516 | 41 | 85% | 27 |
4 | NEUBAUER, H , HOFFMANN, S , KANBACH, M , HABER, J , KALBFLEISCH, S , KRUGER, SP , SALDITT, T , (2014) HIGH ASPECT RATIO X-RAY WAVEGUIDE CHANNELS FABRICATED BY E-BEAM LITHOGRAPHY AND WAFER BONDING.JOURNAL OF APPLIED PHYSICS. VOL. 115. ISSUE 21. P. - | 32 | 80% | 7 |
5 | CHEN, Z , XIE, HL , DENG, B , DU, GH , JIANG, HD , XIAO, TQ , (2014) TOWARD ONE NANOMETER X-RAY FOCUSING: A COMPLEX REFRACTIVE LENS DESIGN.CHINESE OPTICS LETTERS. VOL. 12. ISSUE 12. P. - | 27 | 87% | 3 |
6 | SAKDINAWAT, A , ATTWOOD, D , (2010) NANOSCALE X-RAY IMAGING.NATURE PHOTONICS. VOL. 4. ISSUE 12. P. 840 -848 | 34 | 49% | 190 |
7 | FOX, OJL , ALIANELLI, L , MALIK, AM , PAPE, I , MAY, PW , SAWHNEY, KJS , (2014) NANOFOCUSING OPTICS FOR SYNCHROTRON RADIATION MADE FROM POLYCRYSTALLINE DIAMOND.OPTICS EXPRESS. VOL. 22. ISSUE 7. P. 7657 -7668 | 23 | 88% | 9 |
8 | KESKINBORA, K , ROBISCH, AL , MAYER, M , SANLI, UT , GREVENT, C , WOLTER, C , WEIGAND, M , SZEGHALMI, A , KNEZ, M , SALDITT, T , ET AL (2014) MULTILAYER FRESNEL ZONE PLATES FOR HIGH ENERGY RADIATION RESOLVE 21 NM FEATURES AT 1.2 KEV.OPTICS EXPRESS. VOL. 22. ISSUE 15. P. 18440 -18453 | 29 | 73% | 1 |
9 | CHEN, HY , HOFFMANN, S , SALDITT, T , (2015) X-RAY BEAM COMPRESSION BY TAPERED WAVEGUIDES.APPLIED PHYSICS LETTERS. VOL. 106. ISSUE 19. P. - | 21 | 88% | 4 |
10 | CARZANIGA, R , DOMART, MC , COLLINSON, LM , DUKE, E , (2014) CRYO-SOFT X-RAY TOMOGRAPHY: A JOURNEY INTO THE WORLD OF THE NATIVE-STATE CELL.PROTOPLASMA. VOL. 251. ISSUE 2. P. 449-458 | 27 | 63% | 18 |
Classes with closest relation at Level 1 |