Class information for:
Level 1: STXM//X RAY MICROSCOPY//BIMR

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
16800 635 30.3 58%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
277 3       NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//JOURNAL OF SYNCHROTRON RADIATION//NUCLEAR SCIENCE & TECHNOLOGY 43290
1283 2             X RAY OPTICS//X RAY MICROSCOPY//ZONE PLATE 8701
16800 1                   STXM//X RAY MICROSCOPY//BIMR 635

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 STXM authKW 496268 5% 30% 34
2 X RAY MICROSCOPY authKW 482099 9% 17% 60
3 BIMR address 457940 3% 48% 20
4 C 1S NEXAFS authKW 192344 1% 100% 4
5 NEXAFS authKW 173603 7% 8% 44
6 SOFT X RAY SPECTROMICROSCOPY authKW 150265 1% 63% 5
7 SCANNING TRANSMISSION X RAY MICROSCOPY STXM authKW 144252 1% 50% 6
8 SOFT X RAY MICROSCOPY authKW 125631 1% 29% 9
9 BROCKHOUSE MAT address 116205 6% 6% 39
10 NEXAFS MICROSCOPY authKW 108192 0% 75% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 10305 14% 0% 88
2 Spectroscopy 1482 14% 0% 87
3 Instruments & Instrumentation 1458 16% 0% 99
4 Physics, Applied 394 18% 0% 117
5 Optics 386 11% 0% 73
6 Nuclear Science & Technology 169 6% 0% 35
7 Physics, Multidisciplinary 149 9% 0% 55
8 Chemistry, Physical 132 13% 0% 80
9 Physics, Nuclear 78 4% 0% 26
10 Physics, Atomic, Molecular & Chemical 78 6% 0% 36

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 BIMR 457940 3% 48% 20
2 BROCKHOUSE MAT 116205 6% 6% 39
3 DOW LATEX 96172 0% 100% 2
4 PHYS CHEM ICMM 2 96172 0% 100% 2
5 NSLS PROJECT 2 64113 0% 67% 2
6 CENEM 59177 1% 31% 4
7 ASSEMBLIES UNIT BIA 48086 0% 100% 1
8 BEIP NCRR 48086 0% 100% 1
9 BORCKHOUSE MAT 48086 0% 100% 1
10 BP48 48086 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF MICROSCOPY-OXFORD 21801 5% 1% 34
2 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 17038 7% 1% 46
3 JOURNAL OF SYNCHROTRON RADIATION 14130 5% 1% 30
4 JOURNAL OF MICROSCOPY 2271 2% 0% 11
5 JOURNAL DE PHYSIQUE IV 2229 3% 0% 22
6 PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS 1490 2% 0% 13
7 ULTRAMICROSCOPY 1024 2% 0% 11
8 MICRON 926 1% 0% 7
9 GEOBIOLOGY 903 0% 1% 3
10 REVIEW OF SCIENTIFIC INSTRUMENTS 882 4% 0% 24

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 STXM 496268 5% 30% 34 Search STXM Search STXM
2 X RAY MICROSCOPY 482099 9% 17% 60 Search X+RAY+MICROSCOPY Search X+RAY+MICROSCOPY
3 C 1S NEXAFS 192344 1% 100% 4 Search C+1S+NEXAFS Search C+1S+NEXAFS
4 NEXAFS 173603 7% 8% 44 Search NEXAFS Search NEXAFS
5 SOFT X RAY SPECTROMICROSCOPY 150265 1% 63% 5 Search SOFT+X+RAY+SPECTROMICROSCOPY Search SOFT+X+RAY+SPECTROMICROSCOPY
6 SCANNING TRANSMISSION X RAY MICROSCOPY STXM 144252 1% 50% 6 Search SCANNING+TRANSMISSION+X+RAY+MICROSCOPY+STXM Search SCANNING+TRANSMISSION+X+RAY+MICROSCOPY+STXM
7 SOFT X RAY MICROSCOPY 125631 1% 29% 9 Search SOFT+X+RAY+MICROSCOPY Search SOFT+X+RAY+MICROSCOPY
8 NEXAFS MICROSCOPY 108192 0% 75% 3 Search NEXAFS+MICROSCOPY Search NEXAFS+MICROSCOPY
9 BIOTIC EXCLUSION ZONE 96172 0% 100% 2 Search BIOTIC+EXCLUSION+ZONE Search BIOTIC+EXCLUSION+ZONE
10 INDIRECT SECONDARY ELECTRON CONTRAST 96172 0% 100% 2 Search INDIRECT+SECONDARY+ELECTRON+CONTRAST Search INDIRECT+SECONDARY+ELECTRON+CONTRAST

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 ADE, H , HITCHCOCK, AP , (2008) NEXAFS MICROSCOPY AND RESONANT SCATTERING: COMPOSITION AND ORIENTATION PROBED IN REAL AND RECIPROCAL SPACE.POLYMER. VOL. 49. ISSUE 3. P. 643 -675 62 41% 94
2 WATTS, B , ADE, H , (2012) NEXAFS IMAGING OF SYNTHETIC ORGANIC MATERIALS.MATERIALS TODAY. VOL. 15. ISSUE 4. P. 148 -157 48 46% 12
3 KILCOYNE, ALD , TYLISZCZAK, T , STEELE, WF , FAKRA, S , HITCHCOCK, P , FRANCK, K , ANDERSON, E , HARTENECK, B , RIGHTOR, EG , MITCHELL, GE , ET AL (2003) INTERFEROMETER-CONTROLLED SCANNING TRANSMISSION X-RAY MICROSCOPES AT THE ADVANCED LIGHT SOURCE.JOURNAL OF SYNCHROTRON RADIATION. VOL. 10. ISSUE . P. 125-136 24 63% 368
4 WANG, J , MORIN, C , LI, L , HITCHCOCK, AP , SCHOLL, A , DORAN, A , (2009) RADIATION DAMAGE IN SOFT X-RAY MICROSCOPY.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 170. ISSUE 1-3. P. 25-36 27 59% 67
5 YOON, TH , (2009) APPLICATIONS OF SOFT X-RAY SPECTROMICROSCOPY IN MATERIAL AND ENVIRONMENTAL SCIENCES.APPLIED SPECTROSCOPY REVIEWS. VOL. 44. ISSUE 2. P. 91-122 32 50% 9
6 KIRZ, J , JACOBSEN, C , HOWELLS, M , (1995) SOFT-X-RAY MICROSCOPES AND THEIR BIOLOGICAL APPLICATIONS.QUARTERLY REVIEWS OF BIOPHYSICS. VOL. 28. ISSUE 1. P. 33-130 39 38% 378
7 WANG, J , BUTTON, GA , WEST, MM , HITCHCOCK, AP , (2009) QUANTITATIVE EVALUATION OF RADIATION DAMAGE TO POLYETHYLENE TEREPHTHALATE BY SOFT X-RAYS AND HIGH-ENERGY ELECTRONS.JOURNAL OF PHYSICAL CHEMISTRY B. VOL. 113. ISSUE 7. P. 1869 -1876 19 73% 18
8 CARPENTER, JH , HUNT, A , ADE, H , (2015) CHARACTERIZING MORPHOLOGY IN ORGANIC SYSTEMS WITH RESONANT SOFT X-RAY SCATTERING.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 200. ISSUE . P. 2 -14 31 38% 3
9 RAABE, J , TZVETKOV, G , FLECHSIG, U , BOGE, M , JAGGI, A , SARAFIMOV, B , VERNOOIJ, MGC , HUTHWELKER, T , ADE, H , KILCOYNE, D , ET AL (2008) POLLUX: A NEW FACILITY FOR SOFT X-RAY SPECTROMICROSCOPY AT THE SWISS LIGHT SOURCE.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 79. ISSUE 11. P. - 21 57% 74
10 URQUHART, SG , LANKE, UD , FU, JX , (2008) CHARACTERISATION OF MOLECULAR ORIENTATION IN ORGANIC NANORNATERIALS BY X-RAY LINEAR DICHROISM MICROSCOPY.INTERNATIONAL JOURNAL OF NANOTECHNOLOGY. VOL. 5. ISSUE 9-12. P. 1138-1170 37 36% 5

Classes with closest relation at Level 1


Rank Class id link
1 33188 WESTERN UNIV SYNCHROTRON RADIAT//ANGLE RESOLVED NEXAFS//BIPOLAR RESISTIVE SWITCHING MECHANISM
2 7837 X RAY OPTICS//ZONE PLATE//X RAY MICROSCOPY
3 11037 PHOTOEMISSION MICROSCOPY//SPECTROMICROSCOPY//XPEEM
4 30286 IQMAAB//SOLID STATE SHEAR PULVERIZATION//SOLID STATE SHEAR MILLING
5 23080 LOCAL CRACK DRIVING FORCE//MICROCONTRASTING//X RAY FRACTOGRAPHY
6 1171 CORE EXCITATION//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA//PHOTON STIMULATED DESORPTION PSD
7 12923 GAS PUFF TARGET//EUV SOURCE//LASER PRODUCED PLASMA
8 2805 MULTILAYER MIRROR//PRECIS OPT ENGN//MULTILAYERS
9 19489 IRON OXIDIZING BACTERIA//GALLIONELLA//ZETAPROTEOBACTERIA
10 30199 TRANSMISSION GRATING//FREESTANDING TRANSMISSION GRATING//HIGH TEMP HIGH DENS PLASMA PHYS

Go to start page