Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
2805 | 2144 | 20.2 | 59% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
277 | 3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//JOURNAL OF SYNCHROTRON RADIATION//NUCLEAR SCIENCE & TECHNOLOGY | 43290 |
1283 | 2 | X RAY OPTICS//X RAY MICROSCOPY//ZONE PLATE | 8701 |
2805 | 1 | MULTILAYER MIRROR//PRECIS OPT ENGN//MULTILAYERS | 2144 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | MULTILAYER MIRROR | authKW | 279919 | 2% | 44% | 45 |
2 | PRECIS OPT ENGN | address | 272958 | 3% | 30% | 63 |
3 | MULTILAYERS | authKW | 139788 | 10% | 5% | 218 |
4 | GOLD | address | 128152 | 1% | 60% | 15 |
5 | X RAY EUV OPTICS | authKW | 120323 | 1% | 65% | 13 |
6 | X RAY MULTILAYERS | authKW | 114867 | 1% | 73% | 11 |
7 | X RAY MIRROR | authKW | 110614 | 1% | 30% | 26 |
8 | X RAY REFLECTIVITY | authKW | 108507 | 3% | 12% | 64 |
9 | MO SI MULTILAYERS | authKW | 101264 | 0% | 89% | 8 |
10 | CHIM PHYS MAT RAYONNEMENT | address | 94371 | 3% | 12% | 55 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Optics | 10108 | 29% | 0% | 625 |
2 | Physics, Applied | 7874 | 40% | 0% | 852 |
3 | Materials Science, Coatings & Films | 3240 | 9% | 0% | 198 |
4 | Instruments & Instrumentation | 2822 | 12% | 0% | 258 |
5 | Physics, Condensed Matter | 2029 | 18% | 0% | 381 |
6 | Spectroscopy | 1728 | 8% | 0% | 179 |
7 | Nuclear Science & Technology | 901 | 7% | 0% | 144 |
8 | Physics, Nuclear | 693 | 6% | 0% | 131 |
9 | Materials Science, Multidisciplinary | 430 | 13% | 0% | 283 |
10 | Physics, Particles & Fields | 375 | 5% | 0% | 113 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PRECIS OPT ENGN | 272958 | 3% | 30% | 63 |
2 | GOLD | 128152 | 1% | 60% | 15 |
3 | CHIM PHYS MAT RAYONNEMENT | 94371 | 3% | 12% | 55 |
4 | SIBERIAN SR | 88723 | 0% | 69% | 9 |
5 | LUXOR | 85431 | 1% | 50% | 12 |
6 | SOFT XRAY MICROSCOPY | 75944 | 0% | 67% | 8 |
7 | UMR 7614 | 72505 | 2% | 10% | 49 |
8 | IPOE | 65092 | 0% | 57% | 8 |
9 | DC DE | 59334 | 0% | 83% | 5 |
10 | CNRS UMR 7614 | 58574 | 1% | 34% | 12 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | APPLIED OPTICS | 19935 | 10% | 1% | 222 |
2 | JOURNAL OF SYNCHROTRON RADIATION | 4426 | 1% | 1% | 31 |
3 | OPTICAL ENGINEERING | 4249 | 3% | 0% | 65 |
4 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 3930 | 5% | 0% | 109 |
5 | THIN SOLID FILMS | 3710 | 5% | 0% | 99 |
6 | JOURNAL DE PHYSIQUE IV | 2727 | 2% | 0% | 45 |
7 | JOURNAL OF APPLIED PHYSICS | 2698 | 7% | 0% | 147 |
8 | REVIEW OF SCIENTIFIC INSTRUMENTS | 2472 | 3% | 0% | 74 |
9 | REVUE DE PHYSIQUE APPLIQUEE | 2095 | 1% | 1% | 14 |
10 | JOURNAL DE PHYSIQUE III | 1898 | 1% | 1% | 12 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | MULTILAYER MIRROR | 279919 | 2% | 44% | 45 | Search MULTILAYER+MIRROR | Search MULTILAYER+MIRROR |
2 | MULTILAYERS | 139788 | 10% | 5% | 218 | Search MULTILAYERS | Search MULTILAYERS |
3 | X RAY EUV OPTICS | 120323 | 1% | 65% | 13 | Search X+RAY+EUV+OPTICS | Search X+RAY+EUV+OPTICS |
4 | X RAY MULTILAYERS | 114867 | 1% | 73% | 11 | Search X+RAY+MULTILAYERS | Search X+RAY+MULTILAYERS |
5 | X RAY MIRROR | 110614 | 1% | 30% | 26 | Search X+RAY+MIRROR | Search X+RAY+MIRROR |
6 | X RAY REFLECTIVITY | 108507 | 3% | 12% | 64 | Search X+RAY+REFLECTIVITY | Search X+RAY+REFLECTIVITY |
7 | MO SI MULTILAYERS | 101264 | 0% | 89% | 8 | Search MO+SI+MULTILAYERS | Search MO+SI+MULTILAYERS |
8 | EXTREME ULTRAVIOLET | 89342 | 2% | 17% | 38 | Search EXTREME+ULTRAVIOLET | Search EXTREME+ULTRAVIOLET |
9 | EUV MULTILAYER | 85443 | 0% | 100% | 6 | Search EUV+MULTILAYER | Search EUV+MULTILAYER |
10 | SOFT X RAY RANGE | 85443 | 0% | 100% | 6 | Search SOFT+X+RAY+RANGE | Search SOFT+X+RAY+RANGE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | LOUIS, E , YAKSHIN, AE , TSARFATI, T , BIJKERK, F , (2011) NANOMETER INTERFACE AND MATERIALS CONTROL FOR MULTILAYER EUV-OPTICAL APPLICATIONS.PROGRESS IN SURFACE SCIENCE. VOL. 86. ISSUE 11-12. P. 255 -294 | 67 | 64% | 37 |
2 | MAJKOVA, E , JERGEL, M , YAMAMOTO, M , TSURU, T , LUBY, S , SIFFALOVIC, P , (2007) ADVANCED NANOMETER-SIZE STRUCTURES.ACTA PHYSICA SLOVACA. VOL. 57. ISSUE 6. P. 911 -1074 | 109 | 39% | 1 |
3 | BARTHELMESS, M , BAJT, S , (2011) THERMAL AND STRESS STUDIES OF NORMAL INCIDENCE MO/B4C MULTILAYERS FOR A 6.7 NM WAVELENGTH.APPLIED OPTICS. VOL. 50. ISSUE 11. P. 1610 -1619 | 36 | 86% | 23 |
4 | PERSHYN, YP , GULLIKSON, EM , KONDRATENKO, VV , MAMON, VV , REUTSKAYA, SA , VORONOV, DL , ZUBAREV, EN , ARTYUKOV, IA , VINOGRADOV, AV , (2013) EFFECT OF WORKING GAS PRESSURE ON INTERLAYER MIXING IN MAGNETRON-DEPOSITED MO/SI MULTILAYERS.OPTICAL ENGINEERING. VOL. 52. ISSUE 9. P. - | 39 | 71% | 1 |
5 | BAI, HL , JIANG, EY , WU, P , LOU, ZD , (1999) SOFT X-RAY OPTICAL MULTILAYER MIRRORS.CHINESE SCIENCE BULLETIN. VOL. 44. ISSUE 12. P. 1057-1064 | 39 | 95% | 0 |
6 | PIROZHKOV, AS , RAGOZIN, EN , (2015) APERIODIC MULTILAYER STRUCTURES IN SOFT X-RAY OPTICS.PHYSICS-USPEKHI. VOL. 58. ISSUE 11. P. 1095 -1105 | 30 | 77% | 1 |
7 | PERSHIN, YP , SEVRYUKOVA, VA , ZUBAREV, EM , KONDRATENKO, VV , DERGUN, SM , (2011) IMPACT OF WORKING-GAS PRESSURE ON FORMATION OF INTERMIXED ZONES IN MO/SI MULTILAYER X-RAY MIRRORS FABRICATED BY MAGNETRON SPUTTERING.METALLOFIZIKA I NOVEISHIE TEKHNOLOGII. VOL. 33. ISSUE 11. P. 1513-1528 | 26 | 96% | 0 |
8 | CHOUEIKANI, F , BRIDOU, F , LAGARDE, B , MELTCHAKOV, E , POLACK, F , MERCERE, P , DELMOTTE, F , (2013) X-RAY PROPERTIES AND INTERFACE STUDY OF B4C/MO AND B4C/MO2C PERIODIC MULTILAYERS.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 111. ISSUE 1. P. 191 -198 | 23 | 96% | 5 |
9 | BURCKLEN, C , SOUFLI, R , DENNETIERE, D , POLACK, F , CAPITANIO, B , GULLIKSON, E , MELTCHAKOV, E , THOMASSET, M , JEROME, A , DE ROSSI, S , ET AL (2016) CR/B4C MULTILAYER MIRRORS: STUDY OF INTERFACES AND X-RAY REFLECTANCE.JOURNAL OF APPLIED PHYSICS. VOL. 119. ISSUE 12. P. - | 21 | 91% | 1 |
10 | MELTCHAKOV, E , HECQUET, C , ROULLIAY, M , DE ROSSI, S , MENESGUEN, Y , JEROME, A , BRIDOU, F , VARNIERE, F , RAVET-KRILL, MF , DELMOTTE, F , (2010) DEVELOPMENT OF AL-BASED MULTILAYER OPTICS FOR EUV.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 98. ISSUE 1. P. 111-117 | 24 | 92% | 15 |
Classes with closest relation at Level 1 |