Class information for:
Level 1: PHOTOEMISSION MICROSCOPY//SPECTROMICROSCOPY//XPEEM

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
11037 1013 26.1 63%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
277 3       NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//JOURNAL OF SYNCHROTRON RADIATION//NUCLEAR SCIENCE & TECHNOLOGY 43290
1283 2             X RAY OPTICS//X RAY MICROSCOPY//ZONE PLATE 8701
11037 1                   PHOTOEMISSION MICROSCOPY//SPECTROMICROSCOPY//XPEEM 1013

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PHOTOEMISSION MICROSCOPY authKW 375202 2% 66% 19
2 SPECTROMICROSCOPY authKW 351609 3% 33% 35
3 XPEEM authKW 295369 2% 47% 21
4 PEEM authKW 288416 3% 30% 32
5 EMISSION ELECTRON MICROSCOPE EEM authKW 180852 1% 100% 6
6 ELECTRON MIRROR authKW 175367 1% 73% 8
7 IST NEUROBIOL address 159991 2% 28% 19
8 WIEN FILTER authKW 159653 1% 38% 14
9 LEEM authKW 157490 2% 29% 18
10 PHOTOELECTRON EMISSION MICROSCOPY authKW 140000 1% 39% 12

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 17304 14% 0% 144
2 Instruments & Instrumentation 2651 17% 0% 168
3 Spectroscopy 2408 14% 0% 140
4 Physics, Applied 2312 32% 0% 325
5 Physics, Condensed Matter 971 18% 0% 181
6 Chemistry, Physical 521 18% 0% 179
7 Nanoscience & Nanotechnology 400 8% 0% 77
8 Nuclear Science & Technology 357 6% 0% 63
9 Optics 315 9% 0% 88
10 Physics, Nuclear 304 6% 0% 60

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IST NEUROBIOL 159991 2% 28% 19
2 IRAMIS SPCSI LENSIS 40188 0% 67% 2
3 AG NANOSYNC 30142 0% 100% 1
4 BEAM TECHNOL GRP 30142 0% 100% 1
5 ELECT PROPERTIES IFF 6 30142 0% 100% 1
6 FAK PHYS FMF 30142 0% 100% 1
7 FAKULTAT F PHYS NANOINTEGRAT CENIDE 30142 0% 100% 1
8 FB PHYS NANOINTEGRAT DUISBURG ESSEN CENIDE 30142 0% 100% 1
9 FESTKORPERFOR IFF 6 30142 0% 100% 1
10 FESTKORPERLASER 30142 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ULTRAMICROSCOPY 38059 8% 2% 84
2 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 27641 7% 1% 74
3 SURFACE REVIEW AND LETTERS 7144 2% 1% 25
4 REVIEW OF SCIENTIFIC INSTRUMENTS 6158 8% 0% 79
5 SURFACE AND INTERFACE ANALYSIS 4578 3% 0% 32
6 ADVANCES IN IMAGING AND ELECTRON PHYSICS 3894 1% 2% 7
7 OPTIK 2352 3% 0% 29
8 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 2205 6% 0% 56
9 SURFACE SCIENCE 1728 4% 0% 40
10 JOURNAL OF MICROSCOPY 1168 1% 0% 10

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 PHOTOEMISSION MICROSCOPY 375202 2% 66% 19 Search PHOTOEMISSION+MICROSCOPY Search PHOTOEMISSION+MICROSCOPY
2 SPECTROMICROSCOPY 351609 3% 33% 35 Search SPECTROMICROSCOPY Search SPECTROMICROSCOPY
3 XPEEM 295369 2% 47% 21 Search XPEEM Search XPEEM
4 PEEM 288416 3% 30% 32 Search PEEM Search PEEM
5 EMISSION ELECTRON MICROSCOPE EEM 180852 1% 100% 6 Search EMISSION+ELECTRON+MICROSCOPE+EEM Search EMISSION+ELECTRON+MICROSCOPE+EEM
6 ELECTRON MIRROR 175367 1% 73% 8 Search ELECTRON+MIRROR Search ELECTRON+MIRROR
7 WIEN FILTER 159653 1% 38% 14 Search WIEN+FILTER Search WIEN+FILTER
8 LEEM 157490 2% 29% 18 Search LEEM Search LEEM
9 PHOTOELECTRON EMISSION MICROSCOPY 140000 1% 39% 12 Search PHOTOELECTRON+EMISSION+MICROSCOPY Search PHOTOELECTRON+EMISSION+MICROSCOPY
10 MIRROR ELECTRON MICROSCOPY 125590 0% 83% 5 Search MIRROR+ELECTRON+MICROSCOPY Search MIRROR+ELECTRON+MICROSCOPY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 BAUER, E , (2012) A BRIEF HISTORY OF PEEM.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 185. ISSUE 10. P. 314-322 85 77% 8
2 GUNTHER, S , KAULICH, B , GREGORATTI, L , KISKINOVA, M , (2002) PHOTOELECTRON MICROSCOPY AND APPLICATIONS IN SURFACE AND MATERIALS SCIENCE.PROGRESS IN SURFACE SCIENCE. VOL. 70. ISSUE 4-8. P. 187 -260 99 59% 101
3 BAUER, E , (2009) CATHODE LENS ELECTRON MICROSCOPY: PAST AND FUTURE.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 21. ISSUE 31. P. - 48 89% 13
4 HAWKES, PW , (2012) EXAMPLES OF ELECTROSTATIC ELECTRON OPTICS: THE FARRAND AND ELEKTROS MICROSCOPES AND ELECTRON MIRRORS.ULTRAMICROSCOPY. VOL. 119. ISSUE . P. 9 -17 52 65% 1
5 BAUER, E , (2012) LEEM AND UHV-PEEM: A RETROSPECTIVE.ULTRAMICROSCOPY. VOL. 119. ISSUE . P. 18-23 33 89% 9
6 SCHONHENSE, G , ELMERS, HJ , NEPIJKO, SA , SCHNEIDER, CM , (2006) TIME-RESOLVED PHOTOEMISSION ELECTRON MICROSCOPY.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 142. VOL. 142. ISSUE . P. 159 -323 83 36% 24
7 SCHMIDT, T , SALA, A , MARCHETTO, H , UMBACH, E , FREUND, HJ , (2013) FIRST EXPERIMENTAL PROOF FOR ABERRATION CORRECTION IN XPEEM: RESOLUTION, TRANSMISSION ENHANCEMENT, AND LIMITATION BY SPACE CHARGE EFFECTS.ULTRAMICROSCOPY. VOL. 126. ISSUE . P. 23 -32 29 67% 13
8 MIYAMOTO, T , WADA, T , NIIMI, H , SUZUKI, S , KATO, M , KUDO, M , ASAKURA, K , (2012) A NEW COLLINEAR-TYPE ENERGY-FILTERED X-RAY PHOTOEMISSION ELECTRON MICROSCOPE EQUIPPED WITH A MULTI-POLE ABERRATION-CORRECTED AIR-CORE COIL WIEN FILTER.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 51. ISSUE 4. P. - 30 68% 0
9 ESCHER, M , WINKLER, K , RENAULT, O , BARRETT, N , (2010) APPLICATIONS OF HIGH LATERAL AND ENERGY RESOLUTION IMAGING XPS WITH A DOUBLE HEMISPHERICAL ANALYSER BASED SPECTROMICROSCOPE.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 178. ISSUE . P. 303 -316 27 73% 15
10 ASAKURA, K , NIIMI, H , KATO, M , (2010) ENERGY FILTERED X-RAY PHOTOEMISSION ELECTRON MICROSCOPY.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 162. VOL. 162. ISSUE . P. 1 -43 42 45% 2

Classes with closest relation at Level 1


Rank Class id link
1 16800 STXM//X RAY MICROSCOPY//BIMR
2 20392 CANONICAL ABERRATION THEORY//OPT PHYS ELECT ENGN//MAGNETIC SPECTROMETERS
3 14404 BACKSCATTERED ELECTRONS//DOPANT CONTRAST//SCANNING
4 33188 WESTERN UNIV SYNCHROTRON RADIAT//ANGLE RESOLVED NEXAFS//BIPOLAR RESISTIVE SWITCHING MECHANISM
5 5387 KINETIC OSCILLATIONS//PHYS CHEM ELEKTROCHEM//TRANSVERSAL PATTERNS
6 18594 SECOND ORDER FOCUSING//STATIC MASS SPECTROMETERS//ENERGY ANALYZER
7 13165 GASSENDI//VARIED LINE SPACING GRATING//SPHERICAL GRATING MONOCHROMATOR
8 12951 PHYS BIOL ULTRAFAST SCI TECHNOL//ULTRAFAST ELECTRON DIFFRACTION//ARTHUR AMOS NOYES CHEM PHYS
9 6270 SPIN SEM//SPIN POLARIZED PHOTOEMISSION//SPIN RESOLVED PHOTOEMISSION
10 16154 PROD DESIGN TECHNOL//CORE LENS//THIN LENS APPROXIMATION

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