Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
34087 | 116 | 13.1 | 36% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
3783 | 2 | LIQUID PHASE EPITAXY//MICROCHANNEL EPITAXY//ELECTROEPITAXY | 978 |
34087 | 1 | ALXGA1 XP//VAPOR PRESSURE CONTROL//SURFACE AND INTERFACE PHENOMENA | 116 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ALXGA1 XP | authKW | 526476 | 2% | 100% | 2 |
2 | VAPOR PRESSURE CONTROL | authKW | 526476 | 2% | 100% | 2 |
3 | SURFACE AND INTERFACE PHENOMENA | authKW | 350983 | 2% | 67% | 2 |
4 | TELECOMMUN ADVANCEMENTS ORG | address | 350983 | 2% | 67% | 2 |
5 | SENDAI | address | 318227 | 8% | 13% | 9 |
6 | CRYSTAL MORPHOLOGIES | authKW | 263238 | 1% | 100% | 1 |
7 | DEFECT FREE NUCLEATION | authKW | 263238 | 1% | 100% | 1 |
8 | GAP ALXGA1 XP | authKW | 263238 | 1% | 100% | 1 |
9 | GAPAS | authKW | 263238 | 1% | 100% | 1 |
10 | GRAIN BOUNDARY CHARGE TRANSPORTATION | authKW | 263238 | 1% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 782 | 53% | 0% | 61 |
2 | Physics, Condensed Matter | 360 | 30% | 0% | 35 |
3 | Engineering, Electrical & Electronic | 200 | 26% | 0% | 30 |
4 | Telecommunications | 160 | 10% | 0% | 12 |
5 | Optics | 157 | 16% | 0% | 19 |
6 | Materials Science, Multidisciplinary | 123 | 25% | 0% | 29 |
7 | Crystallography | 104 | 9% | 0% | 10 |
8 | Materials Science, Coatings & Films | 33 | 4% | 0% | 5 |
9 | Physics, Multidisciplinary | 20 | 8% | 0% | 9 |
10 | Instruments & Instrumentation | 8 | 3% | 0% | 4 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | TELECOMMUN ADVANCEMENTS ORG | 350983 | 2% | 67% | 2 |
2 | SENDAI | 318227 | 8% | 13% | 9 |
3 | LASHKAR SEMICOND PHYS | 263238 | 1% | 100% | 1 |
4 | AOBA YAMA 02 | 131618 | 1% | 50% | 1 |
5 | KAWAUCHI AOBA KU | 131618 | 1% | 50% | 1 |
6 | TSURUOKA | 131618 | 1% | 50% | 1 |
7 | CONTROL INFORMAT SYST ENGN | 65804 | 3% | 8% | 3 |
8 | SEMICOND FDN | 52646 | 1% | 20% | 1 |
9 | TELECOMMUN ADVANCEMENT ORG | 26322 | 1% | 10% | 1 |
10 | LASHKARYOV SEMICOND PHYS | 16678 | 3% | 2% | 3 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEE PROCEEDINGS-J OPTOELECTRONICS | 13874 | 4% | 1% | 5 |
2 | JOURNAL OF CRYSTAL AND MOLECULAR STRUCTURE | 8224 | 1% | 3% | 1 |
3 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 7975 | 11% | 0% | 13 |
4 | IEE PROCEEDINGS-OPTOELECTRONICS | 7957 | 4% | 1% | 5 |
5 | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 5114 | 7% | 0% | 8 |
6 | SEMICONDUCTORS | 2494 | 7% | 0% | 8 |
7 | JOURNAL OF ELECTRONIC MATERIALS | 1321 | 6% | 0% | 7 |
8 | MATERIALS SCIENCE & ENGINEERING R-REPORTS | 834 | 1% | 0% | 1 |
9 | UKRAINSKII FIZICHESKII ZHURNAL | 716 | 3% | 0% | 3 |
10 | JOURNAL OF CRYSTAL GROWTH | 677 | 8% | 0% | 9 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ALXGA1 XP | 526476 | 2% | 100% | 2 | Search ALXGA1+XP | Search ALXGA1+XP |
2 | VAPOR PRESSURE CONTROL | 526476 | 2% | 100% | 2 | Search VAPOR+PRESSURE+CONTROL | Search VAPOR+PRESSURE+CONTROL |
3 | SURFACE AND INTERFACE PHENOMENA | 350983 | 2% | 67% | 2 | Search SURFACE+AND+INTERFACE+PHENOMENA | Search SURFACE+AND+INTERFACE+PHENOMENA |
4 | CRYSTAL MORPHOLOGIES | 263238 | 1% | 100% | 1 | Search CRYSTAL+MORPHOLOGIES | Search CRYSTAL+MORPHOLOGIES |
5 | DEFECT FREE NUCLEATION | 263238 | 1% | 100% | 1 | Search DEFECT+FREE+NUCLEATION | Search DEFECT+FREE+NUCLEATION |
6 | GAP ALXGA1 XP | 263238 | 1% | 100% | 1 | Search GAP+ALXGA1+XP | Search GAP+ALXGA1+XP |
7 | GAPAS | 263238 | 1% | 100% | 1 | Search GAPAS | Search GAPAS |
8 | GRAIN BOUNDARY CHARGE TRANSPORTATION | 263238 | 1% | 100% | 1 | Search GRAIN+BOUNDARY+CHARGE+TRANSPORTATION | Search GRAIN+BOUNDARY+CHARGE+TRANSPORTATION |
9 | HIGHLY BI DOPED PBTE | 263238 | 1% | 100% | 1 | Search HIGHLY+BI+DOPED+PBTE | Search HIGHLY+BI+DOPED+PBTE |
10 | HYPOTHETICAL BOUNDARY | 263238 | 1% | 100% | 1 | Search HYPOTHETICAL+BOUNDARY | Search HYPOTHETICAL+BOUNDARY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | SAITO, T , SUTO, K , NISHIZAWA, J , KAWASAKI, M , (2001) SPONTANEOUS RAMAN SCATTERING IN [100], [110], AND [11-2] DIRECTIONAL GAP WAVEGUIDES.JOURNAL OF APPLIED PHYSICS. VOL. 90. ISSUE 4. P. 1831-1835 | 8 | 100% | 10 |
2 | YASUDA, A , SUTO, K , NISHIZAWA, J , (2014) LASING PROPERTIES OF PBSNTE/PBTE DOUBLE HETERO MID-INFRARED LASER DIODES GROWN BY TEMPERATURE DIFFERENCE METHOD UNDER CONTROLLED VAPOR PRESSURE LIQUID-PHASE EPITAXY.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 27. ISSUE . P. 159 -162 | 6 | 86% | 5 |
3 | YASUDA, A , SASAKI, T , SUTO, K , NISHIZAWA, J , (2015) MID-INFRARED TRANSMISSION IMAGING AND SPECTROSCOPY WITH PBSNTE LASER DIODES GROWN WITH STOICHIOMETRY-CONTROLLED LIQUID-PHASE EPITAXY.INFRARED PHYSICS & TECHNOLOGY. VOL. 72. ISSUE . P. 249 -253 | 8 | 57% | 0 |
4 | TANNO, T , SUTO, K , OYAMA, Y , NISHIZAWA, JI , (2003) NONSTOICHIOMETRIC DEEP LEVELS IN MG-DOPED GAP EPITAXIAL LAYERS: EFFECTS OF PRE-ANNEALING OF SUBSTRATES.JOURNAL OF ELECTRONIC MATERIALS. VOL. 32. ISSUE 3. P. 172-175 | 6 | 100% | 0 |
5 | OYAMA, Y , TANABE, T , KATO, Y , NISHIZAWA, JI , SASAKI, T , (2008) PBSNTE DOUBLE-HETERO JUNCTION LASER DIODE AND ITS APPLICATION TO MID-INFRARED SPECTROSCOPIC IMAGING.JOURNAL OF CRYSTAL GROWTH. VOL. 310. ISSUE 7-9. P. 1917-1922 | 5 | 100% | 2 |
6 | YASUDA, A , SUTO, K , TAKAHASHI, Y , NISHIZAWA, J , (2014) MID-INFRARED PHOTOCONDUCTIVE PROPERTIES OF HEAVILY BI-DOPED PBTE P-N HOMOJUNCTION DIODE GROWN BY LIQUID-PHASE EPITAXY.INFRARED PHYSICS & TECHNOLOGY. VOL. 67. ISSUE . P. 609 -612 | 5 | 83% | 2 |
7 | SAITO, T , SUTO, K , KIMURA, T , WATANABE, A , NISHIZAWA, J , (2000) RAMAN GAIN AND OPTICAL LOSS IN GAP-ALGAP WAVEGUIDES.JOURNAL OF APPLIED PHYSICS. VOL. 87. ISSUE 7. P. 3399-3403 | 6 | 100% | 7 |
8 | TANNO, T , SUTO, K , OYAMA, Y , NISHIZAWA, J , (2003) NONSTOICHIOMETRIC DEEP LEVELS IN MG-DOPED GAP EPITAXIAL LAYERS.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 6. ISSUE 5-6. P. 437-440 | 5 | 100% | 0 |
9 | SUTO, K , SAITO, T , KIMURA, T , NISHIZAWA, JI , TANABE, T , (2002) SEMICONDUCTOR RAMAN AMPLIFIER FOR TERAHERTZ BANDWIDTH OPTICAL COMMUNICATION.JOURNAL OF LIGHTWAVE TECHNOLOGY. VOL. 20. ISSUE 4. P. 705-711 | 8 | 62% | 12 |
10 | SUTO, K , ADACHI, S , YONEYAMA, T , NISHIZAWA, J , (1996) FREE EXCITON RECOMBINATION IN GAP AND GAP/ALXGA1-XP LAYERS GROWN BY TEMPERATURE DIFFERENCE METHOD UNDER CONTROLLED VAPOR PRESSURE.JOURNAL OF CRYSTAL GROWTH. VOL. 160. ISSUE 1-2. P. 13-20 | 7 | 88% | 1 |
Classes with closest relation at Level 1 |