Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 35106 | 102 | 14.4 | 30% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 48 | 3 | THERMOELECTRIC//QUANTUM DOTS//MATERIALS SCIENCE, MULTIDISCIPLINARY | 93648 |
| 2458 | 2 | LEAD TELLURIDE//SOVIET PHYSICS SEMICONDUCTORS-USSR//PBTE | 4027 |
| 35106 | 1 | LEAD SELENITE//ARMAMENT DEV ENGN COMMAND//ATTN RDAR MEF A | 102 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | LEAD SELENITE | authKW | 673578 | 3% | 75% | 3 |
| 2 | ARMAMENT DEV ENGN COMMAND | address | 299369 | 1% | 100% | 1 |
| 3 | ATTN RDAR MEF A | address | 299369 | 1% | 100% | 1 |
| 4 | ATTN RDRL SEE I | address | 299369 | 1% | 100% | 1 |
| 5 | CHALKOGENIDE | authKW | 299369 | 1% | 100% | 1 |
| 6 | EBIC EFFECT | authKW | 299369 | 1% | 100% | 1 |
| 7 | INFRARED SPECTRAL RANGE | authKW | 299369 | 1% | 100% | 1 |
| 8 | LEAD TELLURIDE FILM | authKW | 299369 | 1% | 100% | 1 |
| 9 | OXYGEN AND IODINE | authKW | 299369 | 1% | 100% | 1 |
| 10 | PB1 XCDXSE ALLOYS | authKW | 299369 | 1% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 1450 | 62% | 0% | 63 |
| 2 | Materials Science, Ceramics | 886 | 19% | 0% | 19 |
| 3 | Engineering, General | 10 | 3% | 0% | 3 |
| 4 | Physics, Applied | 8 | 9% | 0% | 9 |
| 5 | Instruments & Instrumentation | 4 | 3% | 0% | 3 |
| 6 | Materials Science, Multidisciplinary | 2 | 7% | 0% | 7 |
| 7 | Materials Science, Coatings & Films | 0 | 1% | 0% | 1 |
| 8 | Engineering, Electrical & Electronic | 0 | 4% | 0% | 4 |
| 9 | Spectroscopy | 0 | 1% | 0% | 1 |
| 10 | Chemistry, Applied | 0 | 1% | 0% | 1 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ARMAMENT DEV ENGN COMMAND | 299369 | 1% | 100% | 1 |
| 2 | ATTN RDAR MEF A | 299369 | 1% | 100% | 1 |
| 3 | ATTN RDRL SEE I | 299369 | 1% | 100% | 1 |
| 4 | PHYS IND PHYS | 13606 | 1% | 5% | 1 |
| 5 | KONSTANTINOV ST PETERSBURG NUCL PHYS | 6651 | 1% | 2% | 1 |
| 6 | SILICATE CHEM | 3457 | 2% | 1% | 2 |
| 7 | GREBENSHCHIKOV SILICATE CHEM | 3447 | 2% | 1% | 2 |
| 8 | IV GREBENSHCHIKOV SILICATE CHEM | 2097 | 2% | 0% | 2 |
| 9 | IND PHYS | 1329 | 1% | 0% | 1 |
| 10 | PETRODVORETS BRANCH | 1277 | 1% | 0% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 58570 | 32% | 1% | 33 |
| 2 | GLASS PHYSICS AND CHEMISTRY | 52141 | 18% | 1% | 18 |
| 3 | SEMICONDUCTORS | 19631 | 21% | 0% | 21 |
| 4 | SOVIET MICROELECTRONICS | 4001 | 2% | 1% | 2 |
| 5 | JOURNAL OF OVONIC RESEARCH | 1225 | 1% | 0% | 1 |
| 6 | INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 670 | 3% | 0% | 3 |
| 7 | JOURNAL OF SURFACE INVESTIGATION | 535 | 1% | 0% | 1 |
| 8 | UKRAINSKII FIZICHESKII ZHURNAL | 361 | 2% | 0% | 2 |
| 9 | JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS | 295 | 1% | 0% | 1 |
| 10 | USPEKHI KHIMII | 157 | 1% | 0% | 1 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | LEAD SELENITE | 673578 | 3% | 75% | 3 | Search LEAD+SELENITE | Search LEAD+SELENITE |
| 2 | CHALKOGENIDE | 299369 | 1% | 100% | 1 | Search CHALKOGENIDE | Search CHALKOGENIDE |
| 3 | EBIC EFFECT | 299369 | 1% | 100% | 1 | Search EBIC+EFFECT | Search EBIC+EFFECT |
| 4 | INFRARED SPECTRAL RANGE | 299369 | 1% | 100% | 1 | Search INFRARED+SPECTRAL+RANGE | Search INFRARED+SPECTRAL+RANGE |
| 5 | LEAD TELLURIDE FILM | 299369 | 1% | 100% | 1 | Search LEAD+TELLURIDE+FILM | Search LEAD+TELLURIDE+FILM |
| 6 | OXYGEN AND IODINE | 299369 | 1% | 100% | 1 | Search OXYGEN+AND+IODINE | Search OXYGEN+AND+IODINE |
| 7 | PB1 XCDXSE ALLOYS | 299369 | 1% | 100% | 1 | Search PB1+XCDXSE+ALLOYS | Search PB1+XCDXSE+ALLOYS |
| 8 | WHISKER CRYSTALS | 149683 | 1% | 50% | 1 | Search WHISKER+CRYSTALS | Search WHISKER+CRYSTALS |
| 9 | LEAD SELENIDE | 106908 | 5% | 7% | 5 | Search LEAD+SELENIDE | Search LEAD+SELENIDE |
| 10 | NARROW BAND SEMICONDUCTOR | 99788 | 1% | 33% | 1 | Search NARROW+BAND+SEMICONDUCTOR | Search NARROW+BAND+SEMICONDUCTOR |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | TOMAEV, VV , MAZUR, AS , GREVTSEV, AS , (2017) A STUDY OF THE PROCESS OF THERMAL OXIDATION OF LEAD SELENIDE BY THE NMR AND XRD METHODS.GLASS PHYSICS AND CHEMISTRY. VOL. 43. ISSUE 1. P. 70 -74 | 14 | 78% | 0 |
| 2 | TOMAEV, VV , PETROV, YV , (2012) PREPARATION OF OXIDIZED PBSEO3 FILMS FROM PBSE FILMS.GLASS PHYSICS AND CHEMISTRY. VOL. 38. ISSUE 2. P. 240 -244 | 9 | 90% | 1 |
| 3 | ATAKULOV, SB , ZAINOLOBIDINOVA, SM , NABIEV, GA , TUKHTAMATOV, OA , (2012) EFFECT OF THE STRUCTURAL FEATURES OF POLYCRYSTALLINE SEMICONDUCTOR FILMS ON THE FORMATION OF ANOMALOUS PHOTOVOLTAGE: I. PHENOMENON MECHANISM.SEMICONDUCTORS. VOL. 46. ISSUE 6. P. 708-713 | 8 | 100% | 0 |
| 4 | PANOV, MF , TOMAEV, VV , (2012) OPTICAL REFLECTION OF OXIDIZED PBSE FILMS IN THE INFRARED SPECTRAL RANGE.GLASS PHYSICS AND CHEMISTRY. VOL. 38. ISSUE 4. P. 419 -426 | 8 | 89% | 1 |
| 5 | TOMAEV, VV , (2009) FERROELECTRIC PHASE TRANSITION IN THE PBSE + PBSEO3 COMPOSITE.GLASS PHYSICS AND CHEMISTRY. VOL. 35. ISSUE 6. P. 660-667 | 8 | 89% | 1 |
| 6 | MARAEVA, EV , MOSHNIKOV, VA , TAIROV, YM , (2013) MODELS OF THE FORMATION OF OXIDE PHASES IN NANOSTRUCTURED MATERIALS BASED ON LEAD CHALCOGENIDES SUBJECTED TO TREATMENT IN OXYGEN AND IODINE VAPORS.SEMICONDUCTORS. VOL. 47. ISSUE 10. P. 1422-1425 | 11 | 52% | 4 |
| 7 | TOMAEV, VV , EGOROV, SV , STOYANOVA, TV , (2014) INVESTIGATION INTO THE PHOTOSENSITIVITY OF A COMPOSITE FROM LEAD SELENIDE AND SELENITE IN UV REGION OF SPECTRUM.GLASS PHYSICS AND CHEMISTRY. VOL. 40. ISSUE 2. P. 208-214 | 11 | 50% | 3 |
| 8 | ATAKULOV, SB , ZAINOLOBIDINOVA, SM , NABIEV, GA , TUKHTAMATOV, OA , (2012) EFFECT OF THE STRUCTURAL FEATURES OF POLYCRYSTALLINE SEMICONDUCTOR FILMS ON THE FORMATION OF ANOMALOUS PHOTOVOLTAGE: II. COMPARISON WITH EXPERIMENT.SEMICONDUCTORS. VOL. 46. ISSUE 6. P. 714-718 | 7 | 70% | 0 |
| 9 | CHERNICHKIN, VI , DOBROVOLSKY, AA , DASHEVSKY, ZM , KASIYAN, VA , BEL'KOV, VV , GANICHEV, SD , DANILOV, SN , RYABOVA, LI , KHOKHLOV, DR , (2011) PHOTOCONDUCTIVITY OF PBTE:IN FILMS WITH VARIABLE MICROSTRUCTURE.SEMICONDUCTORS. VOL. 45. ISSUE 11. P. 1474 -1478 | 7 | 54% | 0 |
| 10 | TOMAEV, VV , PANOV, MF , (2006) ELLIPSOMETRIC CONTROL OF THE PARAMETERS OF LEAD SELENIDE FILMS DURING OXIDATION.GLASS PHYSICS AND CHEMISTRY. VOL. 32. ISSUE 3. P. 370-373 | 4 | 100% | 3 |
Classes with closest relation at Level 1 |