Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
2007 | 2389 | 17.8 | 66% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
12 | 3 | DIAMOND AND RELATED MATERIALS//GRAPHENE//CARBON NANOTUBES | 130454 |
201 | 2 | DIAMOND AND RELATED MATERIALS//DIAMOND//DIAMOND FILM | 21288 |
2007 | 1 | FIELD EMISSION//FIELD EMITTER ARRAY//VACUUM MICROELECTRONICS | 2389 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | FIELD EMISSION | authKW | 797427 | 16% | 16% | 383 |
2 | FIELD EMITTER ARRAY | authKW | 454815 | 3% | 57% | 62 |
3 | VACUUM MICROELECTRONICS | authKW | 391662 | 2% | 54% | 57 |
4 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | journal | 327708 | 27% | 4% | 652 |
5 | ELECTRON FIELD EMISSION | authKW | 264180 | 3% | 28% | 75 |
6 | FIELD EMITTER | authKW | 204805 | 2% | 35% | 46 |
7 | FIELD ELECTRON EMISSION | authKW | 84584 | 1% | 23% | 29 |
8 | FIELD EMISSION ARRAY | authKW | 81788 | 0% | 80% | 8 |
9 | EMISSION STABILITY | authKW | 77308 | 0% | 55% | 11 |
10 | ELECTRON EMISSION | authKW | 75934 | 3% | 10% | 62 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 29396 | 70% | 0% | 1667 |
2 | Nanoscience & Nanotechnology | 20647 | 32% | 0% | 755 |
3 | Engineering, Electrical & Electronic | 9846 | 38% | 0% | 915 |
4 | Materials Science, Coatings & Films | 6003 | 12% | 0% | 281 |
5 | Materials Science, Multidisciplinary | 1543 | 20% | 0% | 488 |
6 | Physics, Condensed Matter | 1233 | 14% | 0% | 329 |
7 | Microscopy | 307 | 1% | 0% | 32 |
8 | Chemistry, Physical | 114 | 8% | 0% | 191 |
9 | Physics, Multidisciplinary | 85 | 5% | 0% | 109 |
10 | Instruments & Instrumentation | 54 | 2% | 0% | 57 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | FLAT PANEL DISPLAY | 75888 | 1% | 42% | 14 |
2 | FED RD | 65723 | 0% | 86% | 6 |
3 | CENT MICROSTRUCT IL | 62317 | 1% | 26% | 19 |
4 | EQUIPE EMISS ELECT | 58415 | 0% | 57% | 8 |
5 | GEN SCI MICROSYST TECHNOL | 40894 | 0% | 80% | 4 |
6 | ORION ELECT CO | 40894 | 0% | 80% | 4 |
7 | TOYOOKA TORY | 38340 | 0% | 100% | 3 |
8 | ADV PROJECTS | 30413 | 0% | 24% | 10 |
9 | GUANGDONG PROV DISPLAY MAT TECHNOL | 29415 | 1% | 10% | 22 |
10 | DIGITAL DNA | 28747 | 0% | 38% | 6 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 327708 | 27% | 4% | 652 |
2 | DIAMOND AND RELATED MATERIALS | 60490 | 8% | 3% | 185 |
3 | NEW DIAMOND AND FRONTIER CARBON TECHNOLOGY | 22209 | 1% | 8% | 22 |
4 | DIAMOND FILMS AND TECHNOLOGY | 12156 | 0% | 9% | 11 |
5 | APPLIED SURFACE SCIENCE | 6964 | 6% | 0% | 140 |
6 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 6535 | 4% | 1% | 89 |
7 | APPLIED PHYSICS LETTERS | 3693 | 8% | 0% | 184 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2723 | 3% | 0% | 83 |
9 | ULTRAMICROSCOPY | 1745 | 1% | 1% | 28 |
10 | JOURNAL OF APPLIED PHYSICS | 1609 | 5% | 0% | 122 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | FIELD EMISSION | 797427 | 16% | 16% | 383 | Search FIELD+EMISSION | Search FIELD+EMISSION |
2 | FIELD EMITTER ARRAY | 454815 | 3% | 57% | 62 | Search FIELD+EMITTER+ARRAY | Search FIELD+EMITTER+ARRAY |
3 | VACUUM MICROELECTRONICS | 391662 | 2% | 54% | 57 | Search VACUUM+MICROELECTRONICS | Search VACUUM+MICROELECTRONICS |
4 | ELECTRON FIELD EMISSION | 264180 | 3% | 28% | 75 | Search ELECTRON+FIELD+EMISSION | Search ELECTRON+FIELD+EMISSION |
5 | FIELD EMITTER | 204805 | 2% | 35% | 46 | Search FIELD+EMITTER | Search FIELD+EMITTER |
6 | FIELD ELECTRON EMISSION | 84584 | 1% | 23% | 29 | Search FIELD+ELECTRON+EMISSION | Search FIELD+ELECTRON+EMISSION |
7 | FIELD EMISSION ARRAY | 81788 | 0% | 80% | 8 | Search FIELD+EMISSION+ARRAY | Search FIELD+EMISSION+ARRAY |
8 | EMISSION STABILITY | 77308 | 0% | 55% | 11 | Search EMISSION+STABILITY | Search EMISSION+STABILITY |
9 | ELECTRON EMISSION | 75934 | 3% | 10% | 62 | Search ELECTRON+EMISSION | Search ELECTRON+EMISSION |
10 | COLD CATHODE | 72225 | 1% | 27% | 21 | Search COLD+CATHODE | Search COLD+CATHODE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | TEMPLE, D , (1999) RECENT PROGRESS IN FIELD EMITTER ARRAY DEVELOPMENT FOR HIGH PERFORMANCE APPLICATIONS.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 24. ISSUE 5. P. 185 -239 | 110 | 89% | 165 |
2 | XU, NS , HUQ, SE , (2005) NOVEL COLD CATHODE MATERIALS AND APPLICATIONS.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 48. ISSUE 2-5. P. 47 -189 | 96 | 35% | 338 |
3 | NAGAO, M , YOSHIDA, T , (2015) FABRICATION OF GATED NANO ELECTRON SOURCE FOR VACUUM NANOELECTRONICS.MICROELECTRONIC ENGINEERING. VOL. 132. ISSUE . P. 14 -20 | 36 | 95% | 1 |
4 | YAMADA, T , MASUZAWA, T , MIMURA, H , OKANO, K , (2016) ELECTRON EMISSION FROM CONDUCTION BAND OF HEAVILY PHOSPHORUS DOPED DIAMOND NEGATIVE ELECTRON AFFINITY SURFACE.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 49. ISSUE 4. P. - | 26 | 81% | 1 |
5 | NICOLAESCU, D , NAGAO, M , SATO, T , FILIP, V , KANEMARU, S , ITOH, J , (2005) EMISSION STATISTICS FOR SI AND HFC EMITTER ARRAYS AFTER RESIDUAL GAS EXPOSURE.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 23. ISSUE 2. P. 707-717 | 34 | 85% | 8 |
6 | KANG, WP , DAVIDSON, JL , WISITSORA-AT, A , KERNS, DV , KERNS, S , (2001) RECENT DEVELOPMENT OF DIAMOND MICROTIP FIELD EMITTER CATHODES AND DEVICES.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 19. ISSUE 3. P. 936 -941 | 32 | 97% | 21 |
7 | BURDEN, AP , (2001) MATERIALS FOR FIELD EMISSION DISPLAYS.INTERNATIONAL MATERIALS REVIEWS. VOL. 46. ISSUE 5. P. 213 -231 | 65 | 44% | 17 |
8 | HELFENSTEIN, P , JEFIMOVS, K , KIRK, E , ESCHER, C , FINK, HW , TSUJINO, S , (2012) FABRICATION OF METALLIC DOUBLE-GATE FIELD EMITTER ARRAYS AND THEIR ELECTRON BEAM COLLIMATION CHARACTERISTICS.JOURNAL OF APPLIED PHYSICS. VOL. 112. ISSUE 9. P. - | 24 | 86% | 7 |
9 | DAVIDSON, JL , KANG, WP , WISITSORA-AT, A , (2003) DIAMOND FIELD EMISSION DEVICES.DIAMOND AND RELATED MATERIALS. VOL. 12. ISSUE 3-7. P. 429-433 | 27 | 96% | 23 |
10 | TERNYAK, O , AKHVLEDIANI, R , HOFFMAN, A , WONG, WK , LEE, ST , LIFSHITZ, Y , DAREN, S , CHEIFETZ, E , (2005) FIELD ELECTRON EMISSION FROM UNDOPED, CONTINUOUS, SUBMICRON-THICK DIAMOND FILMS.JOURNAL OF APPLIED PHYSICS. VOL. 98. ISSUE 12. P. - | 31 | 79% | 16 |
Classes with closest relation at Level 1 |