Class information for:
Level 1: TIME COMPRESSION AMPLIFICATION//CHARGE INJECTION PHOTOGATE//STANDARD CMOS PROCESSES

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
32048 144 15.6 27%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
47 3       PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER 93961
3050 2             SOVIET PHYSICS SEMICONDUCTORS-USSR//PHYS MICROSTRUCT//MOBILITY SPECTRUM ANALYSIS 2452
32048 1                   TIME COMPRESSION AMPLIFICATION//CHARGE INJECTION PHOTOGATE//STANDARD CMOS PROCESSES 144

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 TIME COMPRESSION AMPLIFICATION authKW 636157 2% 100% 3
2 CHARGE INJECTION PHOTOGATE authKW 424105 1% 100% 2
3 STANDARD CMOS PROCESSES authKW 282735 1% 67% 2
4 CURRENT TRANSFORMATION COEFFICIENT authKW 212052 1% 100% 1
5 DISTRIBUTION OF RADIATION INTENSITY authKW 212052 1% 100% 1
6 ENHANCED NIR IMAGING authKW 212052 1% 100% 1
7 GE SCHOTTKY PHOTODETECTOR authKW 212052 1% 100% 1
8 HIGH SPEED NIR IMAGING authKW 212052 1% 100% 1
9 INTERNAL AMPLIFICATION authKW 212052 1% 100% 1
10 ITO N SI PHOTODETECTOR authKW 212052 1% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 871 50% 0% 72
2 Physics, Condensed Matter 743 38% 0% 55
3 Engineering, Electrical & Electronic 189 23% 0% 33
4 Instruments & Instrumentation 182 12% 0% 17
5 Materials Science, Multidisciplinary 124 23% 0% 33
6 Optics 93 12% 0% 17
7 Materials Science, Coatings & Films 38 4% 0% 6
8 Physics, Multidisciplinary 19 7% 0% 10
9 Telecommunications 9 3% 0% 4
10 Multidisciplinary Sciences 6 1% 0% 2

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PHOTODETECTOR ARRAYS GRP 212052 1% 100% 1
2 PHOTOELECT ENERGY DEVICE PLICAT 212048 2% 33% 3
3 INAOE 33925 1% 8% 2
4 MEASUREMENT ANAL 3211 1% 2% 1
5 MICROELE 2278 1% 1% 1
6 STATE SCI RUSSIAN FEDERAT 836 1% 0% 1
7 SOLID STATE PHYS SECT 631 1% 0% 1
8 CFM 604 1% 0% 1
9 COMP SYST ENGN 529 1% 0% 1
10 SOLID STATE SECT 522 1% 0% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 INFRARED PHYSICS 16658 6% 1% 9
2 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 4645 15% 0% 21
3 PISMA V ZHURNAL TEKHNICHESKOI FIZIKI 2693 6% 0% 8
4 SOVIET PHYSICS SEMICONDUCTORS-USSR 2425 6% 0% 8
5 SENSORS AND ACTUATORS A-PHYSICAL 1358 6% 0% 8
6 GEC JOURNAL OF RESEARCH 1231 1% 1% 1
7 UKRAINSKII FIZICHESKII ZHURNAL 1026 3% 0% 4
8 PROGRESS IN QUANTUM ELECTRONICS 949 1% 0% 1
9 DOKLADY AKADEMII NAUK BELARUSI 660 2% 0% 3
10 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 590 3% 0% 5

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 TIME COMPRESSION AMPLIFICATION 636157 2% 100% 3 Search TIME+COMPRESSION+AMPLIFICATION Search TIME+COMPRESSION+AMPLIFICATION
2 CHARGE INJECTION PHOTOGATE 424105 1% 100% 2 Search CHARGE+INJECTION+PHOTOGATE Search CHARGE+INJECTION+PHOTOGATE
3 STANDARD CMOS PROCESSES 282735 1% 67% 2 Search STANDARD+CMOS+PROCESSES Search STANDARD+CMOS+PROCESSES
4 CURRENT TRANSFORMATION COEFFICIENT 212052 1% 100% 1 Search CURRENT+TRANSFORMATION+COEFFICIENT Search CURRENT+TRANSFORMATION+COEFFICIENT
5 DISTRIBUTION OF RADIATION INTENSITY 212052 1% 100% 1 Search DISTRIBUTION+OF+RADIATION+INTENSITY Search DISTRIBUTION+OF+RADIATION+INTENSITY
6 ENHANCED NIR IMAGING 212052 1% 100% 1 Search ENHANCED+NIR+IMAGING Search ENHANCED+NIR+IMAGING
7 GE SCHOTTKY PHOTODETECTOR 212052 1% 100% 1 Search GE+SCHOTTKY+PHOTODETECTOR Search GE+SCHOTTKY+PHOTODETECTOR
8 HIGH SPEED NIR IMAGING 212052 1% 100% 1 Search HIGH+SPEED+NIR+IMAGING Search HIGH+SPEED+NIR+IMAGING
9 INTERNAL AMPLIFICATION 212052 1% 100% 1 Search INTERNAL+AMPLIFICATION Search INTERNAL+AMPLIFICATION
10 ITO N SI PHOTODETECTOR 212052 1% 100% 1 Search ITO+N+SI+PHOTODETECTOR Search ITO+N+SI+PHOTODETECTOR

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 NOWAK, M , (1987) PHOTOELECTROMAGNETIC EFFECT IN SEMICONDUCTORS AND ITS APPLICATIONS.PROGRESS IN QUANTUM ELECTRONICS. VOL. 11. ISSUE 3-4. P. 205-346 36 75% 8
2 NOWAK, M , SOLECKA, B , JESIONEK, M , (2014) PHOTOELECTROMAGNETIC INVESTIGATIONS OF GRAPHENE.ACTA PHYSICA POLONICA A. VOL. 126. ISSUE 5. P. 1104 -1106 7 70% 0
3 AUGELLI, V , NOWAK, M , (1999) DISTRIBUTION OF RADIATION INTENSITY IN A THIN SEMICONDUCTOR FILM ON A THICK SUBSTRATE.THIN SOLID FILMS. VOL. 338. ISSUE 1-2. P. 188-196 7 78% 0
4 MALIK, O , GRIMALSKY, V , DE LA HIDALGA-W, J , (2006) BEHAVIOR OF AN OPTICAL SENSOR BASED ON NON-IDEAL SILICON CAPACITORS: FROM AMPLIFICATION TO GENERATION.SENSORS AND ACTUATORS A-PHYSICAL. VOL. 130. ISSUE . P. 208-213 4 80% 4
5 KIKUCHI, K , (1993) AN H-L JUNCTION ROOM-TEMPERATURE LONG-WAVELENGTH IR DETECTOR USING THE AVALANCHE EFFECT.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 26. ISSUE 10. P. 1727-1730 5 100% 1
6 NOWAK, M , (1994) DISTRIBUTION OF RADIATION INTENSITY IN A SEMICONDUCTOR FILM.OPTICAL ENGINEERING. VOL. 33. ISSUE 5. P. 1501-1510 8 57% 1
7 KIKUCHI, K , (1991) IMPROVEMENT OF RESPONSIVITY OF A ROOM-TEMPERATURE 10.6 MU-M SENSOR USING AN INTRA-BAND TRANSITION.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 40. ISSUE 6. P. 962-965 5 100% 0
8 LONCIERZ, B , MURRI, R , NOWAK, M , (1995) DETERMINING CARRIER LIFETIME USING FREQUENCY-DEPENDENCE IN CONTACTLESS PHOTOELECTROMAGNETIC INVESTIGATIONS OF SEMICONDUCTORS.THIN SOLID FILMS. VOL. 266. ISSUE 2. P. 274-277 4 100% 0
9 SADYGOV, ZY , BURBAEV, TM , KURBATOV, VA , (2001) AN AVALANCHE PHOTODIODE WITH METAL-INSULATOR-SEMICONDUCTOR PROPERTIES.SEMICONDUCTORS. VOL. 35. ISSUE 1. P. 117-121 4 80% 0
10 LOU, LF , KITAZAKI, KS , (1989) PHOTON-EMISSION FROM METAL-OXIDE-SEMICONDUCTOR CAPACITORS UNDER FAST-RAMP CONDITIONS.JOURNAL OF APPLIED PHYSICS. VOL. 66. ISSUE 11. P. 5618-5621 5 100% 0

Classes with closest relation at Level 1


Rank Class id link
1 37370 HIGH TECH KUNSTSTOFF HTIK//SIOX LAYER//SURA PLASMA
2 26390 STIMULATED INFRARED EMISSION//2D INFRARED IMAGING//8 12 MU M SPECTRAL RANGE
3 29635 SOVIET PHYSICS SEMICONDUCTORS-USSR//AIII B V//AMORPHOUS SILICON GERMANIUM MOBILITY GAP PROFILE
4 24480 MOBILITY SPECTRUM ANALYSIS//QUANTITATIVE MOBILITY SPECTRUM ANALYSIS QMSA//MAGNETO TRANSPORT MEASUREMENT
5 15060 PLASMA PHYS PLASMA SOURCES//OPTICAL CONSTANTS//JOINT MODERN METROL
6 32383 ACOUSTIC SIGNAL FROM NEUTRINO BEAM//FORECAST OF EARTHQUAKE//QGSJET
7 28543 SUSPENDED STRIPLINE SSL//ANTISYMMETRIC PROBES//CROSS BAR MIXER
8 23114 LEHRSTUHL HALBLEITERTECH//MOS TUNNEL STRUCTURE//SI MIS TET
9 6648 AVALANCHE PHOTODIODE//EXCESS NOISE FACTOR//IMPACT IONIZATION
10 20489 PN JUNCTION LEAKAGE//IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE

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