Class information for:
Level 1: PLASMA PHYS PLASMA SOURCES//OPTICAL CONSTANTS//JOINT MODERN METROL

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
15060 733 17.6 50%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
637 3       SCULPTURED THIN FILMS//MUELLER MATRIX//GLANCING ANGLE DEPOSITION 12611
1771 2             LASER INDUCED DAMAGE//ELLIPSOMETRY//APPLIED OPTICS 6386
15060 1                   PLASMA PHYS PLASMA SOURCES//OPTICAL CONSTANTS//JOINT MODERN METROL 733

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PLASMA PHYS PLASMA SOURCES address 501255 3% 63% 19
2 OPTICAL CONSTANTS authKW 226465 10% 8% 72
3 JOINT MODERN METROL address 214233 1% 86% 6
4 NON UNIFORM THIN FILMS authKW 208283 1% 100% 5
5 ALUMINUM DOPED ZINC OXIDE ZNOAL authKW 173568 1% 83% 5
6 ABELES EQUATIONS authKW 124970 0% 100% 3
7 OPTICAL CONDUCTIVITY MEASUREMENT authKW 124970 0% 100% 3
8 RG PLASMA TECHNOL address 124964 1% 50% 6
9 CZECH METROL address 99969 1% 40% 6
10 SPECTROSCOPIC REFLECTOMETRY authKW 99969 1% 40% 6

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Optics 7092 41% 0% 301
2 Materials Science, Coatings & Films 4315 18% 0% 130
3 Physics, Applied 2410 38% 0% 277
4 Materials Science, Multidisciplinary 1323 31% 0% 230
5 Physics, Condensed Matter 1158 22% 0% 163
6 Instruments & Instrumentation 141 5% 0% 38
7 Spectroscopy 59 3% 0% 23
8 Physics, Multidisciplinary 34 5% 0% 36
9 Materials Science, Ceramics 24 2% 0% 11
10 Engineering, General 15 2% 0% 12

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PLASMA PHYS PLASMA SOURCES 501255 3% 63% 19
2 JOINT MODERN METROL 214233 1% 86% 6
3 RG PLASMA TECHNOL 124964 1% 50% 6
4 CZECH METROL 99969 1% 40% 6
5 AGE SCI ARTS 41657 0% 100% 1
6 AV NIKOLAEV INORGAN CHEM ELE OCHEM 41657 0% 100% 1
7 BEIJING SOLAR ENERGY BLDG ENERGY SAVING 41657 0% 100% 1
8 BEING CO2 UTILIZAT REDUCT TECHNOL 41657 0% 100% 1
9 CENT S PHOTOPROC 41657 0% 100% 1
10 CNRS GEORGIA TECH 41657 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 APPLIED OPTICS 16041 16% 0% 116
2 THIN SOLID FILMS 13379 15% 0% 108
3 ACTA PHYSICA SLOVACA 5604 2% 1% 11
4 OPTICS AND LASER TECHNOLOGY 2629 2% 0% 17
5 JOURNAL OF OPTICAL TECHNOLOGY 1613 2% 0% 11
6 SOVIET JOURNAL OF OPTICAL TECHNOLOGY 1432 1% 1% 5
7 SURFACE AND INTERFACE ANALYSIS 1033 2% 0% 13
8 JOURNAL OF PHYSICS D-APPLIED PHYSICS 1020 3% 0% 23
9 DIAMOND AND RELATED MATERIALS 954 2% 0% 13
10 JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS 933 2% 0% 11

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 OPTICAL CONSTANTS 226465 10% 8% 72 Search OPTICAL+CONSTANTS Search OPTICAL+CONSTANTS
2 NON UNIFORM THIN FILMS 208283 1% 100% 5 Search NON+UNIFORM+THIN+FILMS Search NON+UNIFORM+THIN+FILMS
3 ALUMINUM DOPED ZINC OXIDE ZNOAL 173568 1% 83% 5 Search ALUMINUM+DOPED+ZINC+OXIDE+ZNOAL Search ALUMINUM+DOPED+ZINC+OXIDE+ZNOAL
4 ABELES EQUATIONS 124970 0% 100% 3 Search ABELES+EQUATIONS Search ABELES+EQUATIONS
5 OPTICAL CONDUCTIVITY MEASUREMENT 124970 0% 100% 3 Search OPTICAL+CONDUCTIVITY+MEASUREMENT Search OPTICAL+CONDUCTIVITY+MEASUREMENT
6 SPECTROSCOPIC REFLECTOMETRY 99969 1% 40% 6 Search SPECTROSCOPIC+REFLECTOMETRY Search SPECTROSCOPIC+REFLECTOMETRY
7 SINGLE OSCILLATOR PARAMETERS 95212 1% 57% 4 Search SINGLE+OSCILLATOR+PARAMETERS Search SINGLE+OSCILLATOR+PARAMETERS
8 ERROR PARALLELEPIPEDS 83313 0% 100% 2 Search ERROR+PARALLELEPIPEDS Search ERROR+PARALLELEPIPEDS
9 IMAGING SPECTROPHOTOMETRY 83313 0% 100% 2 Search IMAGING+SPECTROPHOTOMETRY Search IMAGING+SPECTROPHOTOMETRY
10 IMAGING SPECTROSCOPIC REFLECTOMETRY 83313 0% 100% 2 Search IMAGING+SPECTROSCOPIC+REFLECTOMETRY Search IMAGING+SPECTROSCOPIC+REFLECTOMETRY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 NECAS, D , OHLIDAL, I , FRANTA, D , OHLIDAL, M , VODAK, J , (2016) SIMULTANEOUS DETERMINATION OF OPTICAL CONSTANTS, LOCAL THICKNESS AND ROUGHNESS OF ZNSE THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY.JOURNAL OF OPTICS. VOL. 18. ISSUE 1. P. - 21 70% 0
2 NECAS, D , OHLIDAL, I , FRANTA, D , OHLIDAL, M , CUDEK, V , VODAK, J , (2014) MEASUREMENT OF THICKNESS DISTRIBUTION, OPTICAL CONSTANTS, AND ROUGHNESS PARAMETERS OF ROUGH NONUNIFORM ZNSE THIN FILMS.APPLIED OPTICS. VOL. 53. ISSUE 25. P. 5606 -5614 22 56% 2
3 EMAM-ISMAIL, M , SHAABAN, ER , EL-HAGARY, M , (2016) A NEW METHOD FOR CALCULATING THE REFRACTIVE INDEX OF SEMICONDUCTOR THIN FILMS RETRIEVED FROM THEIR TRANSMISSION SPECTRA.JOURNAL OF ALLOYS AND COMPOUNDS. VOL. 663. ISSUE . P. 20 -29 17 61% 2
4 NECAS, D , OHLIDAL, I , FRANTA, D , (2011) VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY OF CONSIDERABLY NON-UNIFORM THIN FILMS.JOURNAL OF OPTICS. VOL. 13. ISSUE 8. P. - 17 68% 14
5 POELMAN, D , SMET, PF , (2003) METHODS FOR THE DETERMINATION OF THE OPTICAL CONSTANTS OF THIN FILMS FROM SINGLE TRANSMISSION MEASUREMENTS: A CRITICAL REVIEW.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 36. ISSUE 15. P. 1850-1857 18 67% 158
6 YEN, ST , CHUNG, PK , (2015) EXTRACTION OF OPTICAL CONSTANTS FROM MAXIMA OF FRINGING REFLECTANCE SPECTRA.APPLIED OPTICS. VOL. 54. ISSUE 4. P. 663 -668 13 81% 1
7 JAKOPIC, G , PAPOUSEK, W , (2016) FAST ANALYTICAL INVERSION OF S-TRANSMITTANCE DATA OF WEAKLY ABSORBING FILMS ON TRANSPARENT SUBSTRATES.THIN SOLID FILMS. VOL. 603. ISSUE . P. 80 -87 12 86% 0
8 LAAZIZ, Y , BENNOUNA, A , CHAHBOUN, N , OUTZOURHIT, A , AMEZIANE, EL , (2000) OPTICAL CHARACTERIZATION OF LOW OPTICAL THICKNESS THIN FILMS FROM TRANSMITTANCE AND BACK REFLECTANCE MEASUREMENTS.THIN SOLID FILMS. VOL. 372. ISSUE 1-2. P. 149-155 15 94% 61
9 MARTINEZ-ANTON, JC , (2000) DETERMINATION OF OPTICAL PARAMETERS IN GENERAL FILM-SUBSTRATE SYSTEMS: A REFORMULATION BASED ON THE CONCEPTS OF ENVELOPE EXTREMES AND LOCAL MAGNITUDES.APPLIED OPTICS. VOL. 39. ISSUE 25. P. 4557 -4568 18 82% 9
10 GONZALEZ-LEAL, JM , PRIETO-ALCON, R , STUCHLIK, M , VLCEK, M , ELLIOTT, SR , MARQUEZ, E , (2004) DETERMINATION OF THE SURFACE ROUGHNESS AND REFRACTIVE INDEX OF AMORPHOUS AS40S60 FILMS DEPOSITED BY SPIN COATING.OPTICAL MATERIALS. VOL. 27. ISSUE 2. P. 147-154 12 100% 22

Classes with closest relation at Level 1


Rank Class id link
1 11862 NANOOPT PROPERTY//SPECTROSCOPIC ELLIPSOMETRY//DIELECTRIC FUNCTION
2 14389 ABSORBING FILMS//ROTATING POLARIZER ANALYZER ELLIPSOMETER//ULTRATHIN DIELECTRIC LAYER
3 11599 VISIBLE SPECTRAL REGION//RUGATE FILTER//INFRARED MULTILAYER
4 36761 INDIVIDUAL NANOFIBERS//LOW BACKGROUND SYSTEM//NANOGRADIENT COATINGS
5 18551 BULK INHOMOGENEITY//TOTAL INTEGRATED SCATTER//ISOTROPY DEGREE
6 32048 TIME COMPRESSION AMPLIFICATION//CHARGE INJECTION PHOTOGATE//STANDARD CMOS PROCESSES
7 1247 CHALCOGENIDE GLASSES//AMORPHOUS CHALCOGENIDES//AMORPHOUS CHALCOGENIDE FILMS
8 34961 5 LODIDEFURFURALOXIME//ABSOLUTE REFLECTANCE NORMAL INCIDENCE//CALIBRATION PROCEDURES AND STANDARDS
9 19434 END HALL ION GUN//MWIR REGION//NON CHOPPED
10 1327 CHALCOGENIDE GLASSES//CHALCOGENIDES//CRYSTALLIZATION KINETICS

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