Class information for:
Level 1: IN082GA018AS//SHORT WAVELENGTH INFRARED//IN053GA047AS PV DETECTOR

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
30844 162 16.1 70%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
47 3       PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER 93961
247 2             GAINNAS//JOURNAL OF CRYSTAL GROWTH//DILUTE NITRIDES 19852
30844 1                   IN082GA018AS//SHORT WAVELENGTH INFRARED//IN053GA047AS PV DETECTOR 162

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IN082GA018AS authKW 753963 2% 100% 4
2 SHORT WAVELENGTH INFRARED authKW 603161 5% 40% 8
3 IN053GA047AS PV DETECTOR authKW 565472 2% 100% 3
4 INFRARED IMAGING MAT DETECTORS address 557846 13% 14% 21
5 INFRARED IMAGING MAT DEVICES address 424097 4% 38% 6
6 ATMOSPHERIC RESEARCH INSTRUMENTATION authKW 376982 1% 100% 2
7 EXTENDED WAVELENGTH authKW 376982 1% 100% 2
8 PZT MULTILAYERS authKW 376982 1% 100% 2
9 STATE S TRANSDUCER TECHNOL address 332127 10% 10% 17
10 EXTENDED WAVELENGTH INGAAS authKW 251320 1% 67% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Optics 1795 44% 0% 71
2 Physics, Applied 854 47% 0% 76
3 Instruments & Instrumentation 225 12% 0% 20
4 Crystallography 146 9% 0% 14
5 Materials Science, Multidisciplinary 104 20% 0% 33
6 Engineering, Electrical & Electronic 47 12% 0% 20
7 Materials Science, Ceramics 31 3% 0% 5
8 Engineering, Aerospace 7 1% 0% 2
9 Metallurgy & Metallurgical Engineering 6 3% 0% 5
10 Physics, Condensed Matter 6 6% 0% 9

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 INFRARED IMAGING MAT DETECTORS 557846 13% 14% 21
2 INFRARED IMAGING MAT DEVICES 424097 4% 38% 6
3 STATE S TRANSDUCER TECHNOL 332127 10% 10% 17
4 SHANGHAI TECH PHYS 208760 33% 2% 53
5 DOPT STM LTB 188491 1% 100% 1
6 REMOTE SENSING SPACE INFORMAT 188491 1% 100% 1
7 STATE XEY FUNCT MAT INFORMAT 188491 1% 100% 1
8 STATE FUNCT MAT INFORMAT 106242 19% 2% 31
9 QUANTUM DEVICES NANOPHOTON 94244 1% 50% 1
10 SHANGHAI MICROSYST INFORMAT TECHNOL 63849 20% 1% 32

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF INFRARED AND MILLIMETER WAVES 117558 22% 2% 35
2 INFRARED PHYSICS & TECHNOLOGY 29938 12% 1% 19
3 JOURNAL OF CRYSTAL GROWTH 594 6% 0% 10
4 LASER FOCUS WORLD 475 1% 0% 2
5 OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS 291 1% 0% 2
6 JOURNAL OF APPLIED PHYSICS 283 8% 0% 13
7 JOURNAL OF THE AMERICAN CERAMIC SOCIETY 243 3% 0% 5
8 IEE PROCEEDINGS-OPTOELECTRONICS 226 1% 0% 1
9 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 208 2% 0% 3
10 APPLIED PHYSICS LETTERS 192 7% 0% 11

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 IN082GA018AS 753963 2% 100% 4 Search IN082GA018AS Search IN082GA018AS
2 SHORT WAVELENGTH INFRARED 603161 5% 40% 8 Search SHORT+WAVELENGTH+INFRARED Search SHORT+WAVELENGTH+INFRARED
3 IN053GA047AS PV DETECTOR 565472 2% 100% 3 Search IN053GA047AS+PV+DETECTOR Search IN053GA047AS+PV+DETECTOR
4 ATMOSPHERIC RESEARCH INSTRUMENTATION 376982 1% 100% 2 Search ATMOSPHERIC+RESEARCH+INSTRUMENTATION Search ATMOSPHERIC+RESEARCH+INSTRUMENTATION
5 EXTENDED WAVELENGTH 376982 1% 100% 2 Search EXTENDED+WAVELENGTH Search EXTENDED+WAVELENGTH
6 PZT MULTILAYERS 376982 1% 100% 2 Search PZT+MULTILAYERS Search PZT+MULTILAYERS
7 EXTENDED WAVELENGTH INGAAS 251320 1% 67% 2 Search EXTENDED+WAVELENGTH+INGAAS Search EXTENDED+WAVELENGTH+INGAAS
8 INGAAS FOCAL PLANE ARRAYS 251320 1% 67% 2 Search INGAAS+FOCAL+PLANE+ARRAYS Search INGAAS+FOCAL+PLANE+ARRAYS
9 SPACE BASED REMOTE SENSING 251320 1% 67% 2 Search SPACE+BASED+REMOTE+SENSING Search SPACE+BASED+REMOTE+SENSING
10 AEROGEL SILICA 188491 1% 100% 1 Search AEROGEL+SILICA Search AEROGEL+SILICA

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 ZHANG, YG , GU, Y , TIAN, ZB , WANG, K , LI, AZ , ZHU, XR , ZHENG, YL , (2009) PERFORMANCE OF GAS SOURCE MBE-GROWN WAVELENGTH-EXTENDED INGAAS PHOTODETECTORS WITH DIFFERENT BUFFER STRUCTURES.JOURNAL OF CRYSTAL GROWTH. VOL. 311. ISSUE 7. P. 1881 -1884 14 93% 6
2 ZHANG, YG , GU, Y , TIAN, ZB , LI, AZ , ZHU, XR , ZHENG, YL , (2008) WAVELENGTH EXTENDED 2.4 MU M HETEROJUNCTION INGAAS PHOTODIODES WITH INALAS CAP AND LINEARLY GRADED BUFFER LAYERS SUITABLE FOR BOTH FRONT AND BACK ILLUMINATIONS.INFRARED PHYSICS & TECHNOLOGY. VOL. 51. ISSUE 4. P. 316-321 12 100% 16
3 ZHANG, YG , GU, Y , TIAN, ZB , LI, AZ , ZHU, XR , WANG, K , (2009) WAVELENGTH EXTENDED INGAAS/INALAS/INP PHOTODETECTORS USING N-ON-P CONFIGURATION OPTIMIZED FOR BACK ILLUMINATION.INFRARED PHYSICS & TECHNOLOGY. VOL. 52. ISSUE 1. P. 52 -56 13 81% 10
4 LI, C , ZHANG, YG , WANG, K , GU, Y , LI, HSBY , LI, YY , (2010) DISTINCTION INVESTIGATION OF INGAAS PHOTODETECTORS CUTOFF AT 2.9 MU M.INFRARED PHYSICS & TECHNOLOGY. VOL. 53. ISSUE 3. P. 173-176 12 80% 12
5 ZHANG, YS , GU, Y , ZHU, C , HAO, GQ , LI, AZ , LIU, TD , (2006) GAS SOURCE MBE GROWN WAVELENGTH EXTENDED 2.2 AND 2.5 MU M INGAASPIN PHOTODETECTORS.INFRARED PHYSICS & TECHNOLOGY. VOL. 47. ISSUE 3. P. 257-262 9 100% 25
6 ZHOU, Y , JI, XL , SHI, M , TANG, HJ , SHAO, XM , LI, X , GONG, HM , CAO, X , YAN, F , (2015) IMPACT OF SINX PASSIVATION ON THE SURFACE PROPERTIES OF INGAAS PHOTO-DETECTORS.JOURNAL OF APPLIED PHYSICS. VOL. 118. ISSUE 3. P. - 13 57% 0
7 ZHANG, YG , GU, Y , WANG, K , LI, AZ , LI, C , (2008) PROPERTIES OF GAS SOURCE MOLECULAR BEAM EPITAXY GROWN WAVELENGTH EXTENDED INGAAS PHOTODETECTOR STRUCTURES ON A LINEAR GRADED INALAS BUFFER.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 23. ISSUE 12. P. - 12 67% 19
8 ZHANG, YG , HAO, GQ , GU, Y , ZHU, C , LI, AZ , LIU, TD , (2005) INGAAS PHOTODETECTORS CUT-OFF AT 1.9 MU M GROWN BY GAS-SOURCE MOLECULAR BEAM EPITAXY.CHINESE PHYSICS LETTERS. VOL. 22. ISSUE 1. P. 250-253 8 100% 9
9 JI, XL , LIU, BQ , TANG, HJ , LI, X , SHI, M , ZHOU, Y , XU, Y , GONG, HM , YAN, F , (2015) IMPROVEMENT OF SURFACE LEAKAGE CURRENT OF 2.6 MU M INGAAS PHOTODETECTORS BY USING INDUCTIVE COUPLED PLASMA CHEMICAL VAPOR DEPOSITION TECHNOLOGY.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 54. ISSUE 4. P. - 12 50% 0
10 LV, JB , CHEN, J , (2016) SIMULATION OF DARK CURRENT SUPPRESSION IN P-I-N INGAAS PHOTODETECTOR WITH IN0.66GA0.34AS/INAS SUPERLATTICE ELECTRON BARRIER.INFRARED PHYSICS & TECHNOLOGY. VOL. 77. ISSUE . P. 335 -338 9 64% 0

Classes with closest relation at Level 1


Rank Class id link
1 8164 MISFIT DISLOCATION//ULTRAHIGH FREQUENCY SEMICOND ELECT//METAMORPHIC BUFFER
2 17212 INALAS INP//CONDUCTION SUBBAND//INALAS ALASSB
3 6648 AVALANCHE PHOTODIODE//EXCESS NOISE FACTOR//IMPACT IONIZATION
4 23027 ACCEPTOR DIFFUSION//CHEM PHYS LUCAS HTS S//ZINC DIFFUSION
5 10858 HIGH POWER PHOTODIODE//PHOTODIODE//UNI TRAVELING CARRIER PHOTODIODE UTC PD
6 5717 INTERBAND CASCADE LASER//NEGATIVE LUMINESCENCE//MID INFRARED LASERS
7 35378 IPM RAS//NIZHNI NOVGOROD PHYS MICROSTRUCT//POROUS QUANTUM LAYER
8 508 HGCDTE//JOURNAL OF ELECTRONIC MATERIALS//MERCURY CADMIUM TELLURIDE
9 16019 INASP INP//INASP//FDN CPQD
10 23762 NONUNIFORMITY CORRECTION//INFRARED FOCAL PLANE ARRAY//SCENE BASED NONUNIFORMITY CORRECTION

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