Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 32877 | 133 | 13.9 | 31% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 660 | 3 | BEIJING NANOENERGY NANOSYST//TRIBOELECTRIC NANOGENERATOR//NANOGENERATOR | 10606 |
| 3184 | 2 | THICK FILM RESISTORS//LTCC//MICROSYST ELECT PHOTON | 2126 |
| 32877 | 1 | GREEN MOLDING COMPOUNDS//ADDITIONS OF CERIUM AND TITANIUM OXIDES//ALL RUSSIA EXPERIMENTAL PHYS | 133 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | GREEN MOLDING COMPOUNDS | authKW | 459181 | 2% | 100% | 2 |
| 2 | ADDITIONS OF CERIUM AND TITANIUM OXIDES | authKW | 229591 | 1% | 100% | 1 |
| 3 | ALL RUSSIA EXPERIMENTAL PHYS | address | 229591 | 1% | 100% | 1 |
| 4 | CHROMOPHORE CENTERS | authKW | 229591 | 1% | 100% | 1 |
| 5 | CONSORZIO CATANIA RECH | address | 229591 | 1% | 100% | 1 |
| 6 | COPPER TRACE CRACKING | authKW | 229591 | 1% | 100% | 1 |
| 7 | MOISTURE RELIABILITY TEST | authKW | 229591 | 1% | 100% | 1 |
| 8 | MOLD AND DIE ATTACH | authKW | 229591 | 1% | 100% | 1 |
| 9 | NOVOLAC AND STRIPLINE | authKW | 229591 | 1% | 100% | 1 |
| 10 | OXIDATION STATES OF VARIABLE VALENCY ELEMENTS | authKW | 229591 | 1% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Materials Science, Ceramics | 745 | 15% | 0% | 20 |
| 2 | Materials Science, Coatings & Films | 678 | 17% | 0% | 22 |
| 3 | Electrochemistry | 357 | 14% | 0% | 19 |
| 4 | Physics, Condensed Matter | 268 | 25% | 0% | 33 |
| 5 | Telecommunications | 56 | 6% | 0% | 8 |
| 6 | Physics, Applied | 56 | 16% | 0% | 21 |
| 7 | Engineering, Electrical & Electronic | 49 | 14% | 0% | 18 |
| 8 | Materials Science, Multidisciplinary | 39 | 15% | 0% | 20 |
| 9 | Engineering, Manufacturing | 17 | 2% | 0% | 3 |
| 10 | Spectroscopy | 10 | 3% | 0% | 4 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ALL RUSSIA EXPERIMENTAL PHYS | 229591 | 1% | 100% | 1 |
| 2 | CONSORZIO CATANIA RECH | 229591 | 1% | 100% | 1 |
| 3 | RADIAT SECTOR | 229591 | 1% | 100% | 1 |
| 4 | SUPERFICI INTERFASI | 131192 | 2% | 29% | 2 |
| 5 | HITACHI ADM | 114794 | 1% | 50% | 1 |
| 6 | SCI TECHNOL THERMOSTRUCT COMPOSITES MAT | 102037 | 2% | 22% | 2 |
| 7 | SUPERFICI INTERFASI CONSORZIO CATANIA RIC | 76529 | 1% | 33% | 1 |
| 8 | WORLDWIDE MFG GRP | 57396 | 1% | 25% | 1 |
| 9 | OPTOELECT PACKAGING INTEGRAT | 45917 | 1% | 20% | 1 |
| 10 | STMICROELE ONICS | 38263 | 1% | 17% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | GLASS AND CERAMICS | 21631 | 8% | 1% | 11 |
| 2 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 19942 | 17% | 0% | 22 |
| 3 | REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES | 8333 | 4% | 1% | 5 |
| 4 | SURFACE ENGINEERING AND APPLIED ELECTROCHEMISTRY | 6533 | 2% | 1% | 3 |
| 5 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1950 | 12% | 0% | 16 |
| 6 | SURFACE AND INTERFACE ANALYSIS | 1231 | 5% | 0% | 6 |
| 7 | RCA REVIEW | 1194 | 1% | 1% | 1 |
| 8 | PROTECTION OF METALS AND PHYSICAL CHEMISTRY OF SURFACES | 889 | 2% | 0% | 2 |
| 9 | TECHNICAL PHYSICS LETTERS | 881 | 4% | 0% | 5 |
| 10 | INTERNATIONAL JOURNAL OF APPLIED GLASS SCIENCE | 858 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | ZHERNOVAYA, NF , BESSMERTNYI, VS , ZHERNOVOI, FE , BRYANTSEVA, IG , (2014) TECHNOLOGICAL PARTICULARS AND PROPERTIES OF TITANIUM-CONTAINING CRYSTAL GLASS.GLASS AND CERAMICS. VOL. 70. ISSUE 9-10. P. 365-368 | 5 | 100% | 0 |
| 2 | MURAKAMI, S , (1994) FORMATION MECHANISM OF SUPPOSED NEGATIVE FIXED CHARGES IN GLASS.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 141. ISSUE 11. P. 3193-3199 | 5 | 83% | 0 |
| 3 | PARCHINCKII, PB , VLASOV, SI , NASIROV, AA , (2004) THE EFFECT OF GAMMA-RAY RADIATION ON THE CHARACTERISTICS OF THE INTERFACE BETWEEN SILICON AND LEAD-BOROSILICATE GLASS.SEMICONDUCTORS. VOL. 38. ISSUE 11. P. 1304-1307 | 4 | 67% | 1 |
| 4 | SHIMBO, M , TAI, S , TANZAWA, K , (1986) GLASS-FORMATION RANGE, ACID RESISTIVITY, AND SURFACE-CHARGE DENSITY OF ZNO-B2O3-SIO2 PASSIVATION GLASS CONTAINING AL2O3.JOURNAL OF THE AMERICAN CERAMIC SOCIETY. VOL. 69. ISSUE 1. P. 23-26 | 6 | 86% | 6 |
| 5 | SCANDURRA, A , INDELLI, GF , ZAFARANA, R , CAVALLARO, A , SCROFANI, E , GIRY, JP , RUSSO, S , BAKOWSKI, M , (2013) MOLDING COMPOUNDS ADHESION AND INFLUENCE ON RELIABILITY OF PLASTIC PACKAGES FOR SIC-BASED POWER MOS DEVICES.IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY. VOL. 3. ISSUE 7. P. 1094-1106 | 5 | 38% | 0 |
| 6 | VLASOV, SI , SAPAROV, FA , (2011) EFFECT OF PRESSURE ON THE ELECTRIC PROPERTIES OF PASSIVATING COATINGS BASED ON LEAD BOROSILICATE GLASSES.SURFACE ENGINEERING AND APPLIED ELECTROCHEMISTRY. VOL. 47. ISSUE 4. P. 338-339 | 2 | 100% | 1 |
| 7 | PARCHINSKIY, PB , NASIROV, AA , LIGAI, LG , ALLAMBERGENOV, MM , ISMAILOV, KA , (2011) DEPENDENCE OF THE SURFACE GENERATION VELOCITY AT SILICON-(LEAD BOROSILICATE) GLASS INTERFACE ON CONDITIONS OF NONEQUILIBRIUM DEPLETION REGION FORMATION.TECHNICAL PHYSICS LETTERS. VOL. 37. ISSUE 8. P. 693-695 | 4 | 44% | 1 |
| 8 | WAGATSUMA, M , YAMAMOTO, F , YAMAKAWA, S , (1982) HOT-MELT ADHESIVE MATERIAL AND ITS BOND RELIABILITY FOR STAC METHOD.REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES. VOL. 30. ISSUE 4. P. 639-648 | 6 | 100% | 1 |
| 9 | BOBROVA, EA , VAVILOV, VS , VULIS, YD , GALKIN, GN , POSPELOV, VV , (1984) FORMATION AND THERMAL-STABILITY OF DEFECTS IN SI SURFACE-LAYERS OF SI-SIO2 STRUCTURES IMPLANTED WITH TL IONS.SOVIET PHYSICS SEMICONDUCTORS-USSR. VOL. 18. ISSUE 4. P. 432-434 | 5 | 100% | 2 |
| 10 | MURAKAMI, S , MIYATA, K , TSURUOKA, M , KOBAYASHI, Y , (1987) CHARACTERIZATION OF ZINC BOROSILICATE GLASS SILICON INTERFACE.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 134. ISSUE 9. P. 2293-2297 | 4 | 100% | 4 |
Classes with closest relation at Level 1 |