Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
21402 | 420 | 25.5 | 83% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
589 | 3 | ATOMIC LAYER DEPOSITION//HFO2//HIGH K DIELECTRICS | 15224 |
664 | 2 | ATOMIC LAYER DEPOSITION//HFO2//HIGH K DIELECTRICS | 13339 |
21402 | 1 | SI001 SUBSTRATES//S UNICAT//INLUMR5270 | 420 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | SI001 SUBSTRATES | authKW | 302925 | 1% | 83% | 5 |
2 | S UNICAT | address | 163579 | 1% | 75% | 3 |
3 | INLUMR5270 | address | 160435 | 2% | 28% | 8 |
4 | CRYSTALLINE OXIDE | authKW | 139806 | 1% | 38% | 5 |
5 | MAT BAUELEMENTE ELEKT | address | 129244 | 1% | 44% | 4 |
6 | PHYS SCI S | address | 125933 | 4% | 10% | 18 |
7 | INTER E STRUCT PHENOMENA | address | 102271 | 3% | 13% | 11 |
8 | LPNUPR20 | address | 96935 | 0% | 67% | 2 |
9 | SRTIO3 FILMS | authKW | 93471 | 1% | 43% | 3 |
10 | LPN UPR20 | address | 81786 | 1% | 38% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 3914 | 61% | 0% | 257 |
2 | Physics, Condensed Matter | 1495 | 32% | 0% | 135 |
3 | Materials Science, Coatings & Films | 789 | 10% | 0% | 43 |
4 | Nanoscience & Nanotechnology | 417 | 11% | 0% | 48 |
5 | Materials Science, Multidisciplinary | 257 | 20% | 0% | 84 |
6 | Chemistry, Physical | 92 | 13% | 0% | 54 |
7 | Engineering, Electrical & Electronic | 88 | 11% | 0% | 46 |
8 | Crystallography | 67 | 4% | 0% | 17 |
9 | Physics, Multidisciplinary | 59 | 7% | 0% | 30 |
10 | Optics | 16 | 4% | 0% | 17 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | S UNICAT | 163579 | 1% | 75% | 3 |
2 | INLUMR5270 | 160435 | 2% | 28% | 8 |
3 | MAT BAUELEMENTE ELEKT | 129244 | 1% | 44% | 4 |
4 | PHYS SCI S | 125933 | 4% | 10% | 18 |
5 | INTER E STRUCT PHENOMENA | 102271 | 3% | 13% | 11 |
6 | LPNUPR20 | 96935 | 0% | 67% | 2 |
7 | LPN UPR20 | 81786 | 1% | 38% | 3 |
8 | MAT SCI ENGN C | 72702 | 0% | 100% | 1 |
9 | MU CAT | 72702 | 0% | 100% | 1 |
10 | SEMICOND PROD SECTOR MD K20 | 72702 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | APPLIED PHYSICS LETTERS | 3582 | 18% | 0% | 74 |
2 | SURFACE SCIENCE | 2081 | 7% | 0% | 28 |
3 | ADVANCED MATERIALS INTERFACES | 1601 | 1% | 1% | 4 |
4 | JOURNAL OF APPLIED PHYSICS | 1161 | 10% | 0% | 42 |
5 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1095 | 4% | 0% | 16 |
6 | MICROELECTRONIC ENGINEERING | 850 | 3% | 0% | 11 |
7 | THIN SOLID FILMS | 624 | 4% | 0% | 18 |
8 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 604 | 3% | 0% | 11 |
9 | PHYSICAL REVIEW B | 551 | 9% | 0% | 37 |
10 | JOURNAL OF CRYSTAL GROWTH | 437 | 3% | 0% | 14 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | MAZET, L , YANG, SM , KALININ, SV , SCHAMM-CHARDON, S , DUBOURDIEU, C , (2015) A REVIEW OF MOLECULAR BEAM EPITAXY OF FERROELECTRIC BATIO3 FILMS ON SI, GE AND GAAS SUBSTRATES AND THEIR APPLICATIONS.SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS. VOL. 16. ISSUE 3. P. - | 65 | 39% | 5 |
2 | REINER, JW , KOLPAK, AM , SEGAL, Y , GARRITY, KF , ISMAIL-BEIGI, S , AHN, CH , WALKER, FJ , (2010) CRYSTALLINE OXIDES ON SILICON.ADVANCED MATERIALS. VOL. 22. ISSUE 26-27. P. 2919 -2938 | 50 | 41% | 98 |
3 | GOODNER, DM , MARASCO, DL , ESCUADRO, AA , CAO, L , BEDZYK, MJ , (2005) X-RAY STANDING WAVE INVESTIGATION OF SUBMONOLAYER BARIUM AND STRONTIUM SURFACE PHASES ON SI(001).PHYSICAL REVIEW B. VOL. 71. ISSUE 16. P. - | 35 | 81% | 12 |
4 | WU, HW , AOKI, T , POSADAS, AB , DEMKOV, AA , SMITH, DJ , (2016) ANTI-PHASE BOUNDARIES AT THE SRTIO3/SI(001) INTERFACE STUDIED USING ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY.APPLIED PHYSICS LETTERS. VOL. 108. ISSUE 9. P. - | 35 | 58% | 1 |
5 | GARRITY, KF , KOLPAK, AM , ISMAIL-BEIGI, S , (2012) GROWTH AND INTERFACIAL PROPERTIES OF EPITAXIAL OXIDES ON SEMICONDUCTORS: AB INITIO INSIGHTS.JOURNAL OF MATERIALS SCIENCE. VOL. 47. ISSUE 21. P. 7417-7438 | 38 | 56% | 5 |
6 | CHOI, M , POSADAS, A , DARGIS, R , SHIH, CK , DEMKOV, AA , TRIYOSO, DH , THEODORE, ND , DUBOURDIEU, C , BRULEY, J , JORDAN-SWEET, J , (2012) STRAIN RELAXATION IN SINGLE CRYSTAL SRTIO3 GROWN ON SI (001) BY MOLECULAR BEAM EPITAXY.JOURNAL OF APPLIED PHYSICS. VOL. 111. ISSUE 6. P. - | 26 | 74% | 5 |
7 | HAO, JH , GAO, J , WANG, Z , YU, DP , (2005) INTERFACE STRUCTURE AND PHASE OF EPITAXIAL SRTIO3 (110) THIN FILMS GROWN DIRECTLY ON SILICON.APPLIED PHYSICS LETTERS. VOL. 87. ISSUE 13. P. - | 25 | 76% | 37 |
8 | ASHMAN, CR , FORST, CJ , SCHWARZ, K , BLOCHL, PE , (2004) FIRST-PRINCIPLES CALCULATIONS OF STRONTIUM ON SI(001).PHYSICAL REVIEW B. VOL. 69. ISSUE 7. P. - | 27 | 69% | 46 |
9 | KLEMENT, D , SPREITZER, M , SUVOROV, D , (2015) FORMATION OF A STRONTIUM BUFFER LAYER ON SI(001) BY PULSED-LASER DEPOSITION THROUGH THE SR/SI(001)(2 X 3) SURFACE RECONSTRUCTION.APPLIED PHYSICS LETTERS. VOL. 106. ISSUE 7. P. - | 21 | 68% | 0 |
10 | HE, JH , ZHANG, GH , GUO, JD , GUO, QL , WU, KH , (2011) ATOMIC STRUCTURE OF SR-INDUCED RECONSTRUCTIONS ON THE SI(100) SURFACE.JOURNAL OF APPLIED PHYSICS. VOL. 109. ISSUE 8. P. - | 15 | 100% | 9 |
Classes with closest relation at Level 1 |