Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
1063 | 2875 | 23.8 | 76% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
339 | 3 | METAMATERIALS//SURFACE PLASMONS//PLASMONICS | 37115 |
2448 | 2 | NEAR FIELD OPTICS//SNOM//SCANNING NEAR FIELD OPTICAL MICROSCOPY | 4049 |
1063 | 1 | NEAR FIELD OPTICS//SNOM//SCANNING NEAR FIELD OPTICAL MICROSCOPY | 2875 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | NEAR FIELD OPTICS | authKW | 839536 | 6% | 49% | 163 |
2 | SNOM | authKW | 671987 | 4% | 54% | 118 |
3 | SCANNING NEAR FIELD OPTICAL MICROSCOPY | authKW | 613747 | 4% | 52% | 112 |
4 | NEAR FIELD SCANNING OPTICAL MICROSCOPY | authKW | 367962 | 3% | 47% | 74 |
5 | NSOM | authKW | 329132 | 2% | 50% | 62 |
6 | NEAR FIELD MICROSCOPY | authKW | 241461 | 2% | 41% | 55 |
7 | NEAR FIELD OPTICAL MICROSCOPY | authKW | 231177 | 2% | 48% | 45 |
8 | SCANNING NEAR FIELD OPTICAL MICROSCOPY SNOM | authKW | 217107 | 1% | 66% | 31 |
9 | APERTURELESS SNOM | authKW | 159287 | 1% | 100% | 15 |
10 | NEAR FIELD OPTICAL MICROSCOPE | authKW | 133423 | 1% | 74% | 17 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 54666 | 15% | 1% | 431 |
2 | Optics | 10951 | 26% | 0% | 758 |
3 | Physics, Applied | 8093 | 35% | 0% | 1013 |
4 | Instruments & Instrumentation | 989 | 7% | 0% | 190 |
5 | Nanoscience & Nanotechnology | 868 | 7% | 0% | 195 |
6 | Physics, Condensed Matter | 662 | 10% | 0% | 288 |
7 | Physics, Multidisciplinary | 345 | 7% | 0% | 194 |
8 | Materials Science, Multidisciplinary | 174 | 9% | 0% | 262 |
9 | Chemistry, Physical | 109 | 8% | 0% | 217 |
10 | Engineering, Electrical & Electronic | 100 | 6% | 0% | 180 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NANOTECHNOL RUMENTAT OPT | 94338 | 2% | 19% | 46 |
2 | EQUIPE OPT SUBMICRON | 66160 | 0% | 69% | 9 |
3 | PROJECT GRP AUTOMAT MESH GENERAT ADV METHODS | 56630 | 0% | 67% | 8 |
4 | CNRSUMR 6603 | 55881 | 0% | 53% | 10 |
5 | FRE 2671 | 55881 | 0% | 53% | 10 |
6 | NANO PHOTON GRP | 53752 | 0% | 56% | 9 |
7 | CNRSUNITE MIXTE RECH 6603 | 42477 | 0% | 100% | 4 |
8 | UPR A0005 | 40893 | 1% | 23% | 17 |
9 | OPT PM DUFFIEUX | 37104 | 1% | 10% | 35 |
10 | PROJECT UTT INRIA GAMMA3 | 34748 | 0% | 55% | 6 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 70719 | 7% | 3% | 193 |
2 | JOURNAL OF MICROSCOPY | 42488 | 4% | 4% | 101 |
3 | JOURNAL OF MICROSCOPY-OXFORD | 24619 | 3% | 3% | 77 |
4 | APPLIED PHYSICS LETTERS | 8077 | 10% | 0% | 295 |
5 | OPTICS COMMUNICATIONS | 6107 | 4% | 0% | 124 |
6 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 5655 | 3% | 1% | 73 |
7 | OPTICAL REVIEW | 4635 | 1% | 1% | 30 |
8 | REVIEW OF SCIENTIFIC INSTRUMENTS | 4568 | 4% | 0% | 116 |
9 | SCANNING | 3876 | 1% | 1% | 25 |
10 | MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 2264 | 0% | 2% | 9 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | DUNN, RC , (1999) NEAR-FIELD SCANNING OPTICAL MICROSCOPY.CHEMICAL REVIEWS. VOL. 99. ISSUE 10. P. 2891 -+ | 213 | 82% | 324 |
2 | GREFFET, JJ , CARMINATI, R , (1997) IMAGE FORMATION IN NEAR-FIELD OPTICS.PROGRESS IN SURFACE SCIENCE. VOL. 56. ISSUE 3. P. 133 -237 | 118 | 83% | 261 |
3 | HECHT, B , SICK, B , WILD, UP , DECKERT, V , ZENOBI, R , MARTIN, OJF , POHL, DW , (2000) SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH APERTURE PROBES: FUNDAMENTALS AND APPLICATIONS.JOURNAL OF CHEMICAL PHYSICS. VOL. 112. ISSUE 18. P. 7761-7774 | 82 | 85% | 428 |
4 | KIM, J , SONG, KB , (2007) RECENT PROGRESS OF NANO-TECHNOLOGY WITH NSOM.MICRON. VOL. 38. ISSUE 4. P. 409 -426 | 128 | 59% | 60 |
5 | HSU, JWP , (2001) NEAR-FIELD SCANNING OPTICAL MICROSCOPY STUDIES OF ELECTRONIC AND PHOTONIC MATERIALS AND DEVICES.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 33. ISSUE 1. P. 1 -50 | 124 | 61% | 44 |
6 | GIRARD, C , (2005) NEAR FIELDS IN NANOSTRUCTURES.REPORTS ON PROGRESS IN PHYSICS. VOL. 68. ISSUE 8. P. 1883 -1933 | 120 | 49% | 137 |
7 | PATANE, S , GUCCIARDI, PG , LABARDI, M , ALLEGRINI, M , (2004) APERTURELESS NEAR-FIELD OPTICAL MICROSCOPY.RIVISTA DEL NUOVO CIMENTO. VOL. 27. ISSUE 1. P. 1 -46 | 85 | 68% | 32 |
8 | NOVOTNY, L , (2007) THE HISTORY OF NEAR-FIELD OPTICS.PROGRESS IN OPTICS, VOL 50. VOL. 50. ISSUE . P. 137 -184 | 85 | 57% | 48 |
9 | DRAGNEA, B , LEONE, SR , (2001) ADVANCES IN SUBMICRON INFRARED VIBRATIONAL BAND CHEMICAL IMAGING.INTERNATIONAL REVIEWS IN PHYSICAL CHEMISTRY. VOL. 20. ISSUE 1. P. 59 -92 | 80 | 71% | 16 |
10 | LIENAU, C , ELSAESSER, T , (2001) SPATIALLY AND TEMPORALLY RESOLVED NEAR-FIELD SCANNING OPTICAL MICROSCOPY STUDIES OF SEMICONDUCTOR QUANTUM WIRES.ULTRAFAST PHYSICAL PROCESSES IN SEMICONDUCTORS. VOL. 67. ISSUE . P. 39 -107 | 92 | 61% | 1 |
Classes with closest relation at Level 1 |