Class information for:
Level 1: PERMITTIVITY MEASUREMENT//COMPLEX PERMITTIVITY//MICROWAVE MEASUREMENTS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
6357 1494 20.4 48%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
42 3       IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS//ENGINEERING, ELECTRICAL & ELECTRONIC 97664
2685 2             PERMITTIVITY MEASUREMENT//PL MICROWAVE NONDESTRUCT TESTING//COMPLEX PERMITTIVITY 3376
6357 1                   PERMITTIVITY MEASUREMENT//COMPLEX PERMITTIVITY//MICROWAVE MEASUREMENTS 1494

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PERMITTIVITY MEASUREMENT authKW 1218064 7% 54% 110
2 COMPLEX PERMITTIVITY authKW 587438 8% 25% 114
3 MICROWAVE MEASUREMENTS authKW 305546 6% 15% 97
4 OPEN ENDED COAXIAL PROBE authKW 214567 1% 50% 21
5 COMPLEX PERMITTIVITY MEASUREMENT authKW 194735 1% 53% 18
6 DIELECTRIC MEASUREMENTS authKW 188776 4% 16% 58
7 MICROWAVE SENSORS authKW 187451 2% 27% 34
8 CAVITY PERTURBATION METHOD authKW 170305 1% 83% 10
9 PERMITTIVITY authKW 140442 8% 6% 118
10 CAVITY PERTURBATION authKW 137927 1% 38% 18

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Engineering, Electrical & Electronic 20805 68% 0% 1014
2 Instruments & Instrumentation 11563 28% 0% 416
3 Telecommunications 2651 12% 0% 174
4 Engineering, General 1306 8% 0% 113
5 Physics, Applied 957 19% 0% 279
6 Optics 391 8% 0% 121
7 Remote Sensing 358 2% 0% 34
8 Imaging Science & Photographic Technology 136 2% 0% 23
9 Geochemistry & Geophysics 60 2% 0% 37
10 Engineering, Biomedical 48 2% 0% 30

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PLICAT NANOSCI NANOENGN 66204 1% 36% 9
2 CERMALLOY 61311 0% 100% 3
3 MICROWAVE TOMOG MAT 60298 1% 27% 11
4 MILLIMETER WAVE TERAHERTZ TECHNOL S MILT 45982 0% 75% 3
5 ADV COMPUTAT ELE OMAGNET 40874 0% 100% 2
6 COMMUN SYST NETWORKS 40874 0% 100% 2
7 ELECT MICROWAVE TOMOG 40874 0% 100% 2
8 MICRO PHOTONELECT LAMI 40874 0% 100% 2
9 ASSOCIATED PLASMA 37412 1% 13% 14
10 INSPEM 36328 0% 44% 4

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 68513 14% 2% 206
2 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 58944 11% 2% 160
3 JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY 19800 2% 3% 28
4 PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER 13885 3% 2% 43
5 MEASUREMENT SCIENCE AND TECHNOLOGY 12580 5% 1% 75
6 MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 12420 6% 1% 95
7 JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS 9555 3% 1% 43
8 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS 7317 2% 1% 37
9 IEEE SENSORS JOURNAL 3993 2% 1% 34
10 JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS 3899 1% 1% 21

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 PERMITTIVITY MEASUREMENT 1218064 7% 54% 110 Search PERMITTIVITY+MEASUREMENT Search PERMITTIVITY+MEASUREMENT
2 COMPLEX PERMITTIVITY 587438 8% 25% 114 Search COMPLEX+PERMITTIVITY Search COMPLEX+PERMITTIVITY
3 MICROWAVE MEASUREMENTS 305546 6% 15% 97 Search MICROWAVE+MEASUREMENTS Search MICROWAVE+MEASUREMENTS
4 OPEN ENDED COAXIAL PROBE 214567 1% 50% 21 Search OPEN+ENDED+COAXIAL+PROBE Search OPEN+ENDED+COAXIAL+PROBE
5 COMPLEX PERMITTIVITY MEASUREMENT 194735 1% 53% 18 Search COMPLEX+PERMITTIVITY+MEASUREMENT Search COMPLEX+PERMITTIVITY+MEASUREMENT
6 DIELECTRIC MEASUREMENTS 188776 4% 16% 58 Search DIELECTRIC+MEASUREMENTS Search DIELECTRIC+MEASUREMENTS
7 MICROWAVE SENSORS 187451 2% 27% 34 Search MICROWAVE+SENSORS Search MICROWAVE+SENSORS
8 CAVITY PERTURBATION METHOD 170305 1% 83% 10 Search CAVITY+PERTURBATION+METHOD Search CAVITY+PERTURBATION+METHOD
9 PERMITTIVITY 140442 8% 6% 118 Search PERMITTIVITY Search PERMITTIVITY
10 CAVITY PERTURBATION 137927 1% 38% 18 Search CAVITY+PERTURBATION Search CAVITY+PERTURBATION

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 POURNAROPOULOS, CL , MISRA, DK , (1997) THE CO-AXIAL APERTURE ELECTROMAGNETIC SENSOR AND ITS APPLICATION IN MATERIAL CHARACTERIZATION.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 8. ISSUE 11. P. 1191 -1202 77 88% 32
2 HASAR, UC , (2010) UNIQUE PERMITTIVITY DETERMINATION OF LOW-LOSS DIELECTRIC MATERIALS FROM TRANSMISSION MEASUREMENTS AT MICROWAVE FREQUENCIES.PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER. VOL. 107. ISSUE . P. 31 -46 45 96% 19
3 HASAR, UC , YURTCAN, MT , (2010) A MICROWAVE METHOD BASED ON AMPLITUDE-ONLY REFLECTION MEASUREMENTS FOR PERMITTIVITY DETERMINATION OF LOW-LOSS MATERIALS.MEASUREMENT. VOL. 43. ISSUE 9. P. 1255 -1265 45 90% 4
4 GREGORY, AP , CLARKE, RN , (2006) A REVIEW OF RF AND MICROWAVE TECHNIQUES FOR DIELECTRIC MEASUREMENTS ON POLAR LIQUIDS.IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION. VOL. 13. ISSUE 4. P. 727-743 60 65% 54
5 HYDE, MW , HAVRILLA, MJ , BOGLE, AE , (2016) NONDESTRUCTIVE DETERMINATION OF THE PERMITTIVITY TENSOR OF A UNIAXIAL MATERIAL USING A TWO-PORT CLAMPED COAXIAL PROBE.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 64. ISSUE 1. P. 239 -246 31 86% 2
6 HASAR, UC , BARROSO, JJ , KAYA, Y , ERTUGRUL, M , BUTE, M , (2013) REFERENCE-PLANE INVARIANT TRANSMISSION-REFLECTION METHOD FOR MEASUREMENT OF CONSTITUTIVE PARAMETERS OF LIQUID MATERIALS.SENSORS AND ACTUATORS A-PHYSICAL. VOL. 203. ISSUE . P. 346 -354 39 81% 2
7 HASAR, UC , ORAL, EA , (2010) A METRIC FUNCTION FOR FAST AND ACCURATE PERMITTIVITY DETERMINATION OF LOW-TO-HIGH-LOSS MATERIALS FROM REFLECTION MEASUREMENTS.PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER. VOL. 107. ISSUE . P. 397-412 34 100% 3
8 HASAR, UC , KAYA, Y , BUTE, M , BARROSO, JJ , ERTUGRUL, M , (2014) MICROWAVE METHOD FOR REFERENCE-PLANE-INVARIANT AND THICKNESS-INDEPENDENT PERMITTIVITY DETERMINATION OF LIQUID MATERIALS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 85. ISSUE 1. P. - 39 68% 5
9 HASAR, UC , BARROSO, JJ , KAYA, Y , BUTE, M , ERTUGRUL, M , (2014) SIMPLE PROCEDURE FOR ROBUST AND ACCURATE COMPLEX PERMITTIVITY MEASUREMENTS OF LOW-LOSS MATERIALS OVER A BROAD FREQUENCY BAND.JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS. VOL. 28. ISSUE 8. P. 903 -915 35 80% 0
10 HASAR, UC , (2010) ACCURATE COMPLEX PERMITTIVITY INVERSION FROM MEASUREMENTS OF A SAMPLE PARTIALLY FILLING A WAVEGUIDE APERTURE.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 58. ISSUE 2. P. 451 -457 30 97% 16

Classes with closest relation at Level 1


Rank Class id link
1 24763 PL MICROWAVE NONDESTRUCT TESTING//MICROWAVE NONDESTRUCTIVE TESTING//MODULATED SCATTERER TECHNIQUE MST
2 37446 EXCESS CONDUCTION LOSS//CHARACTERIZATION OF CARD WIRING PERMITTIVITY//COMP AIDED CIRCUIT DESIGN GRP
3 26716 ION FLUCTUATION//RIBOSOMAL CORES//TRANSLATION DIFFUSION COEFFICIENT
4 10819 HEATING UNIFORMITY//DIELECTRIC LOSS FACTOR//JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY
5 19584 OPEN RESONATOR//INFRARED PHYSICS//CAVITY LENGTH VARIATION TECHNIQUE
6 15866 MOL AGGREGAT ANAL//DIELECTRIC SPECTROSCOPY//INTERFACIAL POLARIZATION
7 36428 DVS CAST//FROHLICH RELAXATION TIMES DISTRIBUTION//HUMIDIFICATION SURFACE
8 20425 MICROWAVE MICROPROBE//MICROWAVE MICROSCOPE//NEAR FIELD MICROWAVE MICROSCOPY
9 18049 VECTOR NETWORK ANALYZER VNA//SCATTERING PARAMETER MEASUREMENT//MICROWAVE NETWORK ANALYZER
10 8026 KIRKWOOD CORRELATION FACTOR//DIELECT//EXCESS PERMITTIVITY

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