Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
2685 | 3376 | 21.4 | 51% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | PERMITTIVITY MEASUREMENT | authKW | 558693 | 3% | 55% | 112 |
2 | PL MICROWAVE NONDESTRUCT TESTING | address | 419702 | 2% | 81% | 57 |
3 | COMPLEX PERMITTIVITY | authKW | 317443 | 4% | 28% | 126 |
4 | MICROWAVE MEASUREMENTS | authKW | 167512 | 3% | 17% | 108 |
5 | OPEN ENDED COAXIAL PROBE | authKW | 134548 | 1% | 60% | 25 |
6 | DIELECTRIC SPECTROSCOPY | authKW | 110685 | 3% | 11% | 112 |
7 | DIELECTRIC MEASUREMENTS | authKW | 108110 | 2% | 18% | 66 |
8 | PERMITTIVITY | authKW | 104357 | 5% | 8% | 153 |
9 | MICROWAVE SENSORS | authKW | 103582 | 1% | 30% | 38 |
10 | COMPLEX PERMITTIVITY MEASUREMENT | authKW | 95998 | 1% | 56% | 19 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 15646 | 40% | 0% | 1365 |
2 | Instruments & Instrumentation | 12383 | 19% | 0% | 657 |
3 | Physics, Applied | 2794 | 21% | 0% | 700 |
4 | Telecommunications | 2022 | 7% | 0% | 238 |
5 | Materials Science, Characterization, Testing | 1539 | 3% | 0% | 95 |
6 | Biophysics | 1099 | 8% | 0% | 255 |
7 | Engineering, General | 1081 | 5% | 0% | 162 |
8 | Engineering, Biomedical | 743 | 4% | 0% | 144 |
9 | Acoustics | 267 | 2% | 0% | 68 |
10 | Electrochemistry | 228 | 3% | 0% | 96 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PL MICROWAVE NONDESTRUCT TESTING | 419702 | 2% | 81% | 57 |
2 | ELDIS | 69557 | 0% | 77% | 10 |
3 | MOL AGGREGAT ANAL | 64304 | 0% | 89% | 8 |
4 | AMNTL | 49231 | 0% | 78% | 7 |
5 | MICROWAVE IMAGING NONDESTRUCT EVALUAT | 45215 | 0% | 100% | 5 |
6 | PL MICROWAVE NONDESTRUCT TESTING AMNTL | 36172 | 0% | 100% | 4 |
7 | MULTIDISCIPLINARY CHEM | 36164 | 0% | 50% | 8 |
8 | PLICAT NANOSCI NANOENGN | 29288 | 0% | 36% | 9 |
9 | IMAGING SENSING TEAM | 28936 | 0% | 80% | 4 |
10 | CERMALLOY | 27129 | 0% | 100% | 3 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 56587 | 7% | 3% | 236 |
2 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 40239 | 7% | 2% | 238 |
3 | JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY | 13660 | 1% | 4% | 35 |
4 | ACOUSTICAL PHYSICS | 9566 | 2% | 2% | 53 |
5 | MEASUREMENT SCIENCE AND TECHNOLOGY | 9038 | 3% | 1% | 96 |
6 | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 6866 | 3% | 1% | 107 |
7 | PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER | 6386 | 1% | 2% | 44 |
8 | MATERIALS EVALUATION | 6246 | 1% | 2% | 34 |
9 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 6112 | 2% | 1% | 51 |
10 | JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS | 4380 | 1% | 1% | 44 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | POURNAROPOULOS, CL , MISRA, DK , (1997) THE CO-AXIAL APERTURE ELECTROMAGNETIC SENSOR AND ITS APPLICATION IN MATERIAL CHARACTERIZATION.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 8. ISSUE 11. P. 1191 -1202 | 78 | 89% | 32 |
2 | HASAR, UC , (2010) UNIQUE PERMITTIVITY DETERMINATION OF LOW-LOSS DIELECTRIC MATERIALS FROM TRANSMISSION MEASUREMENTS AT MICROWAVE FREQUENCIES.PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER. VOL. 107. ISSUE . P. 31 -46 | 45 | 96% | 19 |
3 | HASAR, UC , YURTCAN, MT , (2010) A MICROWAVE METHOD BASED ON AMPLITUDE-ONLY REFLECTION MEASUREMENTS FOR PERMITTIVITY DETERMINATION OF LOW-LOSS MATERIALS.MEASUREMENT. VOL. 43. ISSUE 9. P. 1255 -1265 | 47 | 94% | 4 |
4 | KAATZE, U , (2013) MEASURING THE DIELECTRIC PROPERTIES OF MATERIALS. NINETY-YEAR DEVELOPMENT FROM LOW-FREQUENCY TECHNIQUES TO BROADBAND SPECTROSCOPY AND HIGH-FREQUENCY IMAGING.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 24. ISSUE 1. P. - | 87 | 39% | 25 |
5 | GREGORY, AP , CLARKE, RN , (2006) A REVIEW OF RF AND MICROWAVE TECHNIQUES FOR DIELECTRIC MEASUREMENTS ON POLAR LIQUIDS.IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION. VOL. 13. ISSUE 4. P. 727-743 | 63 | 68% | 54 |
6 | HYDE, MW , HAVRILLA, MJ , BOGLE, AE , (2016) NONDESTRUCTIVE DETERMINATION OF THE PERMITTIVITY TENSOR OF A UNIAXIAL MATERIAL USING A TWO-PORT CLAMPED COAXIAL PROBE.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 64. ISSUE 1. P. 239 -246 | 32 | 89% | 2 |
7 | HOSSEINI, MH , HEIDAR, H , SHAMS, MH , (2017) WIDEBAND NONDESTRUCTIVE MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY USING COUPLED COAXIAL PROBES.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 66. ISSUE 1. P. 148 -157 | 33 | 92% | 0 |
8 | KHARKOVSKY, S , ZOUGHI, R , (2007) MICROWAVE AND MILLIMETER WAVE NONDESTRUCTIVE TESTING AND EVALUATION.IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE. VOL. 10. ISSUE 2. P. 26-38 | 43 | 68% | 133 |
9 | HASAR, UC , BARROSO, JJ , KAYA, Y , ERTUGRUL, M , BUTE, M , (2013) REFERENCE-PLANE INVARIANT TRANSMISSION-REFLECTION METHOD FOR MEASUREMENT OF CONSTITUTIVE PARAMETERS OF LIQUID MATERIALS.SENSORS AND ACTUATORS A-PHYSICAL. VOL. 203. ISSUE . P. 346 -354 | 39 | 81% | 2 |
10 | HASAR, UC , ORAL, EA , (2010) A METRIC FUNCTION FOR FAST AND ACCURATE PERMITTIVITY DETERMINATION OF LOW-TO-HIGH-LOSS MATERIALS FROM REFLECTION MEASUREMENTS.PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER. VOL. 107. ISSUE . P. 397-412 | 34 | 100% | 3 |
Classes with closest relation at Level 2 |