Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
31479 | 152 | 16.0 | 34% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | PASSIVE INTERMODULATION PIM | authKW | 2209808 | 7% | 100% | 11 |
2 | PASSIVE INTERMODULATION | authKW | 1826285 | 7% | 91% | 10 |
3 | PASSIVE INTERMODULATION DISTORTION PIM | authKW | 1004458 | 3% | 100% | 5 |
4 | ANTENNA DISTORTION | authKW | 452005 | 2% | 75% | 3 |
5 | ACOUSTO ELECTROMAGNETIC COUPLING | authKW | 401783 | 1% | 100% | 2 |
6 | BASE STATION ANTENNA SYSTEM | authKW | 401783 | 1% | 100% | 2 |
7 | CANCELLATION SYSTEM | authKW | 401783 | 1% | 100% | 2 |
8 | CO SITE INTERFERENCE | authKW | 401783 | 1% | 100% | 2 |
9 | CONSTRICTION RESISTANCE | authKW | 378409 | 6% | 21% | 9 |
10 | DISTRIBUTED NONLINEARITY | authKW | 361602 | 2% | 60% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 2153 | 68% | 0% | 104 |
2 | Telecommunications | 1550 | 27% | 0% | 41 |
3 | Engineering, Manufacturing | 128 | 5% | 0% | 8 |
4 | Operations Research & Management Science | 112 | 7% | 0% | 10 |
5 | Physics, Applied | 103 | 19% | 0% | 29 |
6 | Engineering, Aerospace | 63 | 3% | 0% | 5 |
7 | Materials Science, Multidisciplinary | 26 | 13% | 0% | 19 |
8 | Education, Scientific Disciplines | 20 | 2% | 0% | 3 |
9 | Management | 8 | 2% | 0% | 3 |
10 | Instruments & Instrumentation | 5 | 3% | 0% | 4 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ASSEMBLY INTEGRAT TESTING GRP | 200892 | 1% | 100% | 1 |
2 | CIRCUITS CONNECT RD | 200892 | 1% | 100% | 1 |
3 | SOLAR OURCE ASSESSMENT UNIT | 200892 | 1% | 100% | 1 |
4 | PLASMA PULSED POWER MICROWAVE | 106349 | 2% | 18% | 3 |
5 | FUNCT NANO DEVICES | 100445 | 1% | 50% | 1 |
6 | SYST SYST PLATFORM DESIGN | 100445 | 1% | 50% | 1 |
7 | WIRELESS THEORY TECHNOL | 100445 | 1% | 50% | 1 |
8 | WIRELESS THEORY TECHNOL WTT | 100445 | 1% | 50% | 1 |
9 | MEASUREMENT INFORMAT | 66963 | 1% | 33% | 1 |
10 | GENIE ELECT PARIS SUPELEC | 50221 | 1% | 25% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 8553 | 5% | 1% | 7 |
2 | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 5603 | 4% | 0% | 6 |
3 | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 5236 | 6% | 0% | 9 |
4 | IEICE TRANSACTIONS ON ELECTRONICS | 4049 | 7% | 0% | 11 |
5 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 3101 | 9% | 0% | 14 |
6 | MICROWAVES & RF | 2599 | 2% | 0% | 3 |
7 | COMSAT TECHNICAL REVIEW | 2541 | 1% | 1% | 1 |
8 | INFOR | 1112 | 1% | 0% | 2 |
9 | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 1108 | 1% | 1% | 1 |
10 | ETRI JOURNAL | 999 | 2% | 0% | 3 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | ZHANG, P , LAU, YY , (2013) CONSTRICTION RESISTANCE AND CURRENT CROWDING IN VERTICAL THIN FILM CONTACT.IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY. VOL. 1. ISSUE 3. P. 83 -90 | 13 | 81% | 0 |
2 | ZHANG, P , LAU, YY , TIMSIT, RS , (2012) ON THE SPREADING RESISTANCE OF THIN-FILM CONTACTS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 59. ISSUE 7. P. 1936 -1940 | 14 | 74% | 8 |
3 | HENRIE, JJ , CHRISTIANSON, AJ , CHAPPELL, WJ , (2010) LINEAR-NONLINEAR INTERACTION AND PASSIVE INTERMODULATION DISTORTION.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 58. ISSUE 5. P. 1230 -1237 | 11 | 79% | 6 |
4 | REN, WB , CHEN, Y , WANG, ZB , XUE, SJ , ZHANG, X , (2016) ELECTRICAL CONTACT RESISTANCE OF COATED SPHERICAL CONTACTS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 63. ISSUE 11. P. 4373 -4379 | 8 | 89% | 0 |
5 | ISHIBASHI, D , KUGA, N , (2012) NON-CONTACT PIM EVALUATION METHOD USING A STANDING WAVE COAXIAL TUBE.IEICE TRANSACTIONS ON ELECTRONICS. VOL. E95C. ISSUE 9. P. 1508 -1514 | 7 | 100% | 1 |
6 | WILKERSON, JR , LAM, PG , GARD, KG , STEER, MB , (2011) DISTRIBUTED PASSIVE INTERMODULATION DISTORTION ON TRANSMISSION LINES.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 59. ISSUE 5. P. 1190 -1205 | 8 | 73% | 12 |
7 | JIANG, J , LI, TJ , LIU, YC , (2013) PASSIVE INTER-MODULATION SCATTERING ANALYSIS OF REFLECTOR CONSIDERING CONTACT NONLINEARITY.CHINESE JOURNAL OF AERONAUTICS. VOL. 26. ISSUE 2. P. 463-469 | 7 | 70% | 1 |
8 | ZHANG, P , LAU, YY , GILGENBACH, RM , (2011) THIN FILM CONTACT RESISTANCE WITH DISSIMILAR MATERIALS.JOURNAL OF APPLIED PHYSICS. VOL. 109. ISSUE 12. P. - | 10 | 50% | 2 |
9 | SHITVOV, AP , SCHUCHINSKY, AG , STEER, MB , KOZLOV, DS , (2016) PASSIVE INTERMODULATION OF ANALOG AND DIGITAL SIGNALS ON TRANSMISSION LINES WITH DISTRIBUTED NONLINEARITIES: MODELLING AND CHARACTERIZATION.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 64. ISSUE 5. P. 1383 -1395 | 7 | 64% | 0 |
10 | NISHIYAMA, H , MINOWA, I , (1999) A STUDY OF THE APPROXIMATE EXPRESSIONS FOR CONSTRICTION RESISTANCE OF MULTITUDE CONDUCTING SPOTS.IEICE TRANSACTIONS ON ELECTRONICS. VOL. E82C. ISSUE 1. P. 25 -32 | 6 | 100% | 4 |
Classes with closest relation at Level 1 |