Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 18317 | 556 | 17.7 | 49% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
| 568 | 2 | HGCDTE//CDTE//CDZNTE | 14414 |
| 18317 | 1 | IV VI SEMICONDUCTOR COMPOUNDS//ANISOTROPY MEASUREMENTS//ARXPS DEPTH PROFILING | 556 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | IV VI SEMICONDUCTOR COMPOUNDS | authKW | 98851 | 1% | 60% | 3 |
| 2 | ANISOTROPY MEASUREMENTS | authKW | 54919 | 0% | 100% | 1 |
| 3 | ARXPS DEPTH PROFILING | authKW | 54919 | 0% | 100% | 1 |
| 4 | AU MO STRUCTURE | authKW | 54919 | 0% | 100% | 1 |
| 5 | AU SN STRUCTURE | authKW | 54919 | 0% | 100% | 1 |
| 6 | BROMINE BROMIDIC ACID | authKW | 54919 | 0% | 100% | 1 |
| 7 | BROMINE ETHYLENE GLYCOL | authKW | 54919 | 0% | 100% | 1 |
| 8 | BROMINE POLISHING | authKW | 54919 | 0% | 100% | 1 |
| 9 | CDTE SUBSTRATES | authKW | 54919 | 0% | 100% | 1 |
| 10 | DEV PROD IL | address | 54919 | 0% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 4701 | 58% | 0% | 325 |
| 2 | Materials Science, Coatings & Films | 4489 | 21% | 0% | 115 |
| 3 | Materials Science, Multidisciplinary | 762 | 28% | 0% | 155 |
| 4 | Physics, Condensed Matter | 468 | 17% | 0% | 94 |
| 5 | Engineering, Electrical & Electronic | 294 | 16% | 0% | 87 |
| 6 | Electrochemistry | 270 | 6% | 0% | 36 |
| 7 | Crystallography | 114 | 4% | 0% | 25 |
| 8 | Chemistry, Physical | 17 | 7% | 0% | 40 |
| 9 | Nanoscience & Nanotechnology | 14 | 3% | 0% | 15 |
| 10 | Nuclear Science & Technology | 9 | 2% | 0% | 11 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | DEV PROD IL | 54919 | 0% | 100% | 1 |
| 2 | ETAB ERAGNY | 54919 | 0% | 100% | 1 |
| 3 | PHYS CHEM PRECIS MEASUREMENTS | 54919 | 0% | 100% | 1 |
| 4 | MATTER RADIAT | 18305 | 0% | 33% | 1 |
| 5 | PUERTO IND ALTAMIRA | 18305 | 0% | 33% | 1 |
| 6 | LASHKAREV SEMICOND PHYS | 15816 | 1% | 4% | 7 |
| 7 | INNOVAT KNOWLEDGE TRANSFER | 13728 | 0% | 25% | 1 |
| 8 | UNIDAD MEXICO | 13728 | 0% | 25% | 1 |
| 9 | REACT ELE OCHIM MICROPOROSITE | 10982 | 0% | 20% | 1 |
| 10 | ELE OCHIM | 10708 | 1% | 3% | 7 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 21829 | 13% | 1% | 75 |
| 2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 11873 | 3% | 1% | 16 |
| 3 | JOURNAL OF ELECTRONIC MATERIALS | 7707 | 7% | 0% | 37 |
| 4 | INORGANIC MATERIALS | 6382 | 6% | 0% | 33 |
| 5 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1742 | 3% | 0% | 16 |
| 6 | JOURNAL OF APPLIED PHYSICS | 1285 | 9% | 0% | 51 |
| 7 | SOVIET ELECTROCHEMISTRY | 1199 | 1% | 0% | 7 |
| 8 | JOURNAL OF CRYSTAL GROWTH | 983 | 4% | 0% | 24 |
| 9 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 719 | 3% | 0% | 15 |
| 10 | JOURNAL OF APPLIED CHEMISTRY OF THE USSR | 620 | 1% | 0% | 5 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | IV VI SEMICONDUCTOR COMPOUNDS | 98851 | 1% | 60% | 3 | Search IV+VI+SEMICONDUCTOR+COMPOUNDS | Search IV+VI+SEMICONDUCTOR+COMPOUNDS |
| 2 | ANISOTROPY MEASUREMENTS | 54919 | 0% | 100% | 1 | Search ANISOTROPY+MEASUREMENTS | Search ANISOTROPY+MEASUREMENTS |
| 3 | ARXPS DEPTH PROFILING | 54919 | 0% | 100% | 1 | Search ARXPS+DEPTH+PROFILING | Search ARXPS+DEPTH+PROFILING |
| 4 | AU MO STRUCTURE | 54919 | 0% | 100% | 1 | Search AU+MO+STRUCTURE | Search AU+MO+STRUCTURE |
| 5 | AU SN STRUCTURE | 54919 | 0% | 100% | 1 | Search AU+SN+STRUCTURE | Search AU+SN+STRUCTURE |
| 6 | BROMINE BROMIDIC ACID | 54919 | 0% | 100% | 1 | Search BROMINE+BROMIDIC+ACID | Search BROMINE+BROMIDIC+ACID |
| 7 | BROMINE ETHYLENE GLYCOL | 54919 | 0% | 100% | 1 | Search BROMINE+ETHYLENE+GLYCOL | Search BROMINE+ETHYLENE+GLYCOL |
| 8 | BROMINE POLISHING | 54919 | 0% | 100% | 1 | Search BROMINE+POLISHING | Search BROMINE+POLISHING |
| 9 | CDTE SUBSTRATES | 54919 | 0% | 100% | 1 | Search CDTE+SUBSTRATES | Search CDTE+SUBSTRATES |
| 10 | ELECTROLESS ETCHANT | 54919 | 0% | 100% | 1 | Search ELECTROLESS+ETCHANT | Search ELECTROLESS+ETCHANT |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | SEELMANNEGGEBERT, M , (1992) PHOTOEMISSION SPECTROSCOPIC TECHNIQUES TO ASSESS PHYSICAL AND CHEMICAL-PROPERTIES OF MERCURY CADMIUM TELLURIDE.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 10. ISSUE 4. P. 1515-1524 | 37 | 76% | 8 |
| 2 | VARESI, JB , BENSON, JD , JAIME-VASQUEZ, M , MARTINKA, M , STOLTZ, AJ , DINAN, JH , (2006) INVESTIGATION OF HGCDTE SURFACE FILMS AND THEIR REMOVAL.JOURNAL OF ELECTRONIC MATERIALS. VOL. 35. ISSUE 6. P. 1443 -1448 | 17 | 94% | 3 |
| 3 | WARK, AW , BERLOUIS, LEA , CRUICKSHANK, FK , PUGH, D , BREVET, PF , (2000) IN-SITU EVALUATION OF THE ANODIC OXIDE GROWTH ON HG1-XCDXTE (MCT) USING ELLIPSOMETRY AND SECOND HARMONIC GENERATION.JOURNAL OF ELECTRONIC MATERIALS. VOL. 29. ISSUE 6. P. 648 -653 | 23 | 79% | 1 |
| 4 | WARK, AW , MCERLEAN, K , CRUICKSHANK, FR , BERLOUIS, LEA , BREVET, PF , (2010) ENHANCEMENT OF THE SECOND HARMONIC SIGNAL FROM HG1-XCDXTE (MCT) IN THE PRESENCE OF AN ANODIC OXIDE FILM.JOURNAL OF ELECTROANALYTICAL CHEMISTRY. VOL. 646. ISSUE 1-2. P. 133-141 | 20 | 61% | 1 |
| 5 | DAVIS, GD , BECK, WA , KILDAY, DG , MCKINLEY, JT , MARGARITONDO, G , (1989) EFFECTS OF THIN INTERLAYERS ON AG/(HGCD)TE INTERFACE BEHAVIOR.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 7. ISSUE 3. P. 870-874 | 24 | 92% | 7 |
| 6 | DAVIS, GD , MCKINLEY, JT , KILDAY, DG , MARGARITONDO, G , (1989) EFFECTS OF AL AND TI INTERLAYERS ON SB/(HGCD)TE INTERFACE BEHAVIOR.JOURNAL OF APPLIED PHYSICS. VOL. 65. ISSUE 9. P. 3435-3440 | 23 | 92% | 1 |
| 7 | BERLOUIS, LEA , WARK, AW , CRUICKSHANK, FR , PUGH, D , BREVET, PF , (1999) SURFACE SECOND HARMONIC GENERATION IN THE CHARACTERIZATION OF ANODIC SULPHIDE AND OXIDE FILMS ON HG1-XCDXTE (MCT).JOURNAL OF ELECTRONIC MATERIALS. VOL. 28. ISSUE 6. P. 830 -837 | 18 | 75% | 1 |
| 8 | WINTON, GH , FARAONE, L , LAMB, R , (1994) CORRELATION OF X-RAY PHOTOELECTRON-SPECTROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROSCOPY DEPTH PROFILES ON HG1-XCDXTE NATIVE OXIDES.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 12. ISSUE 1. P. 35-43 | 17 | 94% | 8 |
| 9 | DAVIS, GD , (1988) OVERLAYER INTERACTIONS WITH (HGCD)TE.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 6. ISSUE 3. P. 1939-1945 | 24 | 80% | 19 |
| 10 | SINGH, A , SHUKLA, AK , JAIN, S , YADAV, BS , PAL, R , (2014) ELECTRICAL CHARACTERISTICS OF ELECTROLESS GOLD CONTACTS ON P-TYPE HG1-XCDXTE.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 26. ISSUE . P. 294 -300 | 12 | 67% | 1 |
Classes with closest relation at Level 1 |