Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
13017 | 865 | 17.7 | 62% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
247 | 2 | GAINNAS//JOURNAL OF CRYSTAL GROWTH//DILUTE NITRIDES | 19852 |
13017 | 1 | INSB//SEMICOND PHYS NANOSTRUCT//INASSB | 865 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | INSB | authKW | 364925 | 6% | 19% | 54 |
2 | SEMICOND PHYS NANOSTRUCT | address | 348649 | 3% | 45% | 22 |
3 | INASSB | authKW | 270599 | 3% | 33% | 23 |
4 | MELT EPITAXY | authKW | 211797 | 1% | 100% | 6 |
5 | INSB THIN FILMS | authKW | 141198 | 0% | 100% | 4 |
6 | III V SEMICONDUCTOR P N DIODES AND HETEROJUNCTIONS | authKW | 105899 | 0% | 100% | 3 |
7 | INAS HALL ELEMENT | authKW | 105899 | 0% | 100% | 3 |
8 | INSB QUANTUM WELL | authKW | 94129 | 0% | 67% | 4 |
9 | COMPOUND SEMICOND DEV | address | 80221 | 1% | 45% | 5 |
10 | ALSB BUFFER LAYER | authKW | 70599 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 8182 | 62% | 0% | 533 |
2 | Crystallography | 2177 | 14% | 0% | 121 |
3 | Materials Science, Multidisciplinary | 2114 | 36% | 0% | 310 |
4 | Physics, Condensed Matter | 1919 | 26% | 0% | 224 |
5 | Materials Science, Coatings & Films | 815 | 7% | 0% | 64 |
6 | Engineering, Electrical & Electronic | 696 | 19% | 0% | 161 |
7 | Nanoscience & Nanotechnology | 382 | 8% | 0% | 69 |
8 | Physics, Multidisciplinary | 70 | 6% | 0% | 51 |
9 | Materials Science, Characterization, Testing | 56 | 1% | 0% | 10 |
10 | Instruments & Instrumentation | 27 | 3% | 0% | 23 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SEMICOND PHYS NANOSTRUCT | 348649 | 3% | 45% | 22 |
2 | COMPOUND SEMICOND DEV | 80221 | 1% | 45% | 5 |
3 | SEMICONDUCTOR PHYS NANOSTRUCT | 70599 | 0% | 100% | 2 |
4 | ELECT PROPERTIES MAT | 57170 | 1% | 18% | 9 |
5 | ELECT NANOSCALE | 47065 | 0% | 67% | 2 |
6 | SEMICOND PHYS TECHNOL | 39708 | 0% | 38% | 3 |
7 | ADV DELIVERY CHEM SYST | 35300 | 0% | 100% | 1 |
8 | ALLIAGE | 35300 | 0% | 100% | 1 |
9 | CI OS | 35300 | 0% | 100% | 1 |
10 | DAEHAK RO 93 | 35300 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF CRYSTAL GROWTH | 12953 | 12% | 0% | 107 |
2 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 7047 | 5% | 1% | 40 |
3 | APPLIED PHYSICS LETTERS | 3644 | 12% | 0% | 108 |
4 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 3011 | 4% | 0% | 38 |
5 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 2409 | 3% | 0% | 26 |
6 | JOURNAL OF APPLIED PHYSICS | 1930 | 9% | 0% | 78 |
7 | JOURNAL OF ELECTRONIC MATERIALS | 1569 | 2% | 0% | 21 |
8 | PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES | 1363 | 2% | 0% | 18 |
9 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 832 | 0% | 1% | 2 |
10 | THIN SOLID FILMS | 830 | 3% | 0% | 30 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | INSB | 364925 | 6% | 19% | 54 | Search INSB | Search INSB |
2 | INASSB | 270599 | 3% | 33% | 23 | Search INASSB | Search INASSB |
3 | MELT EPITAXY | 211797 | 1% | 100% | 6 | Search MELT+EPITAXY | Search MELT+EPITAXY |
4 | INSB THIN FILMS | 141198 | 0% | 100% | 4 | Search INSB+THIN+FILMS | Search INSB+THIN+FILMS |
5 | III V SEMICONDUCTOR P N DIODES AND HETEROJUNCTIONS | 105899 | 0% | 100% | 3 | Search III+V+SEMICONDUCTOR+P+N+DIODES+AND+HETEROJUNCTIONS | Search III+V+SEMICONDUCTOR+P+N+DIODES+AND+HETEROJUNCTIONS |
6 | INAS HALL ELEMENT | 105899 | 0% | 100% | 3 | Search INAS+HALL+ELEMENT | Search INAS+HALL+ELEMENT |
7 | INSB QUANTUM WELL | 94129 | 0% | 67% | 4 | Search INSB+QUANTUM+WELL | Search INSB+QUANTUM+WELL |
8 | ALSB BUFFER LAYER | 70599 | 0% | 100% | 2 | Search ALSB+BUFFER+LAYER | Search ALSB+BUFFER+LAYER |
9 | GAINASSB INAS | 70599 | 0% | 100% | 2 | Search GAINASSB+INAS | Search GAINASSB+INAS |
10 | IN4 X 1RECONSTRUCTION | 70599 | 0% | 100% | 2 | Search IN4+X+1RECONSTRUCTION | Search IN4+X+1RECONSTRUCTION |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | KHAMSEH, S , YASUI, Y , NAKAYAMA, K , NAKATANI, K , MORI, M , MAEZAWA, K , (2011) EFFECTS OF DEPOSITION CONDITIONS OF FIRST INSB LAYER ON ELECTRICAL PROPERTIES OF N-TYPE INSB FILMS GROWN WITH TWO-STEP GROWTH METHOD VIA INSB BILAYER.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 50. ISSUE 4. P. - | 19 | 95% | 1 |
2 | KIM, YH , LEE, JY , NOH, YG , KIM, MD , KWON, YJ , OH, JE , GRONSKY, R , (2006) EFFECT OF TWO-STEP GROWTH ON THE HETEROEPITAXIAL GROWTH OF INSB THIN FILM ON SI (001) SUBSTRATE: A TRANSMISSION ELECTRON MICROSCOPY STUDY.APPLIED PHYSICS LETTERS. VOL. 89. ISSUE 3. P. - | 20 | 100% | 7 |
3 | SUN, CH , WANG, QW , QIU, F , LV, YF , DENG, HY , HU, SH , DAI, N , (2012) SINGLE CRYSTALLINE INASXSB1 (-) (X) FILMS WITH CUT-OFF WAVELENGTH OF 7-8 MU M GROWN ON (100) INSB SUBSTRATES BY LIQUID PHASE EPITAXY.JOURNAL OF ALLOYS AND COMPOUNDS. VOL. 535. ISSUE . P. 39-43 | 18 | 86% | 4 |
4 | KRIER, A , MAO, Y , (1995) ELECTRICAL-TRANSPORT PROPERTIES AND PHOTOLUMINESCENCE OF LATTICE-MATCHED INAS0.91SB0.09 ON GASB GROWN BY LIQUID-PHASE EPITAXY.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 10. ISSUE 7. P. 930-936 | 28 | 88% | 4 |
5 | TEVKE, A , BESIKCI, C , VAN HOOF, C , BORGHS, G , (1998) INSB INFRARED P-I-N PHOTODETECTORS GROWN ON GAAS COATED SI SUBSTRATES BY MOLECULAR BEAM EPITAXY.SOLID-STATE ELECTRONICS. VOL. 42. ISSUE 6. P. 1039-1044 | 21 | 95% | 5 |
6 | HU, SH , DENG, HY , SUN, Y , WU, J , SHANG, LY , LIN, T , WANG, R , DAI, N , (2008) MODIFIED LPE TECHNIQUE GROWTH AND PROPERTIES OF LONG WAVELENGTH INAS0.05SB0.95 THICK FILM.JOURNAL OF ALLOYS AND COMPOUNDS. VOL. 465. ISSUE 1-2. P. 442-445 | 17 | 85% | 2 |
7 | DIXIT, VK , BANSAL, B , VENKATARAMAN, V , BHAT, HL , SUBBANNA, GN , CHANDRASEKHARAN, KS , ARORA, BM , (2002) HIGH-MOBILITY INSB EPITAXIAL FILMS GROWN ON A GAAS (001) SUBSTRATE USING LIQUID-PHASE EPITAXY.APPLIED PHYSICS LETTERS. VOL. 80. ISSUE 12. P. 2102-2104 | 18 | 90% | 12 |
8 | MORI, M , FUJIMOTO, N , AKAE, N , UOTANI, K , TAMBO, T , TATSUYAMA, C , (2006) HETEROEPITAXY OF INSB FILMS GROWN ON A SI(001) SUBSTRATE WITH ALSB BUFFER LAYER.JOURNAL OF CRYSTAL GROWTH. VOL. 286. ISSUE 2. P. 218-222 | 16 | 89% | 8 |
9 | BESIKCI, C , OZER, S , VAN HOOF, C , ZIMMERMANN, L , JOHN, J , MERKEN, P , (2001) CHARACTERISTICS OF INAS(0.8)SB(0.2) PHOTODETECTORS ON GAAS SUBSTRATES.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 16. ISSUE 12. P. 992-996 | 19 | 83% | 10 |
10 | MISHIMA, TD , SANTOS, MB , (2012) REGRESSION ANALYSIS FOR TRANSPORT ELECTRON SCATTERING CAUSED BY STRUCTURAL DEFECTS IN INSB QUANTUM WELLS: APPLICATION OF MATTHIESSEN'S FORMULA.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 51. ISSUE 6. P. - | 17 | 68% | 0 |
Classes with closest relation at Level 1 |