Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
1118 | 9693 | 14.3 | 53% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIAT | journal | 1054167 | 38% | 9% | 3709 |
2 | SILICON DETECTORS | authKW | 637849 | 3% | 60% | 336 |
3 | PIXEL DETECTOR | authKW | 544619 | 2% | 77% | 224 |
4 | RADIATION HARDNESS | authKW | 509902 | 3% | 56% | 290 |
5 | JOURNAL OF INSTRUMENTATION | journal | 501983 | 8% | 20% | 815 |
6 | CMOS IMAGE SENSOR | authKW | 444440 | 3% | 55% | 256 |
7 | PARTICLE TRACKING DETECTORS SOLID STATE DETECTORS | authKW | 422088 | 2% | 76% | 176 |
8 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | journal | 368944 | 14% | 8% | 1395 |
9 | SOLID STATE DETECTORS | authKW | 368122 | 2% | 50% | 235 |
10 | NUCLEAR SCIENCE & TECHNOLOGY | WoSSC | 354375 | 56% | 2% | 5406 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Nuclear Science & Technology | 354375 | 56% | 2% | 5406 |
2 | Instruments & Instrumentation | 278690 | 53% | 2% | 5118 |
3 | Spectroscopy | 196030 | 39% | 2% | 3773 |
4 | Physics, Nuclear | 175882 | 40% | 1% | 3900 |
5 | Physics, Particles & Fields | 151535 | 41% | 1% | 3988 |
6 | Engineering, Electrical & Electronic | 20226 | 28% | 0% | 2726 |
7 | Physics, Applied | 2051 | 12% | 0% | 1187 |
8 | Optics | 210 | 3% | 0% | 337 |
9 | Computer Science, Hardware & Architecture | 40 | 1% | 0% | 65 |
10 | Engineering, General | 38 | 1% | 0% | 100 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | EXPT PL PHYS | 78046 | 1% | 18% | 138 |
2 | MICROSISTEMI | 76171 | 0% | 73% | 33 |
3 | PARTICLE NUCL STUDY | 44801 | 0% | 65% | 22 |
4 | HALBLEITER | 43703 | 0% | 73% | 19 |
5 | DETECTOR RELATED SOFTWARE TECHNOL | 32189 | 0% | 68% | 15 |
6 | IMAGE SENSOR TEAM | 31743 | 0% | 92% | 11 |
7 | O LODGE | 28335 | 0% | 100% | 9 |
8 | SCIPP | 27746 | 0% | 28% | 32 |
9 | IEKP | 27184 | 0% | 39% | 22 |
10 | DPNC | 25963 | 0% | 21% | 39 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1054167 | 38% | 9% | 3709 |
2 | JOURNAL OF INSTRUMENTATION | 501983 | 8% | 20% | 815 |
3 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 368944 | 14% | 8% | 1395 |
4 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 30031 | 4% | 3% | 384 |
5 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 5022 | 1% | 1% | 117 |
6 | IEEE SENSORS JOURNAL | 3566 | 1% | 1% | 83 |
7 | INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 3014 | 1% | 2% | 63 |
8 | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2084 | 0% | 6% | 11 |
9 | JOURNAL OF SYNCHROTRON RADIATION | 2003 | 0% | 1% | 45 |
10 | IEEE INTERNATIONAL SOLID STATE CIRCUITS CONFERENCE | 1904 | 0% | 8% | 8 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SILICON DETECTORS | 637849 | 3% | 60% | 336 | Search SILICON+DETECTORS | Search SILICON+DETECTORS |
2 | PIXEL DETECTOR | 544619 | 2% | 77% | 224 | Search PIXEL+DETECTOR | Search PIXEL+DETECTOR |
3 | RADIATION HARDNESS | 509902 | 3% | 56% | 290 | Search RADIATION+HARDNESS | Search RADIATION+HARDNESS |
4 | CMOS IMAGE SENSOR | 444440 | 3% | 55% | 256 | Search CMOS+IMAGE+SENSOR | Search CMOS+IMAGE+SENSOR |
5 | PARTICLE TRACKING DETECTORS SOLID STATE DETECTORS | 422088 | 2% | 76% | 176 | Search PARTICLE+TRACKING+DETECTORS+SOLID+STATE+DETECTORS | Search PARTICLE+TRACKING+DETECTORS+SOLID+STATE+DETECTORS |
6 | SOLID STATE DETECTORS | 368122 | 2% | 50% | 235 | Search SOLID+STATE+DETECTORS | Search SOLID+STATE+DETECTORS |
7 | ACTIVE PIXEL SENSOR | 339542 | 1% | 79% | 137 | Search ACTIVE+PIXEL+SENSOR | Search ACTIVE+PIXEL+SENSOR |
8 | VERTEX DETECTOR | 319996 | 1% | 76% | 133 | Search VERTEX+DETECTOR | Search VERTEX+DETECTOR |
9 | X RAY DETECTORS | 274903 | 2% | 37% | 238 | Search X+RAY+DETECTORS | Search X+RAY+DETECTORS |
10 | PIXEL | 273368 | 2% | 55% | 159 | Search PIXEL | Search PIXEL |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | BATTAGLIA, M , DA VIA, C , BORTOLETTO, D , BRENNER, R , CAMPBELL, M , COLLINS, P , DALLA BETTA, G , DEMARTEAU, M , DENES, P , GRAAFSMA, H , ET AL (2013) R&D PATHS OF PIXEL DETECTORS FOR VERTEX TRACKING AND RADIATION IMAGING.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 716. ISSUE . P. 29 -45 | 106 | 79% | 4 |
2 | CAMPBELL, M , (2011) 10 YEARS OF THE MEDIPIX2 COLLABORATION.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 633. ISSUE . P. S1-S10 | 107 | 74% | 23 |
3 | AKIMOV, YK , (2007) SILICON RADIATION DETECTORS (REVIEW).INSTRUMENTS AND EXPERIMENTAL TECHNIQUES. VOL. 50. ISSUE 1. P. 1-28 | 100 | 85% | 8 |
4 | SROUR, JR , PALKO, JW , (2013) DISPLACEMENT DAMAGE EFFECTS IN IRRADIATED SEMICONDUCTOR DEVICES.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1740 -1766 | 110 | 61% | 16 |
5 | GABRIELLI, A , (2014) FAST READOUT ARCHITECTURES FOR LARGE ARRAYS OF DIGITAL PIXELS: EXAMPLES AND APPLICATIONS.SCIENTIFIC WORLD JOURNAL. VOL. . ISSUE . P. - | 78 | 80% | 1 |
6 | SEIDEL, S , (2001) A REVIEW OF DESIGN CONSIDERATIONS FOR THE SENSOR MATRIX IN SEMICONDUCTOR PIXEL DETECTORS FOR TRACKING IN PARTICLE PHYSICS EXPERIMENTS.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 465. ISSUE 2-3. P. 267 -296 | 79 | 95% | 8 |
7 | BALLABRIGA, R , ALOZY, J , CAMPBELL, M , FROJDH, E , HEIJNE, EHM , KOENIG, T , LLOPART, X , MARCHAL, J , PENNICARD, D , POIKELA, T , ET AL (2016) REVIEW OF HYBRID PIXEL DETECTOR READOUT ASICS FOR SPECTROSCOPIC X-RAY IMAGING.JOURNAL OF INSTRUMENTATION. VOL. 11. ISSUE . P. - | 43 | 81% | 6 |
8 | HARTMANN, F , (2009) EVOLUTION OF SILICON SENSOR TECHNOLOGY IN PARTICLE PHYSICS.EVOLUTION OF SILICON SENSOR TECHNOLOGY IN PARTICLE PHYSICS. VOL. 231. ISSUE . P. 1 -202 | 70 | 81% | 0 |
9 | AAD, G , ACKERS, M , ALBERTI, FA , ALEPPO, M , ALIMONTI, G , ALONSO, J , ANDERSSEN, EC , ANDREANI, A , ANDREAZZA, A , ARGUIN, JF , ET AL (2008) ATLAS PIXEL DETECTOR ELECTRONICS AND SENSORS.JOURNAL OF INSTRUMENTATION. VOL. 3. ISSUE . P. - | 50 | 93% | 106 |
10 | LEROY, C , RANCOITA, PG , (2007) PARTICLE INTERACTION AND DISPLACEMENT DAMAGE IN SILICON DEVICES OPERATED IN RADIATION ENVIRONMENTS.REPORTS ON PROGRESS IN PHYSICS. VOL. 70. ISSUE 4. P. 493 -625 | 93 | 51% | 50 |
Classes with closest relation at Level 2 |