Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
16271 | 663 | 14.3 | 56% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | GAAS DETECTORS | authKW | 530983 | 2% | 82% | 14 |
2 | GRADED GAP ALXGA1 XAS STRUCTURES | authKW | 373044 | 1% | 90% | 9 |
3 | SCI PROD STATE ENTERPRISE | address | 368440 | 1% | 100% | 8 |
4 | UNIV ELE ON ACCELERATORS | address | 276330 | 1% | 100% | 6 |
5 | GAAS RADIATION DETECTOR | authKW | 230275 | 1% | 100% | 5 |
6 | SCI STATE | address | 164479 | 1% | 71% | 5 |
7 | CCE CHARACTERISTICS | authKW | 103622 | 0% | 75% | 3 |
8 | CHARGE PARTICLE SPECTROSCOPY | authKW | 103622 | 0% | 75% | 3 |
9 | EPITAXIAL GAAS | authKW | 103622 | 0% | 75% | 3 |
10 | SIC SILICON CARBIDE | authKW | 103622 | 0% | 75% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Nuclear Science & Technology | 25211 | 57% | 0% | 377 |
2 | Instruments & Instrumentation | 16798 | 50% | 0% | 329 |
3 | Spectroscopy | 14590 | 41% | 0% | 269 |
4 | Physics, Nuclear | 14167 | 44% | 0% | 289 |
5 | Physics, Particles & Fields | 11917 | 44% | 0% | 292 |
6 | Physics, Condensed Matter | 416 | 15% | 0% | 99 |
7 | Engineering, Electrical & Electronic | 281 | 14% | 0% | 95 |
8 | Physics, Applied | 175 | 13% | 0% | 88 |
9 | Materials Science, Characterization, Testing | 139 | 2% | 0% | 13 |
10 | Materials Science, Coatings & Films | 18 | 2% | 0% | 11 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SCI PROD STATE ENTERPRISE | 368440 | 1% | 100% | 8 |
2 | UNIV ELE ON ACCELERATORS | 276330 | 1% | 100% | 6 |
3 | SCI STATE | 164479 | 1% | 71% | 5 |
4 | DIREZ RIC | 73683 | 1% | 40% | 4 |
5 | SAOBRACAJNI FAK | 61405 | 0% | 67% | 2 |
6 | GESEC RD | 59210 | 0% | 43% | 3 |
7 | DIPARTIMENTO SCI INGN | 54084 | 2% | 11% | 11 |
8 | NUCL PHYS ENGN | 51106 | 2% | 10% | 11 |
9 | AUSSENSTELLE EADQ | 46055 | 0% | 100% | 1 |
10 | CNR BOLOGNA | 46055 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 81100 | 41% | 1% | 269 |
2 | JOURNAL OF INSTRUMENTATION | 11287 | 5% | 1% | 32 |
3 | SEMICONDUCTORS | 9321 | 6% | 1% | 37 |
4 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 9279 | 9% | 0% | 58 |
5 | NUCLEAR TRACKS AND RADIATION MEASUREMENTS | 2331 | 1% | 1% | 9 |
6 | PHYSICA MEDICA | 1123 | 0% | 1% | 3 |
7 | RUSSIAN PHYSICS JOURNAL | 1039 | 1% | 0% | 6 |
8 | MATERIALS SCIENCE FORUM | 922 | 3% | 0% | 19 |
9 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 808 | 2% | 0% | 10 |
10 | TECHNICAL PHYSICS LETTERS | 695 | 2% | 0% | 10 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | GAAS DETECTORS | 530983 | 2% | 82% | 14 | Search GAAS+DETECTORS | Search GAAS+DETECTORS |
2 | GRADED GAP ALXGA1 XAS STRUCTURES | 373044 | 1% | 90% | 9 | Search GRADED+GAP+ALXGA1+XAS+STRUCTURES | Search GRADED+GAP+ALXGA1+XAS+STRUCTURES |
3 | GAAS RADIATION DETECTOR | 230275 | 1% | 100% | 5 | Search GAAS+RADIATION+DETECTOR | Search GAAS+RADIATION+DETECTOR |
4 | CCE CHARACTERISTICS | 103622 | 0% | 75% | 3 | Search CCE+CHARACTERISTICS | Search CCE+CHARACTERISTICS |
5 | CHARGE PARTICLE SPECTROSCOPY | 103622 | 0% | 75% | 3 | Search CHARGE+PARTICLE+SPECTROSCOPY | Search CHARGE+PARTICLE+SPECTROSCOPY |
6 | EPITAXIAL GAAS | 103622 | 0% | 75% | 3 | Search EPITAXIAL+GAAS | Search EPITAXIAL+GAAS |
7 | SIC SILICON CARBIDE | 103622 | 0% | 75% | 3 | Search SIC+SILICON+CARBIDE | Search SIC+SILICON+CARBIDE |
8 | X RAY DETECTORS | 97229 | 6% | 6% | 37 | Search X+RAY+DETECTORS | Search X+RAY+DETECTORS |
9 | EPITAXIAL SEMICONDUCTORS | 92110 | 0% | 100% | 2 | Search EPITAXIAL+SEMICONDUCTORS | Search EPITAXIAL+SEMICONDUCTORS |
10 | IONIZING RADIATION DETECTOR | 92110 | 0% | 100% | 2 | Search IONIZING+RADIATION+DETECTOR | Search IONIZING+RADIATION+DETECTOR |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | BARNETT, AM , LEES, JE , BASSFORD, DJ , (2013) FIRST SPECTROSCOPIC X-RAY AND BETA RESULTS FROM A 400 MU M DIAMETER AL0.8GA0.2AS PHOTODIODE.JOURNAL OF INSTRUMENTATION. VOL. 8. ISSUE . P. - | 31 | 79% | 0 |
2 | BARNETT, AM , LEES, JE , BASSFORD, DJ , (2013) A MULTI-ENERGY (2-60 KEV) CALIBRATION OF 200 MU M AND 400 MU M DIAMETER SPECTROSCOPIC GAAS X-RAY PHOTODIODES.JOURNAL OF INSTRUMENTATION. VOL. 8. ISSUE . P. - | 22 | 92% | 1 |
3 | ZAT'KO, B , DUBECKY, F , SAGATOVA, A , SEDLACOVA, K , RYC, L , (2015) HIGH RESOLUTION ALPHA PARTICLE DETECTORS BASED ON 4H-SIC EPITAXIAL LAYER.JOURNAL OF INSTRUMENTATION. VOL. 10. ISSUE . P. - | 18 | 95% | 1 |
4 | BARNETT, AM , LIOLIOU, G , NG, JS , (2015) CHARACTERIZATION OF ROOM TEMPERATURE ALGAAS SOFT X-RAY MESA PHOTODIODES.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 774. ISSUE . P. 29 -33 | 20 | 77% | 0 |
5 | AYZENSHTAT, GI , BUDNITSKII, DL , MOKEEV, DY , NOVIKOV, VA , SYRESIN, EM , TOLBANOV, OP , TYAZHEV, AV , SHELKOV, GA , (2008) GAMMA-RAY DETECTORS BASED ON GAAS < CR > FOR NANOSTRUCTURAL INVESTIGATIONS.RUSSIAN PHYSICS JOURNAL. VOL. 51. ISSUE 10. P. 1037 -1052 | 19 | 95% | 1 |
6 | NAVA, F , BERTUCCIO, G , CAVALLINI, A , VITTONE, E , (2008) SILICON CARBIDE AND ITS USE AS A RADIATION DETECTOR MATERIAL.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 19. ISSUE 10. P. - | 40 | 38% | 76 |
7 | WHITAKER, MDC , LIOLIOU, G , BUTERA, S , BARNETT, AM , (2016) AL0.2GA0.8AS X-RAY PHOTODIODES FOR X-RAY SPECTROSCOPY.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 840. ISSUE . P. 168 -173 | 18 | 75% | 0 |
8 | DE NAPOLI, M , GIACOPPO, F , RACITI, G , RAPISARDA, E , (2009) DOPANT CONCENTRATION DEPENDENCE OF THE RESPONSE OF SIC SCHOTTKY DIODES TO LIGHT IONS.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 600. ISSUE 3. P. 618-623 | 20 | 77% | 1 |
9 | LIOLIOU, G , MENG, X , NG, JS , BARNETT, AM , (2016) TEMPERATURE DEPENDENT CHARACTERIZATION OF GALLIUM ARSENIDE X-RAY MESA P-I-N PHOTODIODES.JOURNAL OF APPLIED PHYSICS. VOL. 119. ISSUE 12. P. - | 15 | 83% | 0 |
10 | RIZZI, M , ANTONICELLI, V , CASTAGNOLO, B , (2003) NEW MODEL FOR A GAAS X-RAY PIXEL DETECTOR.IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS. VOL. 150. ISSUE 3. P. 210-216 | 17 | 100% | 2 |
Classes with closest relation at Level 1 |