Class information for:
Level 1: SCANNING THERMAL MICROSCOPY//MICRO THERMAL ANALYSIS//SCANNING THERMAL MICROSCOPE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
11893 947 21.6 69%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
339 3       METAMATERIALS//SURFACE PLASMONS//PLASMONICS 37115
2448 2             NEAR FIELD OPTICS//SNOM//SCANNING NEAR FIELD OPTICAL MICROSCOPY 4049
11893 1                   SCANNING THERMAL MICROSCOPY//MICRO THERMAL ANALYSIS//SCANNING THERMAL MICROSCOPE 947

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SCANNING THERMAL MICROSCOPY authKW 1437847 7% 71% 63
2 MICRO THERMAL ANALYSIS authKW 632331 3% 63% 31
3 SCANNING THERMAL MICROSCOPE authKW 237421 1% 82% 9
4 SCANNING THERMAL MICROSCOPY STHM authKW 206351 1% 80% 8
5 STHM authKW 185769 1% 52% 11
6 THERMOREFLECTANCE authKW 141695 2% 22% 20
7 MULTISCALE THERMOPHYS G PI CATHERM address 134343 1% 83% 5
8 HEATED CANTILEVER authKW 115150 1% 71% 5
9 THERMAL MICROSCOPY authKW 108598 1% 42% 8
10 HEATED MICROCANTILEVER authKW 103175 0% 80% 4

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 5823 50% 0% 477
2 Nanoscience & Nanotechnology 4603 24% 0% 227
3 Instruments & Instrumentation 2248 16% 0% 150
4 Engineering, Electrical & Electronic 1808 27% 0% 256
5 Thermodynamics 1223 10% 0% 92
6 Materials Science, Multidisciplinary 363 17% 0% 158
7 Microscopy 359 2% 0% 21
8 Engineering, Mechanical 355 7% 0% 67
9 Materials Science, Characterization, Testing 260 2% 0% 21
10 Optics 156 7% 0% 64

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MULTISCALE THERMOPHYS G PI CATHERM 134343 1% 83% 5
2 ENERGET OPT 96710 1% 25% 12
3 BILTON 72545 0% 75% 3
4 CPMOH 64893 3% 8% 24
5 DACLE LAIR 64486 0% 100% 2
6 DRT LITEN DTNM 64486 0% 100% 2
7 EQUIPE RUMENTATCNRSUPR A0005 64486 0% 100% 2
8 INSA LYONUCBL 64486 0% 100% 2
9 INTEGRATED CIRCUIT FAILURE ANAL RELIABIL CI 42989 0% 67% 2
10 LEHRSTUHL ELEKTR 42989 0% 67% 2

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MICROSCALE THERMOPHYSICAL ENGINEERING 12976 1% 4% 9
2 MICROELECTRONICS RELIABILITY 6326 4% 1% 37
3 CHEMICAL ENGINEERING WORLD 4604 0% 14% 1
4 NANOSCALE AND MICROSCALE THERMOPHYSICAL ENGINEERING 3922 1% 2% 5
5 REVIEW OF SCIENTIFIC INSTRUMENTS 3906 6% 0% 61
6 MICROELECTRONICS JOURNAL 2696 2% 0% 18
7 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS 2689 2% 1% 15
8 MICROELECTRONIC ENGINEERING 2276 3% 0% 27
9 IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES 2255 1% 1% 9
10 SENSORS AND ACTUATORS A-PHYSICAL 1990 3% 0% 25

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SCANNING THERMAL MICROSCOPY 1437847 7% 71% 63 Search SCANNING+THERMAL+MICROSCOPY Search SCANNING+THERMAL+MICROSCOPY
2 MICRO THERMAL ANALYSIS 632331 3% 63% 31 Search MICRO+THERMAL+ANALYSIS Search MICRO+THERMAL+ANALYSIS
3 SCANNING THERMAL MICROSCOPE 237421 1% 82% 9 Search SCANNING+THERMAL+MICROSCOPE Search SCANNING+THERMAL+MICROSCOPE
4 SCANNING THERMAL MICROSCOPY STHM 206351 1% 80% 8 Search SCANNING+THERMAL+MICROSCOPY+STHM Search SCANNING+THERMAL+MICROSCOPY+STHM
5 STHM 185769 1% 52% 11 Search STHM Search STHM
6 THERMOREFLECTANCE 141695 2% 22% 20 Search THERMOREFLECTANCE Search THERMOREFLECTANCE
7 HEATED CANTILEVER 115150 1% 71% 5 Search HEATED+CANTILEVER Search HEATED+CANTILEVER
8 THERMAL MICROSCOPY 108598 1% 42% 8 Search THERMAL+MICROSCOPY Search THERMAL+MICROSCOPY
9 HEATED MICROCANTILEVER 103175 0% 80% 4 Search HEATED+MICROCANTILEVER Search HEATED+MICROCANTILEVER
10 SCANNING JOULE EXPANSION MICROSCOPY 96728 0% 100% 3 Search SCANNING+JOULE+EXPANSION+MICROSCOPY Search SCANNING+JOULE+EXPANSION+MICROSCOPY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 GOMES, S , ASSY, A , CHAPUIS, PO , (2015) SCANNING THERMAL MICROSCOPY: A REVIEW.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 212. ISSUE 3. P. 477 -494 102 59% 16
2 JEONG, W , HUR, S , MEYHOFER, E , REDDY, P , (2015) SCANNING PROBE MICROSCOPY FOR THERMAL TRANSPORT MEASUREMENTS.NANOSCALE AND MICROSCALE THERMOPHYSICAL ENGINEERING. VOL. 19. ISSUE 4. P. 279 -302 65 70% 1
3 PELZL, J , CHIRTOC, M , MECKENSTOCK, R , (2013) THERMAL WAVE-BASED SCANNING PROBE MICROSCOPY AND ITS APPLICATIONS.INTERNATIONAL JOURNAL OF THERMOPHYSICS. VOL. 34. ISSUE 8-9. P. 1353-1366 35 83% 3
4 GOTZEN, NA , VAN ASSCHE, G , GHANEM, A , VAN INGELGEM, Y , HUBIN, A , VAN MELE, B , (2009) MICRO- AND NANO-THERMAL ANALYSIS APPLIED TO MULTI-LAYERED BIAXIALLY-ORIENTED POLYPROPYLENE FILMS.JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY. VOL. 95. ISSUE 1. P. 207 -213 35 90% 6
5 POLLOCK, HM , HAMMICHE, A , (2001) MICRO-THERMAL ANALYSIS: TECHNIQUES AND APPLICATIONS.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 34. ISSUE 9. P. R23 -R53 46 72% 127
6 HAMIAN, S , GAUFFREAU, AM , WALSH, T , LEE, J , PARK, K , (2016) ELECTROTHERMAL CHARACTERIZATION OF DOPED-SI HEATED MICROCANTILEVERS UNDER PERIODIC HEATING OPERATION.JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME. VOL. 138. ISSUE 5. P. - 38 67% 0
7 BONTEMPI, A , THIERY, L , TEYSSIEUX, D , BRIAND, D , VAIRAC, P , (2013) QUANTITATIVE THERMAL MICROSCOPY USING THERMOELECTRIC PROBE IN PASSIVE MODE.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 84. ISSUE 10. P. - 28 90% 5
8 GE, YF , ZHANG, Y , BOOTH, JA , WEAVER, JMR , DOBSON, PS , (2016) QUANTIFICATION OF PROBE-SAMPLE INTERACTIONS OF A SCANNING THERMAL MICROSCOPE USING A NANOFABRICATED CALIBRATION SAMPLE HAVING PROGRAMMABLE SIZE.NANOTECHNOLOGY. VOL. 27. ISSUE 32. P. - 36 65% 0
9 WIELGOSZEWSKI, G , BABIJ, M , SZELOCH, RF , GOTSZALK, T , (2014) STANDARD-BASED DIRECT CALIBRATION METHOD FOR SCANNING THERMAL MICROSCOPY NANOPROBES.SENSORS AND ACTUATORS A-PHYSICAL. VOL. 214. ISSUE . P. 1 -6 28 80% 2
10 CRETIN, B , GOMES, S , TRANNOY, N , VAIRAC, P , (2007) SCANNING THERMAL MICROSCOPY.MICROSCALE AND NANOSCALE HEAT TRANSFER. VOL. 107. ISSUE . P. 181-238 42 62% 15

Classes with closest relation at Level 1


Rank Class id link
1 37093 CLIO CHIM PHYS//BEAMLINE MIRIAM B22//CENT RADIAT SOURCE ELBE
2 21167 GAN ON DIAMOND//DEVICE THERMOG RELIABIL//CHANNEL TEMPERATURE
3 25200 THIN FILM THERMOCOUPLES//SENSORS SUR E TECHNOL PARTNERSHIP//SMART MAT MEMS
4 1002 PHONON TRANSPORT//THERMAL CONDUCTIVITY//THERMAL BOUNDARY CONDUCTANCE
5 10508 PHOTOCARRIER RADIOMETRY//ELECTRON ACOUSTIC MICROSCOPY//PA IMAGING
6 6514 LOCAL ANODIC OXIDATION//NANO OXIDATION//AFM LITHOGRAPHY
7 9949 THERMOGRAPHIC PHOSPHORS//PHOSPHOR THERMOMETRY//FLUORESCENCE INTENSITY RATIO
8 2505 MICROCANTILEVER//CANTILEVER//CANTILEVER SENSOR
9 2223 FUTURE ENERGY IFES//ATOMIC FORCE ACOUSTIC MICROSCOPY//TAPPING MODE
10 13949 DIP PEN NANOLITHOGRAPHY//DIP PEN NANOLITHOGRAPHY DPN//POLYMER PEN LITHOGRAPHY

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