Class information for:
Level 1: MICROSYST IMICRO//NAT SCI SCI//AD SAKHAROV INT STATE ECOL

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
33555 123 21.0 71%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
215 3       ZNO//ZINC OXIDE//GAS SENSOR 51306
103 2             ZNO//ZINC OXIDE//ZINC COMPOUNDS 25623
33555 1                   MICROSYST IMICRO//NAT SCI SCI//AD SAKHAROV INT STATE ECOL 123

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MICROSYST IMICRO address 934605 7% 47% 8
2 NAT SCI SCI address 760278 6% 44% 7
3 AD SAKHAROV INT STATE ECOL address 248257 1% 100% 1
4 ALUMINUM DOPED ZNO THIN FILM authKW 248257 1% 100% 1
5 AUSSENSTELLE SE6 address 248257 1% 100% 1
6 BUMP DEFECT authKW 248257 1% 100% 1
7 BUMPS REDUCTION authKW 248257 1% 100% 1
8 CHARGE TRAPPING MEMORY DEVICES authKW 248257 1% 100% 1
9 CROSS BAR MEMORIES authKW 248257 1% 100% 1
10 DEFECT GALLERY authKW 248257 1% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 562 44% 0% 54
2 Materials Science, Multidisciplinary 347 38% 0% 47
3 Physics, Condensed Matter 315 28% 0% 34
4 Physics, Multidisciplinary 197 20% 0% 24
5 Materials Science, Coatings & Films 174 9% 0% 11
6 Nanoscience & Nanotechnology 121 11% 0% 14
7 Engineering, Electrical & Electronic 63 15% 0% 19
8 Optics 33 8% 0% 10
9 Metallurgy & Metallurgical Engineering 6 3% 0% 4
10 Microscopy 5 1% 0% 1

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MICROSYST IMICRO 934605 7% 47% 8
2 NAT SCI SCI 760278 6% 44% 7
3 AD SAKHAROV INT STATE ECOL 248257 1% 100% 1
4 AUSSENSTELLE SE6 248257 1% 100% 1
5 SEMICONDUCTOR SCI TECHNOL S 248257 1% 100% 1
6 UNIT AGRATE BRIANZA 248257 1% 100% 1
7 MAT NAT SCI 203115 2% 27% 3
8 MICROSTRUCT ANAL UNIT 181191 8% 7% 10
9 MATH NAT SCI 158970 42% 1% 52
10 TOSHIBA AMER ELECT COMPONENTS INC 124127 1% 50% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ACTA PHYSICA POLONICA A 11362 19% 0% 23
2 OPTICA APPLICATA 1374 2% 0% 3
3 JOURNAL OF SURVEYING ENGINEERING 1153 1% 0% 1
4 PHILIPS JOURNAL OF RESEARCH 741 1% 0% 1
5 JOURNAL OF NANOBIOTECHNOLOGY 619 1% 0% 1
6 AIP ADVANCES 583 2% 0% 3
7 MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH 496 1% 0% 1
8 MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS 411 2% 0% 2
9 BULLETIN OF THE POLISH ACADEMY OF SCIENCES-TECHNICAL SCIENCES 309 1% 0% 1
10 OPTO-ELECTRONICS REVIEW 304 1% 0% 1

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ALUMINUM DOPED ZNO THIN FILM 248257 1% 100% 1 Search ALUMINUM+DOPED+ZNO+THIN+FILM Search ALUMINUM+DOPED+ZNO+THIN+FILM
2 BUMP DEFECT 248257 1% 100% 1 Search BUMP+DEFECT Search BUMP+DEFECT
3 BUMPS REDUCTION 248257 1% 100% 1 Search BUMPS+REDUCTION Search BUMPS+REDUCTION
4 CHARGE TRAPPING MEMORY DEVICES 248257 1% 100% 1 Search CHARGE+TRAPPING+MEMORY+DEVICES Search CHARGE+TRAPPING+MEMORY+DEVICES
5 CROSS BAR MEMORIES 248257 1% 100% 1 Search CROSS+BAR+MEMORIES Search CROSS+BAR+MEMORIES
6 DEFECT GALLERY 248257 1% 100% 1 Search DEFECT+GALLERY Search DEFECT+GALLERY
7 ELECTRICAL CONDUCTIVITY N TYPE 248257 1% 100% 1 Search ELECTRICAL+CONDUCTIVITY+N+TYPE Search ELECTRICAL+CONDUCTIVITY+N+TYPE
8 HIGH IDEALITY FACTOR 248257 1% 100% 1 Search HIGH+IDEALITY+FACTOR Search HIGH+IDEALITY+FACTOR
9 HIGH K DIELECTRIC OXIDE 248257 1% 100% 1 Search HIGH+K+DIELECTRIC+OXIDE Search HIGH+K+DIELECTRIC+OXIDE
10 ISFET MISFET TECHNOLOGY 248257 1% 100% 1 Search ISFET+MISFET+TECHNOLOGY Search ISFET+MISFET+TECHNOLOGY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 GUZIEWICZ, E , GODLEWSKI, M , KRAJEWSKI, TA , WACHNICKI, L , LUKA, G , DOMAGALA, JZ , PASZKOWICZ, W , KOWALSKI, BJ , WITKOWSKI, BS , DUZYNSKA, A , ET AL (2010) ZINC OXIDE GROWN BY ATOMIC LAYER DEPOSITION - A MATERIAL FOR NOVEL 3D ELECTRONICS.PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. VOL. 247. ISSUE 7. P. 1611-1615 8 67% 10
2 RATAJCZAK, R , STONERT, A , GUZIEWICZ, E , GIERALTOWSKA, S , KRAJEWSKI, TA , LUKA, G , WACHNICKI, L , WITKOWSKI, BS , GODLEWSKI, M , (2013) RBS/CHANNELING ANALYSIS OF ZINC OXIDE FILMS GROWN AT LOW TEMPERATURE BY ATOMIC LAYER DEPOSITION.ACTA PHYSICA POLONICA A. VOL. 123. ISSUE 5. P. 899 -903 8 62% 1
3 WITKOWSKI, BS , WACHNICKI, L , GIERALTOWSKA, S , RESZKA, A , KOWALSKI, BJ , GODLEWSKI, M , (2015) LOW-TEMPERATURE CATHODOLUMINESCENCE INVESTIGATIONS OF HIGH-QUALITY ZINC OXIDE NANORODS.MICROSCOPY AND MICROANALYSIS. VOL. 21. ISSUE 3. P. 564 -569 9 50% 1
4 GODLEWSKI, M , GUZIEWICZ, E , GIERALTOWSKA, S , LUKA, G , KRAJEWSKI, T , WACHNICKI, L , KOPALKO, K , (2009) BARRIERS IN MINIATURIZATION OF ELECTRONIC DEVICES AND THE WAYS TO OVERCOME THEM - FROM A PLANAR TO 3D DEVICE ARCHITECTURE.ACTA PHYSICA POLONICA A. VOL. 116. ISSUE . P. S19-S21 6 86% 0
5 WACHNICKI, L , KRAJEWSKI, T , LUKA, G , WITKOWSKI, B , KOWALSKI, B , KOPALKO, K , DOMAGALA, JZ , GUZIEWICZ, M , GODLEWSKI, M , GUZIEWICZ, E , (2010) MONOCRYSTALLINE ZINC OXIDE FILMS GROWN BY ATOMIC LAYER DEPOSITION.THIN SOLID FILMS. VOL. 518. ISSUE 16. P. 4556-4559 8 57% 16
6 WACHNICKI, L , DUZYNSKA, A , DOMAGALA, JZ , WITKOWSKI, BS , KRAJEWSKI, TA , PRZEZDZIECKA, E , GUZIEWICZ, M , WIERZBICKA, A , KOPALKO, K , FIGGE, S , ET AL (2011) EPITAXIAL ZNO FILMS GROWN AT LOW TEMPERATURE FOR NOVEL ELECTRONIC APPLICATION.ACTA PHYSICA POLONICA A. VOL. 120. ISSUE 6A. P. A7-A10 7 58% 1
7 PIETRUSZKA, R , LUKA, G , KOPALKO, K , ZIELONY, E , BIEGANSKI, P , PLACZEK-POPKO, E , GODLEWSKI, M , (2014) PHOTOVOLTAIC AND PHOTOELECTRICAL RESPONSE OF N-ZNO/P-SI HETEROSTRUCTURES WITH ZNO FILMS GROWN BY AN ATOMIC LAYER DEPOSITION METHOD.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 25. ISSUE . P. 190 -196 11 30% 8
8 WACHNICKI, L , LUKASIEWICZ, M , WITKOWSKI, B , KRAJEWSKI, T , LUKA, G , KOPALKO, K , MINIKAYEV, R , PRZEZDZIECKA, E , DOMAGALA, JZ , GODLEWSKI, M , ET AL (2010) COMPARISON OF DIMETHYLZINC AND DIETHYLZINC AS PRECURSORS FOR MONOCRYSTALLINE ZINC OXIDE GROWN BY ATOMIC LAYER DEPOSITION METHOD.PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. VOL. 247. ISSUE 7. P. 1699-1701 6 60% 10
9 WITKOWSKI, BS , WACHNICKI, L , NOWAKOWSKI, P , SUCHOCKI, A , GODLEWSKI, M , (2013) TEMPERATURE-DEPENDENCE OF CATHODOLUMINESCENCE OF ZINC OXIDE MONOLAYERS OBTAINED BY ATOMIC LAYER DEPOSITION.OPTICA APPLICATA. VOL. 43. ISSUE 1. P. 187-194 7 47% 1
10 MING, Z , DENG, H , ZHANG, BC , (2016) INVESTIGATION OF BUMP DEFECTS FORMED IN BACK END OF LINE FOR 28NM TECHNOLOGICAL NODE.SURFACE AND INTERFACE ANALYSIS. VOL. 48. ISSUE 10. P. 1072 -1079 3 100% 0

Classes with closest relation at Level 1


Rank Class id link
1 2435 ATOMIC LAYER DEPOSITION//ALD//MOLECULAR LAYER DEPOSITION
2 28633 ACID BASE PROPERTIES OF THE SURFACE//ADSORBATE PROBES//ADSORPTION OF AMMONIA AND OXYGEN
3 62 ZNO//P TYPE ZNO//ZNO FILMS
4 5062 UV PHOTODETECTOR//UV DETECTOR//ULTRAVIOLET PHOTODETECTOR
5 33111 HGCDTE SI HETEROSTRUCTURE//HGCDTE FILM//HGCDTE THIN FILMS
6 25274 VAPOR COOLING CONDENSATION SYSTEM//EFFICIENCY GAIN PRODUCT//ZNO GAN
7 90 AL DOPED ZNO//ZINC OXIDE//TRANSPARENT CONDUCTIVE OXIDE
8 497 THIN FILM TRANSISTORS//THIN FILM TRANSISTORS TFTS//IGZO
9 37719 COULOMBIC WELL POSITIONING//IMPURITY FRANZ KELDYSH EFFECT//INCIDENT PHOTON ENERGY
10 36951 SUPERCONDUCTORS OXIDES INNOVAT MAT DEVIC//MAT SCI SEVILLE ICMSE//NANOTECHNOL SUR ES

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