Class information for:
Level 1: HGCDTE SI HETEROSTRUCTURE//HGCDTE FILM//HGCDTE THIN FILMS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
33111 129 14.4 43%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
509 3       LASER INDUCED BREAKDOWN SPECTROSCOPY//LIBS//LASER ABLATION 21553
4189 2             ALPHA AL2O30001//HGCDTE SI HETEROSTRUCTURE//SURFYNOL 465 500
33111 1                   HGCDTE SI HETEROSTRUCTURE//HGCDTE FILM//HGCDTE THIN FILMS 129

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 HGCDTE SI HETEROSTRUCTURE authKW 946839 3% 100% 4
2 HGCDTE FILM authKW 631224 3% 67% 4
3 HGCDTE THIN FILMS authKW 532596 2% 75% 3
4 SECT EXPT PHYS address 455205 4% 38% 5
5 3D CRYSTAL DEFECTS authKW 236710 1% 100% 1
6 CUTTING PRETREATMENT authKW 236710 1% 100% 1
7 DEPOSITION TIME OF BUFFER LAYER authKW 236710 1% 100% 1
8 DIMENSIONLESS DIFFERENTIAL SLOPE authKW 236710 1% 100% 1
9 ELECTRONOGRAPHY authKW 236710 1% 100% 1
10 ELEMENTS STRUCT OPTOINFORMAT address 236710 1% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 820 51% 0% 66
2 Materials Science, Coatings & Films 768 18% 0% 23
3 Physics, Condensed Matter 472 33% 0% 42
4 Materials Science, Multidisciplinary 267 33% 0% 43
5 Metallurgy & Metallurgical Engineering 43 7% 0% 9
6 Materials Science, Ceramics 41 4% 0% 5
7 Physics, Multidisciplinary 36 9% 0% 12
8 Nanoscience & Nanotechnology 23 5% 0% 7
9 Chemistry, Physical 21 12% 0% 15
10 Physics, Fluids & Plasmas 14 3% 0% 4

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SECT EXPT PHYS 455205 4% 38% 5
2 ELEMENTS STRUCT OPTOINFORMAT 236710 1% 100% 1
3 HIGHER PEDAGOG 236710 1% 100% 1
4 LASINV LASHKARYOV SEMICOND PHYS 236710 1% 100% 1
5 LOSHKAREV SEMICOND PHYS 236710 1% 100% 1
6 PROBLEMS LOGGING INFORMAT 236710 1% 100% 1
7 SHEVCHENKO PL PHYS PROBLEMS 236710 1% 100% 1
8 HIGHER PEDAG 236708 2% 50% 2
9 IN FRANTSEVICH PROBLEMS MAT 118354 1% 50% 1
10 SCI CRYSTAL 78902 1% 33% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 TECHNICAL PHYSICS LETTERS 2336 6% 0% 8
2 TECHNICAL PHYSICS 2070 5% 0% 7
3 POWDER METALLURGY AND METAL CERAMICS 1188 2% 0% 3
4 APPLIED SURFACE SCIENCE 1131 10% 0% 13
5 METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 850 2% 0% 3
6 PLASMA PHYSICS REPORTS 773 2% 0% 3
7 MATERIALS WORLD 678 1% 0% 1
8 UKRAINSKII FIZICHESKII ZHURNAL 643 2% 0% 3
9 MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 643 2% 0% 3
10 INORGANIC MATERIALS 628 4% 0% 5

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 HGCDTE SI HETEROSTRUCTURE 946839 3% 100% 4 Search HGCDTE+SI+HETEROSTRUCTURE Search HGCDTE+SI+HETEROSTRUCTURE
2 HGCDTE FILM 631224 3% 67% 4 Search HGCDTE+FILM Search HGCDTE+FILM
3 HGCDTE THIN FILMS 532596 2% 75% 3 Search HGCDTE+THIN+FILMS Search HGCDTE+THIN+FILMS
4 3D CRYSTAL DEFECTS 236710 1% 100% 1 Search 3D+CRYSTAL+DEFECTS Search 3D+CRYSTAL+DEFECTS
5 CUTTING PRETREATMENT 236710 1% 100% 1 Search CUTTING+PRETREATMENT Search CUTTING+PRETREATMENT
6 DEPOSITION TIME OF BUFFER LAYER 236710 1% 100% 1 Search DEPOSITION+TIME+OF+BUFFER+LAYER Search DEPOSITION+TIME+OF+BUFFER+LAYER
7 DIMENSIONLESS DIFFERENTIAL SLOPE 236710 1% 100% 1 Search DIMENSIONLESS+DIFFERENTIAL+SLOPE Search DIMENSIONLESS+DIFFERENTIAL+SLOPE
8 ELECTRONOGRAPHY 236710 1% 100% 1 Search ELECTRONOGRAPHY Search ELECTRONOGRAPHY
9 FLEXIBLE NANOBRUSH 236710 1% 100% 1 Search FLEXIBLE+NANOBRUSH Search FLEXIBLE+NANOBRUSH
10 GAAS AND GAP LAYERS 236710 1% 100% 1 Search GAAS+AND+GAP+LAYERS Search GAAS+AND+GAP+LAYERS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 LIU, M , MAN, BY , LIN, XC , LI, XY , (2010) EFFECT OF TARGET-SUBSTRATE SEPARATION ON HGCDTE FILMS FORMED BY PULSED LASER DEPOSITION.JOURNAL OF CRYSTAL GROWTH. VOL. 312. ISSUE 7. P. 914-917 9 69% 0
2 LIU, M , BI, D , MAN, BY , KONG, DM , XU, XY , (2013) EFFECTS OF CDZNTE BUFFER LAYER THICKNESS ON PROPERTIES OF HGCDTE THIN FILM GROWN BY PULSED LASER DEPOSITION.APPLIED SURFACE SCIENCE. VOL. 264. ISSUE . P. 522 -526 9 50% 1
3 LIU, M , MAN, BY , LIN, XC , LI, XY , WEI, J , (2009) THE EFFECT OF SUBSTRATE MATERIAL ON PULSED LASER DEPOSITION OF HGCDTE FILMS.APPLIED SURFACE SCIENCE. VOL. 255. ISSUE 9. P. 4848 -4851 7 64% 4
4 GORBACH, TY , MATVEEVA, LA , SMERTENKO, PS , SVECHNIKOV, SV , VENGER, EF , KUZMA, M , WISZ, G , CIACH, R , RAKOWSKA, A , (2000) PROBE MICROANALYSIS INVESTIGATION AND ELECTROREFLECTANCE SPECTROSCOPY OF HG1-XCDXTEPLD FILMS ON SILICON PATTERNED SUBSTRATES.THIN SOLID FILMS. VOL. 380. ISSUE 1-2. P. 256-258 5 100% 2
5 SHUAIBOV, AK , CHUCHMAN, MP , DASHCHENKO, AI , (2003) STUDY OF THE DYNAMICS OF OPTICAL EMISSION FROM THE PLASMA FORMED DURING LASER ABLATION OF A POLYCRYSTALLINE CUINS2 TARGET.TECHNICAL PHYSICS LETTERS. VOL. 29. ISSUE 5. P. 408-410 5 83% 2
6 OSTROVSKII, IP , GIJ, YS , TSMOTS, VM , PAVLOVSKII, YP , (2004) A STUDY OF THE MORPHOLOGY AND MAGNETIC PROPERTIES OF SILICON WHISKERS.CRYSTALLOGRAPHY REPORTS. VOL. 49. ISSUE 2. P. 202-205 4 100% 3
7 GORBACH, TY , KUZMA, M , SMERTENKO, PS , SVECHNIKOV, SV , WISZ, G , (2003) ANISOTROPICALLY ETCHED SI SURFACE AND THE ELECTRICAL PROPERTIES OF SI/HGCDTE HETEROSTRUCTURES.THIN SOLID FILMS. VOL. 428. ISSUE 1-2. P. 165 -169 8 50% 2
8 DRUZHININ, AA , OSTROVSKII, IP , KHOVERKO, YM , KOGUT, IR , NICHKALO, SI , WARCHULSKA, JK , (2012) MAGNETIC SUSCEPTIBILITY OF DOPED SI NANOWHISKERS.JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY. VOL. 12. ISSUE 11. P. 8690-8693 5 63% 1
9 VIRT, IS , BESTER, M , DUMANSKI, L , KUZMA, M , RUDYJ, IO , FRUGYNSKYI, MS , KURILO, IV , (2001) PROPERTIES OF HGCDTE FILMS OBTAINED BY LASER DEPOSITION ON A SAPPHIRE.APPLIED SURFACE SCIENCE. VOL. 177. ISSUE 3. P. 201-206 6 67% 5
10 PAUSTOVSKY, OV , RUD, BM , SHELUDKO, VY , TELNIKOV, EY , KREMENYTSKY, VV , ZAK-HARCHENKO, IV , SMERTENKO, PS , ROGOZ-YNSKA, AO , (2007) STRUCTURE OF A SURFACE AND ELECTROPHYSICAL PROPERTIES OF RESISTIVE THICK FILMS BASED ON BAB6 AFTER LASER ACTION.METALLOFIZIKA I NOVEISHIE TEKHNOLOGII. VOL. 29. ISSUE 10. P. 1347-1359 4 80% 0

Classes with closest relation at Level 1


Rank Class id link
1 30985 A SCHEME//ABSOLUTE INDICATOR OF REFRACTION//ABSOLUTE REFRACTIVE INDEX
2 37635 ALPHA AL2O30001//ALPHA AL2O30001 SURFACE//COMP SOFTWARE SCI
3 31899 DPTO INGN MECAN NAVAL//LONGITUDINAL FIELD COMPONENT//MAXWELL STRESS ELEMENT
4 36488 INVERSION TYPE DEFECT//LONG RANGE PLASMONS//SURFACE MODE LIFETIME
5 1829 LASER ABLATION//PULSED LASER ABLATION//PLUME EXPANSION
6 33555 MICROSYST IMICRO//NAT SCI SCI//AD SAKHAROV INT STATE ECOL
7 8191 CDTE GAAS//CDTE//CDZNTE CDTE
8 22132 HGTE CDTE SUPERLATTICE//ENVELOPE FUNCTION FORMALISM//HGTE HGCDTE
9 37339 RADIOACTIVITY LU 171//984 KEV YB 171//BETA DECAY TO ROTATIONAL BANDS
10 33813 ALKALI HALIDE SINGLE CRYSTALS//INFLUENCE OF WATER ON ALCOHOLS//TEMPERATURE STUDY OF IR SPECTRA OF ALCOHOLS

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