Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
37719 | 50 | 20.8 | 32% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
589 | 3 | ATOMIC LAYER DEPOSITION//HFO2//HIGH K DIELECTRICS | 15224 |
3561 | 2 | DIELECTRIC PHENOMENA//CBH MECHANISM//EUROPIUM INDIUM OXIDE | 1325 |
37719 | 1 | COULOMBIC WELL POSITIONING//IMPURITY FRANZ KELDYSH EFFECT//INCIDENT PHOTON ENERGY | 50 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | COULOMBIC WELL POSITIONING | authKW | 610715 | 2% | 100% | 1 |
2 | IMPURITY FRANZ KELDYSH EFFECT | authKW | 610715 | 2% | 100% | 1 |
3 | INCIDENT PHOTON ENERGY | authKW | 610715 | 2% | 100% | 1 |
4 | L PISARZHEVSKY PHYS CHEM | address | 610715 | 2% | 100% | 1 |
5 | MACROPOROUS SILICON STRUCTURES | authKW | 610715 | 2% | 100% | 1 |
6 | OXIDIZED MACROPOROUS SILICON | authKW | 610715 | 2% | 100% | 1 |
7 | PHOTON SEMICOND STRUCT | address | 610715 | 2% | 100% | 1 |
8 | QUASI GUIDED AND PHOTONIC MODES | authKW | 610715 | 2% | 100% | 1 |
9 | SIO2 NANOCOATINGS | authKW | 610715 | 2% | 100% | 1 |
10 | TOIRE CHIM MET TER RA | address | 610715 | 2% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 349 | 44% | 0% | 22 |
2 | Physics, Applied | 303 | 50% | 0% | 25 |
3 | Materials Science, Coatings & Films | 181 | 14% | 0% | 7 |
4 | Nanoscience & Nanotechnology | 55 | 12% | 0% | 6 |
5 | Physics, Fluids & Plasmas | 47 | 8% | 0% | 4 |
6 | Optics | 34 | 12% | 0% | 6 |
7 | Materials Science, Multidisciplinary | 31 | 20% | 0% | 10 |
8 | Engineering, Electrical & Electronic | 20 | 14% | 0% | 7 |
9 | Chemistry, Physical | 20 | 16% | 0% | 8 |
10 | Physics, Multidisciplinary | 10 | 8% | 0% | 4 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | L PISARZHEVSKY PHYS CHEM | 610715 | 2% | 100% | 1 |
2 | PHOTON SEMICOND STRUCT | 610715 | 2% | 100% | 1 |
3 | TOIRE CHIM MET TER RA | 610715 | 2% | 100% | 1 |
4 | V LASHKARYOV SEMICOND PHYS | 47852 | 10% | 2% | 5 |
5 | MET INZYNIERII MAT IM A KRUPKOWSKIEGO | 30534 | 2% | 5% | 1 |
6 | V LASHKAREV SEMICOND PHYS | 9251 | 2% | 2% | 1 |
7 | ISIR | 3403 | 4% | 0% | 2 |
8 | LV PISARZHEVSKY PHYS CHEM | 2111 | 2% | 0% | 1 |
9 | ELECT ELECT COMMUN ENGN | 2018 | 4% | 0% | 2 |
10 | SEMICOND DEVICE | 1694 | 2% | 0% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | REVUE DE PHYSIQUE APPLIQUEE | 16707 | 12% | 0% | 6 |
2 | OPTO-ELECTRONICS REVIEW | 12026 | 8% | 0% | 4 |
3 | JOURNAL DE PHYSIQUE III | 2285 | 4% | 0% | 2 |
4 | JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1969 | 8% | 0% | 4 |
5 | PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1931 | 2% | 0% | 1 |
6 | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | 1125 | 2% | 0% | 1 |
7 | IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY | 879 | 2% | 0% | 1 |
8 | ACS PHOTONICS | 778 | 2% | 0% | 1 |
9 | INTERNATIONAL JOURNAL OF NANOTECHNOLOGY | 701 | 2% | 0% | 1 |
10 | RADIATION EFFECTS AND DEFECTS IN SOLIDS | 524 | 4% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | HARRELL, WR , GOPALAKRISHNAN, C , (2002) IMPLICATIONS OF ADVANCED MODELING ON THE OBSERVATION OF POOLE-FRENKEL EFFECT SATURATION.THIN SOLID FILMS. VOL. 405. ISSUE 1-2. P. 205-217 | 8 | 80% | 16 |
2 | KARACHEVTSEVA, L , GOLTVIANSKY, Y , SAPELNIKOVA, O , LYTVYNENKO, O , STRONSKA, O , BO, W , KARTEL, M , (2016) WANNIER-STARK ELECTRO-OPTICAL EFFECT, QUASI-GUIDED AND PHOTONIC MODES IN 2D MACROPOROUS SILICON STRUCTURES WITH SIO2 COATINGS.APPLIED SURFACE SCIENCE. VOL. 388. ISSUE . P. 120 -125 | 7 | 47% | 0 |
3 | PILLONNET, A , ONGARO, R , GAROUM, M , (1992) MODEL OF DIELECTRIC COMBINING POOLE-FRENKEL AND MAXWELL-WAGNER EFFECTS.JOURNAL DE PHYSIQUE III. VOL. 2. ISSUE 6. P. 885-898 | 6 | 100% | 0 |
4 | PILLONNET, A , ONGARO, R , (1991) SIMULATED BEHAVIOR OF FIELD-ASSISTED IONIZATION IN THE THEORY OF SYNTHETIC POOLE-FRENKEL EFFECT.JOURNAL DE PHYSIQUE III. VOL. 1. ISSUE 8. P. 1449-1454 | 6 | 100% | 0 |
5 | ONGARO, R , PILLONNET, A , (1991) SYNTHETIC THEORY OF POOLE AND POOLE-FRENKEL (PF) EFFECTS.IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY. VOL. 138. ISSUE 2. P. 127-137 | 7 | 70% | 12 |
6 | ONGARO, R , PILLONNET, A , (1992) THE PROBLEM OF DERIVING THE FIELD-INDUCED THERMAL EMISSION IN POOLE-FRENKEL THEORIES.RADIATION EFFECTS AND DEFECTS IN SOLIDS. VOL. 124. ISSUE 3. P. 289-300 | 8 | 53% | 1 |
7 | KARACHEVTSEVA, L , KUCHMII, S , STROYUK, O , LYTVYNENKO, O , SAPELNIKOVA, O , STRONSKA, O , BO, W , KARTEL, M , (2016) LIGHT-EMITTING STRUCTURES OF CDS NANOCRYSTALS IN OXIDIZED MACROPOROUS SILICON.APPLIED SURFACE SCIENCE. VOL. 388. ISSUE . P. 288 -293 | 5 | 36% | 0 |
8 | HARRELL, WR , FREY, J , (1999) OBSERVATION OF POOLE-FRENKEL EFFECT SATURATION IN SIO2 AND OTHER INSULATING FILMS.THIN SOLID FILMS. VOL. 352. ISSUE 1-2. P. 195-204 | 6 | 38% | 88 |
9 | CHAKRABORTY, PK , GHOSHAL, S , GHATAK, KP , (2006) SIMPLE THEORETICAL ANALYSIS OF THE INTERBAND OPTICAL ABSORPTION COEFFICIENT IN WIDE-GAP SEMICONDUCTORS IN THE PRESENCE OF AN EXTERNAL ELECTRIC FIELD AND ITS DEPENDENCE ON A LONGITUDINAL MAGNETIC FIELD.PHYSICA B-CONDENSED MATTER. VOL. 382. ISSUE 1-2. P. 26 -37 | 2 | 100% | 0 |
10 | KARACHEVTSEVA, L , GOLTVIANSKY, Y , KOLESNYK, O , LYTVYNENKO, O , STRONSKA, O , (2014) WANNIER-STARK EFFECT AND ELECTRON-PHONON INTERACTION IN MACROPOROUS SILICON STRUCTURES WITH SIO2 NANOCOATINGS.OPTO-ELECTRONICS REVIEW. VOL. 22. ISSUE 4. P. 201 -206 | 4 | 40% | 0 |
Classes with closest relation at Level 1 |