Class information for:
Level 1: MECHANICAL RELIABILITY PREDICTION//NO FAULT FOUND//NO FAULT FOUND NFF

Basic class information

Class id #P Avg. number of
references
Database coverage
of references
25446 281 20.0 27%



Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
9 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS 1247339
601 3       FRACTIONAL FOURIER TRANSFORM//MECHANICAL SYSTEMS AND SIGNAL PROCESSING//MICROELECTRONICS AND RELIABILITY 14504
1682 2             MICROELECTRONICS AND RELIABILITY//PREVENTIVE MAINTENANCE//MINIMAL REPAIR 6782
25446 1                   MECHANICAL RELIABILITY PREDICTION//NO FAULT FOUND//NO FAULT FOUND NFF 281

Terms with highest relevance score



rank Term termType Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 MECHANICAL RELIABILITY PREDICTION authKW 665580 2% 88% 7
2 NO FAULT FOUND authKW 452775 2% 83% 5
3 NO FAULT FOUND NFF authKW 325999 1% 100% 3
4 MIL HDBK 217 authKW 301847 2% 56% 5
5 INTEGRATED SYSTEM HEALTH MANAGEMENT authKW 289774 1% 67% 4
6 COMMERCIAL RELIABILITY PROGRAM authKW 217333 1% 100% 2
7 ELECTRONIC COMPONENT RELIABILITY authKW 217333 1% 100% 2
8 MAINTENANCE MAN HOURS authKW 217333 1% 100% 2
9 MANNED SPACECRAFT AVIONICS MSA authKW 217333 1% 100% 2
10 STX TECHNOL address 217333 1% 100% 2

Web of Science journal categories



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 Engineering, Industrial 2587 17% 0% 47
2 Engineering, General 1948 20% 0% 57
3 Engineering, Electrical & Electronic 1627 45% 0% 126
4 Engineering, Aerospace 1171 10% 0% 28
5 Computer Science, Hardware & Architecture 1110 11% 0% 32
6 Computer Science, Software Engineering 865 13% 0% 37
7 Operations Research & Management Science 853 13% 0% 36
8 Engineering, Manufacturing 708 9% 0% 25
9 Nanoscience & Nanotechnology 317 12% 0% 34
10 Materials Science, Characterization, Testing 307 4% 0% 12

Address terms



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 STX TECHNOL 217333 1% 100% 2
2 CALCE ELECT PACKAGING 181104 2% 33% 5
3 UNCERTAIN DECIS MAKING 144883 1% 33% 4
4 CALCE ELECT PROD SYST 124062 5% 9% 13
5 ACCESSORIES 108666 0% 100% 1
6 AIX EN PROVENCE 2 108666 0% 100% 1
7 ALS NSCORT 108666 0% 100% 1
8 AMSRL SE RD 108666 0% 100% 1
9 CHAIR E FINANCE SERV SCI 108666 0% 100% 1
10 COMMERCIAL AVIAT SYST 108666 0% 100% 1

Journals



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 PROCEEDINGS : ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM 69446 6% 4% 17
2 PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM 66531 5% 4% 14
3 IEEE TRANSACTIONS ON RELIABILITY 32228 11% 1% 30
4 MICROELECTRONICS RELIABILITY 16068 11% 0% 32
5 JOURNAL OF COMPUTING AND INFORMATION SCIENCE IN ENGINEERING 7259 2% 1% 6
6 IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE 6730 3% 1% 8
7 RELIABILITY ENGINEERING & SYSTEM SAFETY 5794 5% 0% 15
8 ENGINEERING FAILURE ANALYSIS 4725 4% 0% 11
9 QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL 4227 3% 0% 8
10 JOURNAL OF THE INSTITUTE OF ENVIRONMENTAL SCIENCES 3394 0% 3% 1

Author Key Words



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
LCSH search Wikipedia search
1 MECHANICAL RELIABILITY PREDICTION 665580 2% 88% 7 Search MECHANICAL+RELIABILITY+PREDICTION Search MECHANICAL+RELIABILITY+PREDICTION
2 NO FAULT FOUND 452775 2% 83% 5 Search NO+FAULT+FOUND Search NO+FAULT+FOUND
3 NO FAULT FOUND NFF 325999 1% 100% 3 Search NO+FAULT+FOUND+NFF Search NO+FAULT+FOUND+NFF
4 MIL HDBK 217 301847 2% 56% 5 Search MIL+HDBK+217 Search MIL+HDBK+217
5 INTEGRATED SYSTEM HEALTH MANAGEMENT 289774 1% 67% 4 Search INTEGRATED+SYSTEM+HEALTH+MANAGEMENT Search INTEGRATED+SYSTEM+HEALTH+MANAGEMENT
6 COMMERCIAL RELIABILITY PROGRAM 217333 1% 100% 2 Search COMMERCIAL+RELIABILITY+PROGRAM Search COMMERCIAL+RELIABILITY+PROGRAM
7 ELECTRONIC COMPONENT RELIABILITY 217333 1% 100% 2 Search ELECTRONIC+COMPONENT+RELIABILITY Search ELECTRONIC+COMPONENT+RELIABILITY
8 MAINTENANCE MAN HOURS 217333 1% 100% 2 Search MAINTENANCE+MAN+HOURS Search MAINTENANCE+MAN+HOURS
9 MANNED SPACECRAFT AVIONICS MSA 217333 1% 100% 2 Search MANNED+SPACECRAFT+AVIONICS+MSA Search MANNED+SPACECRAFT+AVIONICS+MSA
10 THE SPOON SHAPED CURVE 217333 1% 100% 2 Search THE+SPOON+SHAPED+CURVE Search THE+SPOON+SHAPED+CURVE

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.



Rank Reference # ref.
in cl.
Shr. of ref. in
cl.
Citations
1 WOO, SW , PARK, J , PECHT, M , (2011) RELIABILITY DESIGN AND CASE STUDY OF REFRIGERATOR PARTS SUBJECTED TO REPETITIVE LOADS UNDER CONSUMER USAGE CONDITIONS.ENGINEERING FAILURE ANALYSIS. VOL. 18. ISSUE 7. P. 1818 -1830 11 100% 1
2 WOO, SW , O'NEAL, DL , PECHT, M , (2011) RELIABILITY DESIGN OF RESIDENTIAL SIZED REFRIGERATORS SUBJECTED TO REPETITIVE RANDOM VIBRATION LOADS DURING RAIL TRANSPORT.ENGINEERING FAILURE ANALYSIS. VOL. 18. ISSUE 5. P. 1322-1332 11 100% 0
3 WOO, SW , O'NEAL, DL , PECHT, M , (2010) RELIABILITY DESIGN OF A RECIPROCATING COMPRESSOR SUCTION REED VALVE IN A COMMON REFRIGERATOR SUBJECTED TO REPETITIVE PRESSURE LOADS.ENGINEERING FAILURE ANALYSIS. VOL. 17. ISSUE 4. P. 979 -991 10 100% 3
4 KHAN, S , PHILLIPS, P , JENNIONS, I , HOCKLEY, C , (2014) NO FAULT FOUND EVENTS IN MAINTENANCE ENGINEERING PART 1: CURRENT TRENDS, IMPLICATIONS AND ORGANIZATIONAL PRACTICES.RELIABILITY ENGINEERING & SYSTEM SAFETY. VOL. 123. ISSUE . P. 183 -195 14 47% 3
5 PECHT, M , DAS, D , RAMAKRISHNAN, A , (2002) THE IEEE STANDARDS ON RELIABILITY PROGRAM AND RELIABILITY PREDICTION METHODS FOR ELECTRONIC EQUIPMENT.MICROELECTRONICS RELIABILITY. VOL. 42. ISSUE 9-11. P. 1259 -1266 9 90% 23
6 ALSHEIKHLY, M , CHRISTOU, A , (1994) HOW RADIATION AFFECTS POLYMERIC MATERIALS.IEEE TRANSACTIONS ON RELIABILITY. VOL. 43. ISSUE 4. P. 551 -556 12 92% 3
7 GOEL, A , GRAVES, RJ , (2006) ELECTRONIC SYSTEM RELIABILITY: COLLATING PREDICTION MODELS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 6. ISSUE 2. P. 258-265 11 65% 19
8 WOO, S , O'NEAL, DL , PECHT, M , (2010) FAILURE ANALYSIS AND REDESIGN OF THE EVAPORATOR TUBING IN A KIMCHI REFRIGERATOR.ENGINEERING FAILURE ANALYSIS. VOL. 17. ISSUE 2. P. 369-379 7 88% 3
9 PECHT, M , SHIBUTANI, T , KANG, M , HODKIEWICZ, M , CRIPPS, E , (2016) A FUSION PROGNOSTICS-BASED QUALIFICATION TEST METHODOLOGY FOR MICROELECTRONIC PRODUCTS.MICROELECTRONICS RELIABILITY. VOL. 63. ISSUE . P. 320 -324 8 67% 0
10 DIAZ, C , KANG, SM , DUVVURY, C , (1995) ELECTRICAL OVERSTRESS AND ELECTROSTATIC DISCHARGE.IEEE TRANSACTIONS ON RELIABILITY. VOL. 44. ISSUE 1. P. 2-5 13 72% 13

Classes with closest relation at Level 1



Rank Class id link
1 28188 WARRANTY DATA//SECT PROD PROC QUAL//MATURITY INDEX ON RELIABILITY MIR
2 34487 DMSMS//OBSOLESCENCE MANAGEMENT//PARAMETER CONFORMANCE
3 20299 ELECTROCHEMICAL MIGRATION//ELECTROCHEMICAL MIGRATION ECM//CONDUCTIVE ANODIC FILAMENT
4 33587 BALLISTIC CARRIER TRANSPORT//ELE ON TELECOMMUN RENNESUMR 6164//ELE ONS SEMICOND PLICAT ELSA
5 6526 CONDITION BASED MAINTENANCE//REMAINING USEFUL LIFE//PROGNOSTICS
6 31163 SEQUENTIAL FAULT DIAGNOSIS//TEST SEQUENCING PROBLEM//TEST SEQUENCING
7 16728 ADV DESIGN MFG RELIABIL MEMS NEMS ODES//DROP TEST//SOLDER JOINT
8 29141 STANDARDIZAT TRANSPORTAT PROD LOGIST//FAILURE AND REPAIR DATA//MIXED LUBRICATION ANALYSIS
9 36044 ACID DECAPSULATION//ACOUSTIC BALL BOND INSPECTION//ACOUSTIC GHZ MICROSCOPY
10 37550 44 BSD CONS//CONNECTION ORIENTED NETWORK SERVICE//DIPARTIMENTO ELETTRON INTELIGNEZA ARTIFICIALE T

Go to start page