Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
25446 | 281 | 20.0 | 27% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | MECHANICAL RELIABILITY PREDICTION | authKW | 665580 | 2% | 88% | 7 |
2 | NO FAULT FOUND | authKW | 452775 | 2% | 83% | 5 |
3 | NO FAULT FOUND NFF | authKW | 325999 | 1% | 100% | 3 |
4 | MIL HDBK 217 | authKW | 301847 | 2% | 56% | 5 |
5 | INTEGRATED SYSTEM HEALTH MANAGEMENT | authKW | 289774 | 1% | 67% | 4 |
6 | COMMERCIAL RELIABILITY PROGRAM | authKW | 217333 | 1% | 100% | 2 |
7 | ELECTRONIC COMPONENT RELIABILITY | authKW | 217333 | 1% | 100% | 2 |
8 | MAINTENANCE MAN HOURS | authKW | 217333 | 1% | 100% | 2 |
9 | MANNED SPACECRAFT AVIONICS MSA | authKW | 217333 | 1% | 100% | 2 |
10 | STX TECHNOL | address | 217333 | 1% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Industrial | 2587 | 17% | 0% | 47 |
2 | Engineering, General | 1948 | 20% | 0% | 57 |
3 | Engineering, Electrical & Electronic | 1627 | 45% | 0% | 126 |
4 | Engineering, Aerospace | 1171 | 10% | 0% | 28 |
5 | Computer Science, Hardware & Architecture | 1110 | 11% | 0% | 32 |
6 | Computer Science, Software Engineering | 865 | 13% | 0% | 37 |
7 | Operations Research & Management Science | 853 | 13% | 0% | 36 |
8 | Engineering, Manufacturing | 708 | 9% | 0% | 25 |
9 | Nanoscience & Nanotechnology | 317 | 12% | 0% | 34 |
10 | Materials Science, Characterization, Testing | 307 | 4% | 0% | 12 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | STX TECHNOL | 217333 | 1% | 100% | 2 |
2 | CALCE ELECT PACKAGING | 181104 | 2% | 33% | 5 |
3 | UNCERTAIN DECIS MAKING | 144883 | 1% | 33% | 4 |
4 | CALCE ELECT PROD SYST | 124062 | 5% | 9% | 13 |
5 | ACCESSORIES | 108666 | 0% | 100% | 1 |
6 | AIX EN PROVENCE 2 | 108666 | 0% | 100% | 1 |
7 | ALS NSCORT | 108666 | 0% | 100% | 1 |
8 | AMSRL SE RD | 108666 | 0% | 100% | 1 |
9 | CHAIR E FINANCE SERV SCI | 108666 | 0% | 100% | 1 |
10 | COMMERCIAL AVIAT SYST | 108666 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PROCEEDINGS : ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 69446 | 6% | 4% | 17 |
2 | PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 66531 | 5% | 4% | 14 |
3 | IEEE TRANSACTIONS ON RELIABILITY | 32228 | 11% | 1% | 30 |
4 | MICROELECTRONICS RELIABILITY | 16068 | 11% | 0% | 32 |
5 | JOURNAL OF COMPUTING AND INFORMATION SCIENCE IN ENGINEERING | 7259 | 2% | 1% | 6 |
6 | IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE | 6730 | 3% | 1% | 8 |
7 | RELIABILITY ENGINEERING & SYSTEM SAFETY | 5794 | 5% | 0% | 15 |
8 | ENGINEERING FAILURE ANALYSIS | 4725 | 4% | 0% | 11 |
9 | QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL | 4227 | 3% | 0% | 8 |
10 | JOURNAL OF THE INSTITUTE OF ENVIRONMENTAL SCIENCES | 3394 | 0% | 3% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | WOO, SW , PARK, J , PECHT, M , (2011) RELIABILITY DESIGN AND CASE STUDY OF REFRIGERATOR PARTS SUBJECTED TO REPETITIVE LOADS UNDER CONSUMER USAGE CONDITIONS.ENGINEERING FAILURE ANALYSIS. VOL. 18. ISSUE 7. P. 1818 -1830 | 11 | 100% | 1 |
2 | WOO, SW , O'NEAL, DL , PECHT, M , (2011) RELIABILITY DESIGN OF RESIDENTIAL SIZED REFRIGERATORS SUBJECTED TO REPETITIVE RANDOM VIBRATION LOADS DURING RAIL TRANSPORT.ENGINEERING FAILURE ANALYSIS. VOL. 18. ISSUE 5. P. 1322-1332 | 11 | 100% | 0 |
3 | WOO, SW , O'NEAL, DL , PECHT, M , (2010) RELIABILITY DESIGN OF A RECIPROCATING COMPRESSOR SUCTION REED VALVE IN A COMMON REFRIGERATOR SUBJECTED TO REPETITIVE PRESSURE LOADS.ENGINEERING FAILURE ANALYSIS. VOL. 17. ISSUE 4. P. 979 -991 | 10 | 100% | 3 |
4 | KHAN, S , PHILLIPS, P , JENNIONS, I , HOCKLEY, C , (2014) NO FAULT FOUND EVENTS IN MAINTENANCE ENGINEERING PART 1: CURRENT TRENDS, IMPLICATIONS AND ORGANIZATIONAL PRACTICES.RELIABILITY ENGINEERING & SYSTEM SAFETY. VOL. 123. ISSUE . P. 183 -195 | 14 | 47% | 3 |
5 | PECHT, M , DAS, D , RAMAKRISHNAN, A , (2002) THE IEEE STANDARDS ON RELIABILITY PROGRAM AND RELIABILITY PREDICTION METHODS FOR ELECTRONIC EQUIPMENT.MICROELECTRONICS RELIABILITY. VOL. 42. ISSUE 9-11. P. 1259 -1266 | 9 | 90% | 23 |
6 | ALSHEIKHLY, M , CHRISTOU, A , (1994) HOW RADIATION AFFECTS POLYMERIC MATERIALS.IEEE TRANSACTIONS ON RELIABILITY. VOL. 43. ISSUE 4. P. 551 -556 | 12 | 92% | 3 |
7 | GOEL, A , GRAVES, RJ , (2006) ELECTRONIC SYSTEM RELIABILITY: COLLATING PREDICTION MODELS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 6. ISSUE 2. P. 258-265 | 11 | 65% | 19 |
8 | WOO, S , O'NEAL, DL , PECHT, M , (2010) FAILURE ANALYSIS AND REDESIGN OF THE EVAPORATOR TUBING IN A KIMCHI REFRIGERATOR.ENGINEERING FAILURE ANALYSIS. VOL. 17. ISSUE 2. P. 369-379 | 7 | 88% | 3 |
9 | PECHT, M , SHIBUTANI, T , KANG, M , HODKIEWICZ, M , CRIPPS, E , (2016) A FUSION PROGNOSTICS-BASED QUALIFICATION TEST METHODOLOGY FOR MICROELECTRONIC PRODUCTS.MICROELECTRONICS RELIABILITY. VOL. 63. ISSUE . P. 320 -324 | 8 | 67% | 0 |
10 | DIAZ, C , KANG, SM , DUVVURY, C , (1995) ELECTRICAL OVERSTRESS AND ELECTROSTATIC DISCHARGE.IEEE TRANSACTIONS ON RELIABILITY. VOL. 44. ISSUE 1. P. 2-5 | 13 | 72% | 13 |
Classes with closest relation at Level 1 |