Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 33587 | 122 | 31.8 | 15% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | ECONOMICS//EDUCATION & EDUCATIONAL RESEARCH//PSYCHOL | 3876184 |
| 310 | 3 | INFORMATION SCIENCE & LIBRARY SCIENCE//INFORMATION & MANAGEMENT//GOVERNMENT INFORMATION QUARTERLY | 40167 |
| 3788 | 2 | END USER SYSTEMS//HOME INFORMATION SERVICES//WORD PROCESSING & INFORMATION SYSTEMS | 970 |
| 33587 | 1 | BALLISTIC CARRIER TRANSPORT//ELE ON TELECOMMUN RENNESUMR 6164//ELE ONS SEMICOND PLICAT ELSA | 122 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | BALLISTIC CARRIER TRANSPORT | authKW | 250292 | 1% | 100% | 1 |
| 2 | ELE ON TELECOMMUN RENNESUMR 6164 | address | 250292 | 1% | 100% | 1 |
| 3 | ELE ONS SEMICOND PLICAT ELSA | address | 250292 | 1% | 100% | 1 |
| 4 | NANOSCALE VACUUM ELECTRONICS | authKW | 250292 | 1% | 100% | 1 |
| 5 | DISTRIBUTION TRANSPARENCY | authKW | 125145 | 1% | 50% | 1 |
| 6 | EYRING RELATION | authKW | 125145 | 1% | 50% | 1 |
| 7 | GRAPHENE SI HETEROJUNCTION | authKW | 125145 | 1% | 50% | 1 |
| 8 | GRP MICROELE ON | address | 125145 | 1% | 50% | 1 |
| 9 | QUANTUM GAIN | authKW | 125145 | 1% | 50% | 1 |
| 10 | IMPLANT PACKAGING | authKW | 83429 | 1% | 33% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 1419 | 62% | 0% | 76 |
| 2 | Computer Science, Hardware & Architecture | 564 | 12% | 0% | 15 |
| 3 | COMPUTER APPLICATIONS & CYBERNETICS | 379 | 2% | 0% | 2 |
| 4 | Computer Science, Software Engineering | 372 | 13% | 0% | 16 |
| 5 | Law | 220 | 8% | 0% | 10 |
| 6 | Nanoscience & Nanotechnology | 212 | 15% | 0% | 18 |
| 7 | Physics, Applied | 202 | 28% | 0% | 34 |
| 8 | Telecommunications | 125 | 9% | 0% | 11 |
| 9 | Information Science & Library Science | 74 | 4% | 0% | 5 |
| 10 | International Relations | 65 | 3% | 0% | 4 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ELE ON TELECOMMUN RENNESUMR 6164 | 250292 | 1% | 100% | 1 |
| 2 | ELE ONS SEMICOND PLICAT ELSA | 250292 | 1% | 100% | 1 |
| 3 | GRP MICROELE ON | 125145 | 1% | 50% | 1 |
| 4 | UP A 6076 | 37077 | 2% | 7% | 2 |
| 5 | GRP MICROELECT VISUALISAT | 23279 | 2% | 5% | 2 |
| 6 | MINNESOTA STROKE INITIAT | 20856 | 1% | 8% | 1 |
| 7 | IMPLANTED DEVICES GRP | 9625 | 1% | 4% | 1 |
| 8 | PMO | 8072 | 1% | 3% | 1 |
| 9 | PHYS COMPOSANTS SEMICOND | 3625 | 1% | 1% | 1 |
| 10 | NETWORK INNOVAT S | 3215 | 2% | 1% | 2 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | BELL LABORATORIES RECORD | 80446 | 2% | 11% | 3 |
| 2 | ELECTRONICS | 31433 | 6% | 2% | 7 |
| 3 | IEEE TRANSACTIONS ON RELIABILITY | 16168 | 11% | 0% | 14 |
| 4 | MICROELECTRONICS RELIABILITY | 10452 | 14% | 0% | 17 |
| 5 | MICROELECTRONICS AND RELIABILITY | 8347 | 5% | 1% | 6 |
| 6 | CRYSTAL LATTICE DEFECTS | 7583 | 1% | 3% | 1 |
| 7 | ANNUAL REVIEW OF INFORMATION SCIENCE AND TECHNOLOGY | 7261 | 2% | 1% | 3 |
| 8 | JOURNAL OF ARTS MANAGEMENT AND LAW | 4313 | 1% | 2% | 1 |
| 9 | TELECOMMUNICATION JOURNAL | 3523 | 1% | 1% | 1 |
| 10 | INFOSYSTEMS | 3166 | 1% | 1% | 1 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | BALLISTIC CARRIER TRANSPORT | 250292 | 1% | 100% | 1 | Search BALLISTIC+CARRIER+TRANSPORT | Search BALLISTIC+CARRIER+TRANSPORT |
| 2 | NANOSCALE VACUUM ELECTRONICS | 250292 | 1% | 100% | 1 | Search NANOSCALE+VACUUM+ELECTRONICS | Search NANOSCALE+VACUUM+ELECTRONICS |
| 3 | DISTRIBUTION TRANSPARENCY | 125145 | 1% | 50% | 1 | Search DISTRIBUTION+TRANSPARENCY | Search DISTRIBUTION+TRANSPARENCY |
| 4 | EYRING RELATION | 125145 | 1% | 50% | 1 | Search EYRING+RELATION | Search EYRING+RELATION |
| 5 | GRAPHENE SI HETEROJUNCTION | 125145 | 1% | 50% | 1 | Search GRAPHENE+SI+HETEROJUNCTION | Search GRAPHENE+SI+HETEROJUNCTION |
| 6 | QUANTUM GAIN | 125145 | 1% | 50% | 1 | Search QUANTUM+GAIN | Search QUANTUM+GAIN |
| 7 | IMPLANT PACKAGING | 83429 | 1% | 33% | 1 | Search IMPLANT+PACKAGING | Search IMPLANT+PACKAGING |
| 8 | CARRIER FREEZE OUT | 50057 | 1% | 20% | 1 | Search CARRIER+FREEZE+OUT | Search CARRIER+FREEZE+OUT |
| 9 | MESSAGE COMMUNICATION | 50057 | 1% | 20% | 1 | Search MESSAGE+COMMUNICATION | Search MESSAGE+COMMUNICATION |
| 10 | PHYSICS OF FAILURE POF | 41714 | 1% | 17% | 1 | Search PHYSICS+OF+FAILURE+POF | Search PHYSICS+OF+FAILURE+POF |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | REY-TAURIAC, Y , DE SAGAZAN, O , TAURIN, M , BONNAUD, O , (2003) ROBUSTNESS IMPROVEMENT OF VDMOS TRANSISTORS IN BIPOLAR/CMOS/DMOS TECHNOLOGY.MICROELECTRONICS RELIABILITY. VOL. 43. ISSUE 9-11. P. 1865-1869 | 3 | 100% | 0 |
| 2 | STOJADINOVIC, ND , (1983) FAILURE PHYSICS OF INTEGRATED-CIRCUITS - A REVIEW.MICROELECTRONICS RELIABILITY. VOL. 23. ISSUE 4. P. 609 -707 | 12 | 60% | 24 |
| 3 | ZIMMERMAN, EK , BRIMMER, KW , (1981) NATIONAL PLANNING FOR DATA COMMUNICATIONS.ANNUAL REVIEW OF INFORMATION SCIENCE AND TECHNOLOGY. VOL. 16. ISSUE . P. 3-49 | 8 | 100% | 4 |
| 4 | BRIMMER, KW , (1982) UNITED-STATES TELECOMMUNICATIONS COMMON CARRIER POLICY.ANNUAL REVIEW OF INFORMATION SCIENCE AND TECHNOLOGY. VOL. 17. ISSUE . P. 33-82 | 8 | 89% | 3 |
| 5 | FROST, DF , POOLE, KF , (1987) A METHOD FOR PREDICTING VLSI-DEVICE RELIABILITY USING SERIES MODELS FOR FAILURE MECHANISMS.IEEE TRANSACTIONS ON RELIABILITY. VOL. 36. ISSUE 2. P. 234 -242 | 8 | 62% | 5 |
| 6 | SCHNABLE, GL , COMIZZOLI, RB , (1981) CMOS INTEGRATED-CIRCUIT RELIABILITY.MICROELECTRONICS RELIABILITY. VOL. 21. ISSUE 1. P. 33 -50 | 11 | 69% | 4 |
| 7 | STOJADINOVIC, ND , RISTIC, SD , (1983) FAILURE PHYSICS OF INTEGRATED-CIRCUITS AND RELATIONSHIP TO RELIABILITY.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 75. ISSUE 1. P. 11 -48 | 9 | 69% | 4 |
| 8 | CAWKELL, T , (1997) COMMUNICATIONS 98; A REVIEW. PART I.ASLIB PROCEEDINGS. VOL. 49. ISSUE 9. P. 243 -249 | 3 | 100% | 0 |
| 9 | EVSEEV, S , CACCIATO, A , (2005) ONSET AND RECOVERY OF ELECTRICAL INSTABILITIES IN CONDUCTING DOUBLE-LAYER DIELECTRIC FILMS.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 152. ISSUE 2. P. F15-F19 | 3 | 75% | 1 |
| 10 | EVSEEV, SB , (2007) EYRING ACCELERATION MODEL IN THICK NITRIDE/OXIDE DIELECTRICS.MICROELECTRONICS RELIABILITY. VOL. 47. ISSUE 4-5. P. 748-751 | 2 | 100% | 1 |
Classes with closest relation at Level 1 |