Class information for:
Level 1: DMSMS//OBSOLESCENCE MANAGEMENT//PARAMETER CONFORMANCE

Basic class information

Class id #P Avg. number of
references
Database coverage
of references
34487 111 23.1 26%



Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
9 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS 1247339
601 3       FRACTIONAL FOURIER TRANSFORM//MECHANICAL SYSTEMS AND SIGNAL PROCESSING//MICROELECTRONICS AND RELIABILITY 14504
1682 2             MICROELECTRONICS AND RELIABILITY//PREVENTIVE MAINTENANCE//MINIMAL REPAIR 6782
34487 1                   DMSMS//OBSOLESCENCE MANAGEMENT//PARAMETER CONFORMANCE 111

Terms with highest relevance score



rank Term termType Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 DMSMS authKW 2475860 8% 100% 9
2 OBSOLESCENCE MANAGEMENT authKW 982481 5% 71% 5
3 PARAMETER CONFORMANCE authKW 825287 3% 100% 3
4 PARAMETER RECHARACTERIZATION authKW 825287 3% 100% 3
5 STRESS BALANCING authKW 825287 3% 100% 3
6 OBSOLESCENCE authKW 795782 16% 16% 18
7 CALCE ELECT PROD SYST address 670977 17% 13% 19
8 TECHNOLOGY INSERTION authKW 628786 4% 57% 4
9 DESIGN REFRESH authKW 550191 2% 100% 2
10 PART RATING authKW 550191 2% 100% 2

Web of Science journal categories



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 Engineering, Industrial 854 15% 0% 17
2 Engineering, Manufacturing 754 14% 0% 16
3 Engineering, General 603 18% 0% 20
4 Management 304 12% 0% 13
5 Engineering, Electrical & Electronic 212 27% 0% 30
6 Operations Research & Management Science 161 9% 0% 10
7 Engineering, Aerospace 131 5% 0% 6
8 Computer Science, Software Engineering 123 8% 0% 9
9 COMPUTER APPLICATIONS & CYBERNETICS 103 1% 0% 1
10 Materials Science, Multidisciplinary 74 21% 0% 23

Address terms



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 CALCE ELECT PROD SYST 670977 17% 13% 19
2 ADV DESIGN OPTIMIZAT ADOPT 275096 1% 100% 1
3 AESA GRP 275096 1% 100% 1
4 GLOBAL TRAINING LOGIST 275096 1% 100% 1
5 HQ AFMC 275096 1% 100% 1
6 KATEDRA MARKETINGU MEDZINARODNEHO OBCHODU 275096 1% 100% 1
7 MFG TECHNOL BRANCH 275096 1% 100% 1
8 ORBITAL SCI FAIRCHILD DEF 275096 1% 100% 1
9 SEXTANT IN FLIGHT SYST 275096 1% 100% 1
10 SIMULAT TRAINING SUPPORT 275096 1% 100% 1

Journals



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 PROCEEDINGS : ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM 73621 10% 2% 11
2 IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES 61260 14% 1% 16
3 ENGINEERING MANAGEMENT JOURNAL 35204 4% 3% 4
4 EMJ-ENGINEERING MANAGEMENT JOURNAL 27813 3% 3% 3
5 COMMUTATION & TRANSMISSION 27508 1% 10% 1
6 SYSTEMS ENGINEERING 8358 3% 1% 3
7 DATA PROCESSING 5189 1% 2% 1
8 IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE 4261 4% 0% 4
9 IEEE CIRCUITS & DEVICES 3186 2% 1% 2
10 IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING 2782 2% 1% 2

Author Key Words



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
LCSH search Wikipedia search
1 DMSMS 2475860 8% 100% 9 Search DMSMS Search DMSMS
2 OBSOLESCENCE MANAGEMENT 982481 5% 71% 5 Search OBSOLESCENCE+MANAGEMENT Search OBSOLESCENCE+MANAGEMENT
3 PARAMETER CONFORMANCE 825287 3% 100% 3 Search PARAMETER+CONFORMANCE Search PARAMETER+CONFORMANCE
4 PARAMETER RECHARACTERIZATION 825287 3% 100% 3 Search PARAMETER+RECHARACTERIZATION Search PARAMETER+RECHARACTERIZATION
5 STRESS BALANCING 825287 3% 100% 3 Search STRESS+BALANCING Search STRESS+BALANCING
6 OBSOLESCENCE 795782 16% 16% 18 Search OBSOLESCENCE Search OBSOLESCENCE
7 TECHNOLOGY INSERTION 628786 4% 57% 4 Search TECHNOLOGY+INSERTION Search TECHNOLOGY+INSERTION
8 DESIGN REFRESH 550191 2% 100% 2 Search DESIGN+REFRESH Search DESIGN+REFRESH
9 PART RATING 550191 2% 100% 2 Search PART+RATING Search PART+RATING
10 UPRATING 458486 5% 33% 5 Search UPRATING Search UPRATING

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.



Rank Reference # ref.
in cl.
Shr. of ref. in
cl.
Citations
1 PECHT, MG , HUMPHREY, D , (2008) ADDRESSING OBSOLESCENCE - THE UPRATING OPTION.IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES. VOL. 31. ISSUE 3. P. 741-745 13 93% 0
2 PECHT, M , HUMPHREY, D , (2006) UPRATING OF ELECTRONIC PARTS TO ADDRESS OBSOLESCENCE.MICROELECTRONICS INTERNATIONAL. VOL. 23. ISSUE 2. P. 32-36 11 100% 6
3 ROJO, FJR , ROY, R , SHEHAB, E , CHERUVU, K , MASON, P , (2012) A COST ESTIMATING FRAMEWORK FOR ELECTRONIC, ELECTRICAL AND ELECTROMECHANICAL (EEE) COMPONENTS OBSOLESCENCE WITHIN THE USE-ORIENTED PRODUCT-SERVICE SYSTEMS CONTRACTS.PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART B-JOURNAL OF ENGINEERING MANUFACTURE. VOL. 226. ISSUE B1. P. 154-166 10 71% 5
4 ROJO, FJR , ROY, R , SHEHAB, E , (2010) OBSOLESCENCE MANAGEMENT FOR LONG-LIFE CONTRACTS: STATE OF THE ART AND FUTURE TRENDS.INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY. VOL. 49. ISSUE 9-12. P. 1235-1250 8 89% 11
5 ZHENG, LY , TERPENNY, J , SANDBORN, P , (2015) DESIGN REFRESH PLANNING MODELS FOR MANAGING OBSOLESCENCE.IIE TRANSACTIONS. VOL. 47. ISSUE 12. P. 1407 -1423 8 80% 1
6 MURRAY, S , BORN, M , PECHT, MG , ERHART, D , (2002) TRACKING SEMICONDUCTOR PART CHANGES THROUGH THE PART SUPPLY CHAIN.IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES. VOL. 25. ISSUE 2. P. 230-238 8 89% 2
7 PENDSE, N , THOMAS, D , DAS, D , PECHT, MG , (2002) UPRATING OF A SINGLE INLINE MEMORY MODULE.IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES. VOL. 25. ISSUE 2. P. 266 -269 8 89% 1
8 KONOZA, A , SANDBORN, P , (2014) EVALUATING THE END OF MAINTENANCE DATES FOR ELECTRONIC ASSEMBLIES COMPOSED OF OBSOLETE PARTS.JOURNAL OF MECHANICAL DESIGN. VOL. 136. ISSUE 3. P. - 7 64% 0
9 CLUFF, KD , SCALISE, JA , (2002) END ITEM TEMPERATURE TEST - AN IMPROVED LINE REPLACEMENT UNIT (LRU)-LEVEL SCREEN.IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES. VOL. 25. ISSUE 4. P. 723-726 6 100% 0
10 DAS, D , PENDSE, N , WILKINSON, C , PECHT, MG , (2001) PARAMETER RECHARACTERIZATION: A METHOD OF THERMAL UPRATING.IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES. VOL. 24. ISSUE 4. P. 729-737 6 100% 7

Classes with closest relation at Level 1



Rank Class id link
1 25446 MECHANICAL RELIABILITY PREDICTION//NO FAULT FOUND//NO FAULT FOUND NFF
2 33569 ARBITRATION PROTOCOLS//3G MOBILE//ADAPTIVE ARBITER
3 34887 ARRESTOR SYSTEM//AIRPORT AIRCRAFT COMPATIBILITY//AIRPORT SURFACE SAFETY
4 21756 VINTAGE CAPITAL MODELS//EQUIPMENT REPLACEMENT//VINTAGE CAPITAL
5 30154 CONCRETE PLANNING//DYNAM SYST ENGN GRP//INDUSTRIAL ROBOT-AN INTERNATIONAL JOURNAL
6 24260 COTS SELECTION//COTS INTEGRATION//COTS PRODUCTS
7 29711 IT CONTROLLING//CLOSENESS CENTRALIZATION MEASURES VECTOR CCV//INFORMATION CONTROL NET ICN
8 22530 ROADMAPPING//TECHNOLOGY ROADMAP//TECHNOLOGY ROADMAPPING
9 25632 DECISION INFORMATICS//SYSTEMS ENGINEERING//INTEGRATION READINESS LEVEL
10 33477 EKONOMICKY CASOPIS//PROGNOSTICKY USTAV//USTAV SLOVENSKEJ SVETOVEJ EKON

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