Class information for:
Level 1: INFRARED ELLIPSOMETRY//BERLIN//BERREMAN EFFECT

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
21113 432 22.4 51%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
637 3       SCULPTURED THIN FILMS//MUELLER MATRIX//GLANCING ANGLE DEPOSITION 12611
1771 2             LASER INDUCED DAMAGE//ELLIPSOMETRY//APPLIED OPTICS 6386
21113 1                   INFRARED ELLIPSOMETRY//BERLIN//BERREMAN EFFECT 432

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 INFRARED ELLIPSOMETRY authKW 706808 5% 50% 20
2 BERLIN address 358316 8% 15% 34
3 BERREMAN EFFECT authKW 346341 2% 70% 7
4 UPR 258 CNRS address 226183 1% 80% 4
5 INFRARED SPECTROSCOPIC ELLIPSOMETRY authKW 225053 3% 29% 11
6 MICROELECT OPT MAT address 176682 3% 17% 15
7 ARBEITSGRP HALBLEITERPHYS address 141366 0% 100% 2
8 SMALL ANGLE OBLIQUE INCIDENCE REFLECTION authKW 141366 0% 100% 2
9 BREWSTERS NULL REFLECTION authKW 94242 0% 67% 2
10 SNELLS TOTAL REFLECTION authKW 94242 0% 67% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Materials Science, Coatings & Films 2174 16% 0% 71
2 Physics, Applied 1160 34% 0% 149
3 Spectroscopy 863 13% 0% 55
4 Physics, Condensed Matter 798 24% 0% 103
5 Instruments & Instrumentation 569 12% 0% 52
6 Materials Science, Multidisciplinary 353 22% 0% 97
7 Optics 279 12% 0% 51
8 Chemistry, Physical 107 13% 0% 58
9 Chemistry, Analytical 64 7% 0% 29
10 Physics, Multidisciplinary 29 6% 0% 24

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 BERLIN 358316 8% 15% 34
2 UPR 258 CNRS 226183 1% 80% 4
3 MICROELECT OPT MAT 176682 3% 17% 15
4 ARBEITSGRP HALBLEITERPHYS 141366 0% 100% 2
5 ARBEITSGRP FESTKORPEROPT HALBLEITERPHYS 70683 0% 100% 1
6 CHIM SOLIDES PULVERULENTS 70683 0% 100% 1
7 DCCDPESPEA 70683 0% 100% 1
8 ELE OCHIM CHIM PHYS CORPS SOLIDE URA 405 70683 0% 100% 1
9 FESTKORPEROPT 70683 0% 100% 1
10 GVC E B009 70683 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 APPLIED SPECTROSCOPY 10548 8% 0% 35
2 SPRINGER TRACTS IN MODERN PHYSICS 7142 2% 1% 7
3 THIN SOLID FILMS 3915 10% 0% 45
4 VIBRATIONAL SPECTROSCOPY 1777 2% 0% 8
5 MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH 1269 1% 1% 3
6 INFRARED PHYSICS & TECHNOLOGY 1109 1% 0% 6
7 INFRARED PHYSICS 1090 1% 0% 4
8 SOVIET JOURNAL OF OPTICAL TECHNOLOGY 875 1% 0% 3
9 MIKROCHIMICA ACTA 596 1% 0% 5
10 PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS 589 3% 0% 13

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 INFRARED ELLIPSOMETRY 706808 5% 50% 20 Search INFRARED+ELLIPSOMETRY Search INFRARED+ELLIPSOMETRY
2 BERREMAN EFFECT 346341 2% 70% 7 Search BERREMAN+EFFECT Search BERREMAN+EFFECT
3 INFRARED SPECTROSCOPIC ELLIPSOMETRY 225053 3% 29% 11 Search INFRARED+SPECTROSCOPIC+ELLIPSOMETRY Search INFRARED+SPECTROSCOPIC+ELLIPSOMETRY
4 SMALL ANGLE OBLIQUE INCIDENCE REFLECTION 141366 0% 100% 2 Search SMALL+ANGLE+OBLIQUE+INCIDENCE+REFLECTION Search SMALL+ANGLE+OBLIQUE+INCIDENCE+REFLECTION
5 BREWSTERS NULL REFLECTION 94242 0% 67% 2 Search BREWSTERS+NULL+REFLECTION Search BREWSTERS+NULL+REFLECTION
6 SNELLS TOTAL REFLECTION 94242 0% 67% 2 Search SNELLS+TOTAL+REFLECTION Search SNELLS+TOTAL+REFLECTION
7 TO LO SPLITTING 94242 0% 67% 2 Search TO+LO+SPLITTING Search TO+LO+SPLITTING
8 55 45 COPPER NICKEL ALLOYS 70683 0% 100% 1 Search 55+45+COPPER+NICKEL+ALLOYS Search 55+45+COPPER+NICKEL+ALLOYS
9 AI2O3 CERAMICS 70683 0% 100% 1 Search AI2O3+CERAMICS Search AI2O3+CERAMICS
10 AISI 430 AND AISI 430 AL TI ALLOYS 70683 0% 100% 1 Search AISI+430+AND+AISI+430+AL+TI+ALLOYS Search AISI+430+AND+AISI+430+AL+TI+ALLOYS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 HINRICHS, K , GENSCH, M , ESSER, N , (2005) ANALYSIS OF ORGANIC FILMS AND INTERFACIAL LAYERS BY INFRARED SPECTROSCOPIC ELLIPSOMETRY.APPLIED SPECTROSCOPY. VOL. 59. ISSUE 11. P. 272A -282A 43 46% 51
2 HINRICHS, K , FURCHNER, A , SUN, GG , GENSCH, M , RAPPICH, J , OATES, TWH , (2014) INFRARED ELLIPSOMETRY FOR IMPROVED LATERALLY RESOLVED ANALYSIS OF THIN FILMS.THIN SOLID FILMS. VOL. 571. ISSUE . P. 648 -652 26 63% 1
3 HU, ZG , HESS, P , (2007) OPTIMIZATION OF THE INCIDENT ANGLE IN INFRARED SPECTROSCOPIC ELLIPSOMETRY: SPECTRA OF C-18-ALKYLTHIOL MONOLAYERS.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 25. ISSUE 3. P. 601-606 15 63% 1
4 KORTE, EH , ROSELER, A , HINRICHS, K , GENSCH, M , (2004) INFRARED SPECTROSCOPIC STUDIES OF NANOLAYERS.REVISTA DE CHIMIE. VOL. 55. ISSUE 9. P. 701-706 11 85% 0
5 KUEHNE, P , HERZINGER, CM , SCHUBERT, M , WOOLLAM, JA , HOFMANN, T , (2014) INVITED ARTICLE: AN INTEGRATED MID-INFRARED, FAR-INFRARED, AND TERAHERTZ OPTICAL HALL EFFECT INSTRUMENT.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 85. ISSUE 7. P. - 20 34% 0
6 KANG, SH , PRABHU, VM , SOLES, CL , LIN, EK , WU, WL , (2009) METHODOLOGY FOR QUANTITATIVE MEASUREMENTS OF MULTILAYER POLYMER THIN FILMS WITH IR SPECTROSCOPIC ELLIPSOMETRY.MACROMOLECULES. VOL. 42. ISSUE 14. P. 5296 -5302 11 65% 14
7 CROSS, LJK , HORE, DK , (2012) DUAL-MODULATOR BROADBAND INFRARED MUELLER MATRIX ELLIPSOMETRY.APPLIED OPTICS. VOL. 51. ISSUE 21. P. 5100 -5110 19 35% 2
8 ADAMSON, P , (2014) INFRARED ELLIPSOMETRY OF NANOMETRIC ANISOTROPIC DIELECTRIC LAYERS ON ABSORBING MATERIALS.INFRARED PHYSICS & TECHNOLOGY. VOL. 64. ISSUE . P. 108-114 10 63% 0
9 SCHUBERT, M , HOFMANN, T , SIK, J , (2005) LONG-WAVELENGTH INTERFACE MODES IN SEMICONDUCTOR LAYER STRUCTURES.PHYSICAL REVIEW B. VOL. 71. ISSUE 3. P. - 12 60% 18
10 HINRICHS, K , ROSELER, A , GENSCH, M , KORTE, EH , (2004) STRUCTURE ANALYSIS OF ORGANIC FILMS BY MID-INFRARED ELLIPSOMETRY.THIN SOLID FILMS. VOL. 455. ISSUE . P. 266 -271 13 57% 10

Classes with closest relation at Level 1


Rank Class id link
1 20344 DIPOLE MOMENT DERIVATIVES//ABSOLUTE ABSORPTION INTENSITIES//PRINCIPAL SPECTRA
2 14389 ABSORBING FILMS//ROTATING POLARIZER ANALYZER ELLIPSOMETER//ULTRATHIN DIELECTRIC LAYER
3 33212 J AN SCI TECHNOL ORG//CYANIDE TREATMENT//DISPLAY TECHNOL DEV GRP
4 19446 SEIRA//SURFACE ENHANCED INFRARED ABSORPTION//SURFACE ENHANCED INFRARED ABSORPTION SEIRA
5 25406 MSOS O P STRUCTURE//SI2H6 GAS//SEMI INSULATING POLYCRYSTALLINE SILICON
6 11862 NANOOPT PROPERTY//SPECTROSCOPIC ELLIPSOMETRY//DIELECTRIC FUNCTION
7 28119 MONOCLINIC SINGLE CRYSTALS//TRICLINIC SINGLE CRYSTALS//MONOCLINIC CRYSTALS
8 14239 SILANE PLASMA//SIH2//SIH3
9 19458 FIRE RADIOMETER//INFRARED EMISSION SPECTROMETRY//VT DRIFTS
10 8494 HYDROGEN TERMINATION//NATIVE OXIDE//HYDRIDE SPECIES

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