Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
21113 | 432 | 22.4 | 51% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
637 | 3 | SCULPTURED THIN FILMS//MUELLER MATRIX//GLANCING ANGLE DEPOSITION | 12611 |
1771 | 2 | LASER INDUCED DAMAGE//ELLIPSOMETRY//APPLIED OPTICS | 6386 |
21113 | 1 | INFRARED ELLIPSOMETRY//BERLIN//BERREMAN EFFECT | 432 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | INFRARED ELLIPSOMETRY | authKW | 706808 | 5% | 50% | 20 |
2 | BERLIN | address | 358316 | 8% | 15% | 34 |
3 | BERREMAN EFFECT | authKW | 346341 | 2% | 70% | 7 |
4 | UPR 258 CNRS | address | 226183 | 1% | 80% | 4 |
5 | INFRARED SPECTROSCOPIC ELLIPSOMETRY | authKW | 225053 | 3% | 29% | 11 |
6 | MICROELECT OPT MAT | address | 176682 | 3% | 17% | 15 |
7 | ARBEITSGRP HALBLEITERPHYS | address | 141366 | 0% | 100% | 2 |
8 | SMALL ANGLE OBLIQUE INCIDENCE REFLECTION | authKW | 141366 | 0% | 100% | 2 |
9 | BREWSTERS NULL REFLECTION | authKW | 94242 | 0% | 67% | 2 |
10 | SNELLS TOTAL REFLECTION | authKW | 94242 | 0% | 67% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 2174 | 16% | 0% | 71 |
2 | Physics, Applied | 1160 | 34% | 0% | 149 |
3 | Spectroscopy | 863 | 13% | 0% | 55 |
4 | Physics, Condensed Matter | 798 | 24% | 0% | 103 |
5 | Instruments & Instrumentation | 569 | 12% | 0% | 52 |
6 | Materials Science, Multidisciplinary | 353 | 22% | 0% | 97 |
7 | Optics | 279 | 12% | 0% | 51 |
8 | Chemistry, Physical | 107 | 13% | 0% | 58 |
9 | Chemistry, Analytical | 64 | 7% | 0% | 29 |
10 | Physics, Multidisciplinary | 29 | 6% | 0% | 24 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | BERLIN | 358316 | 8% | 15% | 34 |
2 | UPR 258 CNRS | 226183 | 1% | 80% | 4 |
3 | MICROELECT OPT MAT | 176682 | 3% | 17% | 15 |
4 | ARBEITSGRP HALBLEITERPHYS | 141366 | 0% | 100% | 2 |
5 | ARBEITSGRP FESTKORPEROPT HALBLEITERPHYS | 70683 | 0% | 100% | 1 |
6 | CHIM SOLIDES PULVERULENTS | 70683 | 0% | 100% | 1 |
7 | DCCDPESPEA | 70683 | 0% | 100% | 1 |
8 | ELE OCHIM CHIM PHYS CORPS SOLIDE URA 405 | 70683 | 0% | 100% | 1 |
9 | FESTKORPEROPT | 70683 | 0% | 100% | 1 |
10 | GVC E B009 | 70683 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | APPLIED SPECTROSCOPY | 10548 | 8% | 0% | 35 |
2 | SPRINGER TRACTS IN MODERN PHYSICS | 7142 | 2% | 1% | 7 |
3 | THIN SOLID FILMS | 3915 | 10% | 0% | 45 |
4 | VIBRATIONAL SPECTROSCOPY | 1777 | 2% | 0% | 8 |
5 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | 1269 | 1% | 1% | 3 |
6 | INFRARED PHYSICS & TECHNOLOGY | 1109 | 1% | 0% | 6 |
7 | INFRARED PHYSICS | 1090 | 1% | 0% | 4 |
8 | SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 875 | 1% | 0% | 3 |
9 | MIKROCHIMICA ACTA | 596 | 1% | 0% | 5 |
10 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 589 | 3% | 0% | 13 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | HINRICHS, K , GENSCH, M , ESSER, N , (2005) ANALYSIS OF ORGANIC FILMS AND INTERFACIAL LAYERS BY INFRARED SPECTROSCOPIC ELLIPSOMETRY.APPLIED SPECTROSCOPY. VOL. 59. ISSUE 11. P. 272A -282A | 43 | 46% | 51 |
2 | HINRICHS, K , FURCHNER, A , SUN, GG , GENSCH, M , RAPPICH, J , OATES, TWH , (2014) INFRARED ELLIPSOMETRY FOR IMPROVED LATERALLY RESOLVED ANALYSIS OF THIN FILMS.THIN SOLID FILMS. VOL. 571. ISSUE . P. 648 -652 | 26 | 63% | 1 |
3 | HU, ZG , HESS, P , (2007) OPTIMIZATION OF THE INCIDENT ANGLE IN INFRARED SPECTROSCOPIC ELLIPSOMETRY: SPECTRA OF C-18-ALKYLTHIOL MONOLAYERS.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 25. ISSUE 3. P. 601-606 | 15 | 63% | 1 |
4 | KORTE, EH , ROSELER, A , HINRICHS, K , GENSCH, M , (2004) INFRARED SPECTROSCOPIC STUDIES OF NANOLAYERS.REVISTA DE CHIMIE. VOL. 55. ISSUE 9. P. 701-706 | 11 | 85% | 0 |
5 | KUEHNE, P , HERZINGER, CM , SCHUBERT, M , WOOLLAM, JA , HOFMANN, T , (2014) INVITED ARTICLE: AN INTEGRATED MID-INFRARED, FAR-INFRARED, AND TERAHERTZ OPTICAL HALL EFFECT INSTRUMENT.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 85. ISSUE 7. P. - | 20 | 34% | 0 |
6 | KANG, SH , PRABHU, VM , SOLES, CL , LIN, EK , WU, WL , (2009) METHODOLOGY FOR QUANTITATIVE MEASUREMENTS OF MULTILAYER POLYMER THIN FILMS WITH IR SPECTROSCOPIC ELLIPSOMETRY.MACROMOLECULES. VOL. 42. ISSUE 14. P. 5296 -5302 | 11 | 65% | 14 |
7 | CROSS, LJK , HORE, DK , (2012) DUAL-MODULATOR BROADBAND INFRARED MUELLER MATRIX ELLIPSOMETRY.APPLIED OPTICS. VOL. 51. ISSUE 21. P. 5100 -5110 | 19 | 35% | 2 |
8 | ADAMSON, P , (2014) INFRARED ELLIPSOMETRY OF NANOMETRIC ANISOTROPIC DIELECTRIC LAYERS ON ABSORBING MATERIALS.INFRARED PHYSICS & TECHNOLOGY. VOL. 64. ISSUE . P. 108-114 | 10 | 63% | 0 |
9 | SCHUBERT, M , HOFMANN, T , SIK, J , (2005) LONG-WAVELENGTH INTERFACE MODES IN SEMICONDUCTOR LAYER STRUCTURES.PHYSICAL REVIEW B. VOL. 71. ISSUE 3. P. - | 12 | 60% | 18 |
10 | HINRICHS, K , ROSELER, A , GENSCH, M , KORTE, EH , (2004) STRUCTURE ANALYSIS OF ORGANIC FILMS BY MID-INFRARED ELLIPSOMETRY.THIN SOLID FILMS. VOL. 455. ISSUE . P. 266 -271 | 13 | 57% | 10 |
Classes with closest relation at Level 1 |