Class information for:
Level 1: NANOOPT PROPERTY//SPECTROSCOPIC ELLIPSOMETRY//DIELECTRIC FUNCTION

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
11862 948 21.2 53%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
637 3       SCULPTURED THIN FILMS//MUELLER MATRIX//GLANCING ANGLE DEPOSITION 12611
1771 2             LASER INDUCED DAMAGE//ELLIPSOMETRY//APPLIED OPTICS 6386
11862 1                   NANOOPT PROPERTY//SPECTROSCOPIC ELLIPSOMETRY//DIELECTRIC FUNCTION 948

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 NANOOPT PROPERTY address 596237 4% 49% 38
2 SPECTROSCOPIC ELLIPSOMETRY authKW 143723 7% 6% 69
3 DIELECTRIC FUNCTION authKW 116268 5% 7% 50
4 ELLIPSOMETRY authKW 102222 9% 4% 88
5 DIELECTRIC FUNCTION PARAMETRIC MODEL authKW 96626 0% 100% 3
6 CDMGTE authKW 72468 0% 75% 3
7 CDP BAGNEUX address 64418 0% 100% 2
8 CRITICAL DOSE RATE authKW 64418 0% 100% 2
9 JOINT CHAIR EXPT PHYS address 64418 0% 100% 2
10 NANO OPT PROPERTY address 57509 1% 36% 5

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 6658 54% 0% 508
2 Materials Science, Coatings & Films 4533 16% 0% 152
3 Physics, Condensed Matter 3454 32% 0% 308
4 Materials Science, Multidisciplinary 749 22% 0% 210
5 Physics, Multidisciplinary 296 10% 0% 92
6 Optics 258 8% 0% 78
7 Nuclear Science & Technology 116 4% 0% 38
8 Engineering, Electrical & Electronic 103 9% 0% 83
9 Instruments & Instrumentation 55 3% 0% 31
10 Electrochemistry 32 2% 0% 21

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 NANOOPT PROPERTY 596237 4% 49% 38
2 CDP BAGNEUX 64418 0% 100% 2
3 JOINT CHAIR EXPT PHYS 64418 0% 100% 2
4 NANO OPT PROPERTY 57509 1% 36% 5
5 ADV DISPLAY RS 32209 0% 100% 1
6 ANAL SHOWA KU 32209 0% 100% 1
7 CARCH PL SCI 32209 0% 100% 1
8 CINMAT 13N 32209 0% 100% 1
9 EK ZAVOISKY KAZAN PHYS TECHNOL 32209 0% 100% 1
10 IMAGE DEVICE 32209 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF APPLIED PHYSICS 8076 17% 0% 164
2 THIN SOLID FILMS 7776 10% 0% 94
3 JOURNAL OF THE KOREAN PHYSICAL SOCIETY 3979 5% 0% 44
4 APPLIED PHYSICS LETTERS 775 6% 0% 54
5 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 773 3% 0% 28
6 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 671 2% 0% 21
7 APPLIED SURFACE SCIENCE 626 3% 0% 27
8 ACTA ELECTRONICA 584 0% 2% 1
9 SURFACE AND INTERFACE ANALYSIS 564 1% 0% 11
10 JOURNAL OF ELECTRONIC MATERIALS 538 1% 0% 13

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SPECTROSCOPIC ELLIPSOMETRY 143723 7% 6% 69 Search SPECTROSCOPIC+ELLIPSOMETRY Search SPECTROSCOPIC+ELLIPSOMETRY
2 DIELECTRIC FUNCTION 116268 5% 7% 50 Search DIELECTRIC+FUNCTION Search DIELECTRIC+FUNCTION
3 ELLIPSOMETRY 102222 9% 4% 88 Search ELLIPSOMETRY Search ELLIPSOMETRY
4 DIELECTRIC FUNCTION PARAMETRIC MODEL 96626 0% 100% 3 Search DIELECTRIC+FUNCTION+PARAMETRIC+MODEL Search DIELECTRIC+FUNCTION+PARAMETRIC+MODEL
5 CDMGTE 72468 0% 75% 3 Search CDMGTE Search CDMGTE
6 CRITICAL DOSE RATE 64418 0% 100% 2 Search CRITICAL+DOSE+RATE Search CRITICAL+DOSE+RATE
7 ALGAAS GAAS SOLAR CELLS 42944 0% 67% 2 Search ALGAAS+GAAS+SOLAR+CELLS Search ALGAAS+GAAS+SOLAR+CELLS
8 ANTI REFLECTIVE AR COATING 32209 0% 100% 1 Search ANTI+REFLECTIVE+AR+COATING Search ANTI+REFLECTIVE+AR+COATING
9 APPLIED EXAMPLES 32209 0% 100% 1 Search APPLIED+EXAMPLES Search APPLIED+EXAMPLES
10 BAND STRUCTURE OF CRYSTALLINE SEMICONDUCTOR COMPOUNDS 32209 0% 100% 1 Search BAND+STRUCTURE+OF+CRYSTALLINE+SEMICONDUCTOR+COMPOUNDS Search BAND+STRUCTURE+OF+CRYSTALLINE+SEMICONDUCTOR+COMPOUNDS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 DJURISIC, AB , CHAN, Y , LI, EH , (2002) PROGRESS IN THE ROOM-TEMPERATURE OPTICAL FUNCTIONS OF SEMICONDUCTORS.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 38. ISSUE 6. P. 237 -293 72 33% 66
2 SUNDARI, ST , (2002) DISORDER EFFECTS ON DIELECTRIC RESPONSE OF SI IRRADIATED WITH AR+.JOURNAL OF APPLIED PHYSICS. VOL. 92. ISSUE 8. P. 4367-4374 31 82% 4
3 PETRIK, P , (2014) PARAMETERIZATION OF THE DIELECTRIC FUNCTION OF SEMICONDUCTOR NANOCRYSTALS.PHYSICA B-CONDENSED MATTER. VOL. 453. ISSUE . P. 2 -7 25 63% 3
4 HIKINO, S , ADACHI, S , (2004) STRUCTURAL CHANGES IN ION-IMPLANTED AND RAPID THERMALLY ANNEALED SI(100) WAFERS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 37. ISSUE 12. P. 1617-1623 23 74% 4
5 JUNG, YW , KIM, TJ , YOON, JJ , KIM, YD , ASPNES, DE , (2008) MODEL DIELECTRIC FUNCTIONS FOR ALXGA1-XAS ALLOYS OF ARBITRARY COMPOSITIONS.JOURNAL OF APPLIED PHYSICS. VOL. 104. ISSUE 1. P. - 16 94% 8
6 TSUNODA, K , ADACHI, S , TAKAHASHI, M , (2002) SPECTROSCOPIC ELLIPSOMETRY STUDY OF ION-IMPLANTED SI(100) WAFERS.JOURNAL OF APPLIED PHYSICS. VOL. 91. ISSUE 5. P. 2936-2941 20 83% 26
7 KURIHARA, K , HIKINO, S , ADACHI, S , (2004) OPTICAL PROPERTIES OF N+ ION-IMPLANTED AND RAPID THERMALLY ANNEALED SI(100) WAFERS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY.JOURNAL OF APPLIED PHYSICS. VOL. 96. ISSUE 6. P. 3247-3254 22 73% 7
8 PETRIK, P , (2008) ELLIPSOMETRIC MODELS FOR VERTICALLY INHOMOGENEOUS COMPOSITE STRUCTURES.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 205. ISSUE 4. P. 732-738 28 51% 5
9 ADACHI, S , MORI, H , TAKAHASHI, M , (2003) MODEL-DIELECTRIC-FUNCTION ANALYSIS OF ION-IMPLANTED SI(100) WAFERS.JOURNAL OF APPLIED PHYSICS. VOL. 93. ISSUE 1. P. 115 -120 20 80% 12
10 YOSHIDA, K , ADACHI, S , (2005) RAPID THERMAL ANNEALING CHARACTERISTICS OF P+-ION-IMPLANTED SI(100) WAFERS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY.JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS. VOL. 44. ISSUE 2. P. 802 -807 19 79% 0

Classes with closest relation at Level 1


Rank Class id link
1 14389 ABSORBING FILMS//ROTATING POLARIZER ANALYZER ELLIPSOMETER//ULTRATHIN DIELECTRIC LAYER
2 31301 BILINEAR TRANSFORMED REFLECTANCE//DOPING RESTRUCTURING MODEL//GLOBAL NUCL FUTURE INITIAT
3 15060 PLASMA PHYS PLASMA SOURCES//OPTICAL CONSTANTS//JOINT MODERN METROL
4 10911 PHOTOREFLECTANCE//FRANZ KELDYSH OSCILLATIONS//NEW YORK STATE ADV TECHNOL ULTRAFAST PHOTON M
5 12826 SIMOX//CONTACTLESS I V METHOD//BURIED OXIDE LAYER
6 21113 INFRARED ELLIPSOMETRY//BERLIN//BERREMAN EFFECT
7 20730 CHARGE CARRIER SCREENING//DEEP HOLE TRAP//GE HEAVILY DOPED INI
8 26088 QUARTERWAVE RETARDERS//ABSORBING SUBSTRATE//BROAD AND WIDE ANGLE
9 34783 PHASE BOUNDARY REGION//QUANTUM WELL LASER STRUCTURES//INVEST DISPOSITIVOS SEMICONDUCTO
10 24490 IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//IMAGING ELLIPSOMETER

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