Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 18605 | 545 | 18.6 | 34% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 589 | 3 | ATOMIC LAYER DEPOSITION//HFO2//HIGH K DIELECTRICS | 15224 |
| 3561 | 2 | DIELECTRIC PHENOMENA//CBH MECHANISM//EUROPIUM INDIUM OXIDE | 1325 |
| 18605 | 1 | AG CLUSTER FILM//A SIOX IR SPECTROSCOPY//ASTRONOMICAL TELESCOPE MIRROR | 545 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | AG CLUSTER FILM | authKW | 74701 | 0% | 67% | 2 |
| 2 | A SIOX IR SPECTROSCOPY | authKW | 56027 | 0% | 100% | 1 |
| 3 | ASTRONOMICAL TELESCOPE MIRROR | authKW | 56027 | 0% | 100% | 1 |
| 4 | CATHODE SURFACE SPUTTERING | authKW | 56027 | 0% | 100% | 1 |
| 5 | CU ISLAND FILM | authKW | 56027 | 0% | 100% | 1 |
| 6 | DIFFERENTIAL NEGATIVE RESISTANCE PROPERTIES | authKW | 56027 | 0% | 100% | 1 |
| 7 | ELECTRIC BEAM EVAPORATING | authKW | 56027 | 0% | 100% | 1 |
| 8 | ELECTRON STIMULATED PHOTON EMISSION | authKW | 56027 | 0% | 100% | 1 |
| 9 | EMISSION ELECTRON MICROSCOPY EEM | authKW | 56027 | 0% | 100% | 1 |
| 10 | EVAPORATED SILICON OXIDE SIOX | authKW | 56027 | 0% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 2499 | 36% | 0% | 197 |
| 2 | Materials Science, Multidisciplinary | 2051 | 43% | 0% | 237 |
| 3 | Materials Science, Coatings & Films | 1795 | 13% | 0% | 73 |
| 4 | Physics, Applied | 1661 | 37% | 0% | 199 |
| 5 | Engineering, Electrical & Electronic | 294 | 16% | 0% | 86 |
| 6 | Materials Science, Ceramics | 171 | 4% | 0% | 21 |
| 7 | Physics, Multidisciplinary | 113 | 8% | 0% | 45 |
| 8 | Physics, Atomic, Molecular & Chemical | 8 | 3% | 0% | 16 |
| 9 | Electrochemistry | 7 | 2% | 0% | 9 |
| 10 | Crystallography | 1 | 1% | 0% | 6 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | SCI TECHNOL PHYS SETAGAYA KU | 56027 | 0% | 100% | 1 |
| 2 | VYE LASHKAREV SEMICOND PHYS | 56027 | 0% | 100% | 1 |
| 3 | MAT MFG DIRECTORATE RX | 14005 | 0% | 25% | 1 |
| 4 | MICROELECT INFORMAT SCI | 14005 | 0% | 25% | 1 |
| 5 | FIS OPT | 11204 | 0% | 20% | 1 |
| 6 | UNITE RECH PHYS MAT ISOLANTS SEMIISOLANTS | 8002 | 0% | 14% | 1 |
| 7 | TIANJIN OPT THIN FILM | 3294 | 0% | 6% | 1 |
| 8 | CERAM GLASS ENGN CICECO | 1930 | 0% | 3% | 1 |
| 9 | MN MIKHEEV MET PHYS | 1512 | 0% | 3% | 1 |
| 10 | THIN FILMS | 1414 | 0% | 1% | 2 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | INTERNATIONAL JOURNAL OF ELECTRONICS | 50609 | 12% | 1% | 66 |
| 2 | THIN SOLID FILMS | 5902 | 11% | 0% | 62 |
| 3 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 5597 | 8% | 0% | 45 |
| 4 | VESTNIK LENINGRADSKOGO UNIVERSITETA SERIYA FIZIKA KHIMIYA | 4242 | 1% | 1% | 7 |
| 5 | JOURNAL OF MATERIALS SCIENCE LETTERS | 3966 | 5% | 0% | 28 |
| 6 | JOURNAL OF MATERIALS SCIENCE | 3473 | 8% | 0% | 43 |
| 7 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 1613 | 4% | 0% | 24 |
| 8 | UKRAINSKII FIZICHESKII ZHURNAL | 823 | 1% | 0% | 7 |
| 9 | JOURNAL OF NON-CRYSTALLINE SOLIDS | 768 | 3% | 0% | 18 |
| 10 | VACUUM | 573 | 2% | 0% | 10 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | PAGNIA, H , SOTNIK, N , (1988) BISTABLE SWITCHING IN ELECTROFORMED METAL-INSULATOR-METAL DEVICES.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 108. ISSUE 1. P. 11 -65 | 26 | 81% | 165 |
| 2 | FEDOROVICH, RD , NAUMOVETS, AG , TOMCHUK, PM , (2000) ELECTRON AND LIGHT EMISSION FROM ISLAND METAL FILMS AND GENERATION OF HOT ELECTRONS IN NANOPARTICLES.PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS. VOL. 328. ISSUE 2-3. P. 74 -179 | 29 | 39% | 8 |
| 3 | SHARPE, RG , PALMER, RE , (1996) REGENERATION OF ELECTROFORMED METAL-INSULATOR-METAL DEVICES: A NEW MODEL.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 8. ISSUE 3. P. 329-338 | 14 | 93% | 6 |
| 4 | NEPIJKO, SA , KUTNYAKHOV, D , PROTSENKO, SI , ODNODVORETS, LV , SCHONHENSE, G , (2011) SENSOR AND MICROELECTRONIC ELEMENTS BASED ON NANOSCALE GRANULAR SYSTEMS.JOURNAL OF NANOPARTICLE RESEARCH. VOL. 13. ISSUE 12. P. 6263 -6281 | 24 | 33% | 1 |
| 5 | ZAIDI, SZA , BEYNON, J , WATERS, DN , CHAUDHARY, AJ , (1995) EFFECT OF COMPOSITION ON OPTICAL PROPERTIES OF CO-EVAPORATED MN/SIOX, CR/SIOX AND CU/SIOX CERMET THIN FILMS.JOURNAL OF MATERIALS SCIENCE. VOL. 30. ISSUE 23. P. 5867-5871 | 14 | 93% | 2 |
| 6 | FEDOROVICH, RD , NAUMOVETS, AG , TOMCHUK, PM , (1993) ELECTRONIC-PROPERTIES OF ISLAND THIN-FILMS CAUSED BY SURFACE SCATTERING OF ELECTRONS.PROGRESS IN SURFACE SCIENCE. VOL. 42. ISSUE 1-4. P. 189 -200 | 14 | 82% | 7 |
| 7 | SHARPE, RG , PALMER, RE , (1996) EVIDENCE FOR FIELD EMISSION IN ELECTROFORMED METAL-INSULATOR-METAL DEVICES.THIN SOLID FILMS. VOL. 288. ISSUE 1-2. P. 164-170 | 11 | 85% | 8 |
| 8 | MCHALE, G , NEWTON, MI , NEAL, DB , (1994) THIN-FILM METAL-INSULATOR METAL STRUCTURE WITH A LANGMUIR-BLODGETT OVERLAYER.VACUUM. VOL. 45. ISSUE 8. P. 897-900 | 11 | 92% | 1 |
| 9 | SAHOTA, MS , SHORT, EL , BEYNON, J , (1996) AN ANALYSIS OF SILICON OXIDE THIN FILMS BY COMPUTER SIMULATION OF SI 2P XPS SPECTRA USING THE SANDERSON TECHNIQUE.JOURNAL OF NON-CRYSTALLINE SOLIDS. VOL. 195. ISSUE 1-2. P. 83-88 | 10 | 91% | 13 |
| 10 | GRAVANO, S , AMR, E , GOULD, RD , ABU SAMRA, M , (2003) MONTE CARLO SIMULATION OF CURRENT-VOLTAGE CHARACTERISTICS IN METALINSULATOR-METAL THIN FILM STRUCTURES.THIN SOLID FILMS. VOL. 433. ISSUE 1-2. P. 321-325 | 7 | 100% | 8 |
Classes with closest relation at Level 1 |