Class information for:
Level 1: SECOND ORDER FOCUSING//STATIC MASS SPECTROMETERS//ENERGY ANALYZER

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
18594 545 14.1 41%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
3221 2             SCANDATE CATHODE//DISPENSER CATHODE//IMPREGNATED CATHODES 2032
18594 1                   SECOND ORDER FOCUSING//STATIC MASS SPECTROMETERS//ENERGY ANALYZER 545

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SECOND ORDER FOCUSING authKW 280135 1% 100% 5
2 STATIC MASS SPECTROMETERS authKW 224108 1% 100% 4
3 ENERGY ANALYZER authKW 179277 1% 40% 8
4 SPHERICAL CONDENSER authKW 168081 1% 100% 3
5 STATIC MASS SPECTROGRAPHS authKW 168081 1% 100% 3
6 ANGLE RESOLVED ANALYSIS authKW 112054 0% 100% 2
7 BOUNDED FIELD authKW 112054 0% 100% 2
8 CYLINDRICAL FIELD authKW 112054 0% 100% 2
9 DISTANT SOURCE authKW 112054 0% 100% 2
10 DOUBLE FOCUSING WITH RESPECT TO ANGLE AND ENERGY authKW 112054 0% 100% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Instruments & Instrumentation 7994 38% 0% 207
2 Spectroscopy 7440 32% 0% 175
3 Physics, Applied 2460 44% 0% 238
4 Nuclear Science & Technology 2200 19% 0% 104
5 Physics, Nuclear 1420 16% 0% 86
6 Physics, Particles & Fields 883 14% 0% 76
7 Physics, Atomic, Molecular & Chemical 246 10% 0% 52
8 Engineering, General 47 3% 0% 15
9 Engineering, Aerospace 18 1% 0% 6
10 Microscopy 18 1% 0% 4

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ATOM IS ELE ON SPECT 56027 0% 100% 1
2 ELE ON SPE 56027 0% 100% 1
3 MARYLAND TRADE 3 56027 0% 100% 1
4 SPACE PHYS SECT 56027 0% 100% 1
5 SCI EXPT THEORET PHYS 21918 1% 13% 3
6 ANALYT RUMENTAT 19483 3% 2% 16
7 SEKR P 1 1 18674 0% 33% 1
8 ASSOC PLASMAS 11204 0% 20% 1
9 ANALYT TOOL MAKING 9336 0% 17% 1
10 MICROELECT HIGHLY PURE MAT TECHNOL 9336 0% 17% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ZHURNAL TEKHNICHESKOI FIZIKI 86900 18% 2% 97
2 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 19867 8% 1% 46
3 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES 19202 4% 2% 22
4 REVIEW OF SCIENTIFIC INSTRUMENTS 10711 14% 0% 76
5 TECHNICAL PHYSICS 7836 5% 1% 28
6 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 7776 14% 0% 76
7 JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS 4114 2% 1% 13
8 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 3047 3% 0% 19
9 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH 1327 1% 0% 8
10 MEASUREMENT SCIENCE AND TECHNOLOGY 869 2% 0% 12

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SECOND ORDER FOCUSING 280135 1% 100% 5 Search SECOND+ORDER+FOCUSING Search SECOND+ORDER+FOCUSING
2 STATIC MASS SPECTROMETERS 224108 1% 100% 4 Search STATIC+MASS+SPECTROMETERS Search STATIC+MASS+SPECTROMETERS
3 ENERGY ANALYZER 179277 1% 40% 8 Search ENERGY+ANALYZER Search ENERGY+ANALYZER
4 SPHERICAL CONDENSER 168081 1% 100% 3 Search SPHERICAL+CONDENSER Search SPHERICAL+CONDENSER
5 STATIC MASS SPECTROGRAPHS 168081 1% 100% 3 Search STATIC+MASS+SPECTROGRAPHS Search STATIC+MASS+SPECTROGRAPHS
6 ANGLE RESOLVED ANALYSIS 112054 0% 100% 2 Search ANGLE+RESOLVED+ANALYSIS Search ANGLE+RESOLVED+ANALYSIS
7 BOUNDED FIELD 112054 0% 100% 2 Search BOUNDED+FIELD Search BOUNDED+FIELD
8 CYLINDRICAL FIELD 112054 0% 100% 2 Search CYLINDRICAL+FIELD Search CYLINDRICAL+FIELD
9 DISTANT SOURCE 112054 0% 100% 2 Search DISTANT+SOURCE Search DISTANT+SOURCE
10 DOUBLE FOCUSING WITH RESPECT TO ANGLE AND ENERGY 112054 0% 100% 2 Search DOUBLE+FOCUSING+WITH+RESPECT+TO+ANGLE+AND+ENERGY Search DOUBLE+FOCUSING+WITH+RESPECT+TO+ANGLE+AND+ENERGY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 YAVOR, MI , (1998) CHARGED PARTICLE OPTICS OF SYSTEMS WITH NARROW GAPS: A PERTURBATION THEORY APPROACH.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 103. VOL. 103. ISSUE . P. 277 -388 35 63% 2
2 YAVOR, M , (2009) CHARGED PARTICLES IN ELECTROMAGNETIC FIELDS.OPTICS OF CHARGED PARTICLE ANALYZERS. VOL. 157. ISSUE . P. 1 -+ 61 24% 12
3 BERDNIKOV, AS , AVERIN, IA , GOLIKOV, YK , (2016) STATIC MASS SPECTROMETERS OF NEW TYPE, USING EULER'S HOMOGENEOUS ELECTRIC AND MAGNETIC FIELDS. I. GENERAL PRINCIPLE AND SINGLE-STAGE SYSTEMS.JOURNAL OF ANALYTICAL CHEMISTRY. VOL. 71. ISSUE 13. P. 1280 -1287 15 79% 0
4 KHURSHEED, A , HOANG, HQ , SRINIVASAN, A , (2012) A WIDE-RANGE PARALLEL RADIAL MIRROR ANALYZER FOR SCANNING ELECTRON/ION MICROSCOPES.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 184. ISSUE 11-12. P. 525-532 10 100% 4
5 YAVOR, MI , BELOV, VD , POMOZOV, TV , (2008) FRINGING FIELD CORRECTION OF THE SECOND-ORDER ANGULAR ABERRATION IN SECTOR FIELD ELECTRON ENERGY ANALYZERS.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 168. ISSUE 1-3. P. 29-33 12 86% 1
6 CLARK, G , ALLEGRINI, F , MCCOMAS, DJ , LOUARN, P , (2016) MODELING THE RESPONSE OF A TOP HAT ELECTROSTATIC ANALYZER IN AN EXTERNAL MAGNETIC FIELD: EXPERIMENTAL VALIDATION WITH THE JUNO JADE-E SENSOR.JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS. VOL. 121. ISSUE 6. P. 5121 -5136 12 71% 0
7 BERDNIKOV, AS , YAVOR, MI , (1998) CALCULATION OF TOROIDAL AND CONICAL ELECTROSTATIC FIELDS FOR ANGLE RESOLVED ELECTRON ENERGY ANALYSIS.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 94. ISSUE 1-2. P. 7-16 13 100% 0
8 DOGAN, M , ULU, M , GENNARAKIS, GG , ZOUROS, TJM , (2013) EXPERIMENTAL ENERGY RESOLUTION OF A PARACENTRIC HEMISPHERICAL DEFLECTOR ANALYZER FOR DIFFERENT ENTRY POSITIONS AND BIAS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 84. ISSUE 4. P. - 9 75% 2
9 BERDNIKOV, AS , AVERIN, IA , GOLIKOV, YK , (2016) STATIC MASS SPECTROGRAPHS OF A NEW TYPE USING EULER'S HOMOGENEOUS ELECTRIC AND MAGNETIC FIELDS. II: CONDITIONS OF HIGH-ORDER DOUBLE FOCUSING FOR TWO-CASCADE SCHEMES.JOURNAL OF ANALYTICAL CHEMISTRY. VOL. 71. ISSUE 14. P. 1332 -1340 7 88% 0
10 ILYIN, AM , ILYINA, IA , (2005) NEW ELECTROSTATIC ENERGY ANALYSERS WITH A BOUNDED CYLINDRICAL FIELD.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 16. ISSUE 9. P. 1798 -1801 8 100% 2

Classes with closest relation at Level 1


Rank Class id link
1 33839 LOW ENERGY RECOILS//VAPOUR SOURCE//RECOIL SPECTROMETER
2 21296 ION MIRROR//MULTI TURN TIME OF FLIGHT MASS SPECTROMETER//REFLECTRON
3 16154 PROD DESIGN TECHNOL//CORE LENS//THIN LENS APPROXIMATION
4 20392 CANONICAL ABERRATION THEORY//OPT PHYS ELECT ENGN//MAGNETIC SPECTROMETERS
5 13080 MICROCHANNEL PLATE//WEDGE AND STRIP ANODE//IONCCD
6 34770 LOGARITHMIC ELECTROMETERS//RETARDING POTENTIAL ANALYZER//FAST ELECTROMETERS
7 11037 PHOTOEMISSION MICROSCOPY//SPECTROMICROSCOPY//XPEEM
8 8897 PHOTOELECTRON DIFFRACTION//PHOTOELECTRON HOLOGRAPHY//X RAY FLUORESCENCE HOLOGRAPHY
9 29281 ELECTRON ION//AR7//ATOMIC WAVENUMBERS
10 31022 MACRO SCALE QUANTUM EFFECTS//CURL FREE VECTOR POTENTIAL//LADDER THEORY

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