Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 34770 | 107 | 14.8 | 34% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
| 691 | 3 | QUANTUM CASCADE LASER//WAVELENGTH MODULATION SPECTROSCOPY//WAVELENGTH MODULATION | 7672 |
| 4108 | 2 | VOIGT FUNCTION//ESCAPE FACTOR//COMPLEX ERROR FUNCTION | 569 |
| 34770 | 1 | LOGARITHMIC ELECTROMETERS//RETARDING POTENTIAL ANALYZER//FAST ELECTROMETERS | 107 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | LOGARITHMIC ELECTROMETERS | authKW | 570759 | 2% | 100% | 2 |
| 2 | RETARDING POTENTIAL ANALYZER | authKW | 380505 | 2% | 67% | 2 |
| 3 | FAST ELECTROMETERS | authKW | 285380 | 1% | 100% | 1 |
| 4 | LINEAR ELECTROMETERS | authKW | 285380 | 1% | 100% | 1 |
| 5 | LOG ELECTROMETER | authKW | 285380 | 1% | 100% | 1 |
| 6 | LOW CURRENT SWITCHING | authKW | 285380 | 1% | 100% | 1 |
| 7 | NUCLEAR CHANNEL | authKW | 285380 | 1% | 100% | 1 |
| 8 | POSITIVELY CHARGED BEAM | authKW | 285380 | 1% | 100% | 1 |
| 9 | SDA 90 | authKW | 285380 | 1% | 100% | 1 |
| 10 | WIDE RANGE CURRENT MEASUREMENT | authKW | 285380 | 1% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Instruments & Instrumentation | 2398 | 47% | 0% | 50 |
| 2 | Physics, Applied | 382 | 39% | 0% | 42 |
| 3 | Engineering, Electrical & Electronic | 121 | 21% | 0% | 23 |
| 4 | Engineering, General | 91 | 7% | 0% | 8 |
| 5 | Physics, Fluids & Plasmas | 47 | 6% | 0% | 6 |
| 6 | Astronomy & Astrophysics | 40 | 9% | 0% | 10 |
| 7 | Physics, Atomic, Molecular & Chemical | 36 | 8% | 0% | 9 |
| 8 | Optics | 31 | 8% | 0% | 9 |
| 9 | Meteorology & Atmospheric Sciences | 22 | 5% | 0% | 5 |
| 10 | Remote Sensing | 17 | 2% | 0% | 2 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ROLLWALA COMP | 142689 | 1% | 50% | 1 |
| 2 | SPACE WEATHER CODE 674 | 95125 | 1% | 33% | 1 |
| 3 | INT SPACE WEATHER STUDY EDUC | 71343 | 1% | 25% | 1 |
| 4 | HEAVY ION FUS SCI VIRTUAL | 57074 | 1% | 20% | 1 |
| 5 | THIN FILM TECHNOL GRP | 43527 | 3% | 5% | 3 |
| 6 | SPACE PLASMA SCI | 38047 | 2% | 7% | 2 |
| 7 | WILLIAM B HANSON SPACE SCI | 32148 | 4% | 3% | 4 |
| 8 | PLASMA SPACE SCI | 12404 | 2% | 2% | 2 |
| 9 | PHOSPHOR DISPLAY MAT | 11889 | 1% | 4% | 1 |
| 10 | WB HANSON SPACE SCI | 5706 | 1% | 2% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | REVIEW OF SCIENTIFIC INSTRUMENTS | 10366 | 31% | 0% | 33 |
| 2 | ELECTRONIC ENGINEERING | 8452 | 2% | 1% | 2 |
| 3 | ELECTRONICS & WIRELESS WORLD | 4754 | 1% | 2% | 1 |
| 4 | INTERNATIONAL JOURNAL OF ELECTRONICS | 2124 | 6% | 0% | 6 |
| 5 | IEEE CIRCUITS & DEVICES | 825 | 1% | 0% | 1 |
| 6 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 798 | 5% | 0% | 5 |
| 7 | INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 639 | 3% | 0% | 3 |
| 8 | JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS | 516 | 6% | 0% | 6 |
| 9 | MEASUREMENT SCIENCE AND TECHNOLOGY | 498 | 4% | 0% | 4 |
| 10 | JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 495 | 2% | 0% | 2 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | LOGARITHMIC ELECTROMETERS | 570759 | 2% | 100% | 2 | Search LOGARITHMIC+ELECTROMETERS | Search LOGARITHMIC+ELECTROMETERS |
| 2 | RETARDING POTENTIAL ANALYZER | 380505 | 2% | 67% | 2 | Search RETARDING+POTENTIAL+ANALYZER | Search RETARDING+POTENTIAL+ANALYZER |
| 3 | FAST ELECTROMETERS | 285380 | 1% | 100% | 1 | Search FAST+ELECTROMETERS | Search FAST+ELECTROMETERS |
| 4 | LINEAR ELECTROMETERS | 285380 | 1% | 100% | 1 | Search LINEAR+ELECTROMETERS | Search LINEAR+ELECTROMETERS |
| 5 | LOG ELECTROMETER | 285380 | 1% | 100% | 1 | Search LOG+ELECTROMETER | Search LOG+ELECTROMETER |
| 6 | LOW CURRENT SWITCHING | 285380 | 1% | 100% | 1 | Search LOW+CURRENT+SWITCHING | Search LOW+CURRENT+SWITCHING |
| 7 | NUCLEAR CHANNEL | 285380 | 1% | 100% | 1 | Search NUCLEAR+CHANNEL | Search NUCLEAR+CHANNEL |
| 8 | POSITIVELY CHARGED BEAM | 285380 | 1% | 100% | 1 | Search POSITIVELY+CHARGED+BEAM | Search POSITIVELY+CHARGED+BEAM |
| 9 | SDA 90 | 285380 | 1% | 100% | 1 | Search SDA+90 | Search SDA+90 |
| 10 | WIDE RANGE CURRENT MEASUREMENT | 285380 | 1% | 100% | 1 | Search WIDE+RANGE+CURRENT+MEASUREMENT | Search WIDE+RANGE+CURRENT+MEASUREMENT |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | RAJPUT, SS , (2003) AN IMPROVED MULTIGAIN RANGE LINEAR CURRENT ELECTROMETER.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 74. ISSUE 6. P. 3120-3126 | 13 | 81% | 1 |
| 2 | ENLOE, CL , AMATUCCI, WE , MCHARG, MG , BALTHAZOR, RL , (2015) SCREENS VERSUS MICROARRAYS FOR RUGGEDIZED RETARDING POTENTIAL ANALYZERS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 86. ISSUE 9. P. - | 7 | 100% | 1 |
| 3 | RAJPUT, SS , GARG, SC , (2002) INSTRUMENTATION FOR A RETARDING POTENTIAL ANALYZER FOR MEASUREMENT OF ELECTRON PARAMETERS.INDIAN JOURNAL OF ENGINEERING AND MATERIALS SCIENCES. VOL. 9. ISSUE 5. P. 315-322 | 10 | 83% | 1 |
| 4 | PONTES, EW , FERREIRA, A , (2012) A NEW METHOD OF CURRENT SWITCHING FOR LINEAR WIDE-RANGE MEASUREMENT SYSTEMS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 61. ISSUE 2. P. 496 -504 | 5 | 100% | 0 |
| 5 | RAJPUT, SS , GARG, SC , (1999) INSTRUMENTATION FOR A RETARDING POTENTIAL ANALYZER EXPERIMENT. PART I. ION PARAMETERS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 70. ISSUE 2. P. 1435 -1441 | 8 | 89% | 2 |
| 6 | FENG, YB , WANG, SJ , KONG, LG , (2010) SIMULATION ANALYSIS OF ERRORS FROM IONOSPHERE SATELLITE-BORNE RETARDING POTENTIAL ANALYZER.CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION. VOL. 53. ISSUE 11. P. 2535-2543 | 5 | 83% | 1 |
| 7 | SHAN, SY , CHANG, RS , (1997) A NOVEL WIDE RANGE ELECTROMETER WITH QUASILINEAR OUTPUT.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 68. ISSUE 10. P. 3917-3919 | 6 | 100% | 1 |
| 8 | ACHARYA, YB , (2001) ANALYTICAL CORRECTION FOR TEMPERATURE AND DIODE CHARACTERISTICS FOR APPLICATION IN A WIDE DYNAMIC RANGE LOGARITHMIC ELECTROMETER.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 72. ISSUE 8. P. 3431 -3434 | 6 | 86% | 1 |
| 9 | FENG, YB , WANG, SJ , KONG, LG , (2011) A SIMULATION ANALYSIS OF SYSTEMATIC ERRORS IN ION ARRIVAL ANGLE AND DRIFT VELOCITY FROM THE SATELLITE BORNE ION DRIFT METER.ADVANCES IN SPACE RESEARCH. VOL. 47. ISSUE 11. P. 1958-1964 | 5 | 71% | 0 |
| 10 | ACHARYA, YB , (2005) CURRENT CONVEYOR BASED ELECTROMETER.AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS. VOL. 59. ISSUE 7. P. 413-416 | 5 | 83% | 0 |
Classes with closest relation at Level 1 |