Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
14564 | 762 | 23.3 | 69% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
589 | 3 | ATOMIC LAYER DEPOSITION//HFO2//HIGH K DIELECTRICS | 15224 |
664 | 2 | ATOMIC LAYER DEPOSITION//HFO2//HIGH K DIELECTRICS | 13339 |
14564 | 1 | RU//RUO2//RUTHENIUM DIOXIDE | 762 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | RU | authKW | 279688 | 6% | 15% | 48 |
2 | RUO2 | authKW | 245118 | 5% | 16% | 38 |
3 | RUTHENIUM DIOXIDE | authKW | 225694 | 3% | 22% | 26 |
4 | RUTHENIUM FILMS | authKW | 200356 | 1% | 100% | 5 |
5 | RUOD3 | authKW | 160285 | 1% | 100% | 4 |
6 | RUTHENIUM OXIDE | authKW | 156766 | 5% | 11% | 35 |
7 | RUO2 THIN FILM | authKW | 90159 | 0% | 75% | 3 |
8 | RUOX | authKW | 90159 | 0% | 75% | 3 |
9 | CONDUCTIVE RUO2 | authKW | 80143 | 0% | 100% | 2 |
10 | ECR ION GUN | authKW | 80143 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 7983 | 23% | 0% | 179 |
2 | Physics, Applied | 4849 | 51% | 0% | 390 |
3 | Physics, Condensed Matter | 1980 | 28% | 0% | 212 |
4 | Materials Science, Multidisciplinary | 1710 | 35% | 0% | 263 |
5 | Electrochemistry | 775 | 9% | 0% | 69 |
6 | Nanoscience & Nanotechnology | 450 | 9% | 0% | 69 |
7 | Engineering, Electrical & Electronic | 264 | 13% | 0% | 101 |
8 | Chemistry, Physical | 75 | 10% | 0% | 75 |
9 | Materials Science, Ceramics | 42 | 2% | 0% | 14 |
10 | Physics, Multidisciplinary | 25 | 4% | 0% | 34 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PASMANT GRP | 80143 | 0% | 100% | 2 |
2 | ADV PROC C ACITOR | 66779 | 1% | 33% | 5 |
3 | BEREICH INGENIEURWISSEN | 40071 | 0% | 100% | 1 |
4 | CENIDEIVG | 40071 | 0% | 100% | 1 |
5 | CHEM N ANO SCI | 40071 | 0% | 100% | 1 |
6 | CHIM PHYS ANALYT PL | 40071 | 0% | 100% | 1 |
7 | HEATING LIGHTING | 40071 | 0% | 100% | 1 |
8 | MAT AVIAT ENGN | 40071 | 0% | 100% | 1 |
9 | QUANTUM PHYS MATH MODELING MAT | 40071 | 0% | 100% | 1 |
10 | SEMICOND DEV 2 | 40071 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | INTEGRATED FERROELECTRICS | 16277 | 5% | 1% | 40 |
2 | CHEMICAL VAPOR DEPOSITION | 11617 | 2% | 2% | 17 |
3 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 4105 | 3% | 0% | 21 |
4 | THIN SOLID FILMS | 3656 | 8% | 0% | 58 |
5 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 3623 | 5% | 0% | 36 |
6 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2689 | 6% | 0% | 46 |
7 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 2529 | 6% | 0% | 44 |
8 | MICROELECTRONIC ENGINEERING | 1114 | 2% | 0% | 17 |
9 | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 1006 | 3% | 0% | 20 |
10 | JOURNAL OF MATERIALS RESEARCH | 844 | 2% | 0% | 16 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | RU | 279688 | 6% | 15% | 48 | Search RU | Search RU |
2 | RUO2 | 245118 | 5% | 16% | 38 | Search RUO2 | Search RUO2 |
3 | RUTHENIUM DIOXIDE | 225694 | 3% | 22% | 26 | Search RUTHENIUM+DIOXIDE | Search RUTHENIUM+DIOXIDE |
4 | RUTHENIUM FILMS | 200356 | 1% | 100% | 5 | Search RUTHENIUM+FILMS | Search RUTHENIUM+FILMS |
5 | RUOD3 | 160285 | 1% | 100% | 4 | Search RUOD3 | Search RUOD3 |
6 | RUTHENIUM OXIDE | 156766 | 5% | 11% | 35 | Search RUTHENIUM+OXIDE | Search RUTHENIUM+OXIDE |
7 | RUO2 THIN FILM | 90159 | 0% | 75% | 3 | Search RUO2+THIN+FILM | Search RUO2+THIN+FILM |
8 | RUOX | 90159 | 0% | 75% | 3 | Search RUOX | Search RUOX |
9 | CONDUCTIVE RUO2 | 80143 | 0% | 100% | 2 | Search CONDUCTIVE+RUO2 | Search CONDUCTIVE+RUO2 |
10 | ECR ION GUN | 80143 | 0% | 100% | 2 | Search ECR+ION+GUN | Search ECR+ION+GUN |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | VASILYEV, VY , MOROZOVA, NB , IGUMENOV, IK , (2014) CHEMICAL VAPOUR-PHASE DEPOSITION OF RUTHENIUM-CONTAINING THIN FILMS.RUSSIAN CHEMICAL REVIEWS. VOL. 83. ISSUE 8. P. 758 -782 | 52 | 71% | 1 |
2 | GAUR, R , MISHRA, L , SIDDIQI, MA , ATAKAN, B , (2014) RUTHENIUM COMPLEXES AS PRECURSORS FOR CHEMICAL VAPOR-DEPOSITION (CVD).RSC ADVANCES. VOL. 4. ISSUE 64. P. 33785 -33805 | 51 | 44% | 0 |
3 | LAI, YH , CHEN, YL , CHI, Y , LIU, CS , CARTY, AJ , PENG, SM , LEE, GH , (2003) DEPOSITION OF RU AND RUO2 THIN FILMS EMPLOYING DICARBONYL BIS-DIKETONATE RUTHENIUM COMPLEXES AS CVD SOURCE REAGENTS.JOURNAL OF MATERIALS CHEMISTRY. VOL. 13. ISSUE 8. P. 1999-2006 | 35 | 78% | 28 |
4 | TUCHSCHERER, A , GEORGI, C , ROTH, N , SCHAARSCHMIDT, D , RUFFER, T , WAECHTLER, T , SCHULZ, SE , OSWALD, S , GESSNER, T , LANG, H , (2012) RUTHENOCENES AND HALF-OPEN RUTHENOCENES: SYNTHESIS, CHARACTERIZATION, AND THEIR USE AS CVD PRECURSORS FOR RUTHENIUM THIN FILM DEPOSITION.EUROPEAN JOURNAL OF INORGANIC CHEMISTRY. VOL. . ISSUE 30. P. 4867 -4876 | 30 | 67% | 6 |
5 | ANDO, T , NAKATA, N , SUZUKI, K , MATSUMOTO, T , OGO, S , (2012) RU CYCLOOCTATETRAENE PRECURSORS FOR MOCVD.DALTON TRANSACTIONS. VOL. 41. ISSUE 6. P. 1678 -1682 | 22 | 85% | 7 |
6 | SONG, YH , CHEN, YL , CHI, Y , LITT, CS , CHING, WL , KAI, JJ , CHEN, RS , HUANG, YS , CARTY, AJ , (2003) DEPOSITION OF CONDUCTIVE RU AND RUO2 THIN FILMS EMPLOYING A PYRAZOLATE COMPLEX [RU(CO)(3)(3,5-(CF3)(2)-PZ)](2) AS THE CVD SOURCE REAGENT.CHEMICAL VAPOR DEPOSITION. VOL. 9. ISSUE 3. P. 162-169 | 33 | 72% | 10 |
7 | YEO, S , PARK, JY , LEE, SJ , LEE, DJ , SEO, JH , KIM, SH , (2015) RUTHENIUM AND RUTHENIUM DIOXIDE THIN FILMS DEPOSITED BY ATOMIC LAYER DEPOSITION USING A NOVEL ZERO-VALENT METALORGANIC PRECURSOR, (ETHYLBENZENE)(1,3-BUTADIENE)RU(0), AND MOLECULAR OXYGEN.MICROELECTRONIC ENGINEERING. VOL. 137. ISSUE . P. 16 -22 | 22 | 76% | 2 |
8 | FUNAKUBO, H , SHIRAISHI, T , OIKAWA, T , HIRANO, M , CHIBA, H , KAWANO, K , (2015) EFFECT OF INCUBATION TIME ON PREPARATION OF CONTINUOUS AND FLAT RU FILMS.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 33. ISSUE 1. P. - | 20 | 80% | 0 |
9 | NOUGARET, L , COMBETTE, P , ARINERO, R , PODLECKI, J , PASCAL-DELANNOY, F , (2007) DEVELOPMENT OF RUTHENIUM DIOXIDE ELECTRODES FOR PYROELECTRIC DEVICES BASED ON LITHIUM TANTALATE THIN FILMS.THIN SOLID FILMS. VOL. 515. ISSUE 7-8. P. 3971-3977 | 23 | 79% | 12 |
10 | YANG, ZJ , GUO, YD , LI, J , LIU, JC , DAI, W , CHENG, XL , YANG, XD , (2010) ELECTRONIC STRUCTURE AND OPTICAL PROPERTIES OF RUTILE RUO2 FROM FIRST PRINCIPLES.CHINESE PHYSICS B. VOL. 19. ISSUE 7. P. - | 23 | 72% | 11 |
Classes with closest relation at Level 1 |