Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
6011 | 1543 | 15.3 | 56% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | SPIRAL INDUCTOR | authKW | 1229951 | 7% | 60% | 104 |
2 | INDUCTORS | authKW | 585913 | 8% | 24% | 126 |
3 | DE EMBEDDING | authKW | 399868 | 3% | 42% | 48 |
4 | INDUCTOR MODEL | authKW | 353341 | 2% | 71% | 25 |
5 | ON CHIP INDUCTOR | authKW | 308151 | 2% | 54% | 29 |
6 | HIGH Q INDUCTOR | authKW | 222606 | 1% | 75% | 15 |
7 | SELF RESONANCE FREQUENCY | authKW | 199526 | 1% | 92% | 11 |
8 | QUALITY FACTOR | authKW | 192798 | 6% | 10% | 99 |
9 | ON WAFER MICROWAVE MEASUREMENTS | authKW | 184176 | 1% | 85% | 11 |
10 | SUBSTRATE LOSS | authKW | 171019 | 1% | 79% | 11 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 35788 | 87% | 0% | 1338 |
2 | Physics, Applied | 1874 | 24% | 0% | 376 |
3 | Telecommunications | 1065 | 8% | 0% | 116 |
4 | Optics | 908 | 11% | 0% | 175 |
5 | Nanoscience & Nanotechnology | 630 | 8% | 0% | 119 |
6 | Computer Science, Hardware & Architecture | 465 | 3% | 0% | 52 |
7 | Engineering, Manufacturing | 278 | 3% | 0% | 40 |
8 | Materials Science, Multidisciplinary | 189 | 11% | 0% | 173 |
9 | Instruments & Instrumentation | 150 | 4% | 0% | 61 |
10 | Computer Science, Interdisciplinary Applications | 135 | 3% | 0% | 49 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NOVITASNANOELECT | 44521 | 0% | 75% | 3 |
2 | ESATTELEMIC | 39576 | 0% | 100% | 2 |
3 | MICROWAVE RF SYST GRP | 39576 | 0% | 100% | 2 |
4 | PROJECT SENSORS MICROSYST | 39576 | 0% | 100% | 2 |
5 | RFOEIC | 39576 | 0% | 100% | 2 |
6 | MAT COMPONENTS PACKAGING | 35616 | 0% | 60% | 3 |
7 | RF INTEGRATED SYST CIRCUITS GRP | 35616 | 0% | 60% | 3 |
8 | MICROWAVE RF TECHNOL | 31640 | 1% | 13% | 12 |
9 | HIGH FREQUENCY TECHNOL COMPONENTS | 28777 | 0% | 36% | 4 |
10 | RFIC | 28761 | 1% | 12% | 12 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 70923 | 14% | 2% | 213 |
2 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 30838 | 5% | 2% | 77 |
3 | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 24750 | 9% | 1% | 136 |
4 | IEEE TRANSACTIONS ON ADVANCED PACKAGING | 21251 | 2% | 3% | 33 |
5 | INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING | 19496 | 2% | 3% | 35 |
6 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 17422 | 8% | 1% | 116 |
7 | IEEE MICROWAVE AND GUIDED WAVE LETTERS | 17121 | 2% | 3% | 27 |
8 | IEEE ELECTRON DEVICE LETTERS | 14328 | 5% | 1% | 81 |
9 | IEICE TRANSACTIONS ON ELECTRONICS | 7541 | 3% | 1% | 48 |
10 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 7115 | 1% | 2% | 22 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SPIRAL INDUCTOR | 1229951 | 7% | 60% | 104 | Search SPIRAL+INDUCTOR | Search SPIRAL+INDUCTOR |
2 | INDUCTORS | 585913 | 8% | 24% | 126 | Search INDUCTORS | Search INDUCTORS |
3 | DE EMBEDDING | 399868 | 3% | 42% | 48 | Search DE+EMBEDDING | Search DE+EMBEDDING |
4 | INDUCTOR MODEL | 353341 | 2% | 71% | 25 | Search INDUCTOR+MODEL | Search INDUCTOR+MODEL |
5 | ON CHIP INDUCTOR | 308151 | 2% | 54% | 29 | Search ON+CHIP+INDUCTOR | Search ON+CHIP+INDUCTOR |
6 | HIGH Q INDUCTOR | 222606 | 1% | 75% | 15 | Search HIGH+Q+INDUCTOR | Search HIGH+Q+INDUCTOR |
7 | SELF RESONANCE FREQUENCY | 199526 | 1% | 92% | 11 | Search SELF+RESONANCE+FREQUENCY | Search SELF+RESONANCE+FREQUENCY |
8 | QUALITY FACTOR | 192798 | 6% | 10% | 99 | Search QUALITY+FACTOR | Search QUALITY+FACTOR |
9 | ON WAFER MICROWAVE MEASUREMENTS | 184176 | 1% | 85% | 11 | Search ON+WAFER+MICROWAVE+MEASUREMENTS | Search ON+WAFER+MICROWAVE+MEASUREMENTS |
10 | SUBSTRATE LOSS | 171019 | 1% | 79% | 11 | Search SUBSTRATE+LOSS | Search SUBSTRATE+LOSS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | SARAFIS, P , HOURDAKIS, E , NASSIOPOULOU, AG , NEVE, CR , BEN ALI, K , RASKIN, JP , (2013) ADVANCED SI-BASED SUBSTRATES FOR RF PASSIVE INTEGRATION: COMPARISON BETWEEN LOCAL POROUS SI LAYER TECHNOLOGY AND TRAP-RICH HIGH RESISTIVITY SI.SOLID-STATE ELECTRONICS. VOL. 87. ISSUE . P. 27-33 | 25 | 93% | 12 |
2 | WANG, C , LIAO, HL , LI, C , HUANG, R , WONG, WS , ZHANG, X , WANG, YY , (2009) A WIDEBAND PREDICTIVE "DOUBLE-PI" EQUIVALENT-CIRCUIT MODEL FOR ON-CHIP SPIRAL INDUCTORS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 56. ISSUE 4. P. 609 -619 | 24 | 96% | 13 |
3 | MALLIK, K , ABUELGASIM, A , HASHIM, N , ASHBURN, P , DE GROOT, CH , (2014) ANALYTICAL AND NUMERICAL MODEL OF SPIRAL INDUCTORS ON HIGH RESISTIVITY SILICON SUBSTRATES.SOLID-STATE ELECTRONICS. VOL. 93. ISSUE . P. 43-48 | 22 | 92% | 2 |
4 | BANITORFIAN, F , ESHGHABADI, F , ABD MANAF, A , PONS, P , NOH, NM , MUSTAFFA, MT , SIDEK, O , (2014) EVALUATION AND ANALYSIS OF METHODS FOR FIXED AND VARIABLE MEMS INDUCTORS DESIGN.INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS. VOL. 44. ISSUE 2. P. 87 -103 | 23 | 88% | 0 |
5 | BURGHARTZ, JN , REJAEI, B , (2003) ON THE DESIGN OF RF SPIRAL INDUCTORS ON SILICON.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 50. ISSUE 3. P. 718 -729 | 23 | 96% | 123 |
6 | TIEMEIJER, LF , HAVENS, RJ , BOUTTEMENT, Y , PRANGER, HJ , (2006) PHYSICS-BASED WIDEBAND PREDICTIVE COMPACT MODEL FOR INDUCTORS WITH HIGH AMOUNTS OF DUMMY METAL FILL.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 54. ISSUE 8. P. 3378-3386 | 24 | 92% | 19 |
7 | YIN, WY , PAN, SJ , LI, LW , GAN, YB , (2004) MODEL DESCRIPTION AND PARAMETER EXTRACTION OF ON-CHIP SPIRAL INDUCTORS FOR MMICS.INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING. VOL. 14. ISSUE 2. P. 111-121 | 23 | 100% | 5 |
8 | BIONDI, T , SCUDERI, A , RAGONESE, E , PALMISANO, G , (2007) CHARACTERIZATION AND MODELING OF SILICON INTEGRATED SPIRAL INDUCTORS FOR HIGH-FREQUENCY APPLICATIONS.ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING. VOL. 51. ISSUE 2. P. 89-100 | 21 | 95% | 1 |
9 | LEE, CI , LIN, WC , (2015) A SIMPLE AND ACCURATE PAD-THRU-SHORT DEEMBEDDING METHOD BASED ON SYSTEMATIC ANALYSIS FOR RF DEVICE CHARACTERIZATION.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 62. ISSUE 1. P. 94 -101 | 21 | 75% | 1 |
10 | WANG, H , SUN, LL , LIU, J , YU, ZP , GAO, JJ , (2012) ANALYSIS OF MODELING APPROACHES FOR ON-CHIP SPIRAL INDUCTORS.INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING. VOL. 22. ISSUE 3. P. 377 -386 | 17 | 100% | 1 |
Classes with closest relation at Level 1 |