X-ray Spectroscopy EDS, WDS
Scanning electron microscopes equipped with energy and wavelength x-ray spectroscopy make it is possible to combine chemical analysis with imaging or crystal structure analysis.
Energy (EDS) and wavelength (WDS) dispersive x-ray spectroscopy are techniques that provide spatially resolved analysis of the surface element distribution of a material. Both techniques use that each element emits x-rays of specific energies, the so-called characteristic x-rays, when interacting with electrons of sufficient high energies. The analysis of the emitted x-rays therefore allows the determination and quantification of the elements present in the sample.
EDS and WDS are complementary techniques in the chemical analysis of a material with WDS specializing in the analysis of light elements like carbon and nitrogen and EDS covering the analysis of heavier elements.
In our laboratory all SEMs are equipped with an EDS detector and one with both EDS and WDS detectors. Therefore, it is possible to combine the chemical analysis with imaging or crystal structure analysis.
All tools at Hultgren Laboratory
