Electron microscopy
We have three different sets of scanning and transmission electron microscopes, of both detector and ion beam type.
Electron microscopes are based on the use of a narrow, high energy electron beam that allows significantly higher resolutions (down to Å length scale) compared to light optical microscopy. There are different types of electron microscopes with the two most common being scanning (SEM) and transmission electron microscopes (TEM). The use of different electron beam energies and detectors allows multiple applications ranging from imaging of the surface topography or crystal structure (link to EBSD) to the chemical analysis (link to EDS/WDS).
There are three SEMs (link to lims SEM1, SEM2, FIB) with different sets of detectors or the addition of an ion beam available in our laboratory. Furthermore, we also provide support for TEM (link to lims TEM support) investigations.
All tools at Hultgren Laboratory
