Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
868 | 2997 | 24.4 | 68% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
19 | 4 | ASTRONOMY & ASTROPHYSICS//ASTROPHYSICAL JOURNAL//ASTRON | 523489 |
158 | 3 | NUCLEAR FUSION//PHYSICS, FLUIDS & PLASMAS//PLASMA PHYSICS AND CONTROLLED FUSION | 61209 |
1313 | 2 | PLASMA SOURCES SCIENCE & TECHNOLOGY//HALL THRUSTER//PHYSICS OF PLASMAS | 8510 |
868 | 1 | PLASMA SOURCES SCIENCE & TECHNOLOGY//CAPACITIVELY COUPLED PLASMA//PLASMA ATOM PHYS | 2997 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | PLASMA SOURCES SCIENCE & TECHNOLOGY | journal | 439832 | 11% | 13% | 344 |
2 | CAPACITIVELY COUPLED PLASMA | authKW | 269999 | 2% | 51% | 52 |
3 | PLASMA ATOM PHYS | address | 192150 | 1% | 44% | 43 |
4 | INDUCTIVELY COUPLED PLASMA | authKW | 162595 | 4% | 14% | 116 |
5 | RF DISCHARGE | authKW | 159648 | 2% | 28% | 56 |
6 | ELECTRICAL ASYMMETRY EFFECT | authKW | 132428 | 0% | 100% | 13 |
7 | LANGMUIR PROBE | authKW | 120286 | 3% | 15% | 81 |
8 | PLASMA SCI TECHNOL | address | 119342 | 2% | 17% | 69 |
9 | LADDER SHAPED ELECTRODE | authKW | 112837 | 0% | 92% | 12 |
10 | PLASMA PROC | address | 108147 | 2% | 22% | 49 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Fluids & Plasmas | 54126 | 33% | 1% | 988 |
2 | Physics, Applied | 21216 | 54% | 0% | 1612 |
3 | Materials Science, Coatings & Films | 7463 | 12% | 0% | 351 |
4 | Physics, Multidisciplinary | 448 | 7% | 0% | 219 |
5 | Instruments & Instrumentation | 270 | 4% | 0% | 115 |
6 | Physics, Mathematical | 168 | 3% | 0% | 84 |
7 | Physics, Condensed Matter | 48 | 4% | 0% | 134 |
8 | Materials Science, Multidisciplinary | 45 | 7% | 0% | 198 |
9 | Computer Science, Interdisciplinary Applications | 6 | 1% | 0% | 32 |
10 | Nanoscience & Nanotechnology | 4 | 1% | 0% | 43 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PLASMA ATOM PHYS | 192150 | 1% | 44% | 43 |
2 | PLASMA SCI TECHNOL | 119342 | 2% | 17% | 69 |
3 | PLASMA PROC | 108147 | 2% | 22% | 49 |
4 | PHYS TECHNOL PLASMAS | 63620 | 1% | 21% | 30 |
5 | THEORET ELECT ENGN | 57001 | 1% | 20% | 28 |
6 | ELECT ENGN COMP SCI 1770 | 45838 | 0% | 75% | 6 |
7 | PHYS OPTOELECT TECHNOL | 44164 | 3% | 5% | 93 |
8 | LPP CNRS | 41590 | 0% | 58% | 7 |
9 | IMPEDANS LTD | 40747 | 0% | 100% | 4 |
10 | PLASMA ATOMPHYS | 36379 | 0% | 71% | 5 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PLASMA SOURCES SCIENCE & TECHNOLOGY | 439832 | 11% | 13% | 344 |
2 | IEEE TRANSACTIONS ON PLASMA SCIENCE | 41041 | 7% | 2% | 198 |
3 | PHYSICS OF PLASMAS | 24614 | 7% | 1% | 214 |
4 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 23648 | 6% | 1% | 182 |
5 | JOURNAL OF PHYSICS D-APPLIED PHYSICS | 19694 | 7% | 1% | 202 |
6 | JOURNAL OF APPLIED PHYSICS | 14408 | 13% | 0% | 392 |
7 | PLASMA SCIENCE & TECHNOLOGY | 9892 | 2% | 2% | 47 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 5998 | 5% | 0% | 137 |
9 | PLASMA CHEMISTRY AND PLASMA PROCESSING | 5144 | 1% | 2% | 27 |
10 | CONTRIBUTIONS TO PLASMA PHYSICS | 5006 | 1% | 1% | 35 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CAPACITIVELY COUPLED PLASMA | 269999 | 2% | 51% | 52 | Search CAPACITIVELY+COUPLED+PLASMA | Search CAPACITIVELY+COUPLED+PLASMA |
2 | INDUCTIVELY COUPLED PLASMA | 162595 | 4% | 14% | 116 | Search INDUCTIVELY+COUPLED+PLASMA | Search INDUCTIVELY+COUPLED+PLASMA |
3 | RF DISCHARGE | 159648 | 2% | 28% | 56 | Search RF+DISCHARGE | Search RF+DISCHARGE |
4 | ELECTRICAL ASYMMETRY EFFECT | 132428 | 0% | 100% | 13 | Search ELECTRICAL+ASYMMETRY+EFFECT | Search ELECTRICAL+ASYMMETRY+EFFECT |
5 | LANGMUIR PROBE | 120286 | 3% | 15% | 81 | Search LANGMUIR+PROBE | Search LANGMUIR+PROBE |
6 | LADDER SHAPED ELECTRODE | 112837 | 0% | 92% | 12 | Search LADDER+SHAPED+ELECTRODE | Search LADDER+SHAPED+ELECTRODE |
7 | LOW INDUCTANCE ANTENNA | 102715 | 0% | 92% | 11 | Search LOW+INDUCTANCE+ANTENNA | Search LOW+INDUCTANCE+ANTENNA |
8 | VHF PLASMA | 91984 | 1% | 53% | 17 | Search VHF+PLASMA | Search VHF+PLASMA |
9 | LOW DAMAGE PROCESS | 91681 | 0% | 100% | 9 | Search LOW+DAMAGE+PROCESS | Search LOW+DAMAGE+PROCESS |
10 | PLASMA UNIFORMITY | 76780 | 0% | 54% | 14 | Search PLASMA+UNIFORMITY | Search PLASMA+UNIFORMITY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | LAFLEUR, T , (2016) TAILORED-WAVEFORM EXCITATION OF CAPACITIVELY COUPLED PLASMAS AND THE ELECTRICAL ASYMMETRY EFFECT.PLASMA SOURCES SCIENCE & TECHNOLOGY. VOL. 25. ISSUE 1. P. - | 122 | 90% | 0 |
2 | BI, ZH , LIU, YX , JIANG, W , XU, X , WANG, YN , (2011) A BRIEF REVIEW OF DUAL-FREQUENCY CAPACITIVELY COUPLED DISCHARGES.CURRENT APPLIED PHYSICS. VOL. 11. ISSUE 5. P. S2 -S8 | 119 | 95% | 16 |
3 | SCHUNGEL, E , BRANDT, S , DONKO, Z , KOROLOV, I , DERZSI, A , SCHULZE, J , (2015) ELECTRON HEATING VIA SELF-EXCITED PLASMA SERIES RESONANCE IN GEOMETRICALLY SYMMETRIC MULTI-FREQUENCY CAPACITIVE PLASMAS.PLASMA SOURCES SCIENCE & TECHNOLOGY. VOL. 24. ISSUE 4. P. - | 95 | 91% | 6 |
4 | BRANDT, S , BERGER, B , SCHUNGEL, E , KOROLOV, I , DERZSI, A , BRUNEAU, B , JOHNSON, E , LAFLEUR, T , O'CONNELL, D , KOEPKE, M , ET AL (2016) ELECTRON POWER ABSORPTION DYNAMICS IN CAPACITIVE RADIO FREQUENCY DISCHARGES DRIVEN BY TAILORED VOLTAGE WAVEFORMS IN CF4.PLASMA SOURCES SCIENCE & TECHNOLOGY. VOL. 25. ISSUE 4. P. - | 84 | 88% | 0 |
5 | AHR, P , SCHUNGEL, E , SCHULZE, J , TSANKOV, TV , CZARNETZKI, U , (2015) INFLUENCE OF A PHASE-LOCKED RF SUBSTRATE BIAS ON THE E- TO H-MODE TRANSITION IN AN INDUCTIVELY COUPLED PLASMA.PLASMA SOURCES SCIENCE & TECHNOLOGY. VOL. 24. ISSUE 4. P. - | 68 | 99% | 4 |
6 | TURNER, MM , (2009) COLLISIONLESS HEATING IN RADIO-FREQUENCY DISCHARGES: A REVIEW.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 42. ISSUE 19. P. - | 75 | 95% | 46 |
7 | BERGER, B , BRANDT, S , FRANEK, J , SCHUNGEL, E , KOEPKE, M , MUSSENBROCK, T , SCHULZE, J , (2015) EXPERIMENTAL INVESTIGATIONS OF ELECTRON HEATING DYNAMICS AND ION ENERGY DISTRIBUTIONS IN CAPACITIVE DISCHARGES DRIVEN BY CUSTOMIZED VOLTAGE WAVEFORMS.JOURNAL OF APPLIED PHYSICS. VOL. 118. ISSUE 22. P. - | 75 | 90% | 0 |
8 | DONKO, Z , SCHULZE, J , CZARNETZKI, U , DERZSI, A , HARTMANN, P , KOROLOV, I , SCHUNGEL, E , (2012) FUNDAMENTAL INVESTIGATIONS OF CAPACITIVE RADIO FREQUENCY PLASMAS: SIMULATIONS AND EXPERIMENTS.PLASMA PHYSICS AND CONTROLLED FUSION. VOL. 54. ISSUE 12. P. - | 79 | 84% | 17 |
9 | SCHUNGEL, E , ZHANG, QZ , IWASHITA, S , SCHULZE, J , HOU, LJ , WANG, YN , CZARNETZKI, U , (2011) CONTROL OF PLASMA PROPERTIES IN CAPACITIVELY COUPLED OXYGEN DISCHARGES VIA THE ELECTRICAL ASYMMETRY EFFECT.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 44. ISSUE 28. P. - | 74 | 90% | 20 |
10 | SCHULZE, J , DERZSI, A , DONKO, Z , (2011) ELECTRON HEATING AND THE ELECTRICAL ASYMMETRY EFFECT IN DUAL-FREQUENCY CAPACITIVE CF4 DISCHARGES.PLASMA SOURCES SCIENCE & TECHNOLOGY. VOL. 20. ISSUE 4. P. - | 71 | 88% | 21 |
Classes with closest relation at Level 1 |