Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
18049 | 569 | 13.3 | 38% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
42 | 3 | IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS//ENGINEERING, ELECTRICAL & ELECTRONIC | 97664 |
3391 | 2 | SIX PORT//SIX PORT REFLECTOMETER//VECTOR NETWORK ANALYZER VNA | 1634 |
18049 | 1 | VECTOR NETWORK ANALYZER VNA//SCATTERING PARAMETER MEASUREMENT//MICROWAVE NETWORK ANALYZER | 569 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | VECTOR NETWORK ANALYZER VNA | authKW | 764925 | 5% | 51% | 28 |
2 | SCATTERING PARAMETER MEASUREMENT | authKW | 464385 | 3% | 58% | 15 |
3 | MICROWAVE NETWORK ANALYZER | authKW | 292166 | 1% | 78% | 7 |
4 | MULTIPORT NETWORK | authKW | 289777 | 2% | 60% | 9 |
5 | SCATTERING MATRIX MEASUREMENT | authKW | 268319 | 1% | 100% | 5 |
6 | VNA CALIBRATION | authKW | 268319 | 1% | 100% | 5 |
7 | TEST FIXTURE | authKW | 259103 | 2% | 37% | 13 |
8 | IMPEDANCE STANDARDS | authKW | 219121 | 1% | 58% | 7 |
9 | 16 TERM ERROR MODEL | authKW | 214655 | 1% | 100% | 4 |
10 | VECTOR NETWORK ANALYZER | authKW | 192942 | 2% | 28% | 13 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 12899 | 86% | 0% | 488 |
2 | Telecommunications | 2497 | 18% | 0% | 102 |
3 | Instruments & Instrumentation | 1756 | 18% | 0% | 102 |
4 | Engineering, Manufacturing | 180 | 3% | 0% | 19 |
5 | Optics | 111 | 7% | 0% | 41 |
6 | Engineering, General | 37 | 2% | 0% | 14 |
7 | Physics, Applied | 33 | 8% | 0% | 46 |
8 | Materials Science, Multidisciplinary | 24 | 8% | 0% | 47 |
9 | Computer Science, Interdisciplinary Applications | 2 | 1% | 0% | 7 |
10 | Engineering, Aerospace | 2 | 1% | 0% | 3 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | CIRCUIT THEORY GRP | 160991 | 1% | 100% | 3 |
2 | RADIOFREQUENCY MICROWAVE ENGN | 71546 | 1% | 33% | 4 |
3 | ADV CONCEPTS GR | 53664 | 0% | 100% | 1 |
4 | ALLGEMEINE ELEKTROTECHN | 53664 | 0% | 100% | 1 |
5 | ANTENNA OPT SYST BRANCH | 53664 | 0% | 100% | 1 |
6 | ARBEITSGRP HOCHFREQUENZMESSTECHN | 53664 | 0% | 100% | 1 |
7 | DC LF ELECT SECT | 53664 | 0% | 100% | 1 |
8 | DIRECTOR AGR | 53664 | 0% | 100% | 1 |
9 | ECOLE SUPER ELE RADIOELE GRENOBLE | 53664 | 0% | 100% | 1 |
10 | ELE OMAGNET WAVES MICROWAVE ELECT | 53664 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 76307 | 24% | 1% | 134 |
2 | MICROWAVE JOURNAL | 48679 | 7% | 2% | 40 |
3 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 26345 | 12% | 1% | 66 |
4 | MICROWAVES & RF | 25018 | 3% | 3% | 18 |
5 | IEEE MICROWAVE MAGAZINE | 19477 | 3% | 2% | 15 |
6 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING | 11332 | 2% | 2% | 9 |
7 | IEEE TRANSACTIONS ON ADVANCED PACKAGING | 10376 | 2% | 1% | 14 |
8 | IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY | 6464 | 1% | 2% | 8 |
9 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 5079 | 3% | 1% | 19 |
10 | MICROWAVES | 4988 | 0% | 5% | 2 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | VECTOR NETWORK ANALYZER VNA | 764925 | 5% | 51% | 28 | Search VECTOR+NETWORK+ANALYZER+VNA | Search VECTOR+NETWORK+ANALYZER+VNA |
2 | SCATTERING PARAMETER MEASUREMENT | 464385 | 3% | 58% | 15 | Search SCATTERING+PARAMETER+MEASUREMENT | Search SCATTERING+PARAMETER+MEASUREMENT |
3 | MICROWAVE NETWORK ANALYZER | 292166 | 1% | 78% | 7 | Search MICROWAVE+NETWORK+ANALYZER | Search MICROWAVE+NETWORK+ANALYZER |
4 | MULTIPORT NETWORK | 289777 | 2% | 60% | 9 | Search MULTIPORT+NETWORK | Search MULTIPORT+NETWORK |
5 | SCATTERING MATRIX MEASUREMENT | 268319 | 1% | 100% | 5 | Search SCATTERING+MATRIX+MEASUREMENT | Search SCATTERING+MATRIX+MEASUREMENT |
6 | VNA CALIBRATION | 268319 | 1% | 100% | 5 | Search VNA+CALIBRATION | Search VNA+CALIBRATION |
7 | TEST FIXTURE | 259103 | 2% | 37% | 13 | Search TEST+FIXTURE | Search TEST+FIXTURE |
8 | IMPEDANCE STANDARDS | 219121 | 1% | 58% | 7 | Search IMPEDANCE+STANDARDS | Search IMPEDANCE+STANDARDS |
9 | 16 TERM ERROR MODEL | 214655 | 1% | 100% | 4 | Search 16+TERM+ERROR+MODEL | Search 16+TERM+ERROR+MODEL |
10 | VECTOR NETWORK ANALYZER | 192942 | 2% | 28% | 13 | Search VECTOR+NETWORK+ANALYZER | Search VECTOR+NETWORK+ANALYZER |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | RUMIANTSEV, A , RIDLER, N , (2008) VNA CALIBRATION.IEEE MICROWAVE MAGAZINE. VOL. 9. ISSUE 3. P. 86 -99 | 24 | 92% | 34 |
2 | FERRERO, A , TEPPATI, V , FLEDELL, E , GROSSMAN, B , RUTTAN, T , (2011) MICROWAVE MULTIPORT MEASUREMENTS FOR THE DIGITAL WORLD.IEEE MICROWAVE MAGAZINE. VOL. 12. ISSUE 1. P. 61 -73 | 22 | 81% | 9 |
3 | DAHLBERG, K , SILVONEN, K , (2014) A METHOD TO DETERMINE LRRM CALIBRATION STANDARDS IN MEASUREMENT CONFIGURATIONS AFFECTED BY LEAKAGE.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 62. ISSUE 9. P. 2132 -2139 | 13 | 100% | 1 |
4 | CHEN, CJ , (2013) A STUDY ON NETWORK ANALYZER SELF-CALIBRATION USING AN ARBITRARY DEVICE.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 62. ISSUE 9. P. 2576 -2582 | 15 | 83% | 1 |
5 | TEPPATI, V , FERRERO, A , (2005) ON-WAFER CALIBRATION ALGORITHM FOR PARTIALLY LEAKY MULTIPORT VECTOR NETWORK ANALYZERS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 53. ISSUE 11. P. 3665 -3671 | 15 | 100% | 11 |
6 | WAN, L , LI, QL , WANG, ZP , WU, JH , (2015) IMPROVED MULTIMODE TRL CALIBRATION METHOD FOR CHARACTERIZATION OF HOMOGENEOUS DIFFERENTIAL DISCONTINUITIES.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 64. ISSUE 3. P. 694 -703 | 12 | 80% | 2 |
7 | MA, RB , HAN, GR , CHEN, XW , ZHANG, WM , (2010) CALIBRATING AN ARBITRARY TEST FIXTURE FOR A SYMMETRIC DEVICE BY THREE MEASUREMENTS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 59. ISSUE 1. P. 145 -152 | 11 | 100% | 3 |
8 | ZHANG, Y , SILVONEN, K , ZHU, NH , (2007) MEASUREMENT OF A RECIPROCAL FOUR-PORT TRANSMISSION LINE STRUCTURE USING THE 16-TERM ERROR MODEL.MICROWAVE AND OPTICAL TECHNOLOGY LETTERS. VOL. 49. ISSUE 7. P. 1511-1515 | 11 | 100% | 4 |
9 | SILVONEN, K , DAHLBERG, K , KIURU, T , (2012) 16-TERM ERROR MODEL IN RECIPROCAL SYSTEMS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 60. ISSUE 11. P. 3551-3558 | 12 | 80% | 2 |
10 | LIN, YC , CHU, TH , (2015) MULTIPORT SCATTERING MATRIX DETERMINATION FROM ONE-PORT MEASUREMENTS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 63. ISSUE 7. P. 2343 -2352 | 9 | 100% | 0 |
Classes with closest relation at Level 1 |