Class information for:
Level 1: VECTOR NETWORK ANALYZER VNA//SCATTERING PARAMETER MEASUREMENT//MICROWAVE NETWORK ANALYZER

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
18049 569 13.3 38%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
42 3       IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS//ENGINEERING, ELECTRICAL & ELECTRONIC 97664
3391 2             SIX PORT//SIX PORT REFLECTOMETER//VECTOR NETWORK ANALYZER VNA 1634
18049 1                   VECTOR NETWORK ANALYZER VNA//SCATTERING PARAMETER MEASUREMENT//MICROWAVE NETWORK ANALYZER 569

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 VECTOR NETWORK ANALYZER VNA authKW 764925 5% 51% 28
2 SCATTERING PARAMETER MEASUREMENT authKW 464385 3% 58% 15
3 MICROWAVE NETWORK ANALYZER authKW 292166 1% 78% 7
4 MULTIPORT NETWORK authKW 289777 2% 60% 9
5 SCATTERING MATRIX MEASUREMENT authKW 268319 1% 100% 5
6 VNA CALIBRATION authKW 268319 1% 100% 5
7 TEST FIXTURE authKW 259103 2% 37% 13
8 IMPEDANCE STANDARDS authKW 219121 1% 58% 7
9 16 TERM ERROR MODEL authKW 214655 1% 100% 4
10 VECTOR NETWORK ANALYZER authKW 192942 2% 28% 13

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Engineering, Electrical & Electronic 12899 86% 0% 488
2 Telecommunications 2497 18% 0% 102
3 Instruments & Instrumentation 1756 18% 0% 102
4 Engineering, Manufacturing 180 3% 0% 19
5 Optics 111 7% 0% 41
6 Engineering, General 37 2% 0% 14
7 Physics, Applied 33 8% 0% 46
8 Materials Science, Multidisciplinary 24 8% 0% 47
9 Computer Science, Interdisciplinary Applications 2 1% 0% 7
10 Engineering, Aerospace 2 1% 0% 3

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CIRCUIT THEORY GRP 160991 1% 100% 3
2 RADIOFREQUENCY MICROWAVE ENGN 71546 1% 33% 4
3 ADV CONCEPTS GR 53664 0% 100% 1
4 ALLGEMEINE ELEKTROTECHN 53664 0% 100% 1
5 ANTENNA OPT SYST BRANCH 53664 0% 100% 1
6 ARBEITSGRP HOCHFREQUENZMESSTECHN 53664 0% 100% 1
7 DC LF ELECT SECT 53664 0% 100% 1
8 DIRECTOR AGR 53664 0% 100% 1
9 ECOLE SUPER ELE RADIOELE GRENOBLE 53664 0% 100% 1
10 ELE OMAGNET WAVES MICROWAVE ELECT 53664 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 76307 24% 1% 134
2 MICROWAVE JOURNAL 48679 7% 2% 40
3 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 26345 12% 1% 66
4 MICROWAVES & RF 25018 3% 3% 18
5 IEEE MICROWAVE MAGAZINE 19477 3% 2% 15
6 IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING 11332 2% 2% 9
7 IEEE TRANSACTIONS ON ADVANCED PACKAGING 10376 2% 1% 14
8 IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY 6464 1% 2% 8
9 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS 5079 3% 1% 19
10 MICROWAVES 4988 0% 5% 2

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 VECTOR NETWORK ANALYZER VNA 764925 5% 51% 28 Search VECTOR+NETWORK+ANALYZER+VNA Search VECTOR+NETWORK+ANALYZER+VNA
2 SCATTERING PARAMETER MEASUREMENT 464385 3% 58% 15 Search SCATTERING+PARAMETER+MEASUREMENT Search SCATTERING+PARAMETER+MEASUREMENT
3 MICROWAVE NETWORK ANALYZER 292166 1% 78% 7 Search MICROWAVE+NETWORK+ANALYZER Search MICROWAVE+NETWORK+ANALYZER
4 MULTIPORT NETWORK 289777 2% 60% 9 Search MULTIPORT+NETWORK Search MULTIPORT+NETWORK
5 SCATTERING MATRIX MEASUREMENT 268319 1% 100% 5 Search SCATTERING+MATRIX+MEASUREMENT Search SCATTERING+MATRIX+MEASUREMENT
6 VNA CALIBRATION 268319 1% 100% 5 Search VNA+CALIBRATION Search VNA+CALIBRATION
7 TEST FIXTURE 259103 2% 37% 13 Search TEST+FIXTURE Search TEST+FIXTURE
8 IMPEDANCE STANDARDS 219121 1% 58% 7 Search IMPEDANCE+STANDARDS Search IMPEDANCE+STANDARDS
9 16 TERM ERROR MODEL 214655 1% 100% 4 Search 16+TERM+ERROR+MODEL Search 16+TERM+ERROR+MODEL
10 VECTOR NETWORK ANALYZER 192942 2% 28% 13 Search VECTOR+NETWORK+ANALYZER Search VECTOR+NETWORK+ANALYZER

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 RUMIANTSEV, A , RIDLER, N , (2008) VNA CALIBRATION.IEEE MICROWAVE MAGAZINE. VOL. 9. ISSUE 3. P. 86 -99 24 92% 34
2 FERRERO, A , TEPPATI, V , FLEDELL, E , GROSSMAN, B , RUTTAN, T , (2011) MICROWAVE MULTIPORT MEASUREMENTS FOR THE DIGITAL WORLD.IEEE MICROWAVE MAGAZINE. VOL. 12. ISSUE 1. P. 61 -73 22 81% 9
3 DAHLBERG, K , SILVONEN, K , (2014) A METHOD TO DETERMINE LRRM CALIBRATION STANDARDS IN MEASUREMENT CONFIGURATIONS AFFECTED BY LEAKAGE.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 62. ISSUE 9. P. 2132 -2139 13 100% 1
4 CHEN, CJ , (2013) A STUDY ON NETWORK ANALYZER SELF-CALIBRATION USING AN ARBITRARY DEVICE.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 62. ISSUE 9. P. 2576 -2582 15 83% 1
5 TEPPATI, V , FERRERO, A , (2005) ON-WAFER CALIBRATION ALGORITHM FOR PARTIALLY LEAKY MULTIPORT VECTOR NETWORK ANALYZERS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 53. ISSUE 11. P. 3665 -3671 15 100% 11
6 WAN, L , LI, QL , WANG, ZP , WU, JH , (2015) IMPROVED MULTIMODE TRL CALIBRATION METHOD FOR CHARACTERIZATION OF HOMOGENEOUS DIFFERENTIAL DISCONTINUITIES.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 64. ISSUE 3. P. 694 -703 12 80% 2
7 MA, RB , HAN, GR , CHEN, XW , ZHANG, WM , (2010) CALIBRATING AN ARBITRARY TEST FIXTURE FOR A SYMMETRIC DEVICE BY THREE MEASUREMENTS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 59. ISSUE 1. P. 145 -152 11 100% 3
8 ZHANG, Y , SILVONEN, K , ZHU, NH , (2007) MEASUREMENT OF A RECIPROCAL FOUR-PORT TRANSMISSION LINE STRUCTURE USING THE 16-TERM ERROR MODEL.MICROWAVE AND OPTICAL TECHNOLOGY LETTERS. VOL. 49. ISSUE 7. P. 1511-1515 11 100% 4
9 SILVONEN, K , DAHLBERG, K , KIURU, T , (2012) 16-TERM ERROR MODEL IN RECIPROCAL SYSTEMS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 60. ISSUE 11. P. 3551-3558 12 80% 2
10 LIN, YC , CHU, TH , (2015) MULTIPORT SCATTERING MATRIX DETERMINATION FROM ONE-PORT MEASUREMENTS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 63. ISSUE 7. P. 2343 -2352 9 100% 0

Classes with closest relation at Level 1


Rank Class id link
1 19457 SIX PORT//SIX PORT REFLECTOMETER//SIX PORT RECEIVER
2 31255 MICROWAVE STANDARDS//BOLOMETER MOUNT//POWER STANDARDS
3 37446 EXCESS CONDUCTION LOSS//CHARACTERIZATION OF CARD WIRING PERMITTIVITY//COMP AIDED CIRCUIT DESIGN GRP
4 6011 SPIRAL INDUCTOR//INDUCTORS//DE EMBEDDING
5 33317 NULL BALANCED//NOISE STANDARD//RADIONAVIGATION
6 5646 HIGH SPEED INTERCONNECTS//NONUNIFORM TRANSMISSION LINES//MULTICONDUCTOR TRANSMISSION LINES
7 15419 ON CHIP ANTENNA//ANTENNA IN PACKAGE//GRID ARRAY ANTENNA
8 6357 PERMITTIVITY MEASUREMENT//COMPLEX PERMITTIVITY//MICROWAVE MEASUREMENTS
9 10615 FREQUENCY MULTIPLIER//FREQUENCY DOUBLER//THZ COMMUNICATIONS
10 24989 IMBALANCE DIFFERENCE MODEL//COMMON MODE RADIATION//COMMON MODE CURRENT

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