Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
5646 | 1593 | 17.5 | 44% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | HIGH SPEED INTERCONNECTS | authKW | 485119 | 3% | 56% | 45 |
2 | NONUNIFORM TRANSMISSION LINES | authKW | 456858 | 3% | 57% | 42 |
3 | MULTICONDUCTOR TRANSMISSION LINES | authKW | 445090 | 4% | 39% | 60 |
4 | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | journal | 350120 | 15% | 8% | 238 |
5 | DELAY EXTRACTION | authKW | 220976 | 1% | 82% | 14 |
6 | CABLE BUNDLE | authKW | 172501 | 1% | 100% | 9 |
7 | INCIDENT FIELDS | authKW | 155249 | 1% | 90% | 9 |
8 | PASSIVE MACROMODELS | authKW | 147432 | 1% | 77% | 10 |
9 | TRANSMISSION LINES | authKW | 143407 | 5% | 9% | 81 |
10 | FREQUENCY DEPENDENT PARAMETERS | authKW | 130666 | 1% | 45% | 15 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 38213 | 88% | 0% | 1404 |
2 | Telecommunications | 14099 | 25% | 0% | 401 |
3 | Computer Science, Hardware & Architecture | 6052 | 11% | 0% | 178 |
4 | Engineering, Manufacturing | 1593 | 6% | 0% | 91 |
5 | Computer Science, Interdisciplinary Applications | 790 | 7% | 0% | 105 |
6 | Optics | 157 | 6% | 0% | 89 |
7 | Materials Science, Multidisciplinary | 148 | 10% | 0% | 164 |
8 | Computer Science, Information Systems | 122 | 3% | 0% | 46 |
9 | Physics, Applied | 108 | 8% | 0% | 135 |
10 | Instruments & Instrumentation | 7 | 2% | 0% | 25 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | UAQ EMC | 60551 | 1% | 20% | 16 |
2 | DIP SISTEMI ELETTR AUTOMAZ | 25554 | 0% | 67% | 2 |
3 | AUTOMAT CONTROL ELECT INFORMAT | 21559 | 0% | 38% | 3 |
4 | CADENCE DESIGN SYST | 21559 | 0% | 38% | 3 |
5 | ALLGEMEINE ELEKTROTECH LEISTUNGSELEKT IELE | 19167 | 0% | 100% | 1 |
6 | ALLGEMEINE ELEKTROTECH LEISTUNGSELEKTRON | 19167 | 0% | 100% | 1 |
7 | CCCE CIRCUIT DESIGN | 19167 | 0% | 100% | 1 |
8 | CENT ENGN BUSINESS DEV | 19167 | 0% | 100% | 1 |
9 | CHONGQING CAERI QUAL INSPECT AUTHENTICAT CO | 19167 | 0% | 100% | 1 |
10 | CIRCUIT SIMULAT | 19167 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 350120 | 15% | 8% | 238 |
2 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 109688 | 17% | 2% | 269 |
3 | IEEE TRANSACTIONS ON ADVANCED PACKAGING | 79977 | 4% | 6% | 65 |
4 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING | 61240 | 2% | 9% | 35 |
5 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 20955 | 5% | 2% | 73 |
6 | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 11612 | 2% | 2% | 28 |
7 | PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER | 8124 | 2% | 1% | 34 |
8 | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 7897 | 3% | 1% | 47 |
9 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 7533 | 1% | 2% | 23 |
10 | JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS | 7360 | 2% | 1% | 39 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | HIGH SPEED INTERCONNECTS | 485119 | 3% | 56% | 45 | Search HIGH+SPEED+INTERCONNECTS | Search HIGH+SPEED+INTERCONNECTS |
2 | NONUNIFORM TRANSMISSION LINES | 456858 | 3% | 57% | 42 | Search NONUNIFORM+TRANSMISSION+LINES | Search NONUNIFORM+TRANSMISSION+LINES |
3 | MULTICONDUCTOR TRANSMISSION LINES | 445090 | 4% | 39% | 60 | Search MULTICONDUCTOR+TRANSMISSION+LINES | Search MULTICONDUCTOR+TRANSMISSION+LINES |
4 | DELAY EXTRACTION | 220976 | 1% | 82% | 14 | Search DELAY+EXTRACTION | Search DELAY+EXTRACTION |
5 | CABLE BUNDLE | 172501 | 1% | 100% | 9 | Search CABLE+BUNDLE | Search CABLE+BUNDLE |
6 | INCIDENT FIELDS | 155249 | 1% | 90% | 9 | Search INCIDENT+FIELDS | Search INCIDENT+FIELDS |
7 | PASSIVE MACROMODELS | 147432 | 1% | 77% | 10 | Search PASSIVE+MACROMODELS | Search PASSIVE+MACROMODELS |
8 | TRANSMISSION LINES | 143407 | 5% | 9% | 81 | Search TRANSMISSION+LINES | Search TRANSMISSION+LINES |
9 | FREQUENCY DEPENDENT PARAMETERS | 130666 | 1% | 45% | 15 | Search FREQUENCY+DEPENDENT+PARAMETERS | Search FREQUENCY+DEPENDENT+PARAMETERS |
10 | RADIATED SUSCEPTIBILITY | 128835 | 1% | 61% | 11 | Search RADIATED+SUSCEPTIBILITY | Search RADIATED+SUSCEPTIBILITY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | ACHAR, R , NAKHLA, MS , (2001) SIMULATION OF HIGH-SPEED INTERCONNECTS.PROCEEDINGS OF THE IEEE. VOL. 89. ISSUE 5. P. 693 -728 | 46 | 78% | 326 |
2 | MANFREDI, P , DE ZUTTER, D , GINSTE, DV , (2016) ANALYSIS OF NONUNIFORM TRANSMISSION LINES WITH AN ITERATIVE AND ADAPTIVE PERTURBATION TECHNIQUE.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 58. ISSUE 3. P. 859 -867 | 35 | 88% | 0 |
3 | ANTONINI, G , (2012) SPECTRAL MODELS OF LOSSY NONUNIFORM MULTICONDUCTOR TRANSMISSION LINES.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 54. ISSUE 2. P. 474-481 | 29 | 97% | 8 |
4 | ROY, S , BEYGI, A , DOUNAVIS, A , (2013) ELECTROMAGNETIC INTERFERENCE ANALYSIS OF MULTICONDUCTOR TRANSMISSION LINE NETWORKS USING LONGITUDINAL PARTITIONING-BASED WAVEFORM RELAXATION ALGORITHM.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 55. ISSUE 2. P. 395 -406 | 24 | 92% | 5 |
5 | TANG, M , MAO, JF , (2010) FINITE-DIFFERENCE ANALYSIS OF INTERCONNECTS WITH FREQUENCY-DEPENDENT PARAMETERS BASED ON EQUIVALENT CIRCUIT MODELS.IEEE TRANSACTIONS ON ADVANCED PACKAGING. VOL. 33. ISSUE 2. P. 457 -467 | 28 | 85% | 4 |
6 | CHELDAVI, A , ANSARI, D , (2004) EFFICIENT FREQUENCY-DOMAIN MODELLING AND SIMULATION OF NONUNIFORM COUPLED TRANSMISSION LINES: APPLICATION IN TRANSIENT ANALYSIS OF VLSI CIRCUITS.CANADIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING-REVUE CANADIENNE DE GENIE ELECTRIQUE ET INFORMATIQUE. VOL. 29. ISSUE 3. P. 167-177 | 29 | 97% | 1 |
7 | GUO, J , XIE, YZ , LI, KJ , CANAVERO, F , (2014) CONVERGENCE ANALYSIS OF THE DISTRIBUTED ANALYTICAL REPRESENTATION AND ITERATIVE TECHNIQUE (DARIT-FIELD) FOR THE FIELD COUPLING TO MULTICONDUCTOR TRANSMISSION LINES.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 56. ISSUE 6. P. 1613 -1622 | 22 | 96% | 2 |
8 | BEYGI, A , DOUNAVIS, A , (2012) ANALYSIS OF EXCITED MULTICONDUCTOR TRANSMISSION LINES BASED ON THE PASSIVE METHOD OF CHARACTERISTICS MACROMODEL.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 54. ISSUE 6. P. 1281-1288 | 25 | 89% | 0 |
9 | ANTONINI, G , ORLANDI, A , PIGNARI, SA , (2013) REVIEW OF CLAYTON R. PAUL STUDIES ON MULTICONDUCTOR TRANSMISSION LINES.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 55. ISSUE 4. P. 639-647 | 23 | 92% | 3 |
10 | RAJHI, A , GHNIMI, S , GHARSSALLAH, A , (2012) TRANSIENT ANALYSIS OF THE EM FIELD COUPLING TO MULTI-CONDUCTOR TRANSMISSION LINES USING THE NILT METHOD.INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES. VOL. 4. ISSUE 4. P. 463 -472 | 26 | 81% | 1 |
Classes with closest relation at Level 1 |